Patents Assigned to Nova
  • Patent number: 10082390
    Abstract: Methods and systems for feed-forward of multi-layer and multi-process information using XPS and XRF technolgies are disclosed. In an example, a method of thin film characterization includes measuring first XPS and XRF intensity signals for a sample having a first layer above a substrate. A thickness of the first layer is determined based on the first XPS and XRF intensity signals. The information for the first layer and for the substrate is combined to estimate an effective substrate. Second XPS and XRF intensity signals are measured for a sample having a second layer above the first layer above the substrate. The method also involves determining a thickness of the second layer based on the second XPS and XRF intensity signals, the thickness accounting for the effective substrate.
    Type: Grant
    Filed: June 19, 2015
    Date of Patent: September 25, 2018
    Assignee: NOVA MEASURING INSTRUMENTS INC.
    Inventors: Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael C. Kwan, Mark Klare, Charles Thomas Larson
  • Patent number: 10072111
    Abstract: A solid, spheroidal polymerization catalyst having a particle size distribution characterized by a Dm*/Dn of less than 3.0, the catalyst comprising a phosphinimine catalyst, a cocatalyst and a magnesium chloride support. A process for the polymerization of ethylene with one or more alpha olefin catalyzed by a solid, spheroidal polymerization catalyst having a particle size distribution characterized by a Dm*/Dn of less than 3.0, the catalyst comprising a phosphinimine catalyst, a cocatalyst and a magnesium chloride support.
    Type: Grant
    Filed: January 22, 2018
    Date of Patent: September 11, 2018
    Assignee: NOVA Chemicals (International) S.A.
    Inventors: Qinyan Wang, Tyler Craig, Savina Udara Suduweli Kondage, Bradley Wade Funk
  • Patent number: 10071895
    Abstract: High density (density ?0.945 g/cm3) unimodal polyethylene compositions for use in hot-fill closures and processes.
    Type: Grant
    Filed: December 10, 2015
    Date of Patent: September 11, 2018
    Assignee: NOVA Chemicals (International) S.A.
    Inventors: XiaoChuan Wang, Mark Rejman, Ronald William Lewoniuk, Ian Robert Gibbons, Eric Paul Brusset
  • Patent number: 10073045
    Abstract: An optical method and system are presented for use in measurement of isolated features of a structure. According to this technique, Back Focal Plane Microscopy (BFM) measurements are applied to a structure and measured data indicative thereof is obtained, wherein the BFM measurements utilize dark-field detection mode while applying pinhole masking to incident light propagating through an illumination channel towards the structure, the measured data being thereby indicative of a scattering matrix characterizing scattering properties of the structure, enabling identification of one or more isolated features of the structure.
    Type: Grant
    Filed: July 24, 2013
    Date of Patent: September 11, 2018
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Gilad Barak, Yanir Hainick, Dror Shafir
  • Patent number: 10071826
    Abstract: High density (density ?0.950 g/cm3) polyethylene compositions for use in hot fill closures and processes.
    Type: Grant
    Filed: January 19, 2016
    Date of Patent: September 11, 2018
    Assignee: NOVA Chemicals (International) S.A.
    Inventor: XiaoChuan Wang
  • Publication number: 20180251882
    Abstract: An anti-coking surface having a thickness up to 15 microns comprising from 15 to 50 wt. % of MnCr2O4; from 15 to 25 wt. % of Cr0.23Mn0.08Ni0.69, from 10 to 30 wt. % of Cr1.3Fe0.7O3, from 12 to 20 wt. % of Cr2O3, from 4 to 20 wt. % of CuFe5O8, and less than 5 wt. % of one or more compounds chosen from FeO(OH), Cr+3O(OH), CrMn, Si and SO2 (either as silicon oxide or quartz) and less than 0.5 wt. % of aluminum in any form provided that the sum of the components is 100 wt. % is provided on steel.
    Type: Application
    Filed: February 21, 2018
    Publication date: September 6, 2018
    Applicant: NOVA Chemicals (International) S.A.
    Inventors: Evan Mah, Vasily Simanzhenkov, Leslie Benum, Hany Farag, Bolaji Olayiwola
  • Patent number: 10066936
    Abstract: An article is presented configured for controlling a multiple patterning process, such as a spacer self-aligned multiple patterning, to produce a target pattern. The article comprises a test site carrying a test structure comprising at least one pair of gratings, wherein first and second gratings of the pair are in the form of first and second patterns of alternating features and spaces and differ from the target pattern by respectively different first and second values which are selected to provide together a total difference such that a differential optical response from the test structure is indicative of a pitch walking effect.
