Abstract: A method for imaging in a microscope with oblique illumination includes illuminating an object by an illumination beam path that is obliquely incident on an object plane of the microscope. A microscopic image of the object and a corresponding digital image signal are produced. The digital image signal is processed by digital image processing using a convolution kernel to increase contrast. An increased-contrast digital image is produced from the processed digital image signal.

Abstract: A scanning microscope includes an objective arranged in an illuminating beam path to focus an illuminating light bundle onto a sample. A scanning unit is arranged upstream of the objective to deflect the illuminating light bundle such that it is focused by the objective executes a scanning movement on the sample. A detection unit is arranged in a detection beam path to receive a detection light bundle not deflected by the scanning unit. For spectral influencing of the detection light bundle, the detection unit contains a spectrally selective component which has an active surface with a spectral edge which varies with the location of incidence of the detection light bundle on the active surface. The active surface is arranged in the detection beam path at the location of an image of an objective pupil, or in a position at which a variation of the spectral edge is compensated for.

Abstract: The invention relates to a mirror device for deflecting illuminating light in SPIM microscopy. The invention is characterized by a holding component that comprises a connecting element for mounting the holding component on a microscope objective, at least one deflection mirror being detachably mounted on the holding component.

Abstract: An electric circuit for a microscope includes a lock-in amplifier. The lock-in amplifier has an input for an input signal, an input for a reference signal, an output for an output signal and a bandwidth filter configured such that a low bandwidth frequency value and/or a high bandwidth frequency value is variably settable. A dynamic bandwidth controller is configured to receive at least one parameter of a current setting of the microscope as an input, and to control the low bandwidth frequency value and/or the high bandwidth frequency value of the lock-in amplifier as a function of the at least one parameter of the current setting of the microscope.

Abstract: An immersion objective lens for a microscope includes a first lens group having positive refractive power, a second lens group having positive refractive power, a third lens group having negative refractive power and a fourth lens group having positive refractive power disposed in this sequence from the object side. The second lens group is moveable along an optical axis so as to achieve a corrective effect with respect to a spherical aberration, such that a sum of a distance between the second lens group and the first lens group and of a distance between the second lens group and the third lens group is constant. The corrective effect of the second lens group is predetermined such that the spherical aberration is minimized for a light incidence that corresponds to a mean numerical aperture that lies between zero and a nominal aperture of the immersion objective lens.

Abstract: A method for adjusting an intensity of a light beam in an optical arrangement includes passing the light beam through an acousto-optical tunable filter (AOTF). The intensity of the light beam is adjusted as a function of frequency and/or amplitude of a sound wave with which the AOTF is operated. The amplitude of the sound wave at a specified sound wave frequency is selected such that the amplitude is larger than would be required to achieve a first maximum diffraction efficiency for a specified wavelength or for a specified wavelength spectrum of the light beam. The amplitude of the sound wave is also selected such that a value of an integral of a product of the transmission function of the AOTF and the wavelength spectrum of the light beam is larger than at a value of the amplitude to be selected to achieve the first maximum.

Abstract: A microscopy system provides for scanning a sample by a microscope, which is at least in part electrically or electronically controllable and in which a plurality of images or digital images are generatable in a scanning operation at different times and/or different locations of the sample. The microscopy system includes a control computer configured to control the microscope, as well as further computers that are integratable into the microscopy system such that an adaptation of the microscopy system is possible dynamically and/or during the scanning operation using at least one of the further computers.

Abstract: A scanning microscope includes an objective and a scanning element that is adjustable for a time-variable deflection to guide a focused illumination beam across the sample in a scanning movement. A detection beam is guided across sensor elements of an image sensor in a movement which corresponds to the scanning movement of the focused illumination beam. A dispersive element of a predetermined dispersive effect arranged upstream of the image sensor spatially separates different spectral components of the detection beam from one another on the image sensor. A controller detects the time-variable adjustment of the scanning element, assigns the spatially separated spectral components of the detection beam to the sensor elements of the image sensor based on the detected time-variable adjustment, while taking into account the predetermined dispersive effect of the dispersive element, and individually reads out the sensor elements assigned to the spectral components.

