Patents Assigned to Particle Measuring Systems, Inc.
-
Publication number: 20030235926Abstract: A flow-through monitor for detecting molecular contamination (MC) within a fluid flow. The monitor has a diffusion chamber having an inlet port and an outlet port, and a structure for supporting a fluid flow from the inlet port to the outlet port. The structure includes a flow gap causing a diffusion of molecular contaminants into the diffusion chamber, while substantially preventing, for a rate of the fluid flow above a predetermined magnitude, particulate contaminants within the fluid from entering the diffusion chamber. A SAW device detects molecular contamination interior to the diffusion chamber. Fluid input to the flow-through monitor may be diluted by a pure fluid for extended monitor life. A system for aggregate sampling connects an ensemble manifold upstream of the flow-through monitor. A system for triggered sampling connects a sample preconcentrator downstream of the flow-through monitor. A chemically selective membrane may be located between the flow gap and the SAW.Type: ApplicationFiled: June 24, 2002Publication date: December 25, 2003Applicant: Particle Measuring Systems, Inc.Inventors: Brian A. Knollenberg, Daniel Rodier, Scott Waisanen
-
Publication number: 20030233864Abstract: A molecular contamination monitor for monitoring molecular contamination on a surface of a subject surface susceptible to degradation by a molecular contaminant. The monitor includes a surface acoustic wave (SAW) device having a SAW measurement surface coated with a material that is equivalent to the subject material with respect to spontaneous contamination by a contaminant. In the preferred embodiment, the coating comprises the same material as the subject surface or a material that interacts chemically with the contaminant in an equivalent manner to the subject surface. Exemplary coatings include: photoresist, copper, silver, gold, platinum, titanium, tungsten, aluminum, nickel, metal oxides, stearic acid, silicon, gallium arsenide, gallium nitride, germanium, silicon germanium, silicon dioxide, silicon nitride, and glass. Exemplary coating methods include sputtering, CVD, ALD and misted deposition.Type: ApplicationFiled: June 24, 2002Publication date: December 25, 2003Applicant: Particle Measuring Systems, Inc.Inventor: Daniel Rodier
-
Patent number: 6615679Abstract: A system for detecting particles in a clean environment includes and ensemble manifold having a plurality of sample ports, a delivery port, and flow junction having no open-close valves or other flow selectors connecting all of said sample ports to said delivery port. In one embodiment, the ensemble manifold is mounted directly on a particle detector using a snap-on connector. A plurality of fluid sources are located in a clean environment, each of the fluid sources fluidically connected to one of the sample ports.Type: GrantFiled: August 15, 2000Date of Patent: September 9, 2003Assignee: Particle Measuring Systems, Inc.Inventors: Brian A. Knollenberg, Glenn W. Brandon, Bryan Bast
-
Publication number: 20030032366Abstract: An apparatus and method for determining the chemical content of a chemical mechanical planarization (CMP) slurry. A CMP sample cell has windows for passing electromagnetic radiation. Three wavelengths of electromagnetic radiation, one of which is strongly absorbed by said CMP slurry and the other two of which are weakly absorbed by said CMP slurry, are directed through said sample cell to a detector, which processes a signal. A processor utilizes the signal to determine the transmission at each wavelength, then utilizes Beer's law to determine a transmission function for each wavelength, and calculates the wavelength dependent particle transmission for each wavelength using an optical model, to form a system of three equations in three unknowns, which are solved to determine a parameter representative of the chemical content of the CMP slurry.Type: ApplicationFiled: August 13, 2001Publication date: February 13, 2003Applicant: Particle Measuring Systems, Inc.Inventor: Todd A. Cerni
-
Patent number: 6275290Abstract: A sensitive particle distribution probe uses special processing including a modified Twomey/Chahine iterative convergence technique and a specially constructed sample cell to obtain particle size distribution measurements from optically dense slurries, such as the slurries used in the semiconductor industry for chemical mechanical planarization. Spectral transmission data is taken over the spectral range of 0.20-2.5 microns, utilizing specially constructed, chemically resistant sample cells of 50-2000 microns thickness, and miniature, fixed grating, linear detector array spectrometers. At wavelengths greater than one micron, the preferred design utilizes InGaAs linear detector arrays. An ultrasonic disrupter can be employed to breakup harmless soft agglomerates. In addition to direct particle size distribution measurement, the invention described here could be used to detect other fundamental causes of slurry degradation, such as foaming and jelling.Type: GrantFiled: April 22, 1999Date of Patent: August 14, 2001Assignee: Particle Measuring Systems, Inc.Inventors: Todd A. Cerni, Scott Waisanen, Dennis J. Knowlton
