Patents Assigned to Micro-Epsilon Messtechnik GmbH & Co. KG
  • Patent number: 11828583
    Abstract: With regard to a reliable measurement of the thickness of an object (4) even in an environment with high temperatures, a device (1) is provided for determining the thickness of an object (4), more particularly a strip-like or flat object (4), preferably for use in a hot rolling process, having a frame (2) with at least one leg (5, 6), the at least one leg (5, 6) having a sensor (8a, 8b) for the contactless measuring of the distance to the object (4), which device is characterised in that the at least one leg (5, 6) has a structure consisting of a plurality of layers in order to reduce the temperature effect on the frame (2) and/or on the sensor (8a, 8b).
    Type: Grant
    Filed: November 6, 2019
    Date of Patent: November 28, 2023
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventor: Gerhard Kirschner
  • Patent number: 11614614
    Abstract: A disclosed reluctance actuator includes a magnetizable stator, at least one coil, and a yoke. The coil is configured to generate a magnetic field in the stator and the yoke is configured to partially close the magnetic flux of the stator. The yoke is further configured as a movable element that performs lifting/tilting movements. An actuator system including a non-magnetic housing and a reluctance actuator is also disclosed. In the actuator system, the reluctance actuator may be at least partially located in the non-magnetic housing. A method of performing lifting/tilting movements of the yoke of a reluctance actuator is also disclosed. The method includes controlling a current in the at least one coil of the reluctance actuator to thereby generate a magnetic field in the stator. The magnetic field generates a lifting/tilting movement of the yoke due to interaction between the magnetic field and the yoke.
    Type: Grant
    Filed: February 8, 2018
    Date of Patent: March 28, 2023
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventors: Georg Schitter, Ernst Csencsics, Johannes Schlarp, Tobias Schopf
  • Patent number: 11333481
    Abstract: 1. A device for the contactless distance and/or position determination of a measurement object (1), with an electrically conductive measurement object (1) and with a sensor (3) operating in particular according to the inductive, capacitive or the eddy current principle, wherein the sensor (3) comprises a measurement device (4), characterized in that the measurement device (4) is formed by at least two measurement elements (5, 5?, 5?) which are spatially separated from each other. Moreover, a corresponding sensor (3) is indicated.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: May 17, 2022
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventors: Reinhold Hoenicka, Tobias Schopf, Jakob Stieß
  • Patent number: 11313664
    Abstract: The present invention relates to a measuring device for determining the thickness of a dielectric layer on a conductive substrate. The device comprises a resonance cavity for electromagnetic fields which has a rotationally symmetrical wall, an end plate and an open end and is adapted to be positioned with the open end on the dielectric layer. The device further comprises an antenna which is adapted to excite an electro-magnetic field in the resonance cavity, a reflection measuring unit for determining at least one property of the electromagnetic field and an evaluation circuit for determining the thickness of the dielectric layer from the at least one property of the electromagnetic field. A diameter of the rotationally symmetrical wall varies in a longitudinal direction of the resonance cavity.
    Type: Grant
    Filed: August 14, 2018
    Date of Patent: April 26, 2022
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Christian Ziep, Maik Richter, Johann Hinken
  • Patent number: 11125550
    Abstract: A method of optically measuring a surface of a measurement object is disclosed. The method includes generating image light having an image pattern, projecting the generated image light onto the measurement object, and recording influenced light having an influenced image pattern. The image light is generated by an image generation device and the influenced light is captured by a capturing device. The influenced light is light that is reflected, scattered, diffracted, and/or transmitted by the measurement object based on interaction of the image light with the measurement object. The method further includes applying a correcting function to the image light. The correction function alters the image light such that the influenced image pattern recorded by the capturing device shows temporally and/or locally an at least approximately constant and/or homogenous and/or linear brightness. A device having an image generation device, image capture device, and correcting device is also disclosed.
    Type: Grant
    Filed: May 18, 2018
    Date of Patent: September 21, 2021
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventors: Hannes Loferer, Reiner Kickingereder, Josef Reitberger, Rainer Hesse, Robert Wagner
  • Patent number: 11095061
    Abstract: An electrical plug connector for a coaxial or triaxial cable, wherein the cable includes an internal conductor, a first shielding conductor surrounding the internal conductor and extending coaxially with it, and optionally a second shielding conductor surrounding the first shielding conductor. The plug connector has a connector body, which includes an internal conductor contact element designed as a plug, socket, or coupling, for contacting with the internal conductor, an internal shield contact element provided for contacting with the first shielding conductor, and optionally an external shield contact element provided for contacting with the second shielding conductor. The connector body is configured such that the contact elements in the mounted condition of the plug connector are arranged on the cable such that a maximum diameter of the connector body is less than or equal to the outer diameter of the cable or only slightly larger than the outer diameter of the cable.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: August 17, 2021
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventors: Benedikt Biller, Norbert Reindl
  • Patent number: 11092432
    Abstract: The disclosure relates to a reference plate for calibrating and/or checking a deflectometry sensor system, said deflectometry sensor system including an image generation device and a capturing device having at least one capturing element, wherein the reference plate includes a reflective surface, and wherein, for the purpose of checking at least one system parameter of said deflectometry sensor system, the reflective surface is provided with a predefined pattern including markings. A corresponding method for calibrating and/or checking a deflectometry sensor system is moreover indicated.
