Patents Assigned to Jordan
  • Publication number: 20080063471
    Abstract: A swing-out manhole cover assembly having at least one ramp to facilitate opening and closing the cover. The manhole cover assembly includes a frame, a cover, a swing assembly and at least one ramp. As the cover swings open away from the frame about the swing assembly, the ramp imparts linear translation to the cover separating the cover from the frame slightly. As the cover swings back to close the manhole cover, the ramp reverses the linear translation and the cover returns back to the frame. A spring may be included to bias the cover in the closed position.
    Type: Application
    Filed: November 27, 2007
    Publication date: March 13, 2008
    Applicant: EAST JORDAN IRON WORKS, INC.
    Inventors: Lee Veldboom, Kevin Vrondran, Jeremy Johnson
  • Patent number: 7341398
    Abstract: A lift-assisted manhole cover assembly with a flush surface and external pivot shaft. The cover includes a mounting tab that extends beyond the general periphery of the cover. The mounting tab may be connected to a shaft that is threadedly engaged with the frame. A spring may be mounted between the frame and the mounting tab, for example, in a sleeve, to provide a mechanical assist in lifting the cover. The sleeve may be disposed outside the manhole opening where it does not block access to the manhole opening.
    Type: Grant
    Filed: May 24, 2006
    Date of Patent: March 11, 2008
    Assignee: East Jordan Iron Works, Inc.
    Inventors: Jeremy I. Johnson, Lee M. Veldboom, Scott B. Beal, Herbert Carl Barnum, William R. Austin, James F. Malpass, Todd C. Loviska, Brian J. Rachwitz, Rex A. Garringer, John H. Snyder
  • Patent number: 7321652
    Abstract: A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors simultaneously in different, respective positions, whereby the detectors generate respective outputs. Energy-dispersive processing is applied to the outputs of the detectors so as to identify one or more X-ray diffraction lines of the sample.
    Type: Grant
    Filed: September 15, 2006
    Date of Patent: January 22, 2008
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventors: Boris Yokhin, Alexander Krokhmal, Alex Tokar
  • Publication number: 20070274779
    Abstract: A lift-assisted manhole cover assembly with a flush surface and external pivot shaft. The cover includes a mounting tab that extends beyond the general periphery of the cover. The mounting tab may be connected to a shaft that is threadedly engaged with the frame. A spring may be mounted between the frame and the mounting tab, for example, in a sleeve, to provide a mechanical assist in lifting the cover. The sleeve may be disposed outside the manhole opening where it does not block access to the manhole opening.
    Type: Application
    Filed: May 24, 2006
    Publication date: November 29, 2007
    Applicant: EAST JORDAN IRON WORKS, INC.
    Inventors: Jeremy Johnson, Lee Veldboom, Scott Beal, Herbert Barnum, William Austin, James Malpass, Todd Loviska, Brian Rachwitz, Rex Garringer, John Snyder
  • Patent number: 7245695
    Abstract: A method for testing a material applied to a surface of a sample includes directing an excitation beam, having a known beam-width and intensity cross-section, onto a region of the sample. An intensity of X-ray fluorescence emitted from the region responsively to the excitation beam is measured. A distribution of the material within the region is estimated, responsively to the measured intensity of the X-ray fluorescence and to the intensity cross-section of the excitation beam, with a spatial resolution that is finer than the beam-width.
    Type: Grant
    Filed: April 11, 2005
    Date of Patent: July 17, 2007
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Tzachi Rafaeli, Alex Tokar
  • Patent number: 7231016
    Abstract: A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse reflection property of the sample. A second reflectance spectrum of the sample is acquired while irradiating the sample with a converging beam of the X-rays. The second reflectance spectrum is analyzed using the diffuse reflection property so as to determine a characteristic of the surface layer of the sample.
    Type: Grant
    Filed: April 4, 2006
    Date of Patent: June 12, 2007
    Assignee: Jordan Valley Applied Radiation, Ltd.
    Inventors: David Berman, Isaac Mazor, Boris Yokhin, Amos Gvirtzman
  • Patent number: 7130376
    Abstract: A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the surface so as to generate a reflectance signal as a function of elevation angle relative to the surface. A feature due to reflection of the radiation from the first layer is identified in the reflectance signal. The reflectance signal is calibrated responsively to the identified feature and to the known reflectance property of the first layer. The calibrated reflectance signal is analyzed to determine a characteristic of the second layer. Other enhanced inspection methods are disclosed, as well.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: October 31, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: David Berman, Alex Dikopoltsev, Dileep Agnihotri
  • Patent number: 7120228
    Abstract: Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a converging beam of X-rays toward a surface of the sample. At least one detector array is arranged to sense the X-rays scattered from the sample as a function of elevation angle over a range of elevation angles simultaneously, and to generate output signals responsively to the scattered X-rays. The detector array has a first configuration in which the detector array senses the X-rays that are reflected from the surface of the sample at a grazing angle, and a second configuration in which the detector array senses the X-rays that are diffracted from the surface in a vicinity of a Bragg angle of the sample. A signal processor processes the output signals so as to determine a characteristic of the surface layer of the sample.