-
Patent number: 6246474Abstract: A very sensitive particle distribution probe uses special processing including a modified Twomey/Chahine iterative convergence technique and a specially constructed sample cell to obtain particle size distribution measurements from optically dense slurries, such as the slurries used in the semiconductor industry for chemical mechanical planarization. Spectral transmission data is taken over the spectral range of 0.20-2.5 microns, utilizing specially constructed, chemically resistant sample cells of 50-250 microns thickness, and miniature, fixed grating, linear detector array spectrometers. At wavelengths greater than 1 micron, the preferred design utilizes InGaAs linear detector arrays. An ultrasonic disrupter can be employed to breakup harmless soft agglomerates. In addition to direct particle size distribution measurement, the invention described here could be used to detect other fundamental causes of slurry degradation, such as foaming and jelling.Type: GrantFiled: April 29, 1998Date of Patent: June 12, 2001Assignee: Particle Measuring Systems, Inc.Inventors: Todd A. Cerni, Scott Waisanen
-
Patent number: 6167107Abstract: The invention includes a particle sensor with a particle counter. A regenerative blower pulls ambient air into a flow within the particle counter, and a laser illuminates the flow to generate laser radiation indicative of particles within the flow. A detector detects the laser radiation; and particle sensing electronics counts particles within the flow at a preselected volumetric flow rate, e.g., 1 CFM. Preferably, the particle counter includes a plurality of pressure sensors; and a blower speed voltage controller adjusts the speed of the blower according to signals from the pressure sensors to achieve the preselected volumetric flow rate. The regenerative blower permits use of a high efficiency exhaust filter to filter air exhausted from the blower. An airflow path between the particle counter and the regenerative blower preferably has at least one bend between the particle counter and the blower to increase compactness of the system.Type: GrantFiled: July 16, 1999Date of Patent: December 26, 2000Assignee: Particle Measuring Systems, Inc.Inventor: Thomas Bates
-
Patent number: 5903338Abstract: A modified mixing-type condensation nuclei counter for measuring the size and number of small particles is presented. A gas stream is saturated with respect to a working fluid. The saturated gas at a first temperature is mixed in a growth chamber with a sample gas at a second temperature that is lower than the first temperature. The mixture of the saturated gas and the sample gas at different temperatures results in supersaturation of the mixed gas with respect to the working fluid. Particles in the sample gas act as nucleation sites for condensation of the working fluid. The particles are thus grown to a larger size and therefore are more easily measured by known light-scattering particle detection methods. The efficiency of the supersaturation process is made even more efficient by cooling the growth chamber to a third temperature which is lower than the second temperature or by turbulently mixing the saturated gas and the sample gas.Type: GrantFiled: February 11, 1998Date of Patent: May 11, 1999Assignee: Particle Measuring Systems, Inc.Inventors: Rashid A. Mavliev, Craig A. Parsons
-
Patent number: 5861950Abstract: A particle detection system in which a beam of light is incident upon an inviscid jet of fluid. A sample fluid containing particles is passed through an inviscid flow producing nozzle. An inviscid flow jet is output from the nozzle. The entire inviscid flow jet moves with uniform velocity and can therefore be contained within the sample region for the detection system. A volumetric measurement is thereby achieved where all of the sample fluid moves with uniform velocity. Sample fluid is decelerated in a deceleration chamber to a velocity significantly less than the nozzle velocity. The nozzle has a length and a width where the ratio of length to width is less than about 1. Sample fluid flows from the deceleration chamber through the nozzle and is output from the nozzle in an inviscid flow jet into a collection chamber. An optical collector system collects light scattered by particles in the inviscid flow jet and images the scattered light on a detector.Type: GrantFiled: July 10, 1997Date of Patent: January 19, 1999Assignee: Particle Measuring Systems, Inc.Inventor: Dennis J. Knowlton
-
