Abstract: The invention relates to a method for investigating a sample with regard to the lifetime of an excited state, in particular a fluorescence lifetime, and/or with regard to a property of a sample which is correlated with a lifetime of an excited state, in particular with a fluorescence lifetime, a sample region being illuminated with a sequence of excitation light pulses. The method is characterized in that the light quantity and/or number of photons of the detected light, in particular fluorescent light, proceeding from the sample region is measured temporally between the excitation light pulses exclusively within a detection time window in each case, at least two detection time windows having different temporal lengths.

Abstract: An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.

Abstract: A widefield microscope illumination system and a method for illumination, the system having a microscope objective with an optical objective axis, an illumination light source sending widefield illumination light along illumination beam paths having corresponding illumination axes along which the illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined illumination light entry area, a spatially resolving light detector detecting detected light sent from an illuminated sample through the microscope objective along a detected light beam path, and an automatic illumination light beam path manipulation device, controlled by a control system, which is arranged in front of the microscope objective in relation to the direction of the illumination light beam path, and by which illumination light beam path manipulation device the illumination axes are automatically movable at time intervals to a plurality of illumination light entry sites.

Abstract: An apparatus for controlling an acousto-optical component influencing at least one of illumination light and detection light in a microscope is described. The apparatus comprises a radio-frequency generator for supplying the acousto-optical component with a radio frequency. The radio-frequency generator is configured to compensate deviations in the characteristics of the light due to temperature fluctuations in the acousto-optical component by adapting the radio frequency.

Abstract: A laser microscope (10) having a laser light source (22) which generates laser light pulses (23) for the purpose of examining a sample (16). An optical element (25) is arranged in the beam path of the laser light pulses (23). The optical element (25) disperses the wavelength spectrum of the laser light pulses (23). Fractions (46, 48, 60, 62) of the broad-band laser light pulses (32) having different wavelengths travel different path lengths upon passing through a compensation device (30), such that the different fractions (46, 48, 60, 62) arrive at the sample (16) at the same time.

Abstract: A STED-SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By optionally turning on a STED deactivation light beam the light sheet can optionally be made thinner and therefore the optical resolution can be increased.

Abstract: The present invention relates to a confocal laser scanning microscope (100) having an illumination device (1) that comprises a laser light source (41) that is configured to illuminate a sample (25), and a control application circuit (40) for the laser light source (1) which is configured to output a pulsed control application signal (48) in order to supply the laser light source (41), the control application circuit (40) being configured so that it determines both a pulse amplitude (A) and a pulse width (W) of at least one pulse of the pulsed control application signal (48) as a function of at least one input variable (S).

Abstract: The present invention relates to a microscope illumination system for switching between a first, confocal and a second, non-confocal microscope illumination mode, the system having an illumination unit that, in order to provide the first illumination mode, includes an illumination source for generating an illumination beam propagating parallel to the optical axis; a scanning mirror for deflecting the illumination beam perpendicular to the optical axis; and a scanning eyepiece and a downstream scanning tube lens for imaging the scanning mirror into the back focal plane of a microscope objective and for expanding the illumination beam, the objective focusing the illumination beam onto a specimen to be examined. In order to provide the second illumination mode, the system has a focusing lens inserted into the path of the illumination beam in such a way that the illumination beam is focused into the back focal plane of the microscope objective.

Abstract: A SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By an illumination optics having a zoom optics that is provided in the beam path of the illumination light beam the focal length of the illumination light beam can be varied.

Abstract: A device (100) for variable deflection of light is described, encompassing a micromechanical mirror arrangement (14) having a plurality of light-reflecting mirror actuators (18, 20, 22, 24, 26), and a control unit (32) with which the mirror actuators (18, 20, 22, 24, 26) are controllable into different reflection positions in order to vary the light deflection. The device (100) has a back-reflection structure (60), systematically adapted to the mirror arrangement (14), for reflecting back onto another portion of the mirror actuators (18, 20, 22, 24, 26), in targeted fashion, the light reflected onto the back-reflection structure (60) from one portion of the mirror actuators (18, 20, 22, 24, 26).

Abstract: A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.

