Patents Assigned to Mitutoyo Corporation
  • Patent number: 11543899
    Abstract: An inductive position detector for stylus position measurement in a scanning probe comprises a coil board configuration located along a central axis in the probe. The coil board configuration includes a field generating coil configuration and top and bottom axial and rotary sensing coil configurations. The field generating coil configuration generates a changing magnetic flux, and coil signals indicate conductive disruptor element and/or stylus positions. At least one misalignment compensation element is configured to reduce a signal offset that results from a misalignment of at least one coil of the coil board configuration (e.g., the coil board configuration may comprise a printed circuit board with a plurality of layers in which the coils are located and the misalignment of the at least one coil may result from a registration error, such as within manufacturing tolerances, in a layer to layer registration as part of a fabrication process).
    Type: Grant
    Filed: December 28, 2020
    Date of Patent: January 3, 2023
    Assignee: Mitutoyo Corporation
    Inventor: Christopher Richard Hamner
  • Patent number: 11543225
    Abstract: A caliper measurement force detecting device includes a fixed unit that is securely attached to a slider so as not to displace relative to the slider; a movable unit that is provided to allow a slight displacement relative to the fixed unit along a direction parallel to a displacement direction of the slider; and pressure detectors that are arranged between the fixed unit and the movable unit and are provided so as to detect pressure applied in the direction parallel to the displacement direction of the slider. The movable unit includes an alternative finger hook that is arranged near a finger hook of the slider and serves as an operator that pushes and pulls the slider instead of the finger hook of the slider.
    Type: Grant
    Filed: May 19, 2021
    Date of Patent: January 3, 2023
    Assignee: MITUTOYO CORPORATION
    Inventors: Kohei Fuchigami, Osamu Saito, Keisuke Iori
  • Publication number: 20220412727
    Abstract: An illumination device has a light source unit, a lens unit, and a filter unit An imaging device receives object light, generated by the illumination light, from the measurement object at a predetermined observation solid angle, and pixels of the imaging device can each identify the different light wavelength ranges. A processing device includes an arithmetic unit configured to obtain a normal vector at each point of the measurement object corresponding to each pixel from inclusion relation between the plurality of solid angle regions, constituting the object light, and the predetermined observation solid angle, and a shape reconstruction unit configured to reconstruct the shape of the measurement object.
    Type: Application
    Filed: November 26, 2020
    Publication date: December 29, 2022
    Applicants: Machine Vision Lighting Inc., MITUTOYO CORPORATION
    Inventors: Shigeki MASUMURA, Yasuhiro TAKAHAMA, Jyota MIYAKURA, Masaoki YAMAGATA
  • Patent number: 11536636
    Abstract: A hardness tester includes an image acquirer (controller) acquiring an image of a surface (surface image) of a sample captured by an image capturer, an identifier (controller) identifying, based on the surface image of the sample, a non-conformity region inside the image that is unsuitable for the hardness test using predetermined conditions, and a test position definer (controller) defining a test position in an area outside the non-conformity region identified by the identifier.
    Type: Grant
    Filed: November 17, 2020
    Date of Patent: December 27, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Koji Shinza, Fumihiko Koshimizu
  • Patent number: 11536563
    Abstract: A method for calibrating parameters includes a measurement step that obtains measurement data by scanning a defined surface; a correction step that obtains corrected data by correcting the measurement data based on the parameters; a determination step that calculates a roundness of the corrected data and determines whether the calculated roundness is equal to or less than a predetermined value; and an adjustment step that increases or reduces at least one of the parameters when the roundness is determined to be greater than the predetermined value, and the correction step, the determination step, and the adjustment step are repeated until the roundness is determined to be equal to or less than the predetermined value.
    Type: Grant
    Filed: July 22, 2020
    Date of Patent: December 27, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Yoshiyuki Omori
  • Patent number: 11530911
    Abstract: An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallelly moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.
    Type: Grant
    Filed: March 20, 2020
    Date of Patent: December 20, 2022
    Assignee: Mitutoyo Corporation
    Inventors: Ryoichi Imaizumi, Ichiro Taniguchi
  • Patent number: 11531103
    Abstract: A measurement apparatus that includes a laser apparatus outputting a frequency-modulated laser beam, a branching part branching the frequency-modulated laser beam into a reference light and a measurement light, a beat signal generation part generating a beat signal by mixing the reference light and a reflected light that is reflected by radiating the measurement light onto an object to be measured, an extraction part extracting a signal component corresponding to a resonator frequency of the frequency-modulated laser beam, a clock signal generation part generating a first clock signal on the basis of the signal component, a conversion part converting the beat signal into a first digital signal using the first clock signal, and a calculation part calculating a difference in a propagation distance between the reference light and the measurement light on the basis of the first digital signal.