Patent number: 5751422Abstract: A resonant optical cavity having a laser medium therein is positioned within a specific environment, such as a process and/or harsh environment, and a sensing region, also within the resonant optical cavity, receives light whereby particles at the sensing region affect, as by scattering, light at the sensing region. The affected light is optically collected within the specific environment and optically coupled to a processor outside the specific environment where an output is provided that is indicative of particles detected at the sensing region, including small particles having a size at least as small as about 0.05 to 10 microns. With a solid state laser medium utilized within the resonant optical cavity, the solid state laser medium is pumped by an actuator, such as a semiconductor diode laser, providing a light output that is optically coupled to the solid state laser medium.Type: GrantFiled: February 26, 1996Date of Patent: May 12, 1998Assignee: Particle Measuring Systems, Inc.Inventor: John R. Mitchell
-
Patent number: 5671046Abstract: Device and method are disclosed for optically detecting particles in a free (i.e., unenclosed) stream of liquid. The free liquid stream is produced by ejecting liquid under pressure from a nozzle so that the stream has a smooth round surface. A laser beam intersects the free liquid stream and light scattered by particles in the free liquid stream is collected and processed to provide an output indicative of size and/or number of particles causing the light to be scattered. The free liquid stream is preferably directed vertically downward, and the laser beam and light collector are angularly positioned with respect to the free liquid stream and one another with the light collector collecting scattered light at the intersection of the light beam and the free liquid stream.Type: GrantFiled: July 1, 1996Date of Patent: September 23, 1997Assignee: Particle Measuring Systems, Inc.Inventor: Dennis J. Knowlton
-
Patent number: 5493123Abstract: System and method are disclosed for inspecting objects, such as sheets of flat panel glass, to detect flaws or contamination at a surface. The surface to be inspected is illuminated with 253.7 nm ultraviolet (UV) radiation to assure detection of defects only at the front surface subjected to the radiation. UV radiation reaching the front surface is scattered by defects at the front surface, and scattered UV radiation is collected by a UV dark field imaging system and directed by the imaging system to a detecting unit, preferably including a charge coupled device (CCD). The detecting unit senses UV radiation scattered at the surface due to defects within a selected size range and provides an output to a processing unit providing an output indicative of the defects sensed within the selected size range.Type: GrantFiled: April 28, 1994Date of Patent: February 20, 1996Assignee: Particle Measuring Systems, Inc.Inventors: Robert G. Knollenberg, Vaughn C. Hoxie, Clinton E. Utter
-
Patent number: 5459569Abstract: A modular particle detecting device is disclosed for nonintrusive in-situ detection of particles passing through a sensing region. The device is particularly useful for microcontamination control in semiconductor processing environments, and includes, as separate components, a viewing unit and a sensing unit. The viewing unit has a detecting window and heated illuminating and discharge windows for condensation control. A fluid passage connectable to a flow line enables particle-carrying fluid to pass through a sensing region within the passage. The sensing unit has illuminating circuitry for providing light through the illuminating window to the sensing region, and has detecting circuitry to receive, through the detecting window, light scattered at the sensing region to thereby detect particles in fluid then at the sensing region without physical intrusion of the sensing unit into the sensing region.Type: GrantFiled: April 21, 1993Date of Patent: October 17, 1995Assignee: Particle Measuring Systems, Inc.Inventors: Scott C. Knollenberg, Robert G. Knollenberg
-
Patent number: 5282151Abstract: Submicron diameter particle detection utilizing a high density array is disclosed. The high density array, such as a charge coupled device, is utilized to detect light scattered at a sensing region by particles illuminated by a light source, such as a laser source. Charge storage is utilized to buffer each data frame transferred from the high density array and the multiple serial outputs are processed by parallel processing that includes threshold detection and analog-to-digital converting. A micro-computer and associated digital storage receives the digital outputs and provides outputs indicative of submicron particle sizing.Type: GrantFiled: February 28, 1991Date of Patent: January 25, 1994Assignee: Particle Measuring Systems, Inc.Inventor: Robert G. Knollenberg
-
Patent number: 4893928Abstract: A detection device is disclosed for determining particle size from particle effected light scattering in a sensing region illuminated by a laser beam and receiving the particles in a medium, such as air. Background light from molecular scattering is reduced to a level that enables light scattered by particles having a size of at least as low as about 0.1 micron to be sensed in a high background of molecular scattering such as, for example, where molecular scattering can exceed the 0.1 micron particle's scattering by one hundred times.Type: GrantFiled: September 13, 1988Date of Patent: January 16, 1990Assignee: Particle Measuring Systems, Inc.Inventor: Robert G. Knollenberg
