Patents Assigned to Micro-Epsilon Messtechnik GmbH & Co. KG
-
Patent number: 7061230Abstract: A circuit for measuring distances and which has at least two inputs (1, 2), at least one measuring coil (3), and at least one signal source, wherein at least two input signals (epos, eneg) are generated by means of the signal source, and the inputs (1, 2) are activatable by means of the input signals (epos, eneg). The input signals (epos, eneg) are applied, preferably preprocessed, to the inputs of the measuring coil (3). The circuit is designed for use where little space is available for the circuit, with the input signals (epos, eneg) being applied to a preferably timed SC network, which generates a measuring output signal that is dependent on temperature. A corresponding method is also described.Type: GrantFiled: March 18, 2004Date of Patent: June 13, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
-
Patent number: 7012462Abstract: A circuit and method for demodulating at least one modulated signal (e), such as a measuring signal of a sensor. The circuit comprises at least one input (1), with the signal (e) being applied to the input (1), and the input is connected to at least one switched-capacitor network which is configured to demodulate the signal. The circuit permits use even in a small available space.Type: GrantFiled: August 27, 2003Date of Patent: March 14, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
-
Patent number: 6999892Abstract: A circuit arrangement (10) for activating a sensor and evaluating its signals, in particular for parametric sensors with complex impedances. The circuit arrangement comprises at least one sensor (2) for acquiring mechanical data. In order to minimize or largely prevent temperature caused disturbances in a constructionally simple layout, the measuring signal, the absolute temperature, and the gradient temperature of the sensor (2) are acquired simultaneously, preferably by means of a microprocessor or microcomputer (3). A corresponding method for activating sensors and evaluating their signals is also described.Type: GrantFiled: December 17, 2002Date of Patent: February 14, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Martin Sellen, Karl Wisspeintner
-
Patent number: 6867585Abstract: A circuit (1) for compensating for temperature with a sensor operating by the eddy current principle for measuring physical conditions of an object. The circuit includes an evaluation unit (3) for evaluating a measuring signal (100) of the sensor (2). The sensor (2) and the evaluation unit (3) are interconnected via a connection cable (4). For the purpose of minimizing or preventing to the greatest extent temperature caused interferences, an additional compensation line (5) is provided which compensates for the temperature of the connection cable (4). A corresponding method for compensating for temperature is described.Type: GrantFiled: October 14, 2003Date of Patent: March 15, 2005Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Franz Hrubes
-
Patent number: 6822442Abstract: A sensor arrangement with a first sensor (1) which comprises a measuring coil (2) that operates by the eddy current principle, and which detects the distance from a target (6), and a second sensor (3), the two sensors (1, 3) being arranged in a housing (4). To reduce the interaction of the sensors with each other, a panel (7) is positioned on the measuring side of the housing, with the panel being an active component of the second sensor (3). The second sensor is preferably a capacitive sensor, with the panel (7) being the active measuring surface of the capacitive sensor.Type: GrantFiled: April 8, 2003Date of Patent: November 23, 2004Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Franz Hrubes, Norbert Reindl
-
Publication number: 20040201376Abstract: A circuit for measuring distances comprising at least two inputs (1, 2), at least one measuring coil (3), and at least one signal source, wherein at least two input signals (epos, eneg) are generated by means of the signal source, and the inputs (1, 2) are activatable by means of the input signals (epos, eneg) The input signals (epos, eneg) are applied, preferably preprocessed, to the inputs of the measuring coil (3). The circuit is designed for use where little space is available for the circuit, with the input signals (epos, eneg) being applied to a preferably timed SC network, which generates a measuring signal and/or an output signal that is dependent on temperature. A corresponding method is also described.Type: ApplicationFiled: March 18, 2004Publication date: October 14, 2004Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
-
Patent number: 6762922Abstract: A device and a method for detecting the position of an object (1), such as an armature (2) of an inlet or outlet valve (3), with the device comprising at least two coils (4, 5), preferably two magnet coils, which can be energized for moving the object (1) between the two coils (4, 5), or used with an evaluation circuit for detecting the position of the object (1). The two coils (4, 5) are alternately used for moving the object (1) between the coils (4, 5) and for detecting the position of the object (1).Type: GrantFiled: December 17, 2002Date of Patent: July 13, 2004Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Stanislav Mednikov, Mark Netschaewsky, Günter Schallmoser
-
