Patents Assigned to Particle Measuring Systems, Inc.
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Publication number: 20230009668Abstract: Disclosed is a liquid impinger, for example a liquid impinger, particularly a disposable liquid impinger. The liquid impinger comprises, for example, at least one nozzle positioned in the interior and attached to the bottom portion. In some aspects, the liquid impinger comprises a polymeric material. Also disclosed are methods of making the liquid impinger comprising, for example, forming at least two components, assembling the at least two components into the liquid impinger, filling the liquid impinger with liquid, and exposing the filled liquid impinger to radiation for sterilization prior to use. Also disclosed are methods of using the liquid impinger, for example, by transporting a gas comprising analytes through the liquid impinger and transferring at least a portion of the analytes from the gas into the liquid contained therein.Type: ApplicationFiled: June 24, 2022Publication date: January 12, 2023Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Giovanni SCIALĂ’, Davide RECCHIA
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Patent number: 11540248Abstract: A mobile monitoring device for monitoring controlled contamination areas may include a motorized mobile structure, a sampling unit, and a central management and control unit. The motorized mobile structure is configured to move within an area to be monitored. The sampling unit is positioned on said mobile structure, and configured to perform sampling operations of air and/or surfaces of said area and obtain sampling data. The central management and control unit is operatively connected to the mobile structure and to said sampling unit. The mobile structure may be controlled by the central unit to reach predefined points of the area to be monitored. The sampling unit may be selectively activated and/or deactivated by said central unit in correspondence with said predefined starting points of said sampling operations.Type: GrantFiled: November 3, 2020Date of Patent: December 27, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Giovanni Scialò, Davide Recchia, Claudio Bechini
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Publication number: 20220397495Abstract: A manifold system and methods of collecting samples, where the manifold system comprises multiple input sample ports and a preferably rotatable flow focusing element. The manifold system is able to sample aerosols and gases from multiple sample points, such as from cleanrooms and manufacturing environments, for collection and analysis. The flow focusing element reduces cross talk and cross contamination of particles, including nanoparticles, between different samples.Type: ApplicationFiled: June 14, 2022Publication date: December 15, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Edward YATES, Cary HERTERT, Brian A. KNOLLENBERG, Jonathan SKUBA
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Publication number: 20220397519Abstract: Modular docking station and methods for sampling and monitoring gas and other fluids, where a sampling device is able to be removably attached to the docking station, thereby allowing the sampling device to be replaced without having to remove or disconnect the docking station from the rest of the sampling system. This allows the docking station to remain connected to the rest of the system with minimal or no interruption and reduces maintenance costs and time when replacing the sampling device.Type: ApplicationFiled: June 14, 2022Publication date: December 15, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian A. KNOLLENBERG, Edward YATES, Daniel RODIER
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Publication number: 20220397510Abstract: Disclosed is a method for detecting and/or growing particles, comprising controlling the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Also disclosed is an apparatus or system for detecting and/or growing particles, comprising a fluidics system configured to control the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Certain aspects do not employ one or more porous structures for vapor generation, nor a separate carrier fluid flow or inlet comprising a carrier fluid and vaporized working liquid for combining with the sample flow in the saturator region.Type: ApplicationFiled: June 14, 2022Publication date: December 15, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Edward YATES, Cary HERTERT, Brian A. KNOLLENBERG
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Patent number: 11428619Abstract: Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.Type: GrantFiled: January 20, 2021Date of Patent: August 30, 2022Assignee: Particle Measuring Systems, Inc.Inventors: Brian A. Knollenberg, Daniel Robert Rodier
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Patent number: 11428617Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.Type: GrantFiled: December 29, 2020Date of Patent: August 30, 2022Assignee: Particle Measuring Systems, Inc.Inventors: Brian A. Knollenberg, Daniel Rodier
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Patent number: 11416123Abstract: Provided herein are methods and devices that allow for efficient management of many different sampling locations within a facility. A method for operating a biological sampler, a particle counter, and like air sampling, analysis, and/or monitoring equipment or instrumentation is described, such as by sampling an environment at a sampling position with the biological sampler and storing sample data and other useful information in memory in association with unique identifier(s) including sampling location(s) for the samples. Also provided are associated devices for carrying out the methods.Type: GrantFiled: April 25, 2019Date of Patent: August 16, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniele Pandolfi, Matt Michaelis, Paul B. Hartigan, Cliff Ketcham
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Publication number: 20220236146Abstract: Provided herein are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.Type: ApplicationFiled: December 30, 2021Publication date: July 28, 2022Applicant: Particle Measuring Systems, Inc.Inventors: Giovanni SCIALO, Davide RECCHIA
