Patents Assigned to Nanotechnologies, Inc.
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Patent number: 7022996Abstract: In order to provide a radiation detector capable of implementing measurements with a good energy resolution and a high detection efficiency over a broad energy range using a single detector, in the present invention, a radiation detecting element composed of Si semiconductor and the radiation detecting element composed of CdZnTe or CdTe semiconductor are lined up as two layers longitudinally. The radiation detecting element composed of Si semiconductor is taken as a first layer at the side of incidence of the radiation and the radiation detecting element composed of CdZnTe or CdTe semiconductor is taken as a second layer.Type: GrantFiled: May 22, 2003Date of Patent: April 4, 2006Assignee: SII NanoTechnology Inc.Inventors: Yoshiki Matoba, Kazuhiko Kimura
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Patent number: 7018683Abstract: A microscopic projection or a characteristic pattern are formed in the vicinity of a region to be processed before processing using electron beam CVD, during processing an image of a region containing the projection or pattern formed by electron beam CVD is captured to obtain a current position of the projection or pattern, a difference between the position before staring and the current position is treated as a drift amount and processing is restarted at a region that has been subjected to microscopic adjustment of the electron irradiation region.Type: GrantFiled: June 15, 2004Date of Patent: March 28, 2006Assignee: SII NanoTechnology Inc.Inventors: Osamu Takaoka, Ryoji Hagiwara
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Patent number: 7020152Abstract: A network system has a first LAN, a second LAN, and a storage device for storing data accessible from the first LAN and the second LAN. A control apparatus controls accessibility of the data stored in the storage device from the first LAN and the second LAN. The control apparatus includes an access prevention device for preventing access from the first LAN to the second LAN and from the second LAN to the first LAN and a device for overriding a setting of the access prevention device to allow accessibility of the second LAN from the first LAN.Type: GrantFiled: November 2, 1999Date of Patent: March 28, 2006Assignee: SII NanoTechnology Inc.Inventors: Toshio Doi, Masashi Muramatsu, Hiroshi Matsumura, Toshiaki Fujii
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Patent number: 7012214Abstract: Nanopowder synthesis systems in which a pulsed magnetic field is applied to electrodes of precursor material, in close proximity to an electrical discharge arc that is formed between the electrodes, to attain increased yields of nanopowder. A magnet insert of a coating precursor material is used to coat the nanopowder and thereby reduce nanoparticle agglomeration.Type: GrantFiled: September 24, 2003Date of Patent: March 14, 2006Assignee: Nanotechnologies, Inc.Inventors: Kurt A. Schroder, Doug K. Jackson
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Patent number: 7005124Abstract: Antineoplastic dendritic polymer conjugates which are useful drug delivery systems for carrying antineoplastic agents to malignant tumors are prepared by obtaining a dendritic polymer having functional groups which are accessible to an antineoplastic agent capable of interacting with the functional groups, and contacting the dendritic polymer with the antineoplastic agent. The preferred platin-based analogues of the antineoplastic agents conjugated to the dendritic polymer may be administered intravenously, orally, parentally, subcutaneously, intramuscularly, intraarterially or topically to an animal having a malignant tumor in an amount which is effective to inhibit growth of the malignant tumor. The antineoplastic dendritic polymer conjugates exhibit high drug efficiency, high drug carrying capacity, good water solubility, good stability on storage, reduced toxicity, and improved anti-tumor activity in vivo.Type: GrantFiled: October 29, 2001Date of Patent: February 28, 2006Assignee: Dendritic Nanotechnologies, Inc.Inventors: Navid Malik, Ruth Duncan, Donald A. Tomalia, Roseita Esfand
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Patent number: 7002150Abstract: A thin specimen producing method acquires a work amount in a 1-line scan by an FIB under a predetermined condition, measures a remaining work width of a thin film on an upper surface of a specimen by a microscopic length-measuring function, determines a required number of scan lines of work to reach a predetermined width by calculation, and executes a work to obtain a set thickness. The work amount in a one-line scan by the FIB under the predetermined condition is determined by working the specimen in scans of plural lines, measuring the etched dimension by the microscopic length-measuring function, and calculating an average work amount per one-line scan.Type: GrantFiled: May 27, 2004Date of Patent: February 21, 2006Assignee: SII NanoTechnology Inc.Inventors: Kouji Iwasaki, Yutaka Ikku
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Patent number: 6974952Abstract: A radiation detector comprises an energy/electricity converter having a detection area for detecting incident radiation, and electrodes connecting the converter to an external driving circuit for driving the converter to convert energy of the incident radiation detected by the detection area of the converter into an electric signal. A collimator is integrally connected to the converter and has an opening for transmitting radiation to irradiate the detection area of the converter and portions for preventing radiation from irradiating a part of the converter other than the detection area. A spacer is integrally connected to the collimator and the converter for maintaining a preselected distance between the collimator and the detection area of the converter.Type: GrantFiled: April 17, 2003Date of Patent: December 13, 2005Assignee: SII NanoTechnology Inc.Inventors: Toshimitsu Morooka, Keiichi Tanaka, Atsushi Nagata, Kazuo Chinone, Tatsuji Ishikawa