Publication number: 20040075452Abstract: A circuit (1) for compensating for temperature with a sensor operating by the eddy current principle for measuring physical conditions of an object. The circuit includes an evaluation unit (3) for evaluating a measuring signal (100) of the sensor (2). The sensor (2) and the evaluation unit (3) are interconnected via a connection cable (4). For the purpose of minimizing or preventing to the greatest extent temperature caused interferences, an additional compensation line (5) is provided which compensates for the temperature of the connection cable (4). A corresponding method for compensating for temperature is described.Type: ApplicationFiled: October 14, 2003Publication date: April 22, 2004Applicant: Micro-Epsilon Messtechnik GmbH & Co., KGInventor: Franz Hrubes
-
Publication number: 20040071245Abstract: A circuit and method for demodulating at least one modulated signal (e), such as a measuring signal of a sensor. The circuit comprises at least one input (1), with the signal (e) being applied to the input (1), and the input is connected to at least one switched-capacitor network which is configured to demodulate the signal. The circuit permits use even in a small available space.Type: ApplicationFiled: August 27, 2003Publication date: April 15, 2004Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Ulrich Kleine, Falk Roewer, Klaus Salzwedel, Felix Mednikov, Martin Sellen
-
Publication number: 20040070527Abstract: A method for linearizing a nonlinear curve with a linearization circuit (1), wherein the curve represents the relationship between input signals and output signals of a sensor. An output signal (100, 110, 120) of the sensor, which is respectively associated with an input signal, is displayed with respect to a simple and costfavorable linearization such that the adjustment of the linearization circuit (1) essentially occurs in an automated way by means of a sequence controller (2). A corresponding circuit is also described for practicing the method.Type: ApplicationFiled: October 9, 2003Publication date: April 15, 2004Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Franz Hrubes, Karl Wisspeintner
-
Publication number: 20030169036Abstract: A sensor arrangement with a first sensor (1) which comprises a measuring coil (2) that operates by the eddy current principle, and which detects the distance from a target (6), and a second sensor (3), the two sensors (1, 3) being arranged in a housing (4). To reduce the interaction of the sensors with each other, a panel (7) is positioned on the measuring side of the housing, with the panel being an active component of the second sensor (3). The second sensor is preferably a capacitive sensor, with the panel (7) being the active measuring surface of the capacitive sensor.Type: ApplicationFiled: April 8, 2003Publication date: September 11, 2003Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Franz Hrubes, Norbert Reindl
-
Publication number: 20030130814Abstract: A circuit arrangement (10) for activating a sensor and evaluating its signals, in particular for parametric sensors with complex impedances. The circuit arrangement comprises at least one sensor (2) for acquiring mechanical data. In order to minimize or largely prevent temperature caused disturbances in a constructionally simple layout, the measuring signal, the absolute temperature, and the gradient temperature of the sensor (2) are acquired simultaneously, preferably by means of a microprocessor or microcomputer (3). A corresponding method for activating sensors and evaluating their signals is also described.Type: ApplicationFiled: December 17, 2002Publication date: July 10, 2003Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Felix Mednikov, Martin Sellen, Karl Wisspeintner
-
Publication number: 20030098686Abstract: A device and a method for detecting the position of an object (1), such as an armature (2) of an inlet or outlet valve (3), with the device comprising at least two coils (4, 5), preferably two magnet coils, which can be energized for moving the object (1) between the two coils (4, 5), or used with an evaluation circuit for detecting the position of the object (1). The two coils (4, 5) are alternately used for moving the object (1) between the coils (4, 5) and for detecting the position of the object (1).Type: ApplicationFiled: December 17, 2002Publication date: May 29, 2003Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Felix Mednikov, Stanislav Mednikov, Mark Netschaewsky, Gunter Schallmoser
-
Patent number: 6571133Abstract: A method, in particular for monitoring, controlling and adjusting a process, wherein a signal processing instruction is synthesized on a computer-assisted user interface by arranging and connecting icons (6, 7), and generated by the computer from base modules containing individual instructions, one base module being allocated to each icon (6, 7), and the individual instructions of the selected base modules being linked to one another according to the graphic integration of the symbols (6, 7) for transmitting and/or processing data.Type: GrantFiled: February 9, 2000Date of Patent: May 27, 2003Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Roland Mandl, Johann Nommer, Erich Fuchs, Bernhard Sick
-
