Abstract: A method for improving dynamic range of a device for detecting light includes providing at least two detection regions. The detection regions are each formed by an array of a plurality of single-photon avalanche diodes (SPADs) and the detection regions each comprise at least one signal output. A characteristic curve is determined for each of the detection regions. The characteristic curves are combined with one another and/or offset against one another in order to obtain a correction curve and/or a correction factor.

Abstract: A method for scanning a sample using an electrically or electronically controllable microscope includes performing a continuous scanning of the sample so as to repeatedly generate a plurality of images of the sample, each of the plurality of images corresponding to a different time, the microscope being controlled via a control computer during the scanning. The plurality of images are analyzed using at least one second computer connected via a network, wherein the at least one second computer is configured to classify each of the plurality of images as one of interesting and non-interesting while the continuous scanning of the sample with the microscope continues. The continuous scanning of the sample is automatically influenced based on the classifying of the images performed by the at least one second computer.

Abstract: The invention relates to a method for microscopic investigation of a plurality of samples.

Abstract: The invention relates to a method for examining a sample. The method is distinguished by the fact that the sample is illuminated with an illumination light beam in each case simultaneously in a plurality of mutually different sample planes in each case along an illumination line, and wherein each sample region illuminated along an illumination line is scanned in each case with a dedicated detection PSF and the detection light emanating from the illuminated sample regions is detected simultaneously and spatially separately from one another. The invention additionally relates to a microscope, in particular for performing such a method.

Abstract: A fluorescence microscope has an incident fluorescence illumination unit generating an incident fluorescence illumination beam path a multi-band fluorescence filter system encompassing a multi-band beam splitter for deflecting the incident fluorescence illumination beam path into an objective of the microscope and onto a specimen. The filter system has a multi-band blocking filter that at least partly transmits a fluorescence emission beam path proceeding from the specimen; and having a digital camera for generating a fluorescence image of the specimen. The microscope has a bright-field transmitted illumination unit for generating a bright-field transmitted illumination beam path for transmitted illumination of the specimen. The filter system is arranged fixedly so that upon acquisition of a bright-field image of the specimen, the system remains in a bright-field transmitted light beam path proceeding from the specimen.

Abstract: The invention relates to a method for tomographic investigation of a sample, in which method a sample is illuminated with an illuminating light bundle and in which a transmitted light bundle that contains the light of the illuminating light bundle transmitted through the sample is detected with a transmission detector. The invention further relates to an apparatus for tomographic investigation of a sample. Provision is made that the illuminating light bundle and the transmitted light bundle pass in opposite propagation directions through the same objective.

Abstract: An illumination apparatus for a microscope, for producing a de-excitation or switching light distribution, includes a light source configured to produce a primary illumination light beam and a beam splitter configured to divide the primary illumination light beam into two partial illumination light beams. An illumination objective is configured to focus the partial illumination light beams onto and/or into a sample such that the partial illumination light beams extend, spatially separated from one another, through an entry pupil of the illumination objective and are spatially superposed on and/or in the sample after passing through the illumination objective. A phase influencer is configured to cause a relative phase offset of the partial illumination light beams with respect to one another in such a way that the partial illumination light beams in the entry pupil of the illumination objective have a phase offset of ?.

Abstract: A method for suppressing a spurious pulse following a measurement pulse in a measurement signal using a circuit includes generating a square-wave signal from the measurement signal. A delayed square-wave signal is generated by delaying the square-wave signal by a time span ?1. The delayed square-wave signal is input into a control input of a switching arrangement. The measurement signal or a signal derived therefrom is input into an input of the switching arrangement. The signal at the input of the switching arrangement is switched to a first output of the switching arrangement based on the delayed first square-wave signal at the control input of the switching arrangement. The time span ?1 is matched to the measurement signal such that the switching arrangement is not switched to the first output during the spurious pulse. A signal at the first output is output as an output signal of the circuit.

Abstract: A light sheet microscope or a confocal microscope includes illumination optics configured to transmit light of at least two wavelengths from at least one light source, along respective wavelength-dependent beam paths, from an illumination side of the illumination optics to a specimen side of the illumination optics. A lateral chromatic correction system comprising at least one optical lateral chromatic correction element is configured such that the beam paths of the at least two different wavelengths have, at a specimen-side output of the lateral chromatic correction element, an offset parallel to each other and/or are inclined relative to each other in relation to the illumination side, which, on the specimen side of the illumination optics, results in an offset of the foci of the at least two wavelengths transverse to an optical axis of the illumination optics.

Abstract: A Raman microscopy imaging device (100) is described, having: a first laser light source (12) for emitting a first laser beam (16) having a first wavelength along a first light path (20); a second laser light source (44) for emitting a second laser beam (18) having a second wavelength, different from the first wavelength, along a second light path (22) physically separated from the first light path (20); a beam combining element (32) for collinearly combining the two laser beams (16, 18) in one shared light path (34) directed onto a sample; a detector (38) for sensing a measured signal on the basis of the two laser beams (16, 18) interacting with the sample; and an evaluation unit (40) for evaluating the measured signal sensed by the detector (38). According to the present invention the first laser light source (12) is embodied as a pulsed source, and the second laser light source (44) as a continuous source.

Abstract: A microscope system includes a light sheet microscopic functional unit that illuminates and images a sample in a first operating state with a light sheet-like illumination light distribution, and a scanning microscopic functional unit that illuminates and images the sample in a second operating state with a point-like illumination light distribution. A first scanning element uniaxially scans the sample, in the first operating state, with the light sheet-like illumination light distribution, and uniaxially scans the sample, in the second operating state, with the point-like illumination light distribution. A second scanning element uniaxially scans the sample, in the second operating state, with the point-like illumination light distribution, such that, in the second operating state, the second scanning element generates together with the first scanning element a biaxial scanning of the sample with the point-like illumination light distribution.

Abstract: A method for microscopically imaging a volume sample includes focusing a microscope objective having a correcting element successively in at least two reference planes which are located within the volume sample at different volume sample depths along the optical axis of the microscope objective; determining, for each reference plane, a reference setting of the correcting element in which an imaging error which is dependent upon the volume sample depth is corrected by the correcting element; determining, on the basis of the reference settings determined for at least one target plane in the volume sample, a target setting for the correcting element in which the imaging error occurring at the volume sample depth of the target plane is corrected by the correcting element; and focusing the microscope objective on the target plane and bringing the correcting element into the target setting in order to image the volume sample.

Abstract: A method for the examination of a sample includes illuminating the sample in a sample plane along a sample line with an illuminating light beam. The sample is acted upon by a depletion or switching light beam, which overlaps in the sample plane in an overlap region with the illuminating light beam. Part of fluorescent light emanating from the sample plane is detected as detection light originating from a first subregion of the overlap region, in which the probability of an interaction of the sample molecules with the depletion or switching light beam is greater than 90%, and/or originating from a second subregion which is at least partially surrounded by the first sub-region and/or in which the depletion or switching light beam has a zero point, while at the same time the fluorescent light originating from outside the first subregion and the second subregion is suppressed and not detected.

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illuminating beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-type illuminating light distribution illuminating the sample in one partial region. A detection unit has a detector that is designed to capture detection light originating from the section of the sample that is illuminated by the illuminating light distribution. An objective is provided for both the illuminator and the detection unit such that the objective is to be penetrated by the illuminating beam and the detection light. The illuminator has a beam modulator designed to modulate the illuminating beam perpendicular to the illumination axis.