Patents Assigned to Micro-Epsilon Messtechnik GmbH & Co. KG
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Publication number: 20120299585Abstract: An inductively operating sensor, particularly for measuring distances and positions of a metallic object, comprising at least a coil, a ferromagnetic or ferritic core and perhaps a housing comprising a sensor element, with the core being embedded in a single or multi-layered ceramic and jointly with the ceramic forming a coil body and with the coil body and the core being connected to each other in a form-fitting fashion. Furthermore, a method is suggested for producing such a sensor.Type: ApplicationFiled: May 3, 2012Publication date: November 29, 2012Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Reinhold Hoenicka, Sabine Schmideder, Günter Schallmoser
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Patent number: 8248598Abstract: According to the invention, a method for compensating for temperature related measurement errors in an optical arrangement, comprising at least one lens is designed with a view to an economical and reliable as possible compensation for temperature related measurement errors without significant increased production expense, wherein a multicolored beam is passed through the optical arrangement, which is focused at points at varying distances from the lens as a result of the chromatic aberration of the lens, at least a part of the spectrum of the light beam being at least partly reflected within the optical arrangement and directed to a detector device by means of which a determination of a spectrum is carried out, the temperature of the arrangement is determined from the spectrum recorded by the detection device and a compensation for temperature related measurement errors is carried out based on the temperature determined thus. A corresponding optical arrangement in disclosed.Type: GrantFiled: May 21, 2008Date of Patent: August 21, 2012Assignee: Micro-epsilon Messtechnik GmbH & Co. KGInventors: Reinhold Hoenicka, Alexander Fink
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Publication number: 20120146625Abstract: The invention relates to a sensor arrangement for detecting at least one of the movement and the position of two components of an assembly, which are located close to each other or are disposed one inside the other and can be moved relative to each other, said sensor arrangement comprising at least one first sensor for detecting at least one of the movement and the position of the one component and a second sensor for detecting at least one of the movement and the position of the other component, the sensors functioning according to different measuring principles without affecting each other mutually.Type: ApplicationFiled: October 5, 2010Publication date: June 14, 2012Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO.KGInventors: Werner Grommer, Christian Pfaffinger, Axel Seikowsky
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Patent number: 8198888Abstract: In one embodiment, a method for determining the distance of a conducting surface profiled in a direction of distance determination from a functional surface moving relative to the profiled surface is disclosed. The method includes connecting inputs of a sensor to an oscillator arrangement. The sensor includes a first and a second measuring coil. The method includes further connecting outputs of the sensor to an analog-to-digital converter via a demodulator unit to obtain first and second digital measured values. The first and second digital measured values correspond to the distance between the profiled surface and the first and second measuring coil of the sensor, respectively. The method further includes connecting an arithmetic unit to the analog converter unit. The second measurement coil is arranged at a known distance from the first measuring coil on the side of the first measuring coil that faces away from the profiled surface.Type: GrantFiled: September 29, 2005Date of Patent: June 12, 2012Assignees: Siemens Aktiengesellschaft, Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Werner Grömmer, Felix Mednikov, Robert Schmid, Martin Sellen, Benno Weis
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Patent number: 8064686Abstract: A device for the contactless optical determination of the position of an object. In particular, the present invention provides a method and device for the contactless optical determination of the 3D position of an object wherein an image of the object is generated by means of a camera and the 3D position of the object is calculated from the camera image based on the image information about detected geometrical characteristics. Determination of the 3D position of the object includes determination of the 3D position and the 3D orientation of the object.Type: GrantFiled: March 24, 2006Date of Patent: November 22, 2011Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Robert Wagner, Rainer Hesse
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Patent number: 7808314Abstract: The invention relates to a circuit for adjusting an impedance between two terminals, said impendance including the input impedance of the circuit. The aim of the invention is to enlarge the adjustment range and to stabilize—the operating behavior of such a circuit. For this purpose, the circuit comprises amplifiers, adjusting means with which amplification of at least one amplifier and/or the circuit can be changed in general and the impedance between the two terminals can be modified by influencing the one or more adjusting means.Type: GrantFiled: January 10, 2007Date of Patent: October 5, 2010Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Franz Hrubes
