Patents Assigned to Particle Measuring Systems, Inc.
  • Patent number: 10928293
    Abstract: Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.
    Type: Grant
    Filed: September 3, 2019
    Date of Patent: February 23, 2021
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Brian A. Knollenberg, Daniel Robert Rodier
  • Publication number: 20210044978
    Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.
    Type: Application
    Filed: August 7, 2020
    Publication date: February 11, 2021
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Matt MICHAELIS, Daniele PANDOLFI, Brett HALEY
  • Patent number: 9631222
    Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.
    Type: Grant
    Filed: March 12, 2015
    Date of Patent: April 25, 2017
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Cliff Ketcham, Paul B. Hartigan, Ronald W. Adkins
  • Publication number: 20160002700
    Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.
    Type: Application
    Filed: March 12, 2015
    Publication date: January 7, 2016
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
  • Publication number: 20150355000
    Abstract: Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.
    Type: Application
    Filed: March 12, 2015
    Publication date: December 10, 2015
    Applicant: Particle Measuring Systems, Inc
    Inventors: Thomas BATES, Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
  • Patent number: 8869593
    Abstract: The invention provides an apparatus for increasing the size of gas-entrained particles in order to render the gas-entrained particles detectable by a particle detector, the apparatus comprising an evaporation chamber (2) and a condenser (7); the apparatus is configured so that vapour-laden gas from the evaporation chamber can flow into the condenser and condensation of the vaporisable substance onto gas-entrained particles in the condenser takes place to increase the size of the particles so that they are capable of being detected by a particle detector.
    Type: Grant
    Filed: May 8, 2009
    Date of Patent: October 28, 2014
    Assignee: Particle Measuring Systems Inc.
    Inventors: Boris Zachar Gorbunov, Harald Wilhelm Julius Gnewuch
  • Patent number: 8800383
    Abstract: Provided are devices and methods for monitoring flow rate in aerosol particle counters. The particle sensor has a particle counter, a flow measurement orifice comprising a differential pressure sensor for measuring differential pressure (DP) across the flow measurement orifice during particle sensor operation and a critical flow orifice. A vacuum source pulls ambient gas through each of the particle counter, flow measurement orifice and critical flow orifice. An atmospheric pressure sensor measures atmospheric pressure (AP) and a bench pressure sensor measures pressure in the particle sensor (BP). The output from the sensors is used to identify a flow condition, such as by a monitor operably connected to each of the differential pressure sensor, atmospheric pressure sensor and bench pressure sensor. In this manner, deviation in flow rate from a target flow rate is readily monitored without the need for expensive sensors or other flow-controlling components.
    Type: Grant
    Filed: August 24, 2010
    Date of Patent: August 12, 2014
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Thomas Bates
  • Patent number: 8427642
    Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
    Type: Grant
    Filed: February 14, 2012
    Date of Patent: April 23, 2013
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Karen R. Sandberg
  • Publication number: 20120222495
    Abstract: Provided are devices and methods for monitoring flow rate in aerosol particle counters. The particle sensor has a particle counter, a flow measurement orifice comprising a differential pressure sensor for measuring differential pressure (DP) across the flow measurement orifice during particle sensor operation and a critical flow orifice. A vacuum source pulls ambient gas through each of the particle counter, flow measurement orifice and critical flow orifice. An atmospheric pressure sensor measures atmospheric pressure (AP) and a bench pressure sensor measures pressure in the particle sensor (BP). The output from the sensors is used to identify a flow condition, such as by a monitor operably connected to each of the differential pressure sensor, atmospheric pressure sensor and bench pressure sensor. In this manner, deviation in flow rate from a target flow rate is readily monitored without the need for expensive sensors or other flow-controlling components.
    Type: Application
    Filed: August 24, 2010
    Publication date: September 6, 2012
    Applicant: Particle Measuring Systems, Inc.
    Inventor: Thomas Bates
  • Patent number: 8174697
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Grant
    Filed: September 26, 2011
    Date of Patent: May 8, 2012
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, legal representative, Dwight A. Sehler
  • Patent number: 8154724
    Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: April 10, 2012
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Jon Sandberg, Karen R. Sandberg, legal representative
  • Patent number: 8027035
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Grant
    Filed: March 8, 2011
    Date of Patent: September 27, 2011
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, Legal Representative, Dwight A. Sehler
  • Patent number: 7985949
    Abstract: Methods and systems are provided for detecting analytes in a gas phase sample. An ion mobility spectrometer is provided for detecting analytes having an excess amount of dopant in its separation region. In an embodiment, the dopant is added directly to the separation region, such as with a drift gas or by diffusion, thereby providing excess dopant that dominates subsequent cluster formation and maintenance. Excess dopant in the separation region minimizes or reduces interfering signals associated with unwanted substances, such as water vapor, that are introduced to the IMS. In an aspect, the invention provides IMS systems and methods having increased sensitivity and reliability for analyte detection.