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Patent number: 6965629Abstract: A nanopowder synthesis system having an autofuser device which obviates the need for external power switches, and which accommodates repeated discharges (of the order of 107) between ablating electrodes of precursor material at a high repetition rate (?1 Hz).Type: GrantFiled: June 7, 2004Date of Patent: November 15, 2005Assignee: Nanotechnologies, Inc.Inventors: Kurt A. Schroder, Douglas Keith Jackson, Stephen James Schmidt
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Patent number: 6953519Abstract: In order to establish processing techniques capable of making multi-tip probes with sub-micron intervals and provide such microscopic multi-tip probes, there is provided an outermost surface analysis apparatus for semiconductor devices etc. provided with a function for enabling positioning to be performed in such a manner that there is no influence on measurement in electrical measurements at an extremely small region using this microscopic multi-tip probe, and there are provided the steps of making a cantilever 1 formed with a plurality of electrodes 3 using lithographic techniques, and forming microscopic electrodes 6 minute in pitch by sputtering or gas-assisted etching a distal end of the cantilever 1 using a focused charged particle beam or using CVD.Type: GrantFiled: August 29, 2003Date of Patent: October 11, 2005Assignee: SII NanoTechnology Inc.Inventors: Yoshiharu Shirakawabe, Hiroshi Takahashi, Tadashi Arai
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Patent number: 6948356Abstract: A viscoelasticity measuring instrument for measuring a viscoelasticity of a sample has a temperature detection control unit for obtaining, prior to a practical measurement operation, a measurement executable temperature range for the sample by an experimental temperature control operation and application of AC power. A main measurement control unit carries out a viscoelasticity measurement operation within the temperature range obtained by the temperature detection control unit.Type: GrantFiled: August 6, 2004Date of Patent: September 27, 2005Assignee: SII NanoTechnology Inc.Inventors: Nobuaki Okubo, Jun Nagasawa
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Patent number: 6949745Abstract: An electron beam apparatus has an optical axis, an electron beam source for generating an electron beam directed along the optical axis, and a magnetic field lens having an axis coincident with the optical axis for focusing the electron beam onto a sample which is subjected to a negative voltage so that secondary electrons are emitted from the sample. The magnetic field lens has a conductive cylinder surrounding a part of the optical axis to permit the passage therethrough of an electron beam from the electron beam source. A first detector detects secondary electrons emitted by the sample in a direction away from the optical axis and is disposed at a position generally confronting the conductive cylinder. A second detector is disposed over the conductive cylinder. A Wien filter deflector deflects secondary electrons emitted by the sample toward and for detection by the second detector. The Wien filter deflector is disposed on the optical axis and between the conductive cylinder and the second detector.Type: GrantFiled: May 14, 2003Date of Patent: September 27, 2005Assignee: SII NanoTechnology Inc.Inventor: Akira Yonezawa
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Patent number: 6941798Abstract: A scanning probe is microscope has a cantilever having a probe at a disal end thereof and an oscillator for generating a resonance signal near a resonance of the cantilever. A vibrating device receives the resonance signal as a driving signal for vibrating the cantilever. A variable gain amplifier adjusts a gain of displacement signal corresponding to displacement of the vibrating cantilever so as to satisfy the equation G=(A/A0)*G0 to control a quality factor value of the cantilever resonance to an optimal quality factor value, where G represents a gain value of the variable gain amplifer, A represents a preselected oscillation amplitude of the oscillator, A0 represents an initial oscillation amplitude of the oscillator, and G0 represents a gain value of the variable gain amplifier when the initial oscillation amplitude of the oscillator is A0.Type: GrantFiled: September 16, 2003Date of Patent: September 13, 2005Assignee: SII NanoTechnology Inc.Inventors: Takehiro Yamaoka, Kazutoshi Watanabe, Kazunori Ando, Yoshiharu Shirakawabe
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Publication number: 20050195054Abstract: An electrical connector includes first and second conducting members which are pivotally attached to each other. A portion of the first and second conducting members distal to the pivotal attachment form an electrical contact with the electrode. The first and second conducting members, when operably connected to electric power source, provide parallel current paths for an electric current from the power source to the electrode. The contact is preloaded. Further, the first and second conducting members are configured to provide additional forces at the contact with the electrode in response to the current flow, the additional forces having at least a predetermined value when a value of the electric current has a preselected value. For example, the predetermined value of the additional forces may be determined, using known properties of electrical contacts, so as to ensure that the contact does not fail when the current reaches the preselected value.Type: ApplicationFiled: March 3, 2005Publication date: September 8, 2005Applicant: Nanotechnologies, Inc.Inventor: Douglas Jackson