Abstract: A detector device is designed to capture light and to generate electrical signals. The detector device includes a housing and a detector disposed in the housing so as to be moveable at least partially in the housing and with respect to the housing. The detector device is useable in a detection system and/or in a microscope.

Abstract: A light/voltage converter circuit for converting intensity fluctuations of light into an alternating voltage measurement signal includes a photodiode configured to detect the light and a transformer comprising a primary coil and a secondary coil. The primary coil is connected in a series circuit to the photodiode, and the alternating voltage measurement signal is applied to the secondary coil. An electrical network is configured to block direct current and conduct alternating current. The electrical network is connected in parallel with the series circuit consisting of the primary coil of the transformer and the photodiode.

Abstract: A method for laser microdissection includes detecting at least a portion of an object to be dissected in an image-producing manner in a laser microdissection system and generating a first digital object image. A first processing specification is defined based on the first digital object image. In a first processing step, the object is processed using a laser beam of the laser microdissection system in accordance with the first processing specification. At least a portion of the object is detected in an image-producing manner and a second digital object image is generated. A second processing specification is defined during execution of the first processing step based on the second digital object image. In a second processing step, the object is processed using the laser beam of the laser microdissection system in accordance with the second processing specification.

Abstract: A method for producing a preview image with an inclined-plane microscope with a tilted illumination plane include illuminating, at successive points in time, different illumination planes, which are tilted relatively to an optical axis of an optical viewing element and spaced apart from one another. The illumination planes are imaged onto a sensor with photosensitive elements arranged line-by-line. The preview image is produced by successively reading out strip-type read-out areas of the sensor, a longitudinal extension of the read-out areas being oriented parallel to the lines of the photosensitive elements, such that the preview image reproduces a viewing plane perpendicular to the optical axis of the optical viewing element.

Abstract: The invention relates to a beam combiner for a microscope, in particular a scanning microscope, which receives at least a first illuminating light bundle and a second illuminating light bundle and combines them into a collinear output light bundle, the first illuminating light bundle and the second illuminating light bundle having the same illuminating light wavelength but a different polarization, in particular linear polarization. The beam combiner is embodied as an acousto-optic beam combiner and is constructed and operated in such a way that by interaction with at least one mechanical wave, both the first illuminating light bundle and the second illuminating light bundle are diffracted and are thereby directed into a common optical axis.

Abstract: A method for examining a sample includes illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip. The illumination strip is projected into a detection plane by detection light originating from the illumination strip being focused in the detection plane. The detection light is detected by a detector. The detector is formed as a slit detector, and the direction of a slit width of the slit detector is oriented at an angle different from zero degrees with respect to the direction of a longitudinal extent of an image of the illumination strip projected into the detection plane.

Abstract: A method for examining and processing a microscopic sample arranged on a slide includes producing reference markings on the slide by a laser beam of a laser microdissection system. A digital image of the sample and the reference markings on the slide is produced by a digital optical imaging device. An image region is defined and first position information data which indicate a position of the image region is generated. The reference markings are identified in the image and second position information data which indicate a position of the reference markings in the image is generated. The reference markings are identified, and third position information data which indicate the position of the reference markings in the laser microdissection system is generated. The first, second and third position information data are correlated and a sample region which corresponds to the image region is processed.

Abstract: A device for detecting light includes a silicon photomultiplier (SiPM) comprising a detection area formed from an array of a plurality of single-photon avalanche diodes (SPADs). An optical system is configured to shape the light such that the detection area is covered as completely as possible with a light beam region of substantially constant intensity.

Abstract: A fluorescence lifetime imaging microscopy method with time-correlated single photon counting includes periodically exciting a sample to emit fluorescence photons, with a measurement interval being defined between each two successive excitation light pulses. A value characterizing fluorescence decay behavior is determined based on detection times of detected fluorescence photons, and imaging is performed based one the value. An analog detector signal is sampled within a plurality of sampling intervals within a respective one of the measurement intervals and is converted into a sequence of discrete signal values associated with the sampling intervals. It is determined based thereon whether more than a predefined number of fluorescence photons has been detected within the respective measurement interval.

Abstract: A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.