Patents Assigned to Particle Measuring Systems, Inc.
  • Publication number: 20260140038
    Abstract: A particle detection system may include a laser optical source providing a beam of electromagnetic radiation, one or more beam shaping elements for receiving the beam of electromagnetic radiation, an optical isolator disposed in the path of the beam, between the laser source and the one or more beam shaping elements, a particle interrogation zone disposed in the path of the beam, wherein particles in the particle interrogation zone interact with the beam of electromagnetic radiation, and a first photodetector configured to detect light scattered and/or transmitted from the particle interrogation zone, a second photodetector configured to monitor power of the beam, and a controller configured to adjust the beam power based on a signal from the second photodetector, wherein the optical isolator is configured to filter optical feedback from the particle detection system out of an optical path leading to the second photodetector.
    Type: Application
    Filed: November 19, 2025
    Publication date: May 21, 2026
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian A. KNOLLENBERG, Dwight SEHLER, Saeid ROSTAMI
  • Publication number: 20260092840
    Abstract: Provided herein are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.
    Type: Application
    Filed: May 15, 2025
    Publication date: April 2, 2026
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Giovanni SCIALO, Davide RECCHIA
  • Patent number: 12461010
    Abstract: A method for reducing false-positive particle detection events of an optical particle detection system includes: filtering raw particle count data to produce filtered particle count data. The filtering includes: temporarily storing the raw particle count data for a buffering time period; segmenting the raw particle count data into a series of elemental data intervals; examining each elemental data interval for a noise signature; identifying a noise signature in the segmented raw particle count data; in response to the identified noise signature, flagging one or more sequential elemental data intervals as corresponding to a noise event; and removing the one or more flagged elemental data intervals from the raw particle count data to produce the filtered particle count data, and/or generating replacement data and substituting the replacement data for the one or more flagged elemental data intervals to produce the filtered particle count data.
    Type: Grant
    Filed: November 14, 2024
    Date of Patent: November 4, 2025
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Joseph Thomas Cilke, Brett Haley, Scott Maclaughlin, Brian A. Knollenberg, Benjamin Martinez, Clayton Ellinwood
  • Publication number: 20250334502
    Abstract: A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam and a reference beam. The particle interrogation zone may be disposed in the path of the interrogation beam. The reflecting surface may be configured to reflect the interrogation beam back on itself. The second beam splitter may be configured to: (i) receive the reference beam and side scattered light from one or more particles interacting with the interrogation beam in the particle interrogation zone; and (ii) produce a first component beam and second component beam. The first photodetector may be configured to detect the first component beam. The second photodetector may be configured to detect the second component beam.
    Type: Application
    Filed: May 12, 2025
    Publication date: October 30, 2025
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Mehran Vahdani MOGHADDAM, Brian A. KNOLLENBERG, Dwight SEHLER
  • Patent number: 12422341
    Abstract: A manifold system and methods of collecting samples, where the manifold system comprises multiple input sample ports and a preferably rotatable flow focusing element. The manifold system is able to sample aerosols and gases from multiple sample points, such as from cleanrooms and manufacturing environments, for collection and analysis. The flow focusing element reduces cross talk and cross contamination of particles, including nanoparticles, between different samples.
    Type: Grant
    Filed: June 14, 2022
    Date of Patent: September 23, 2025
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Edward Yates, Cary Hertert, Brian A. Knollenberg, Jonathan Skuba
  • Patent number: 12399114
    Abstract: Modular docking station and methods for sampling and monitoring gas and other fluids, where a sampling device is able to be removably attached to the docking station, thereby allowing the sampling device to be replaced without having to remove or disconnect the docking station from the rest of the sampling system. This allows the docking station to remain connected to the rest of the system with minimal or no interruption and reduces maintenance costs and time when replacing the sampling device.