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Publication number: 20100090688Abstract: A method for determining the position and/or change of position of a measured object relative to a sensor, where the sensor preferably has a sensor coil to which an alternating current is applied, is characterized in that a magnet associated with the measured object, in a soft magnetic foil, whose permeability changes under the influence of a magnetic field on the basis of the magnetic field's field strength and which is arranged in the area of influence of the sensor, brings about a change in the permeability of the foil and in that the change in the permeability of the foil is determined from the latter's reaction to the sensor, and this is used to determine the position and/or change of position of the measured object relative to the sensor. A sensor arrangement is designed accordingly.Type: ApplicationFiled: December 21, 2007Publication date: April 15, 2010Applicant: Micro-Epsilon Messtechnik GmbH & Co., KGInventor: Vladislav Mednikov
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Patent number: 7602175Abstract: A non-contacting position measuring system comprising a sensor that includes a measuring coil which can be energized with alternating current, where the measuring coil comprises at least two voltage taps, an electrically or magnetically conductive object to be measured which is assigned to the sensor, and an evaluation circuit, where the sensor and the object to be measured can be displaced relative to one another in a longitudinal direction of the measuring coil. The position-measuring system presented is formed in such a manner that the object to be measured comprises at least one marking affecting the impedance of the measuring coil between two voltage taps so that the evaluation circuit provides an output signal correlating with the position of the object to be measured in relation to the voltage taps.Type: GrantFiled: May 18, 2006Date of Patent: October 13, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Martin Sellen, Eduard Huber
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Patent number: 7576849Abstract: Method and apparatus for optically testing the quality of objects such as silicon wafers which have a circular peripheral edge, wherein light is directed onto the edge region of the object, and the light radiating from the object due to reflection, refraction and/or diffraction is detected by means of a measuring unit which produces an image from the received light. Defects on and/or in the object are identified from the produced image.Type: GrantFiled: November 16, 2005Date of Patent: August 18, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Robert Wagner
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Patent number: 7561273Abstract: The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which are arranged at different distances from the imaging optical system, using the chromatic aberration of the optics. The focused light beam can be deviated to a point of the surface. A sensor device is provided in order to detect the reflected light beam. The aim of the invention is to maintain the largest distance possible between the measuring head and the object. The imaging optical system comprises an optical system for the targeted circulation of a chromatic aberration and an additional optical system which is used to form the focused light beam emerging from the imaging optical system.Type: GrantFiled: November 13, 2007Date of Patent: July 14, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Torsten Stautmeister, Bernhard Messerschmidt, Karl Wisspeinter
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Patent number: 7545154Abstract: The invention relates to a sensor which uses the capacitive measuring principle which is used to detect the proximity of a dielectric medium, preferably for detecting a human body part, which is used in an anti-pinching system. The sensor includes a capacitor and an evaluation electronic system. The variation of the capacity of the capacitor, which is caused by the medium, can be measured. The capacitor, which can establish a distinction between a human body part or a solid and water and/or humidity, is characterized in that the capacitor can be operated in a successive manner by at least two different frequencies and/or at least two different pulse duty factors by using the different ratio of said elements in a variable electric field. The invention also relates to a corresponding method.Type: GrantFiled: June 20, 2007Date of Patent: June 9, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Manfred Wagner, Norbert Reindl
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Patent number: 7533472Abstract: A cable length sensor, in particular, a bowden cable displacement sensor, comprising a cable drum, a measuring cable wound on the cable drum and a return device at least lightly pre-tensioned in the start position, wherein the measuring cable may be withdrawn by rotating the cable drum against the force of the return device and by withdrawing the measuring cable the return device may be further tensioned. The return device is arranged in a housing, and coupling means for releasably coupling the return device to the rotating movement of the cable drum are provided so as to permit ready removal and replacement of the return device. Also, the housing may be provided with a sensor element operated from outside the housing for determining the current position of the return device, in particular the at least lightly tensioned starting position of the return device.Type: GrantFiled: February 6, 2008Date of Patent: May 19, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Thomas Birchinger, Jaroslav Hruby