    Type: Grant
    Filed: October 5, 2017
    Date of Patent: August 17, 2021
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventors: Stephan Zweckinger, Josef Hochleitner, Hannes Loferer, Robert Wagner, Rainer Hesse
  • Patent number: 10890435
    Abstract: A device is disclosed for measuring the geometry of the inner wall of bores, drill holes and passages, which are optionally countersunk, and in particular for threaded, pin, and rivet connections of workpieces, said device comprising at least one optical sensor measuring towards the inner wall and capable of being introduced into the drill hole and rotated via a feed/rotating unit, wherein an auxiliary object is provided with a passage and rests on the surface of the workpiece, through which passage said sensor is inserted into the countersink and/or bore. The device is characterized in that the inner wall of the auxiliary object is provided with a structure and that the sensor scans said structure(s) while passing through the auxiliary object. The disclosure also relates to a corresponding method.
    Type: Grant
    Filed: September 14, 2016
    Date of Patent: January 12, 2021
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventors: Juergen Haas, Alexander Streicher, Bernhard Jochum, Guenter Schallmoser
  • Patent number: 10700698
    Abstract: A disclosed linearization circuit includes a reference component, a charging and discharging controller, and a comparator circuit. The reference component has a non-linear dependence on current or voltage. The charging and discharging controller is configured to control alternating charging and discharging of the reference component. A voltage associated with the reference component forms a reference signal. The charging and discharging are controlled such that the reference signal has a periodic time dependence. The reference signal and a measurement signal are received by the comparator circuit. The comparator circuit is configured to generate and output a square-wave signal based on a reference time point during a charge-discharge cycle, and based on a result of a comparison of the reference signal with the measurement signal, such that the square-wave signal represents a linearized output signal. This disclosure further relates to a corresponding method.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: June 30, 2020
    Assignee: Micro-Epsilon Messtechnik GMBH & Co. KG
    Inventor: Harald Haas
  • Patent number: 10502591
    Abstract: A sensor arrangement for determining a position and/or a change in the position of a measurement object is described, wherein the sensor arrangement has a magnet and a magnetic field sensor which can be moved relative to one another in a direction of movement. The magnet generates a magnetic field. Movements of the magnet and of the measurement object or movements of the magnetic field sensor and of the measurement object are coupled. To achieve the greatest possible measurement range with a characteristic curve which is as linear as possible at the same time, the sensor arrangement comprises a rod-shaped body which is made from a ferromagnetic material and has a considerably larger dimension in the longitudinal direction than in the transverse direction. A relative movement takes place between the rod-shaped body and the magnet, wherein the rod-shaped body can be connected to the magnet. The magnetic field from the magnet is at least partially directed in the direction of the magnetic field sensor.
    Type: Grant
    Filed: November 20, 2015
    Date of Patent: December 10, 2019
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Felix Mednikov, Johann Hofer, Christian Pfaffinger
  • Patent number: 10240908
    Abstract: An inductively operating sensor, particularly for measuring distances and positions of a metallic object, comprising at least a coil, a ferromagnetic or ferritic core and perhaps a housing comprising a sensor element, with the core being embedded in a single or multi-layered ceramic and jointly with the ceramic forming a coil body and with the coil body and the core being connected to each other in a form-fitting fashion. Furthermore, a method is suggested for producing such a sensor.
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: March 26, 2019
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Reinhold Hoenicka, Sabine Schmideder, Gunter Schallmoser
  • Patent number: 10234274
    Abstract: A method for measuring the thickness on measurement objects, whereby at least one sensor measures against the object from the top and at least one other sensor measures against the object from the bottom and, at a known distance of the sensors to one another, the thickness of the object is calculated according to the formula D=Gap?(S1+S2), whereby D=the thickness of the measurement object, Gap=the distance between the sensors, S1=the distance of the top sensor to the upper side of the measurement object, and S2=the distance of the bottom sensor to the underside of the measurement object, is characterized by the compensation of a measurement error caused by tilting of the measurement object and/or by displacement of the sensors and/or by tilting of the sensors, whereby the displacement and/or the tilting is determined by calibration and the calculated thickness or the calculated thickness profile is corrected accordingly. The invention further concerns a device for applying the method.
    Type: Grant
    Filed: August 28, 2014
    Date of Patent: March 19, 2019
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Herbert Fuellmeier, Guenter Schallmoser
  • Patent number: 10184784
    Abstract: The invention relates to a device serving for the combined measurement of the width and thickness of a flat object, in particular a plate, a belt, or a web. The device comprises a measurement apparatus which has at least one contactless sensor, which is for width measurement on the object and which is movable crosswise to the longitudinal direction or conveying direction of the object. According to the invention, on the opposite side of the object, there is a second sensor opposite the first sensor which, together with the first sensor, serves for thickness measurement on the object, wherein the two sensors can travel above and below the object, that is, on opposite sides of the object.