    Type: Grant
    Filed: July 30, 2008
    Date of Patent: July 26, 2011
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Dan Rodier
  • Patent number: 7973929
    Abstract: Described herein is a portable, low power consuming optical particle counter calibration verification system and reliable and sensitive methods for verifying the calibration status of a gas or liquid particle counter. The calibration verification systems described herein are useful for quickly determining the calibration status of an optical particle counter at its point of use, as well as for allowing the end user to determine if an optical particle counter is in need of a recalibration before the recommended calibration schedule suggests.
    Type: Grant
    Filed: November 14, 2008
    Date of Patent: July 5, 2011
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Thomas Bates
  • Publication number: 20110155927
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Application
    Filed: March 8, 2011
    Publication date: June 30, 2011
    Applicant: Particle Measuring Systems, Inc.
    Inventors: John MITCHELL, Jon Sandberg, Dwight A. Sehler, Karen R. Sandberg
  • Patent number: 7916293
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: March 29, 2011
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, legal representative, Dwight A. Sehler
  • Patent number: 7796255
    Abstract: The invention relates to particle sensors that are capable of passively cooling high-powered optical sources within the sensor, thereby extending the optical source lifetime without requiring additional power. The sensor detects particles within a sample fluid by optical interaction of the optical source with flowing sample fluid in the sample chamber. Sample fluid that exits the sample chamber is directed into thermal contact with the optical source, thereby cooling the optical source. Sample fluid that has come into thermal contact with the optical source is continuously removed from the sensor to ensure the optical source is adequately cooled. A variety of elements are used to facilitate thermal contact between the optical source and sample fluid including plenums, heat sinks, and airflow cavities. Provided are related methods for cooling a one or more heat-producing device within a particle sensor.
    Type: Grant
    Filed: March 21, 2008
    Date of Patent: September 14, 2010
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Rick Miller
  • Patent number: 7667839
    Abstract: A particle sensor for optically detecting an unconstrained particle suspended in a flowing gas includes a sample chamber having a gas inlet and a gas outlet; a gas flow system for flowing said gas from said gas inlet through said sample chamber to said gas outlet, a source of light; an optical system directing said light through said sample chamber, an optical collection system located to collect light scattered by said particles in the gas, and a detection system located to detect the collected light. The total pressure drop through said gas flow system is 3 inches of water or less. The gas flow system includes an axial fan, which may be a high static pressure fan or a counter-rotating fan. In a 1.0 CFM system, the gas inlet nozzle has an area of 25 square millimeters or more.
    Type: Grant
    Filed: March 30, 2006
    Date of Patent: February 23, 2010
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Thomas Bates
  • Patent number: 7576857
    Abstract: A liquid particle counter for optically detecting an unconstrained particle suspended in a flowing liquid includes a sample chamber having a liquid inlet and a liquid outlet; a laser diode module producing a symmetrically collimated laser beam; a beam shaping optical system directing the laser beam at the sample chamber; and an optical detector located to detect light scattered by the particle in the sample chamber, the detector producing an electric signal characteristic of a parameter of the particle. The laser beam has an energy of a watt or more and passed through an aperture in a black glass aperture element in the sample chamber. The black glass aperture element removes diffracted and stray light from the beam without damage to the sample chamber.
    Type: Grant
    Filed: August 20, 2004
    Date of Patent: August 18, 2009
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Gregg A. Wagner
  • Publication number: 20090128810
    Abstract: Described herein is a portable, low power consuming optical particle counter calibration verification system and reliable and sensitive methods for verifying the calibration status of a gas or liquid particle counter. The calibration verification systems described herein are useful for quickly determining the calibration status of an optical particle counter at its point of use, as well as for allowing the end user to determine if an optical particle counter is in need of a recalibration before the recommended calibration schedule suggests.
    Type: Application
    Filed: November 14, 2008
    Publication date: May 21, 2009
    Applicant: Particle Measuring Systems, Inc.
    Inventor: Thomas Bates