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Publication number: 20090009245Abstract: The invention relates to a circuit for adjusting an impedance between two terminals, said impendance including the input impedance of the circuit. The aim of the invention is to enlarge the adjustment range and to stabilize—the operating behavior of such a circuit. For this purpose, the circuit comprises amplifiers, adjusting means with which amplification of at least one amplifier and/or the circuit can be changed in general and the impedance between the two terminals can be modified by influencing the one or more adjusting means.Type: ApplicationFiled: January 10, 2007Publication date: January 8, 2009Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Franz Hrubes
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Patent number: 7369225Abstract: A device and method for checking surfaces in the interior of holes, depressions, or the like. The device and method are developed in such a manner that a multicolor light beam can be produced with a light source, wherein a light beam, due to the chromatic aberration of the imaging optics, can be focused onto several points at different distances from the imaging optics, such that the distance to the surface can be determined from the spectrum of the detected light beam.Type: GrantFiled: December 8, 2006Date of Patent: May 6, 2008Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Bernhard Messerschmidt, Karl Wisspeintner
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Publication number: 20080039867Abstract: The invention relates to a universal actuator platform for guiding end effectors, for example, cameras, surgical, or medical tools, or instruments etc. in minimally invasive interventions, in which each end effector is introduced into a body cavity at an entrance point with at least one interface, for connecting at least one kinematic device, with an end effector, to at least one drive mechanism for the kinematic device and to a drive controller.Type: ApplicationFiled: November 5, 2004Publication date: February 14, 2008Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Hubertus Feussner, Eduard Sammereier, Martin Sellen, Jürgen Michael Knapp, Robert Geiger, Ludwig Kirschenhofer
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Patent number: 7275015Abstract: A method and a device for determining motion parameters of a conductive, profiled surface (22) relative to a sensor (3), with the sensor (3) comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface (22) and the sensor (3), to a variation, which is determined by means of the coil (16). The position change is derived from the coupling impedance (Zc) of the coil (16), and the real component (Rc) and the imaginary component (Xc) of the complex coupling impedance (Zc) of the coil (16) are determined, with a distance d between the sensor (3) and the surface (22) being computed based on the determined values while using an algorithm as a basis.Type: GrantFiled: October 25, 2005Date of Patent: September 25, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Stanislav Medinkov, Mark Netchaewskij, Felix Mednikov, Werner Grömmer, Martin Sellen
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Patent number: 7257994Abstract: Measuring device and method for determining the position of an electrically conductive test object (1) with a noncontacting sensor, in particular an eddy current sensor (2), wherein the test object (1) is adapted for linear reciprocal movement in a predetermined direction. The test object (1) includes a marking (6), and the sensor is arranged transversely to the direction of movement of the test object (1) and at a constant distance from the test object in the region of the marking (6), so that a movement of the test object causes the sensor to produce an at least largely linear signal change over a predetermined measuring range.Type: GrantFiled: December 7, 2005Date of Patent: August 21, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Franz Hrubes
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Patent number: 7157902Abstract: A sensor coil for a non-contacting inductive displacement sensor, having two inner substantially identically formed winding sections (1), with an unwound section (2) provided between the two inner winding sections. Also, the coil has two outer substantially identically formed winding sections (3), which are respectively arranged at the ends of the two inner winding sections (1) facing away from the unwound section (2). The two outer winding sections (3) have a larger number of windings than the two inner winding sections (1), thereby producing a measuring signal which is substantially linear along the measuring range.Type: GrantFiled: December 20, 2004Date of Patent: January 2, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Markus Weber
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Patent number: 7150016Abstract: A method of controlling and visualizing processes, wherein data are produced by means of at least one task and/or thread, and consumed by means of at least one further task and/or thread, is designed with respect to a deterministic behavior without increased costs for software or hardware such that a decoupling of mutually blocking tasks and/or threads occurs in real time systems.Type: GrantFiled: May 21, 2001Date of Patent: December 12, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Andreas Bauhofer, Heidemarie Meyerhofer, Roland Mandl
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Patent number: 7092833Abstract: A method for linearizing a nonlinear curve with a linearization circuit (1), wherein the curve represents the relationship between input signals and output signals of a sensor. An output signal (100, 110, 120) of the sensor, which is respectively associated with an input signal, is displayed with respect to a simple and cost favorable linearization such that the adjustment of the linearization circuit (1) essentially occurs in an automated way utilizing sequence controller (2). A corresponding circuit is also described for practicing the method.Type: GrantFiled: October 9, 2003Date of Patent: August 15, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Franz Hrubes, Karl Wisspeintner