-
Patent number: 4893932Abstract: A surface analysis system and method are disclosed for determining particle contamination and/or defects on or below a surface of material. Laser beams having different polarizations are directed to the surface to be analyzed and light scattered from particle contamination and/or defects on or below the surface is collected and detected to provide electrical signals representative thereof. The electrical signals are then processed to provide an output indicative of sensed contamination and/or defects. In the embodiment particularly shown and described, a pair of polarized laser beams, one of which is a "P" polarized laser beam and the other of which is a "S" polarized laser beam, are separately directed to a monitoring region so that the beams impinge at a common point on the surface to be analyzed.Type: GrantFiled: October 21, 1988Date of Patent: January 16, 1990Assignee: Particle Measuring Systems, Inc.Inventor: Robert G. Knollenberg
-
Patent number: 4798465Abstract: A detection device is disclosed for determining particle size from particle effected light scattering in a sensing region receiving the particles in a gas carrier, such as air, and a laser beam to illuminate the sensing region. Background light from molecular scattering is reduced to a level that enables light scattered by particles having a size of at least as low as about 0.1 micron to be sensed in a high background of molecular scattering such as, for example, where molecular scattering can exceed the 0.1 micron particle's scattering by one hundred times. High molecular scattering is generated whenever the gas volume being viewed is large as is required for high flow rates, high molecular density (high pressures), or large gas molecules.Type: GrantFiled: April 14, 1986Date of Patent: January 17, 1989Assignee: Particle Measuring Systems, Inc.Inventor: Robert G. Knollenberg
-
Patent number: 4740988Abstract: A laser device is disclosed having mirror heating to enhance performance of the device by minimizing induced light absorption to thereby improve mirror quality. The mirrors of a laser device are commonly made of a substrate having a coating thereon formed by alternating layers of high and low refractive index materials, normally classified as refractory oxide materials, which materials are susceptible to formation therein of color centers, such as formation of F-centers when exposed to ultraviolet light, which color centers reduce mirror quality due to induced light absorption losses. By heating the mirror, the F-centers are substantially eliminated to thereby improve mirror quality and enhance the longevity of the laser device.Type: GrantFiled: November 12, 1986Date of Patent: April 26, 1988Assignee: Particle Measuring Systems, Inc.Inventors: Robert G. Knollenberg, Ramin Lalezari, Kenneth R. Sample
-
Patent number: 4728190Abstract: A device and method are disclosed for optically detecting particles in a fluid. A fluid passage with transparent walls defining a monitoring volume, or region, is provided, and particles in the fluid are optically detected by directing a laser beam through the fluid in the monitoring region and collecting light scattered by the particles. A capillary is utilized as the fluid passage, and reflections from the walls of the capillary are effectively precluded. The laser beam is directed through the capillary by means of a window at the entrance side and a lens at the collecting side with the air-glass interfaces being outside the depth of view of particle monitoring within the monitoring region. As a result of this arrangement, the amount of scattered light is greatly reduced and a more uniform light signal is achieved which results in better size resolution of particles than has heretofore been achieved.Type: GrantFiled: October 15, 1985Date of Patent: March 1, 1988Assignee: Particle Measuring Systems, Inc.Inventor: Robert G. Knollenberg
-
Patent number: 4636075Abstract: Particle measurement is disclosed utilizing orthogonally polarized components of a laser beam. A laser beam is split into orthogonally polarized components and at least one of the components is thereafter beam shaped to have a modified dimension. The components are then recombined and focused to provide a beam combination that is directed through a particle containing volume where scattering of the components occurs by the particles. With the components superimposed upon one another, a localized volume is created with one beam being contracted to a smaller volume than the other beam with the illumination intensity ratios thereat being either greater or less than unity depending upon the optics selected.Type: GrantFiled: August 22, 1984Date of Patent: January 13, 1987Assignee: Particle Measuring Systems, Inc.Inventor: Robert G. Knollenberg