Patents Assigned to Jordan
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Patent number: 8449216Abstract: A manhole cover assembly includes a frame that includes a central opening and a safety stop portion, and a cover hingedly attached to the frame such that the cover is pivotable between a closed position covering the central opening and an open position providing access to the central opening. A safety device is connected to the frame and the cover for locking the cover in the open position. Movement of the cover to the open position automatically moves the safety device to a locked position in which said safety device engages the safety stop portion and prevents movement of the cover to the closed position. When the cover is open, the safety device is manually movable between the locked position and an unlocked position in which the safety device is disengaged from the safety stop and permits movement of the cover to the closed position.Type: GrantFiled: September 20, 2011Date of Patent: May 28, 2013Assignee: East Jordan Iron Works, Inc.Inventors: Kevin S. Vrondran, Scott B. Beal, David E. Fuller, Dennis E. Webb, Jeremy I. Johnson
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Patent number: 8437450Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having multiple single-crystal layers, including at least a first layer and a second layer that is formed over and tilted relative to the first layer. The X-rays that are diffracted from each of the first and second layers are sensed simultaneously while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including at least a first diffraction peak due to the first layer and a second diffraction peak due to the second layer. The diffraction spectrum is analyzed so as to identify a characteristic of at least the second layer.Type: GrantFiled: December 2, 2010Date of Patent: May 7, 2013Assignee: Jordan Valley Semiconductors Ltd.Inventors: John Wall, David Jacques, Boris Yokhin, Alexander Krokhmal, Paul Ryan, Richard Bytheway, David Berman, Matthew Wormington
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Publication number: 20130089178Abstract: A method for inspection includes irradiating, with a focused beam, a feature formed on a semiconductor wafer, the feature including a volume containing a first material and a cap made of a second material, different from the first material, that is formed over the volume. One or more detectors positioned at different angles relative to the feature are used to detect X-ray fluorescent photons that are emitted by the first material in response to the irradiating beam and pass through the cap before striking the detectors. Signals output by the one or more detectors at the different angles in response to the detected photons are processed in order to assess a quality of the cap.Type: ApplicationFiled: October 9, 2012Publication date: April 11, 2013Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.Inventor: Jordan Valley Semiconductors Ltd.
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Publication number: 20130084143Abstract: A variety of fasteners and guide assembly devices are disclosed. The fasteners in various forms include a guide member that protrudes from the fastener to facilitate guiding of the fastener into a hole, passage, opening, etc. or corresponding fastener component such as a nut. The guide member may be substantially rigid or substantially flexible. The guide member may be permanently or temporarily attached to the fastener.Type: ApplicationFiled: September 24, 2012Publication date: April 4, 2013Applicant: JORDAN CREATIVEWORKS, LLCInventor: Jordan CreativeWorks, LLC
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Publication number: 20130073326Abstract: A system for overseeing implementations of organizational policies, procedures, and/or directives. A host identifies parties involved in the implementations and tracks implementation statuses by (a) issuing notices for access by the identified parties, (b) with each notice, providing actions selectable as a response to the notice, and (c) tracking responses by the identified parties. In response to a predefined event, a user device associated by the host with one of the identified parties polls the host to determine whether a notice is pending for the associated party, and if so, provides an alert. Based on a user response to the alert, the user device displays the pending notice via a browser, and sends to the host via the browser a user-selected response to the pending notice. The host leaves the notice pending until the host receives a user-selected response.Type: ApplicationFiled: September 19, 2011Publication date: March 21, 2013Applicant: Jordan Lawrence Group, L.C.Inventors: Bradley W. Jordan, Alice M. Lawrence, A. Martin Hansen
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Publication number: 20130071183Abstract: A manhole cover assembly includes a frame that includes a central opening and a safety stop portion, and a cover hingedly attached to the frame such that the cover is pivotable between a closed position covering the central opening and an open position providing access to the central opening. A safety device is connected to the frame and the cover for locking the cover in the open position. Movement of the cover to the open position automatically moves the safety device to a locked position in which said safety device engages the safety stop portion and prevents movement of the cover to the closed position. When the cover is open, the safety device is manually movable between the locked position and an unlocked position in which the safety device is disengaged from the safety stop and permits movement of the cover to the closed position.Type: ApplicationFiled: September 20, 2011Publication date: March 21, 2013Applicant: EAST JORDAN IRON WORKS, INC.Inventors: Kevin S. Vrondran, Scott B. Beal, David E. Fuller, Dennis E. Webb, Jeremy I. Johnson
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Publication number: 20130046712Abstract: Methods of selling or offering for sale at least one unaltered duplicate part of print media, such as from a magazine or newspaper, separate to that which is otherwise dispensed or offered for sale as a combined multi-part unit.Type: ApplicationFiled: July 19, 2012Publication date: February 21, 2013Applicant: Jordan CreativeWorks, LLCInventor: Jordan S. Bernhard
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Publication number: 20130039471Abstract: Apparatus for inspection of a disk, which includes a crystalline material and has first and second sides. The apparatus includes an X-ray source, which is configured to direct a beam of X-rays to impinge on an area of the first side of the disk. An X-ray detector is positioned to receive and form input images of the X-rays that are diffracted from the area of the first side of the disk in a reflective mode. A motion assembly is configured to rotate the disk relative to the X-ray source and detector so that the area scans over a circumferential path in proximity to an edge of the disk. A processor is configured to process the input images formed by the X-ray detector along the circumferential path so as to generate a composite output image indicative of defects along the edge of the disk.Type: ApplicationFiled: August 9, 2012Publication date: February 14, 2013Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.Inventors: Matthew Wormington, Paul Ryan, John Leonard Wall