    Type: Grant
    Filed: March 10, 2015
    Date of Patent: September 4, 2018
    Assignee: NOVA MEASURING INSTRUMENTS LTD
    Inventor: Igor Turovets
  • Patent number: 10070158
    Abstract: Digital files are compressed using a process including Schmidt decompositions of matrices using an algorithm, termed ‘BSD’ herein, which is based on an algebraic method generalizing QR decomposition. Software analyzes an input file and initially identifies a matrix M, with entries within a predefined set of integers, within the file. Next, essential entries are defined, extracted from M, that contain sufficient information to recover M using BSD. The compressed file includes the essential entries and their positions within M. To achieve an encryption process, software encrypts the pattern matrix that includes the positions of the essential entries of M. To achieve a lossy compression, software identifies essential entries that contain sufficient information to recover an approximation to M for which the quality is determined by an error threshold. For a more efficient lossy compression, software uses singular value decomposition, BSD, and other signal processing of M.
    Type: Grant
    Filed: August 21, 2015
    Date of Patent: September 4, 2018
    Assignee: NOVA SOUTHEASTERN UNIVERSITY
    Inventor: Abdelkrim Bourouihiya
  • Patent number: 10066093
    Abstract: Barrier films are prepared from a blend of two high density polyethylene blend components and a high performance organic nucleating agent. The two high density polyethylene blend components have substantially different melt indices. Large reductions in the moisture vapor transmission rate of the film are observed in the presence of the nucleating agent when the melt indices of the two blend components have a ratio of greater than 10/1. The resulting barrier films are suitable for the preparation of packaging for dry foods such as crackers and breakfast cereals.
    Type: Grant
    Filed: November 14, 2017
    Date of Patent: September 4, 2018
    Assignee: NOVA Chemicals (International) S.A.
    Inventors: Norman Dorien Joseph Aubee, Douglas Checknita, P Scott Chisholm, Patrick Lam, Sarah Marshall, Denny Paul Sauvageau, Tony Tikuisis, Tingting Yu Chuang
  • Publication number: 20180236432
    Abstract: Oxidative dehydrogenation of paraffins to olefins provides a lower energy route to produce olefins. Oxidative dehydrogenation processes may be integrated with a number of processes in a chemical plant such as polymerization processes, manufacture of glycols, and carboxylic acids and esters. Additionally, oxidative dehydrogenation processes can be integrated with the back end separation process of a conventional steam cracker to increase capacity at reduced cost.
    Type: Application
    Filed: April 26, 2018
    Publication date: August 23, 2018
    Applicant: NOVA Chemicals (International) S.A.
    Inventors: Vasily Simanzhenkov, Leonid Modestovich Kustov, Aleksey Victorovich Kucherov, Elena Dmitrievna Finashina, Xiaoliang Gao, Edward Christopher Foy, Claire Jeannine Ennis
  • Patent number: 10053565
    Abstract: This disclosure relates to multilayer films having improved caulkability. These multilayer films have at least one layer containing an ethylene interpolymer product, or a blend containing an ethylene interpolymer product, where the ethylene interpolymer product has: a Dilution Index (Yd) greater than 0; total catalytic metal ?3.0 ppm; ?0.03 terminal vinyl unsaturations per 100 carbon atoms, and; optionally a Dimensionless Modulus (Xd) greater than 0. The ethylene interpolymer products have a melt index from about 0.4 to about 100 dg/minute, a density from about 0.950 to about 0.970 g/cm3, a polydispersity (Mw/Mn) from about 2 to about 25 and a CDBI50 from about 55% to about 97%. Further, the ethylene interpolymer products are a blend of at least two ethylene interpolymers; where one ethylene interpolymer is produced with a single-site catalyst formulation and at least one ethylene interpolymer is produced with a heterogeneous catalyst formulation.
    Type: Grant
    Filed: November 2, 2016
    Date of Patent: August 21, 2018
    Assignee: NOVA Chemicals (International) S.A.
    Inventors: Daniel Ward, Michael Li, Xiaochuan Wang, Tieqi Li, Christopher John Brooke Dobbin, Fazle Sibtain, Kenneth Edward Taylor, Hamidreza Khakdaman
  • Patent number: 10053564
    Abstract: This disclosure relates to caps and closures manufactured from an ethylene interpolymer product, or a blend containing an ethylene interpolymer product, where the ethylene interpolymer product has: a Dilution Index (Yd) greater than 0; total catalytic metal ?3.0 ppm; ?0.03 terminal vinyl unsaturations per 100 carbon atoms, and; optionally a Dimensionless Modulus (Xd) greater than 0. The ethylene interpolymer products have a melt index from about 0.4 to about 20 dg/minute, a density from about 0.948 to about 0.968 g/cm3, a polydispersity (Mw/Mn) from about 2 to about 25 and a CDBI50 from about 54% to about 98%. Further, the ethylene interpolymer products are a blend of at least two ethylene interpolymers; where one ethylene interpolymer is produced with a single-site catalyst formulation and at least one ethylene interpolymer is produced with a heterogeneous catalyst formulation.