    Type: Grant
    Filed: June 14, 2022
    Date of Patent: August 26, 2025
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian A. Knollenberg, Edward Yates, Daniel Rodier
  • Patent number: 12399102
    Abstract: An optical system for particle size and concentration analysis, includes: at least one laser that produces an illuminating beam; a focusing lens that focuses the illuminating beam on particles that move relative to the illuminating beam at known or pre-defined angles to the illuminating beam through the focal region of the focusing lens; and at least two forward-looking detectors, that detect interactions of particles with the illuminating beam in the focal region of the focusing lens. The focusing lens is a cylindrical lens that forms a focal region that is: (i) narrow in the direction of relative motion between the particles and the illuminating beam, and (ii) wide in a direction perpendicular to a plane defined by an optical axis of the system and the direction of relative motion between the particles and the illuminating beam. Each of the two forward-looking detectors is comprised of two segmented linear arrays of detectors.
    Type: Grant
    Filed: August 11, 2023
    Date of Patent: August 26, 2025
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Nir Karasikov, Ori Weinstein, Shoam Shwartz, Mehran Vahdani Moghaddam, Uri Dubin
  • Patent number: 12399089
    Abstract: Disclosed is a liquid impinger, for example a liquid impinger, particularly a disposable liquid impinger. The liquid impinger comprises, for example, at least one nozzle positioned in the interior and attached to the bottom portion. In some aspects, the liquid impinger comprises a polymeric material. Also disclosed are methods of making the liquid impinger comprising, for example, forming at least two components, assembling the at least two components into the liquid impinger, filling the liquid impinger with liquid, and exposing the filled liquid impinger to radiation for sterilization prior to use. Also disclosed are methods of using the liquid impinger, for example, by transporting a gas comprising analytes through the liquid impinger and transferring at least a portion of the analytes from the gas into the liquid contained therein.
    Type: Grant
    Filed: June 24, 2022
    Date of Patent: August 26, 2025
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Giovanni Scialò, Davide Recchia
  • Patent number: 12352671
    Abstract: Provided are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.
    Type: Grant
    Filed: January 23, 2024
    Date of Patent: July 8, 2025
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Giovanni Scialo, Davide Recchia
  • Publication number: 20250216316
    Abstract: Particle detection systems and methods are disclosed. In one embodiment, a particle detection system comprises an incident beam light source that emits an incident beam, a particle interrogation zone disposed in the path of the incident beam, a photodetector disposed to detect the incident beam after passing through the particle interrogation zone, a pump beam light source for emitting a pump beam, the pump beam being targeted at the particle interrogation zone, wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of light from the incident beam, scattered light due to incident beam scattering in the particle interrogation zone, and scattered light due to pump beam scattering in the particle interrogation zone.
    Type: Application
    Filed: February 27, 2025
    Publication date: July 3, 2025
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Daniel RODIER, Mehran Vahdani MOGHADDAM, Christopher A. BONINO
  • Patent number: 12326393
    Abstract: A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam and a reference beam. The particle interrogation zone may be disposed in the path of the interrogation beam. The reflecting surface may be configured to reflect the interrogation beam back on itself. The second beam splitter may be configured to: (i) receive the reference beam and side scattered light from one or more particles interacting with the interrogation beam in the particle interrogation zone; and (ii) produce a first component beam and second component beam. The first photodetector may be configured to detect the first component beam. The second photodetector may be configured to detect the second component beam.
    Type: Grant
    Filed: January 19, 2023
    Date of Patent: June 10, 2025
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Mehran Vahdani Moghaddam, Brian A. Knollenberg, Dwight Sehler
  • Publication number: 20250180460
    Abstract: A method for reducing false-positive particle detection events of an optical particle detection system includes: filtering raw particle count data to produce filtered particle count data. The filtering includes: temporarily storing the raw particle count data for a buffering time period; segmenting the raw particle count data into a series of elemental data intervals; examining each elemental data interval for a noise signature; identifying a noise signature in the segmented raw particle count data; in response to the identified noise signature, flagging one or more sequential elemental data intervals as corresponding to a noise event; and removing the one or more flagged elemental data intervals from the raw particle count data to produce the filtered particle count data, and/or generating replacement data and substituting the replacement data for the one or more flagged elemental data intervals to produce the filtered particle count data.
    Type: Application
    Filed: November 14, 2024
    Publication date: June 5, 2025
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Joseph Thomas CILKE, Brett HALEY, Scott MACLAUGHLIN, Brian A. KNOLLENBERG, Benjamin MARTINEZ, Clayton ELLINWOOD
  • Patent number: 12313514
    Abstract: The present invention provides a system and method of particle size and concentration measurement that comprises the steps of: providing a focused, synthesized, structured laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration.