Abstract: The present invention relates to a glass plate (2) for use in a device (1) for stretching sample sections having a sectioning knife, the glass plate (2) being arranged at the back (3) of the sectioning knife in such a way that a defined gap (4) for reception of the sectioned sample is formed between the back (3) of the sectioning knife and the plate (2), the glass plate (2) possessing, at least on one of its longitudinal sides (21, 22), edges (211, 212; 221, 222) ground and polished to optical flatness.

Abstract: The present invention relates to a holder for at least one capture device (30) for collecting microdissected specimens, having a holding element (2) in which the at least one capture device (30) is to be arranged, the holding element (2) being transferable into a working position in order to collect microdissected specimens, the holding element (2) being mounted by way of at least two levers (3a, 3b) in a frame (1) of the holder (40), and being vertically displaceable relative to said frame (1) by way of a displacement of the levers (3a, 3b).

Abstract: A sample retainer for a microscope is described, comprising a sample stage (32), a holder (34) arranged on the sample stage (32), a sample carrier (36), couplable to the holder (34), to which a sample is attachable, and an adjusting apparatus (44), engaging on the holder (34), with which with the sample carrier (36), together with the holder (34) to which the sample carrier (36) is coupled, is displaceable on the sample stage (32), relative to the objective (46), into a target position. A decoupling apparatus that decouples the sample carrier (36), arranged in the target position, from the holder (34) upon imaging of the sample through the objective (46) is provided.

Abstract: A microscope includes: an objective turret holding a micro and a macro objective for rotation to operational positions along an optical axis; observation optics in an imaging beam path, and an illumination device including a beam splitter for generating an illumination beam path and coupling the illumination beam path into the imaging beam path, the macro objective including a first subsystem attachable to the objective turret, and a second subsystem insertable into the imaging beam path between the turret and the observation optics when the first subsystem is operational, the illumination device allowing a telecentric beam path with an illumination pupil produced by either the micro objective or the macro objective, and adjustment optics in the illumination beam path having positive refractive power and causing the illumination pupil to be shifted to a rear exit pupil, located between the first optical subsystem and the beam splitter, of the macro objective.

Abstract: A device for focusing a microscope objective on a sample accurately with a high spatial resolution. The device has a positioning unit having a main body, an objective holder movably supported on the main body and adapted to hold the microscope objective, and an actuator for moving the objective holder along the optical axis of the microscope objective. The objective holder holds the microscope objective only at a front portion of the microscope objective facing the sample. The positioning unit includes one or more lever arms, each of which coupled at its one end via a first flexure bearing to the main body and at its other end via a second flexure bearing to the objective holder. The main body of the positioning unit is attached to a stage that carries the sample.

Abstract: An arrangement for fluorescence microscopic examination of specimens includes: a fluorescence microscope; an illumination device that includes: a housing including an interface configured to optically couple the housing and the fluorescence microscope; a plurality of light-emitting diodes disposed in the housing; a respective collector disposed downstream of each of the light emitting diodes and configured to generate a directed light flux; and at least one dichroic splitter disposed in the housing, the at least one splitter and the light-emitting diodes being spatially disposed with respect to one another so that the directed light fluxes are combinable via the at least one splitter into a common illumination beam path directed onto the interface; and a logical control device common to the fluorescence microscope and the illumination device.

Abstract: A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.

Abstract: A method and an apparatus for imaging a sample structure (34) with a light microscope are described. The sample structure (34) is prepared with markers and an active marker subset is generated in that a part of the markers is brought into a state in which they can be imaged. When a predetermined activation state is present, the sample structure (34) is imaged onto an arrangement (40) of sensor elements which each generate an image signal, these image signals resulting in a single frame of the sample structure (34). The presence of a predetermined activation state is checked in that at least two test single frames are generated at an interval, and the respective change of the image signal between the two test single frames is detected. The presence of the predetermined activation state is determined when the detected changes of the image signals in their entirety exceed a quantity.

Abstract: The invention relates to a method and a device for illuminating or irradiating an object, a sample (8), or the like, for the purpose of imaging or analysis, particularly for use in a laser microscope (1), preferably in a confocal microscope having a laser light source (2) emitting the illuminating light, the laser light being coupled directly or by means of a glass fiber into an illumination light path (4), characterized in that the laser light source (2) is switched on rapidly upon a trigger signal directly prior to the actual need, for example, directly prior to imaging.