Abstract: An inker is usually used in electrical properties testing processes to mark the defective dies of the semiconductor wafer. However, the conventional inker having only one axis will be shaken during working time, resulting in making a mistake of marking the wrong dies. The present invention discloses a multi-axes inker to fix the problem. Another axis is added to the conventional inker. The new axis can help in restricting the original axis, so that the inker is stable and can mark the right dies without a mistake.
© 2024 Justia