    Type: Grant
    Filed: October 20, 2016
    Date of Patent: August 21, 2018
    Assignee: NOVA Chemicals (International) S.A.
    Inventors: XiaoChuan Wang, Tieqi Li, Christopher John Brooke Dobbin, Fazle Sibtain, Kenneth Edward Taylor, Hamidreza Khakdaman
  • Patent number: 10056242
    Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: August 21, 2018
    Assignee: Nova Measuring Instruments Inc.
    Inventors: David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt, Chris Bevis
  • Patent number: 10054423
    Abstract: Method and system for measuring one or more parameters of a patterned structure, using light source producing an input beam of at least partially coherent light in spatial and temporal domains, a detection system comprising a position sensitive detector for receiving light and generating measured data indicative thereof, an optical system configured for focusing the input light beam onto a diffraction limited spot on a sample's surface, collecting an output light returned from the illuminated spot, and imaging the collected output light onto a light sensitive surface of the position sensitive detector, where an image being indicative of coherent summation of output light portions propagating from the structure in different directions.
    Type: Grant
    Filed: December 26, 2013
    Date of Patent: August 21, 2018
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Dror Shafir, Gilad Barak, Shay Wolfling
  • Publication number: 20180230255
    Abstract: The present disclosure provides high density polyethylene resins having good low temperature impact resistance. The resins are suitable for use in rotomolding application for large parts. The resin is a bi- or trimodal resin produced using solution phase polymerization in the presence of a single site catalyst.
    Type: Application
    Filed: April 12, 2018
    Publication date: August 16, 2018
    Applicant: NOVA Chemicals (International) S.A.
    Inventors: Celine Bellehumeur, Mark Hoidas
  • Publication number: 20180230298
    Abstract: This disclosure relates to caps and closures manufactured from an ethylene interpolymer product, or a blend containing an ethylene interpolymer product.
    Type: Application
    Filed: February 16, 2017
    Publication date: August 16, 2018
    Applicant: NOVA Chemicals (International) S.A.
    Inventors: Xiaochuan Wang, Tieqi Li, Fazle Sibtain, Christopher Dobbin, Kenneth Taylor, Hamidreza Khakdaman, Brian Molloy
  • Patent number: 10048595
    Abstract: A method of controlling a manufacturing process, the method including the steps of a) providing a testing area with a periodic structure, where the periodic structure includes a series of sets of patterned features, b) illuminating the periodic structure with a light, thereby producing a non-zero order diffraction signal, c) collecting the diffraction signal to produce a test signature, d) matching the test signature with a reference signature, where the reference signature was previously produced by performing steps a), b), and c) with respect to a reference structure that is at least similar to the periodic structure, and e) controlling a manufacturing process using a control setting set associated with the matching reference signature.
    Type: Grant
    Filed: February 13, 2017
    Date of Patent: August 14, 2018
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventor: Boaz Brill
  • Patent number: 10041838
    Abstract: A metrology system is presented for measuring parameters of a structure. The system comprises: an optical system and a control unit. The optical system is configured for detecting light reflection of incident radiation from the structure and generating measured data indicative of angular phase of the detected light components corresponding to reflections of illuminating light components having different angles of incidence. The control unit is configured for receiving and processing the measured data and generating a corresponding phase map indicative of the phase variation along at least two dimensions, and analyzing the phase map using modeled data for determining one or more parameters of the structure.
    Type: Grant
    Filed: February 23, 2015
    Date of Patent: August 7, 2018
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Gilad Barak, Dror Shafir, Danny Grossman
  • Patent number: PP29632
    Abstract: A new and distinct Heuchera plant characterized by purple to silver colored leaves with dark to green veins, medium large, slightly lobed, geranium-like leaves, light pink flowers in spring on upright flowering stems in spring on upright flowering stems, good sun tolerance, a large, mounding habit with excellent crown count, and excellent vigor.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: August 28, 2018
    Assignee: Terra Nova Nurseries, Inc.
    Inventor: Janet N. Egger
  • Patent number: PP29644
    Abstract: A new and distinct Heuchera plant characterized by glossy, red to burgundy colored leaves, medium size, lobed and lightly ruffled leaves, small pink flowers in short spikes in August, good sun tolerance, a medium, low mounding habit with excellent crown count, and excellent vigor.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: September 4, 2018
    Assignee: Terra Nova Nurseries, Inc.
    Inventor: Janet N. Egger