    Type: Grant
    Filed: May 3, 2016
    Date of Patent: January 22, 2019
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Achim Sonntag, Herbert Fuellmeier, Gerhard Kirschner
  • Publication number: 20190003857
    Abstract: A non-contact working sensor, especially an inductive or capacitive sensor, preferably for measuring the distance or position of an object, with an inductive or capacitive sensor element, wherein measuring elements of the sensor element are embedded in a multilayered ceramic and together with the ceramic form the sensor element, is characterized in that the sensor element is constructed geometrically and/or electrically symmetrical in regard to its measuring elements and in that a mounting spaced apart from a holder is realized with the least possible contact surfaces on the sensor element. Furthermore, the invention relates to a sensor element, such as is used in the sensor according to the invention.
    Type: Application
    Filed: February 9, 2017
    Publication date: January 3, 2019
    Applicant: Micro-Epsilon Messtechnik GmbH & Co., KG
    Inventors: Josef HACKL, Axel SEIKOWSKY, Martin WASMEIER
  • Patent number: 10060762
    Abstract: The invention relates to a sensor element for an inductive sensor used for a displacement or distance measurement by means of a magnetic field that varies according to the distance from the measurement object but that remains temporally constant. In said sensor, thin ferromagnetic material is integrated into a substrate. The invention also relates to a sensor comprising said sensor element and to a method for producing the sensor element.
    Type: Grant
    Filed: July 4, 2014
    Date of Patent: August 28, 2018
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Christian Pfaffinger, Werner Groemmer, Karl Wisspeintner, Guenter Schallmoser, Thomas Wisspeintner
  • Patent number: 10036657
    Abstract: The invention relates to a sensor element (1) of a capacitive sensor consisting of two or more layers of a substrate (2), the electrodes (3) of the sensor being inserted between said layers. The sensor element is characterized in that a heating element (5) is integrated into said sensor element (1).
    Type: Grant
    Filed: July 4, 2014
    Date of Patent: July 31, 2018
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Norbert Reindl, Manfred Wagner
  • Patent number: 10001388
    Abstract: A circuit arrangement (1) for controlling an inductive displacement measurement sensor (2) is described. The displacement measurement sensor has a sensor coil (2), which is supplemented by means of a capacitor (Cpar) to form an oscillating circuit. In addition, the circuit arrangement has an oscillator (3) for generating an excitation signal (UExciter), which excites the oscillating circuit to oscillate. The excitation signal (UExciter) is superimposed with a DC voltage (Utemp), the amplitude of which changes when the temperature of the sensor coil (2) changes. The sensor coil (2) is connected to a controllable resistor (Rvar). Furthermore, the circuit arrangement (1) has a comparator (4), which compares the DC voltage (Utemp) with a reference voltage (Utref). On the basis of the result of the comparison, the comparator (4) outputs a control voltage (Ur), which controls the controllable resistor (Rvar).
    Type: Grant
    Filed: July 7, 2015
    Date of Patent: June 19, 2018
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventor: Franz Hrubes
  • Patent number: 9677947
    Abstract: A temperature sensor comprising a sensor element that is arranged in a housing, is characterized in that the sensor element is totally enclosed with a thermally conductive material, preferably with a thermally conductive paste, inside the housing.
    Type: Grant
    Filed: November 16, 2012
    Date of Patent: June 13, 2017
    Assignee: MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
    Inventors: Reinhold Hoenicka, Sabine Schmideder, Norbert Reindl
  • Patent number: 9672962
    Abstract: A bushing of an electrical conductor through a wall which separates two regions from one another, wherein the conductor extends through a passage in the wall, at a distance from said wall, characterized in that a sleeve, which is electrically insulated from the passage and is hermetically sealed, preferably extends approximately coaxially through the passage, and in that the electrical conductor extends through the sleeve and is incorporated in the sleeve in a hermetically sealed, preferably integral, manner.
    Type: Grant
    Filed: March 29, 2011
    Date of Patent: June 6, 2017
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Alfons Meilhamer, Reinhold Hoenicka
  • Patent number: 9574865
    Abstract: A method for detecting magnetic fields, particularly for detecting the position of objects with a preferably oblong, soft-magnetic element, which is connected to electronics, with via the electronics the impedance of the soft-magnetic material is measured, characterized in that a magnetic field is used in which by the position of an object which is located in an arrangement with the soft-magnetic material the magnetic field develops at the location of the soft-magnetic material, with the magnetic permeability ? of the soft-magnetic material adjusting, depending on the magnetic field and thus the position of the object. A respective device serves for applying the method according to the invention.
    Type: Grant
    Filed: August 12, 2011
    Date of Patent: February 21, 2017
    Assignee: MICRO-EPSILON Messtechnik GmbH & Co. KG
    Inventors: Christian Pfaffinger, Johann Hofer, Felix Mednikov, Thomas Wisspeintner, Guenter Schallmoser