Abstract: The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.

Abstract: The present invention relates to improvement in accuracy in a device and a method for determining whether a spectrum of a target sample coincide with a standard spectrum or not. A spectrum determination device 10 determines whether a sample spectrum coincides with a reference spectrum or not by the reference spectrum obtained from a spectrum group. The spectrum determination device 10 comprises a storage unit 26 for storing the reference spectrum, and a determination unit 28 for comparing the reference spectrum and the sample spectrum to determine a sample 20 from the comparison result. The reference spectrum is set with a differing weighting for each point. The determination unit 28 calculates an individual coincidence with the sample spectrum for each point of the reference spectrum, and calculates a coincidence of the sample spectrum with the reference spectrum by the individual coincidence and the differing weighting to determine the sample 20.

Abstract: The present invention provides a total reflection prism that can be used in multiple reflection method and that can make the contact area with the sample small. A total reflection prism is made of a plate-shaped optical member, has a leading-in part and a leading-out part of a measurement light provided at positions deviated from the center of either of the front and back surfaces, and has a plurality of plane parts that are formed perpendicularly to the front and back surfaces respectively on an outer periphery of the prism excluding the front and back surfaces of the prism. The leading-in part is provided to irradiate the measurement light that is guided inside at an angle of incidence of total reflection toward either of the front and back surfaces. The front and back surfaces are provided so that the measurement light travels while totally reflected alternately.

Abstract: To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device (1) includes: a pair of plane mirrors (2a, 2b) disposed on a central axis (P1); a pair of intermediate mirrors (4a, 4b) opposing to the plane mirrors (2a, 2b), respectively; a pair of ellipsoidal mirrors (6a, 6b) opposing to the intermediate mirrors (4a, 4b), respectively; and an ATR crystal (8) provided at a position nearer to the sample side than the pair of plane mirrors (2a, 2b) on the central axis (P1).

Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength ?1 of a semi-conductor laser, and a step of interpolating intensity signals (I1?, I2?, . . . ) that would be obtained when the interference wave is sampled at positions (D1?, D2?, . . . ) of the movable mirror set on the basis of a wavelength ?0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1?, I2?, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength ?0.

Abstract: To provide a microspectroscope that can perform a wide range mapping measurement with high sensitivity, at high speed, and with high wavelength resolution. The Raman spectroscope comprises: a unit for linearly irradiating excitation light; a movable stage for a sample; an objective lens for focusing Raman light from the linear irradiation region; an incident slit provided at the imaging position of Raman light; a spectrometer for diffusing the passing light; a CCD detector for detecting Raman spectral image; and a control device for controlling the mapping measurement by synchronizing the movable stage and the CCD detector. The control device controls the movable stage to move in the direction orthogonal to the longitudinal direction of the linear irradiation light and obtain one average spectrum.

Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Abstract: The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscope 10 comprises a light source 12, an irradiating unit 14 for irradiating the infrared light from the light source to a sample 16, a focusing unit 18 for focusing the infrared light transmitted through or reflected by the sample 16, and a detector 20 for detecting the focused infrared light. The irradiating unit 14 comprises a first aperture 24, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unit 18 comprises a second aperture 30, and the second aperture is disposed at an imaging position of the infrared light at the first aperture 24. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detector 20 to detect the infrared light as a detecting light.

Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength ?1 of a semi-conductor laser, and a step of interpolating intensity signals (I1?, I2?, . . . ) that would be obtained when the interference wave is sampled at positions (D1?, D2?, . . . ) of the movable mirror set on the basis of a wavelength ?0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1?, I2?, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength ?0.

Abstract: A chromatography system has a multi-channel detection device including a flow cell, optics for directing light from light sources to the flow cell and outputting light that has passed through the flow cell, and a multi-channel detector. The optics has a function of dispersing light in wavelength in an optical path. The detector receives the light dispersed in wavelength. The multi-channel detection device also has a signal processing part connected to the detector. The chromatography system has a data processing apparatus. The signal processing circuit has a function of calculating an absorbance by absorbance=?log10(I/I0) using the intensity I of light having a wavelength to be measured that is outputted from the detector and a reference intensity I0 of light that is an average of intensities of light having different wavelengths that is produced at the same point of time as the light having a wavelength to be measured.

Abstract: A high-pressure fluorescence flow cell comprises a cell body made of a light-transmissive material, wherein the cell body is penetrated by a straight-line flow path for a high-pressure fluid, wherein the flow path is formed with a cross section of 0.1 mm2 to 5 mm2, both inclusive, orthogonal to its longitudinal direction, wherein the ratio t/d of the wall thickness t (mm) to the width d (mm) of the flow path satisfies formula (1) below, t d ? 1 2 × [ ? + P ? - P - 1 ] × 1.5 ( 1 ) where ? indicates the tensile stress (MPa) of the material of the cell body, and P indicates the withstand pressure (MPa) of the cell body.