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Patent number: 6936653Abstract: The invention relates to a composite comprising a weight fraction of single-wall carbon nanotubes and at least one polar polymer wherein the composite has an electrical and/or thermal conductivity enhanced over that of the polymer alone. The invention also comprises a method for making this polymer composition. The present application provides composite compositions that, over a wide range of single-wall carbon nanotube loading, have electrical conductivities exceeding those known in the art by more than one order of magnitude. The electrical conductivity enhancement depends on the weight fraction (F) of the single-wall carbon nanotubes in the composite. The electrical conductivity of the composite of this invention is at least 5 Siemens per centimeter (S/cm) at (F) of 0.5 (i.e. where single-wall carbon nanotube loading weight represents half of the total composite weight), at least 1 S/cm at a F of 0.1, at least 1×10?4 S/cm at (F) of 0.004, at least 6×10?9 S/cm at (F) of 0.Type: GrantFiled: March 14, 2003Date of Patent: August 30, 2005Assignee: Carbon NanoTechnologies, Inc.Inventors: Kenneth O. McElrath, Kenneth A. Smith, Thomas M. Tiano, Margaret E. Roylance
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Patent number: 6934920Abstract: In a sample analysis method, positional coordinates of reference points on a surface of the sample are measured using a first device. Positional coordinates of an object on the surface of the sample to be analyzed are also measured using the first device. A sample piece containing on a surface thereof a preselected number of the reference points and the object is removed from the sample. The sample piece is then mounted on a second device different from the first device. The positional coordinates of the reference points on the surface of the sample piece are then measured using the second device. The positional coordinates of the object on the surface of the sample piece are then calculated using the positional coordinates of the reference points measured by the second device and the positional coordinates of the object measured by the first device. The object on the surface of the sample piece is then analyzed.Type: GrantFiled: October 5, 2001Date of Patent: August 23, 2005Assignee: SII NanoTechnology Inc.Inventors: Toshiaki Fujii, Masamichi Oi, Atsushi Yamauchi
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Patent number: 6932504Abstract: A self-detecting type cantilever for an atomic force microscope (AFM) has an electro-flexural conversion element for converting a flexural amount of the cantilever into an electric current or voltage, a temperature measurement element disposed at a front end portion of the cantilever for measuring a temperature, and a heating element disposed at the front end portion of the cantilever for heating the temperature measurement element. The temperature measurement element and the heating element are superposed with each other on a main face of the cantilever via an electrical insulating layer. As a result, even if the amount of electric energy supplied to the heating element is reduced, it is possible to effectively supply an amount of heat necessary for measurement to the temperature measurement element. Therefore, by minimizing the heat to be supplied to a sample and the cantilever, the respondency of measurement is improved and temperature measurement can be performed with a high degree of accuracy.Type: GrantFiled: March 24, 2003Date of Patent: August 23, 2005Assignee: SII NanoTechnology Inc.Inventors: Hiroshi Takahashi, Yoshiharu Shirakawabe, Tadashi Arai
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Patent number: 6924481Abstract: Automatic pattern matching and shape measurement are enabled by adjusting a brightness level of a microscope image based on information of a local region of the image so that a magnified image of the local region takes on an appropriate brightness and is not affected by brighter peripheral portions of the image, thereby enabling feature extraction of a desired pattern. By using the inventive method in an energized beam apparatus having a sample stage capable of linear and tilting movement, a series of operations including cross section forming, sample tilting, cross section observation, and pattern recognition, may be performed on an automated basis.Type: GrantFiled: May 30, 2002Date of Patent: August 2, 2005Assignee: SII NanoTechnology Inc.Inventors: Yutaka Ikku, Tetsuji Nishimura
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Patent number: 6916389Abstract: A process for producing a mixture of particulates using compressed gas and sonication. The process is particularly useful to mix reactive particulates, such as thermites.Type: GrantFiled: August 13, 2002Date of Patent: July 12, 2005Assignee: Nanotechnologies, Inc.Inventors: David Richard Pesiri, Robert C. Dye
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Patent number: 6911979Abstract: A derived data display adjustment system for a sample analyzer allows user selection of one or more displayed images to be subjected to a derived data calculation process. A derived data user interface is displayed on a display screen in response to user selection of one or more displayed images to enable user selection of a derived data calculation process. A determination is made as to whether or not display of the derived data may be achieved without interfering with other displayed images. If not, a derived data adjustment user interface is displayed to enable a user to select a convenient display location for display of the derived data.Type: GrantFiled: December 4, 2001Date of Patent: June 28, 2005Assignee: SII NanoTechnology Inc.Inventor: Rintaro Nakatani
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Patent number: 6904791Abstract: A scanning probe microscope simply and accurately confirms whether or not a sample shape satisfies specified conditions. A pseudo reference image Sref1 comprises a pair of reference line profiles Lref1 and Lref2 arranged apart from each other in parallel. An operator moves and rotates the position of the pseudo reference image Sref1 on a screen so that a sample shape line profile fits between the reference line profiles Lref1 and Lref2 of the pseudo reference image Sref1. If it is possible to fit the line profile of the sample shape between the reference line profiles Lref1 and Lref2, it is determined that the sample shape is in spec, while if it is not possible to fit the line profile of the sample shape between the reference line profiles Lref1 and Lref2, no matter how the pseudo reference image Sref1 is moved and rotated, it is determined that the sample shape is out of spec.Type: GrantFiled: May 14, 2003Date of Patent: June 14, 2005Assignee: SII NanoTechnology Inc.Inventor: Akihiko Honma