Patents Assigned to Micro-Epsilon Messtechnik GmbH & Co. KG
  • Patent number: 5898304
    Abstract: A sensor arrangement (1) comprising at least one measuring coil (2), at least one voltage source (3) for the measuring coil (2), and an evaluation unit (4) with means for detecting, processing, and evaluating measured signals. This sensor arrangement (1) is used to measure distances and thicknesses substantially independently of the material involved, without the user having to know the physicomathematical relations between the influencing quantities and the measured values. In order to evaluate the measured signals, the evaluation unit (4) of the sensor arrangement comprises a neural network (5) with an input layer, at least one hidden layer, an output layer, and connection weights for the individual layers. The connection weights are determined and stored in a learning phase by measurements taken on a plurality of different suitable learning objects with known actual values.
    Type: Grant
    Filed: March 21, 1997
    Date of Patent: April 27, 1999
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Roland Mandl
  • Patent number: 5629619
    Abstract: A noncontact distance measuring system with a sensor (2) that draws on alternating current and has a measuring coil (1), an electronic supply/evaluation circuit (3) connected with the sensor (2), and an electrically and/or magnetically conductive test object (4) associated to the sensor (2), the measuring coil being packaged in a preferably cylindrical housing, and the test object (4) at least partially surrounding the coil housing (5) and being movable in its longitudinal direction, is structured so as to reduce the overall length and to avoid the output impedance of the measuring coil from the position of the test object, in that the test object (4) is designed as a ring (6) surrounding the coil housing (5) at a distance, that the measuring coil (1) has at least two voltage taps (7), so that depending on the number of voltage taps (7) either voltage values can be tapped sequentially between the individual voltage taps (7) and a reference potential (8), and that the electronic supply/evaluation circuit (3) i
    Type: Grant
    Filed: October 31, 1994
    Date of Patent: May 13, 1997
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Felix Mednikov
  • Patent number: 5559431
    Abstract: To suppress and compensate influences of disturbance variables, a method of calibrating a sensor is disclosed, in which at most as many so-called influence variables influencing the measuring result are considered as measurable quantities are detected by the sensor, the set of the influence variables being composed of at least one disturbance variable influencing the measurement and at least one target quantity to be determined from the measurable quantities.
    Type: Grant
    Filed: October 7, 1994
    Date of Patent: September 24, 1996
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Martin Sellen
  • Patent number: 5525903
    Abstract: A sensor arrangement and a method of acquiring properties of the surface layer (3) of a metallic target (2), which allow a nondestructive and substantially distance-independent measurement to be performed, with the requirements to be met by the sensor positioning being minimal. The sensor arrangement (1) comprises a combination of at least one eddy-current sensor (5) with at least one displacement measuring sensor (6), the depth of penetration of the eddy currents generated by the eddy-current sensor (5) corresponding to at least twice the thickness of the surface layer (3), and the displacement measuring sensor (6) serving to determine the distance of the sensor arrangement (1) from the target surface (4).
    Type: Grant
    Filed: August 18, 1994
    Date of Patent: June 11, 1996
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Axel Seikowsky, Andreas Spang
  • Patent number: 5485082
    Abstract: A method of calibrating a thickness measuring device having preferably two noncontacting or scanning displacement measuring sensors (2, 3), which allows to calibrate in a simple manner, at the location of measurement, thickness measuring devices operating by different measuring principles by means of a reference object (7).
    Type: Grant
    Filed: December 10, 1992
    Date of Patent: January 16, 1996
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Karl Wisspeintner, Roland Mandl
  • Patent number: 5477473
    Abstract: A sensor-drive and signal-processing method, wherein the primary side of the sensor is supplied with a preferably oscillating input signal, and the output signal from the secondary side of the sensor is demodulated, if need be, filtered and amplified, is developed for realizing smaller structural designs for sensors and associated electronics such that both the sensor drive on the primary side and the signal conditioning and processing on the secondary side occur in digital form.
    Type: Grant
    Filed: February 1, 1994
    Date of Patent: December 19, 1995
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Heinrich Baumann
  • Patent number: 5353648
    Abstract: A torque transmitter comprising two members 1, 2 rotatable relative to each other and serving to transmit a torque, and which has the ability to continuously measure the transmitted torque. The transmitter includes a transducer ring 3, and a displacement measuring device 6 having at least two noncontacting sensors 4, 5 for detecting the axial position of the transducer ring 3 relative to a reference member 7. The members 1, 2 are inter-connected via transverse beams and connected with the transducer ring 3 via fork-like members, so that upon a torque being transmitted between the members 1, 2, the latter are rotated relative to one another proportionally to the torque, and the transducer ring 3 is axially displaced.
    Type: Grant
    Filed: April 2, 1992
    Date of Patent: October 11, 1994
    Assignees: Ringspann GmbH, Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Franz Hrubes, Karlheinz Timtner
  • Patent number: 5302894
    Abstract: A noncontacting displacement measuring system therefor a sensor (2) with a housing (11), at least one coil (1) accommodated in the sensor housing (11) and an embedding substance (13) for anchoring the coil (1), and further therefor an electronic supply/evaluation unit, is designed such that the influence of fluids and solids with a high dielectric constant on the measured values is large eliminated. To this end, a shield (15) is provided on the measuring side (8) of the sensor (2), which is at least largely impervious to electric field lines (9) emanating from the coil (1), but largely permeable to electromagnetic field lines emanating from the coil (1).
    Type: Grant
    Filed: September 30, 1991
    Date of Patent: April 12, 1994
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Franz Hrubes
  • Patent number: 5291794
    Abstract: A method for monitoring mechanical power transmission systems is disclosed, wherein the power transmission system includes at least one power transmitting element, and which is characterized for a reliable and simple measurement of elongations on the power transmitting element by the following steps: First two substantially parallel planes are established on the unstressed power transmitting element, each plane being defined by at least three space coordinates or respectively measuring points on the power transmitting element. Then, the relative change in position of the two planes to one another is determined on the stressed power transmitting element. Finally, the determined relative change in position of the planes is correlated with the local elongation or compression on the power transmitting element. An apparatus for carrying out the method is likewise described.
    Type: Grant
    Filed: May 5, 1992
    Date of Patent: March 8, 1994
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Friedrich Klein
  • Patent number: 4847794
    Abstract: A method of error compensation for transducers having non-linear characteristics is shown. A computer-supported measuring circuit is used. In a first factory alignment, the output characteristic of the transducer is set so that it can be linearized by the computer using a power function. The appropriate exponent of the power function is stored. At the place of use, at least three calibration measurements are performed with the installed transducer using defined calibration measured values substantially spanning the measuring range of the transducer equidistantly. The power function is solved with the calibration measuring results and the stored exponent, so that the constants not yet known can be calculated. During every following service measurement, the actual measuring result is put into the now solved power function. The result of the equation is then outputted as the error-compensated measuring result.
    Type: Grant
    Filed: August 27, 1986
    Date of Patent: July 11, 1989
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Franz Hrubes