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Publication number: 20220228963Abstract: The present invention provides a system and method of particle size and concentration measurement that comprises the steps of: providing a focused, synthesized, structured laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration.Type: ApplicationFiled: January 6, 2022Publication date: July 21, 2022Applicant: Particle Measuring Systems, Inc.Inventor: Joseph SHAMIR
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Patent number: 11385161Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.Type: GrantFiled: April 27, 2020Date of Patent: July 12, 2022Assignee: Particle Measuring Systems, Inc.Inventors: Thomas A. Bates, Matt Michaelis, Brett Haley
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Publication number: 20220155212Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: ApplicationFiled: December 16, 2021Publication date: May 19, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel RODIER, James LUMPKIN, Dwight SEHLER, Brian KNOLLENBERG
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Patent number: 11320360Abstract: Provided herein are systems and methods of optical particle counters which account and adjust for the refractive index of the carrier fluid being analyzed. The provided systems are robust and may be implemented in a variety of optical particle counters including obscured light, reflected light, emitted light and scattered light particle counters. The described systems may be useful with any fluid, including gases or liquids. In some cases, the system can account for the differences in refractive index between two liquids, for example, ultrapure water and an acid, such as sulfuric, hydrochloric, hydrofluoric, acetic, phosphoric, chromic phosphoric, and the like. By accounting for the refractive index of the carrier fluid, the described systems and methods are also more sensitive and able to more accurately detect and characterize smaller particles, including nanoscale sized particles.Type: GrantFiled: August 30, 2019Date of Patent: May 3, 2022Assignee: Particle Measuring Systems, Inc.Inventors: James M. Lumpkin, Brian A. Knollenberg, John R. Mitchell
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Patent number: 11268930Abstract: Described herein are monitoring systems and methods, including for airborne molecular contamination (AMC), that combine a sampler, such as an impinger or sorbent tube with a real time analyzer, such as an ion mobility spectrometer (IMS) or optical particle counter. The system may allow for selective sampling in which the sampler is only exposed to the target fluid during periods in which the real time analyzer detects analytes, such as molecular contamination or particles, meeting particular criteria such the composition and/or concentration of analytes. The invention also includes impinger systems having a sampler reservoir comprising an anion leaching resistant material characterized by low anion leach rates in the presence of deionized water.Type: GrantFiled: August 25, 2020Date of Patent: March 8, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, Brian Knollenberg, Isidro Sanchez
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Patent number: 11255760Abstract: Provided herein are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.Type: GrantFiled: November 8, 2019Date of Patent: February 22, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Giovanni Scialo, Davide Recchia
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Patent number: 11250684Abstract: The invention generally provides devices and methods for particle detection for minimizing human-caused contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Methods of the invention may incorporate wirelessly transmitting an alarm signal from a particle detector to a remote device, replicating a graphical user interface of the particle detector on an electronic display of the remote device, and passing one or more user instructions from the remote device to the particle detector via the replicate graphical interface of the remote device.Type: GrantFiled: April 7, 2021Date of Patent: February 15, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Scott MacLaughlin, Matt Michaelis, Brian A. Knollenberg
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Patent number: 11237095Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: GrantFiled: April 24, 2020Date of Patent: February 1, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, James Lumpkin, Dwight Sehler, Brian Knollenberg
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Patent number: 11231345Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.Type: GrantFiled: May 23, 2019Date of Patent: January 25, 2022Assignees: PARTICLE MEASURING SYSTEMS, S.R.L., PARTICLE MEASURING SYSTEMS, INC.Inventors: Giovanni Scialo, Ronald W. Adkins, Davide Recchia
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Patent number: 11215546Abstract: The invention generally provides systems and methods for particle detection for minimizing microbial growth and cross-contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. In some embodiments, systems of the invention incorporate a housing having an outer surface being a first antimicrobial surface and a touchscreen being a second antimicrobial surface. In some embodiments, substantially all of the outer surfaces of the system are antimicrobial surfaces. In some embodiments, the first antimicrobial surface may comprise an Active Screen Plasma alloyed layer. In some embodiments, the housing may comprise a molded polymer substrate and a metal coating layer bonded to the molded polymer substrate such that at least some exterior surfaces of the housing are metal coated surfaces.Type: GrantFiled: October 6, 2020Date of Patent: January 4, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Scott MacLaughlin, Jon Skuba
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Publication number: 20210404936Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.Type: ApplicationFiled: April 27, 2020Publication date: December 30, 2021Applicant: Particle Measuring Systems, Inc.Inventors: Thomas A. BATES, Matt MICHAELIS, Brett HALEY