Abstract: A pressure control apparatus for a supercritical fluid according to the present invention includes: a valve comprising; a valve chamber provided in a midway of a channel through which a supercritical fluid passes; and an electrically-operated valve element located in the valve chamber; a pressure detection member for detecting the pressure of the supercritical fluid in the channel on an upstream or downstream side of the valve chamber; an open/close control member for controlling the pressure detected by the pressure detection member to be a target pressure; and a valve-opening rate adjustment member for adjusting the valve-opening rate when the valve is opened based on the state of the supercritical fluid.

Abstract: A pressure gauge mounted to a pump or a back pressure regulator in an HPLC, SFC, or SFE system provides improved solvent exchange and improved measurement precision. A through hole having an inside diameter of 1.0 mm is made in a hexagonal member similar in shape to a pipe joint. A part of the hexagonal member is cut away to form a flat surface such that the distance to the outside periphery of the through hole is 0.5 mm to serve as a strain-measurement strain gauge attaching surface. One strain gauge is attached to the center of the strain-measurement strain gauge attaching surface, and two strain gauges are attached for temperature correction, one on the same surface as the strain-measurement strain gauge attaching surface and the other on an outside surface of the hexagonal member.

Abstract: A chromatography system has a multi-channel detection device including a flow cell, optics for directing light from light sources to the flow cell and outputting light that has passed through the flow cell, and a multi-channel detector. The optics has a function of dispersing light in wavelength in an optical path. The detector receives the light dispersed in wavelength. The multi-channel detection device also has a signal processing part connected to the detector. The chromatography system has a data processing apparatus. The signal processing circuit has a function of calculating an absorbance by absorbance=?log10(I/I0) using the intensity I of light having a wavelength to be measured that is outputted from the detector and a reference intensity I0 of light that is an average of intensities of light having different wavelengths that is produced at the same point of time as the light having a wavelength to be measured.

Abstract: A depolarizer includes a pair of wedge-shaped plates made of an optically isotropic material, laid one on top of another such that the total thickness is constant and wedge-plate holding means for holding the pair of wedge plates separately. The wedge-plate holding means includes a pressure-applying section for applying pressure to each of the pair of wedge plates in a direction perpendicular to the thickness direction of the pair of wedge plates. The pressure-applying direction for one of the pair of wedge plates and the pressure-applying direction for the other of the pair of wedge plates intersect at an angle of 45 degrees.

Abstract: Measuring apparatus comprises a rotating plate 17, a torque detection plate 18 disposed on a same axis parallel to the plate 17 with a given gap, a torque sensor about the plate 18 through the specimen held between two plates. The plate 18 is a total reflection prism which is made from a material that has a greater refractive index than the specimen and transmits UV and infrared light. An ultraviolet beam is directed onto the specimen through the prism. An infrared beam is directed into the prism. The infrared beam emerging from the prism after total reflection from the interface between the prism and the specimen is detected. A signal processor analyzes the infrared absorption spectrum of the specimen on the basis of the infrared beam. While the viscosity of the specimen in the curing process is measured, the signal processor simultaneously measures the infrared absorption spectrum.

Abstract: A circular dichroism (CD) spectrometer includes an alignment mechanism that automatically adjusts the elements thereof at appropriate positions. The spectrometer has a focusing-lens position-and-orientation adjustment mechanism which adjusts the position and the orientation of the detector-side focusing lens. It also has a detector rotation mechanism which adjusts the orientation of the detector. Firstly, a control PC monitors the CD spectrum of D form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum matches the reference spectrum related to the D form. Next, the control PC moniters CD spectrum of L form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum of the D and L forms become symmetrical. And, the rotation mechanism adjusts the orientation of the detector such that the intensity of the detector signal is maximized.

Abstract: A solution sample holding method between two light-transmitting plate-like members for measuring light passing through a minute amount of solution sample, comprises a dripping step and a covering step. The dripping step is to drip a minute amount of solution sample in a drip area of a sample mounting face of a first light-transmitting member. The sample mounting face also includes a liquid-repellent area surrounding the drip area. The covering step is to cover the solution sample with a second light-transmitting member and to maintain a predetermined distance between the first light-transmitting member and the second light-transmitting member. The liquid-repellent area of the sample mounting face is covered with a liquid-repellent substance. The minute amount of solution sample is held in contact with the two light-transmitting members.

Abstract: A circular dichroism (CD) spectrometer includes an alignment mechanism that automatically adjusts the elements thereof at appropriate positions. The spectrometer has a focusing-lens position-and-orientation adjustment mechanism which adjusts the position and the orientation of the detector-side focusing lens. It also has a detector rotation mechanism which adjusts the orientation of the detector. Firstly, a control PC monitors the CD spectrum of D form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum matches the reference spectrum related to the D form. Next, the control PC moniters CD spectrum of L form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum of the D and L forms become symmetrical. And, the rotation mechanism adjusts the orientation of the detector such that the intensity of the detector signal is maximized.