Patent number: 6479990Abstract: A method for operating an eddy current sensor (10) with a measuring coil (2) and an evaluation circuit (4) for determining material or geometric parameters of a test object (5), in which the test object (5) is arranged at a distance (d) from the measuring coil (2). The impedance of the measuring coil (2) is evaluated, while the measuring coil (2) is being supplied with an alternating voltage of a predetermined frequency, and the evaluation circuit (4) determines the material and geometric parameters of the test object (5) based on the impedance of the measuring coil (2). The impedance of the measuring coil (2) is determined at an alternating voltage of a first frequency, and the impedance of the measuring coil (2) is determined at an alternating voltage of a second frequency, and the evaluation circuit (4) computes the material and geometric parameters of the test object (5) on the basis of the impedances of the measuring coil (2) at the first and the second frequencies.Type: GrantFiled: June 18, 2001Date of Patent: November 12, 2002Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Roland Mandl, Mark Netschaevsky
-
Patent number: 6462536Abstract: Eddy current sensor with an exploring coil (2) wound on a coil form (32), with two terminals (6, 7), a source of ac voltage, an electrically conductive measuring probe (3), and an evaluation circuit, wherein the measuring probe (3) is displaceable relative to the exploring coil (2), and the evaluation circuit generates an evaluation signal as a function of the position of the measuring probe (3), wherein the eddy current sensor comprises an electrode (4) with a tap (8) for enabling electrical contact, the electrode forming together with the windings of the exploring coil (2) and an intermediate layer (33) a component with distributed electromagnetic parameters, whose output signals are used to determine the position of the measuring probe (3).Type: GrantFiled: December 15, 1999Date of Patent: October 8, 2002Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Karl Wisspeintner
-
Publication number: 20020004811Abstract: A method of controlling and visualizing processes, wherein data are produced by means of at least one task and/or thread, and consumed by means of at least one further task and/or thread, is designed with respect to a deterministic behavior without increased costs for software or hardware such that a decoupling of mutually blocking tasks and/or threads occurs in real time systems.Type: ApplicationFiled: May 21, 2001Publication date: January 10, 2002Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Andreas Bauhofer, Heidemarie Meyerhofer, Roland Mandl
-
Publication number: 20010054896Abstract: A method for operating an eddy current sensor (10) with a measuring coil (2) and an evaluation circuit (4) for determining material or geometric parameters of a test object (5), in which the test object (5) is arranged at a distance (d) from the measuring coil (2). The impedance of the measuring coil (2) is evaluated, while the measuring coil (2) is being supplied with an alternating voltage of a predetermined frequency, and the evaluation circuit (4) determines the material and geometric parameters of the test object (5) based on the impedance of the measuring coil (2). The impedance of the measuring coil (2) is determined at an alternating voltage of a first frequency, and the impedance of the measuring coil (2) is determined at an alternating voltage of a second frequency, and the evaluation circuit (4) computes the material and geometric parameters of the test object (5) on the basis of the impedances of the measuring coil (2) at the first and the second frequencies.Type: ApplicationFiled: June 18, 2001Publication date: December 27, 2001Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Roland Mandl, Mark Netschaevsky
-
Patent number: 6318153Abstract: A sensor (1) is proposed for noncontacting thickness gauging on films (2), in particular blown films, with a sensor head (3) and a mount (4) for the sensor head (3), which provides reliable measuring results despite transportation-caused movements of the film (2), and which is particularly suitable for a continuous quality control during the production process. In accordance with the invention, the sensor head (3) comprises at least one noncontacting sensor element for gauging the thickness in accordance with the physical properties of the film (2). Furthermore, the position of the sensor head (3) is adjustable such that the sensor head (3) is held during the entire measuring process at a predeterminable, at least largely constant distance from the film (2).Type: GrantFiled: March 26, 1999Date of Patent: November 20, 2001Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Martin Dumberger, Axel Seikowsky, Martin Sellen, Karl Wisspeintner
-
Patent number: 6246230Abstract: A noncontacting displacement sensor (1) is proposed with a measuring coil (2) to which alternating current can be applied, the measuring coil (2) having at least two voltage taps (3), with an electrically and/or magnetically conductive measuring object (5), and with an evaluation circuit (4) for evaluating and, if need be, determining an output voltage that corresponds to the position of the measuring object (5) with respect to the voltage taps (3). To provide the displacement sensor of a structural form that is as compact as possible, the measuring object (5) is arranged and displaceable in the interior of the measuring coil (2), the total impedance of the measuring coil (2) being independent of the position of the measuring object (5).Type: GrantFiled: April 19, 1999Date of Patent: June 12, 2001Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Felix Mednikov