    Type: Grant
    Filed: June 3, 2020
    Date of Patent: December 20, 2022
    Assignee: Mitutoyo Corporation
    Inventor: Shinji Komatsuzaki
  • Patent number: 11530914
    Abstract: A shape measuring apparatus applies, to a light beam, a periodic pattern having periodicity in a direction perpendicular to an optical axis and displaceable in the direction perpendicular to the optical axis, relatively displaces a focal point of an objective lens in a direction parallel to the optical axis, and calculates, based on amplitude of intensity of the light beam detected by a photodetector, face shape data on the object to be measured. Then, a top surface measuring step of acquiring face shape data on a top surface of the object to be measured, and a bottom surface measuring step of acquiring face shape data on a bottom surface of the object to be measured by transmitting through the top surface of the object to be measured and aligning the focal point of the objective lens on the bottom surface of the object to be measured are performed.
    Type: Grant
    Filed: July 27, 2021
    Date of Patent: December 20, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Lukasz Redlarski, Hideyuki Arai
  • Patent number: 11530908
    Abstract: A measurement point determination method for determining the number or an arrangement of measurement points for a measurement apparatus that performs measurement processing of a measurement item at a plurality of measurement points, the method comprises the steps of acquiring a minimum value and a maximum value of the number of measurement points, acquiring a target value of uncertainty for the measurement item of the measurement apparatus, estimating uncertainties when the measurement item is measured by the measurement apparatus using two or more of the numbers of measurement points between the minimum value and the maximum value of the number of measurement points, and determining the number of measurement points of the measurement apparatus on the basis of the target value and the estimated uncertainties.
    Type: Grant
    Filed: September 3, 2019
    Date of Patent: December 20, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Takeshi Hagino, Yuto Inoue, Masayuki Nara
  • Publication number: 20220400543
    Abstract: An illuminator includes: a light emitter including a light-emitting diode; a temperature sensor configured to detect a current temperature of the light emitter; and an illumination controller configured to adjust a drive voltage being supplied to the light emitter in accordance with the current temperature. The illumination controller includes a reference temperature storage in which a reference temperature is stored in advance and is configured to adjust the drive voltage by detecting the current temperature from the temperature sensor on a constant time cycle and comparing the current temperature with the reference temperature.
    Type: Application
    Filed: June 13, 2022
    Publication date: December 15, 2022
    Applicant: MITUTOYO CORPORATION
    Inventors: Tadashi YAMAZAKI, Yuto KONNO, Hideki MORITA, Nobuya KANEKO, Satoru HIRASAWA
  • Patent number: 11525664
    Abstract: A calibration method includes the steps of placing a structure to be measured at a first position, measuring a first distance from a laser interferometer to a reflector, and measuring first coordinates of a body to be measured, moving the structure to be measured to a second position, measuring a second distance from the laser interferometer to the reflector and measuring second coordinates of the structure to be measured with the coordinate measuring apparats, while the structure to be measured is at the second position, determining a scale error of the reference instrument, mounting the reference instrument, measuring the interval between objects to be measured, and calculating a calibration value of the interval between the objects to be measured.
    Type: Grant
    Filed: July 20, 2021
    Date of Patent: December 13, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Masayuki Nara
  • Patent number: 11525978
    Abstract: A variable focal length lens apparatus is provided with a variable focal length lens in which a focusing position periodically changes in response to a drive signal that is input; a light source that emits detection light at an object via the variable focal length lens; an photodetector that receives the detection light that is reflected by the object, and outputs a light detection signal; a signal processor that, based on the light detection signal that is input, outputs a light emission signal that is synchronized to a focusing time point where the detection light is focused on a surface of the object; an illuminator that provides pulse illumination to the object with illuminating light, based on the light emission signal that is input; and an image capturer that captures an image of the object through the variable focal length lens.
    Type: Grant
    Filed: July 23, 2019
    Date of Patent: December 13, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Koji Kubo
  • Publication number: 20220390227
    Abstract: There is provided a probe unit correction method for correcting linear expansion of a probe unit to obtain an accurate measurement value. First, a probe offset value is calculated as a model. Then, a probe unit correction method includes a temperature data acquisition step of acquiring a temperature difference between a temperature at a time of calibration and a temperature of a current measurement environment, a reference tip coordinate correction step of calculating, as a reference tip correction coordinate value, a correction value of a reference tip coordinate value to which linear expansion is added, and a probe offset correction step of calculating, as a probe offset correction value, a correction value of a probe offset value to which the linear expansion is added.