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Patent number: 8371390Abstract: A dual packer for at least partially defining a production zone in a wellbore, the dual packer including a packer body having an up-hole side and a down-hole side. A first through bore and a second through bore each extend through the packer body from the up-hole side to the down-hole side. A first piping extends from the down-hole side of the first through bore and includes a perforated sub adjacent the down-hole side of the packer body. A second piping extends from the down-hole side of the second through bore and is communicably connected to the first piping down-hole of the first perforated sub.Type: GrantFiled: October 13, 2011Date of Patent: February 12, 2013Assignees: Jordan Development Company, LLCInventor: William C. Quinlan
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Publication number: 20120281814Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.Type: ApplicationFiled: July 12, 2012Publication date: November 8, 2012Applicant: JORDAN VALLEY SEMICONDUCTORS LTDInventors: Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden, David Berman, Matthew Wormington
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Publication number: 20120275568Abstract: Apparatus for inspection of a sample includes an X-ray source, which is configured to irradiate a location on the sample with a beam of X-rays. An X-ray detector is configured to receive the X-rays that are scattered from the sample and to output a first signal indicative of the received X-rays. A VUV source is configured to irradiate the location on the sample with a beam of VUV radiation. A VUV detector is configured to receive the VUV radiation that is reflected from the sample and to output a second signal indicative of the received VUV radiation. A processor is configured to process the first and second signals in order to measure a property of the sample.Type: ApplicationFiled: March 14, 2012Publication date: November 1, 2012Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.Inventors: Isaac Mazor, Matthew Wormington, Ayelet Dag, Bagrat Khachatryan
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Patent number: 8243878Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.Type: GrantFiled: January 7, 2010Date of Patent: August 14, 2012Assignee: Jordan Valley Semiconductors Ltd.Inventors: Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden, David Berman, Matthew Wormington
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Publication number: 20120182542Abstract: An optical metrology apparatus for measuring nanoimprint structures using Vacuum Ultra-Violet (VUV) light is described.Type: ApplicationFiled: January 15, 2012Publication date: July 19, 2012Applicant: Jordan Valley Semiconductors Ltd.Inventors: Phillip Walsh, Jeffrey B. Hurst, Dale A. Harrison
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Patent number: 8206058Abstract: A manhole cover assembly includes a frame defining an access opening, first and second mounting posts extending from the frame, and a cover for covering the access opening. The cover includes first and second mounting recesses that pivotally receive the first and second mounting posts respectively, such that said cover is movable between an open position and a closed position by rotating the recesses about the posts. At least one of the recesses includes a locking groove that aligns with the post when the cover is moved to an open position to lock the cover in the open position.Type: GrantFiled: July 15, 2008Date of Patent: June 26, 2012Assignee: East Jordan Iron Works, Inc.Inventors: Kevin S. Vrondran, David E. Fuller, Jeremy I. Johnson
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Publication number: 20120140889Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having multiple single-crystal layers, including at least a first layer and a second layer that is formed over and tilted relative to the first layer. The X-rays that are diffracted from each of the first and second layers are sensed simultaneously while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including at least a first diffraction peak due to the first layer and a second diffraction peak due to the second layer. The diffraction spectrum is analyzed so as to identify a characteristic of at least the second layer.Type: ApplicationFiled: December 2, 2010Publication date: June 7, 2012Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.Inventors: John Wall, David Jacques, Boris Yokhin, Alexander Krokhmal, Paul Ryan, Richard Bytheway, David Berman, Matthew Wormington
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Patent number: 8153987Abstract: A calibration pad having multiple calibration sites is provided. A particular calibration site may be utilized until that particular site has been determined to have become unacceptable for further use, for example from contamination, in which case the calibration processes may then move to use a different calibration site(s) on the calibration pad(s). A variety of techniques may be utilized to provide the determination that a site is no longer acceptable for use. Movement may thus occur over time from site to site for use in a calibration process. A variety of criteria may be established to determine when to move to another site. Though the designation of a site as “bad” may be based upon measured reflectance data, other criteria may also be used. For example, the number of times a site has been exposed to light may be the criteria for designating a site as bad. Alternatively the cumulative exposure of a site may be the criteria.Type: GrantFiled: May 22, 2009Date of Patent: April 10, 2012Assignee: Jordan Valley Semiconductors Ltd.Inventors: Jeffrey B. Hurst, Matthew Weldon, Phillip Walsh, Cristian Rivas, Dale A. Harrison
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Publication number: 20120043095Abstract: A dual packer for at least partially defining a production zone in a wellbore, the dual packer including a packer body having an up-hole side and a down-hole side. A first through bore and a second through bore each extend through the packer body from the up-hole side to the down-hole side. A first piping extends from the down-hole side of the first through bore and includes a perforated sub adjacent the down-hole side of the packer body. A second piping extends from the down-hole side of the second through bore and is communicably connected to the first piping down-hole of the first perforated sub.Type: ApplicationFiled: October 13, 2011Publication date: February 23, 2012Applicants: JORDAN DEVELOPMENT COMPANY, L.L.C.Inventor: William C. Quinlan
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Patent number: 8119991Abstract: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.Type: GrantFiled: August 12, 2010Date of Patent: February 21, 2012Assignee: Jordan Valley Semiconductors Ltd.Inventor: Dale A Harrison
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Publication number: 20120014508Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum of the sample. The diffraction spectrum is corrected to compensate for a non-uniform property of the converging beam.Type: ApplicationFiled: July 12, 2011Publication date: January 19, 2012Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.Inventors: Matthew Wormington, Alexander Krohmal, David Berman, Gennady Openganden
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Patent number: 8054453Abstract: A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized.Type: GrantFiled: September 7, 2010Date of Patent: November 8, 2011Assignee: Jordan Valley Semiconductors Ltd.Inventor: Dale A. Harrison