    Type: Grant
    Filed: January 6, 2022
    Date of Patent: May 27, 2025
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventor: Joseph Shamir
  • Patent number: 12276592
    Abstract: Particle detection systems and methods are disclosed. In one embodiment, a particle detection system comprises an incident beam light source that emits an incident beam, a particle interrogation zone disposed in the path of the incident beam, a photodetector disposed to detect the incident beam after passing through the particle interrogation zone, a pump beam light source for emitting a pump beam, the pump beam being targeted at the particle interrogation zone, wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of light from the incident beam, scattered light due to incident beam scattering in the particle interrogation zone, and scattered light due to pump beam scattering in the particle interrogation zone.
    Type: Grant
    Filed: June 8, 2021
    Date of Patent: April 15, 2025
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Daniel Rodier
  • Patent number: 12270817
    Abstract: Devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors including a sampling head comprising one or more intake apertures, a selectively removable cover, an impactor base connected to the sampling head, and one or more magnets fixed to the sampling head, the selectively removable cover and/or the impactor base. The one or more magnets allow for robotic manipulation of the impactor devices.
    Type: Grant
    Filed: December 20, 2023
    Date of Patent: April 8, 2025
    Assignees: PARTICLE MEASURING SYSTEMS, INC., PHARMA INTEGRATION S.R.L.
    Inventors: Giovanni Scialò, Davide Recchia, Claudio Bechini
  • Patent number: 12231890
    Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.
    Type: Grant
    Filed: December 13, 2022
    Date of Patent: February 18, 2025
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Matt Michaelis, Daniele Pandolfi, Brett Haley
  • Patent number: 12130222
    Abstract: Disclosed is a method for detecting and/or growing particles, comprising controlling the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Also disclosed is an apparatus or system for detecting and/or growing particles, comprising a fluidics system configured to control the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Certain aspects do not employ one or more porous structures for vapor generation, nor a separate carrier fluid flow or inlet comprising a carrier fluid and vaporized working liquid for combining with the sample flow in the saturator region.
    Type: Grant
    Filed: June 14, 2022
    Date of Patent: October 29, 2024
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Edward Yates, Cary Hertert, Brian A. Knollenberg
  • Publication number: 20240264066
    Abstract: A method of calibrating an optical particle counter may include performing first and second calibration procedures. The first calibration procedure may include performing sensitivity calibration and/or channel size calibration of the optical particle counter under calibration using a monodispersed particle standard. The second calibration procedure may include sample volume calibration. The sample volume calibration may include: flowing a polydispersed particle calibration sample dispersed in a fluid through the optical particle counter under calibration to produce a first signal output; flowing the polydispersed particle calibration sample dispersed in the fluid through a reference optical particle counter to produce a reference signal output; comparing the first signal output with the reference signal output; and adjusting, in response to the comparing, an effective sample volume parameter stored in a computer readable memory of the optical particle counter under calibration.
    Type: Application
    Filed: February 5, 2024
    Publication date: August 8, 2024
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventor: Brian A. KNOLLENBERG
  • Publication number: 20240230509
    Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.
    Type: Application
    Filed: October 27, 2023
    Publication date: July 11, 2024
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
  • Publication number: 20240219412
    Abstract: Provided herein are systems and methods for sampling of controlled environments, including automated and/or robotically controlled sampling. The present systems and methods are useful for determining the presence of, quantity, size, concentration, viability, species or characteristics of particles, including viable biological particles, within a controlled environment. The described systems and methods may utilize rotational motion via robotics, automation and/or control systems to reduce, or eliminate, some or all of the steps carried out by human operators in traditional particle collection and/or analysis methodologies. The described systems and methods may rotational motion via robotics, automation and/or control systems to provide for particle sampling over time periods that are well-defined for an individual impactor and/or sequential sampling via a plurality of impactors.
    Type: Application
    Filed: December 18, 2023
    Publication date: July 4, 2024
    Applicants: PARTICLE MEASURING SYSTEMS, INC., PHARMA INTEGRATION S.R.L
    Inventors: Giovanni SCIALÒ, Davide RECCHIA, Claudio BECHINI