    Type: Application
    Filed: June 3, 2022
    Publication date: December 8, 2022
    Applicant: MITUTOYO CORPORATION
    Inventor: Kohju KASAHARA
  • Patent number: 11520472
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine (CMM), including a user interface that comprises a workpiece inspection program simulation portion configurable to display a 3-D view of a workpiece; an editing user interface portion comprising an editable plan representation of a current workpiece feature inspection plan for the workpiece; and an editable alignment program plan representation for the workpiece. The system is configured with the editable alignment program plan representation being automatically responsive to editing operations, regardless of whether the editing operations are performed in the 3-D view or the editable plan representation. The editing operations include deleting or adding at least one workpiece feature to or from the editable alignment program plan representation.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: December 6, 2022
    Assignees: Mitutoyo Corporation, Mitutoyo Europe GmbH
    Inventors: Guenther Ade, Frank Uwe Madsen, Petra Brieger
  • Patent number: 11523042
    Abstract: An image detection device includes a liquid resonant lens system whose focal point is cyclically changeable; an image detector configured to detect a detection image in a to-be-imaged region through the lens system; a pulsed illuminator configured to emit pulsed light on the to-be-imaged region in synchronization with the focal point; and an illumination controller configured to increase or decrease an illumination duration of the pulsed illuminator depending on a required light volume of the to-be-imaged region at the focal point where the pulsed illuminator emits pulsed light.
    Type: Grant
    Filed: September 4, 2020
    Date of Patent: December 6, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Yuki Kurahashi
  • Publication number: 20220383642
    Abstract: A position detection system includes: a plurality of distance detection apparatuses that generate distance data indicating distances to a plurality of positions on the object by detecting light reflected by the object in a predetermined three-dimensional space; an object identification part that identifies the object included in one or more pieces of distance data among a plurality of pieces of the distance data generated by the plurality of distance detection apparatuses; and a position identification part that identifies a position of the object in the three-dimensional space on the basis of (i) a position in the three-dimensional space of the distance detection apparatus that generated the distance data with which the object identification part identified the object and (ii) a position of the object in the distance data.
    Type: Application
    Filed: May 18, 2022
    Publication date: December 1, 2022
    Applicant: MITUTOYO CORPORATION
    Inventors: Tomohiro KIIRE, Kazuhiko HIDAKA
  • Patent number: 11512941
    Abstract: An analysis apparatus includes an acquisition part that acquires a plurality of interference images based on lights having a plurality of different wavelengths from an interference measurement apparatus, a removing part that outputs an interference component by removing a non-interference component included in an interference signal for each pixel in the plurality of the interference images, a conversion part that generates an analysis signal by performing a Hilbert transformation on the interference component, and a calculation part that calculates a distance between a reference surface and a surface of an object to be measured by specifying a phase gradient of a wavelength of light radiated onto the reference surface and the surface of the object to be measured on the basis of the interference component and the analysis signal.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: November 29, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Shimpei Matsuura
  • Patent number: 11510643
    Abstract: Volume data is generated by performing a CT scan with a spherical calibration jig having known dimensions in contact with an object. A profile of the surface shape of the object in the volume data is obtained, and a boundary surface of the spherical calibration jig is calculated from the center coordinates of the spherical calibration jig. A correction value for adjusting a boundary surface of the object determined from the gradient of the profile to the boundary surface of the spherical calibration jig is determined, and the boundary surface of the object is corrected by using the correction value. The shape of the object is determined by using the corrected boundary surface. The precision of measurement X-ray CT can thus be increased by accurately detecting the boundary surface of the object.
    Type: Grant
    Filed: September 17, 2020
    Date of Patent: November 29, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Hidemitsu Asano, Masato Kon
  • Publication number: 20220373316
    Abstract: A surface texture measuring machine includes: a parameter setting unit configured to set one or more parameters related to a surface texture of a workpiece; a measurement unit configured to calculate a measurement value corresponding to each of the parameters on the basis of displacement measurement data obtainable by scanning a surface of the workpiece or a master workpiece; a judgment value calculation unit configured to calculate a judgment value corresponding to each of the parameters with an assumption that the measurement value of the master workpiece is defined as a reference value and a value having a predetermined ratio relative to the reference value is defined as a tolerance; and a judgment unit configured to compare the measurement value of the workpiece and the judgment value for each of the parameters.
    Type: Application
    Filed: May 23, 2022
    Publication date: November 24, 2022
    Applicant: MITUTOYO CORPORATION
    Inventor: Hiroomi HONDA
  • Patent number: 11506518
    Abstract: The photoelectric rotary encoder includes: a generally disk-shaped scale with a grating-like pattern formed with a predetermined period along a measurement direction, the measurement direction being a direction of rotation of a measurement target that rotates on a predetermined axis, the scale being plate-like and centered on an axis of rotation; and a head that detect, from the scale, the amount of displacement caused by the rotation of the measurement target. The head includes a light source, a diffraction unit with grating parts, and a light-receiving unit with light-receiving elements. The grating parts of the diffraction unit are formed as deformed grating parts that spread cut wide, from the center on the axis of rotation, along the grating-like pattern of the scale. The light-receiving elements are formed as linear grating parts.
    Type: Grant
    Filed: November 18, 2021
    Date of Patent: November 22, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Yoshiaki Kato, Miyako Mizutani