    Type: Grant
    Filed: September 21, 2004
    Date of Patent: October 10, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: Boris Yokhin, Isaac Mazor, Tzachi Rafaeli
  • Patent number: 7113566
    Abstract: A method for inspection of a sample includes directing a beam of X-rays toward a sample and configuring an array of detector elements to capture the X-rays scattered from the sample. The sample is shifted in a direction parallel to the axis of the array between at least first and second positions, which positions are separated one from another by an increment that is not an integer multiple of the pitch of the array. At least first and second signals are generated by the detector elements responsively to the X-rays captured thereby while the sample is in at least the first and second positions, respectively. The first and second signals are combined so as to determine an X-ray scattering profile of the sample as a function of position along the axis.
    Type: Grant
    Filed: July 15, 2005
    Date of Patent: September 26, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: Asher Peled, Isaac Mazor, Boris Yokhin
  • Patent number: 7110491
    Abstract: A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on an area of a periodic feature on a surface of the sample and receiving the X-rays scattered from the surface in a reflection mode so as to detect a spectrum of diffraction in the scattered X-rays as a function of azimuth. The spectrum of diffraction is analyzed in order to determine a dimension of the feature.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: September 19, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: Isaac Mazor, Boris Yokhin
  • Patent number: 7103142
    Abstract: A method for inspection of a sample includes irradiating the sample with a beam of X-rays, measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby generating an X-ray spectrum, and applying a multi-step analysis to the spectrum so as to determine one or more physical properties of a simulated model of the sample. The multi-step analysis includes spectrally analyzing the spectrum so as to determine one or more characteristic frequencies and fitting the simulated model to the spectrum by an iterative optimization process beginning from an initial condition determined by the one or more characteristic frequencies.
    Type: Grant
    Filed: February 24, 2005
    Date of Patent: September 5, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: Dileep Agnihotri, Alex Dikopoltsev, Boris Yokhin
  • Patent number: 7076024
    Abstract: X-ray apparatus, consisting of a single X-ray tube which is adapted to generate X-rays and a first optic which is adapted to focus a first portion of the X-rays onto a region of a sample via a first beam path, thereby generating first scattered X-rays from the region. The apparatus also includes a second optic which is adapted to focus a second portion of the X-rays onto the region of the sample via a second beam path, different from the first beam path, thereby generating second scattered X-rays from the region. A detector assembly simultaneously collects the first and the second scattered X-rays.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: July 11, 2006
    Assignee: Jordan Valley Applied Radiation, Ltd.
    Inventor: Boris Yokhin
  • Patent number: 7068753
    Abstract: A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse reflection property of the sample. A second reflectance spectrum of the sample is acquired while irradiating the sample with a converging beam of the X-rays. The second reflectance spectrum is analyzed using the diffuse reflection property so as to determine a characteristic of the surface layer of the sample.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: June 27, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: David Berman, Isaac Mazor, Boris Yokhin, Amos Gvirtzman
  • Patent number: 7062013
    Abstract: A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the surface so as to generate a reflectance signal as a function of elevation angle relative to the surface. A feature due to reflection of the radiation from the first layer is identified in the reflectance signal. The reflectance signal is calibrated responsively to the identified feature and to the known reflectance property of the first layer. The calibrated reflectance signal is analyzed to determine a characteristic of the second layer. Other enhanced inspection methods are disclosed, as well.
    Type: Grant
    Filed: October 20, 2003
    Date of Patent: June 13, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: David Berman, Alex Dikopoltsev, Dileep Agnihotri
  • Patent number: D524565
    Type: Grant
    Filed: February 15, 2005
    Date of Patent: July 11, 2006
    Assignee: Brown Jordan International, Inc.
    Inventor: Jay S. Franks
  • Patent number: D529096
    Type: Grant
    Filed: March 2, 2005
    Date of Patent: September 26, 2006
    Assignee: Jordan Neuroscience, Inc.
    Inventor: Kenneth G. Jordan
  • Patent number: D545978
    Type: Grant
    Filed: February 27, 2006
    Date of Patent: July 3, 2007
    Assignee: East Jordan Iron Works, Inc.
    Inventors: John M. Snyder, Paul F. Harm
  • Patent number: D552363
    Type: Grant
    Filed: January 8, 2007
    Date of Patent: October 9, 2007
    Assignee: Brown Jordan International, Inc.
    Inventor: Bryan Walker Graham
  • Patent number: D552369
    Type: Grant
    Filed: January 8, 2007
    Date of Patent: October 9, 2007
    Assignee: Brown Jordan International, Inc.
    Inventor: Bryan Walker Graham
  • Patent number: D560934
    Type: Grant
    Filed: January 8, 2007
    Date of Patent: February 5, 2008
    Assignee: Brown Jordan International, Inc.
    Inventor: Bryan Walker Graham