Abstract: Apparatuses, systems, and methods are presented for column replacement. An input register, which includes a set of input divisions, may receive write data for a memory array. An output register, which includes a set of normal output divisions and a set of replacement output divisions, may output write data to an array. A column replacement circuit may selectively couple input divisions to output divisions. A column replacement circuit may couple normal output divisions for functional columns of an array to corresponding input divisions. A column replacement circuit may couple replacement output divisions for functional columns of an array to input divisions selected by the column replacement circuit, which may be corresponding input divisions or other input divisions.

Abstract: Systems and methods for die crack detection are disclosed. In one exemplary embodiment, a die includes a first conductive segment, an intermediate conductive segment, and a second conductive segment. The crack detection ring substantially surrounds the die according to a serpentine path having a plurality of legs, wherein each leg intersects the first conductive segment at a first intersection, an intermediate conductive segment at an intermediate intersection and a second conductive segment at a second intersection, wherein the intermediate intersection is horizontally offset from at least the first intersection and the second intersection.

Abstract: Techniques are provided for mitigating issues of memory hole mis-shape. In one aspect, one or more control circuits are configured to program a group of non-volatile memory cells from an erase state to a plurality of programmed states using a first program parameter. The one or more control circuits measure threshold voltages of the group to determine a severity of memory hole mis-shape in the group. The one or more control circuits program the group from the erase state to the plurality of programmed states using a second program parameter selected based on the severity of the memory hole mis-shape in the group.

Abstract: An apparatus includes a first processor that generates first control signals to control a first circuit to perform memory operations on memory cells. A first number of first physical signal lines delivers the first control signals to a conversion circuit. A second number of second physical signal lines delivers converted control signals to the first circuit. The conversion circuit is coupled by the first number of first physical signal lines to the first processor and by the second number of second physical signal lines to the first circuit. The conversion circuit converts the first control signals to the converted control signals, and outputs the converted control signals to the first circuit. The first number of first physical signal lines is less than the second number of second physical signal lines to reduce the first number of first physical signal lines coupled between the first processor and the first circuit.

Abstract: Read operations are performed in a memory device which efficiently provide baseline read data and recovery read data. In one aspect, on-die circuitry, which is on a die with an array of memory cells, obtains recovery read data before it is requested or needed by an off-die controller. In another aspect, data from multiple reads is obtained and made available in a set of output latches for retrieval by the off-die controller. Read data relative to multiple read thresholds is obtained and transferred from latches associated with the sense circuits to the set of output latches. The read data relative to multiple read thresholds can be stored and held concurrently in the set of output latches for retrieval by the off-die controller.

Abstract: A circuit may perform a skew correction process that positions clock pulses of an output clock signal in respective target sampling positions. The circuit may receive an input clock signal and an input data signal and select one of a plurality of predetermined skew cases for the input clock signal and the input data signal. In addition, the circuit may performing timing relationship measurements for transition permutations of the clock signal and the data signal. The circuit may determine which of the input clock signal and the input data signal to delay and an amount of the delay based on the selected skew case and the timing relationship measurements. An output of the circuit may delay the input clock signal or the input data signal according to the determinations, which centers the sampling transitions of the clock signal in target sampling positions.

Abstract: Apparatuses and techniques are described for calibrating a negative voltage source. A ground voltage is applied to a multi-stage amplifier from the negative voltage source while an offset voltage measurement (OVM) is made at the output of the multi-stage amplifier. The OVM is recorded and subsequently used by a calibration circuit when the negative voltage source applies a range of negative voltages to the input of the multiple stage amplifier. The calibration circuit subtracts the OVM from measurements obtained at the output of the multi-stage amplifier to obtain corrected measurements, and uses the corrected measurements to calibrate the negative voltage source, e.g., by adjusting a relationship between digital values input to the negative voltage source and the output voltages.

Abstract: A reservoir computing system comprising an input layer configured to receive input data from a signal propagation channel and to convert the input data into fixed input values, a reservoir configured to receive the fixed input values and generate a set of trained output values, and an output layer configured to receive the set of trained output values and generate a probability distribution based on the set of trained output values. The reservoir is comprised of a plurality of integrated oscillator components coupled in a fixed, random network, wherein each of the oscillator components is comprised of a device characterized by a current-voltage curve that comprises a region of non-linear behavior, such as a negative differential resistance (NDR) behavior.

Abstract: A computing reservoir comprised of a plurality of oscillator components configured to receive input data and produce one or more output signals, and a feedback loop coupled to an output of the network, wherein the feedback loop is comprised of circuitry configured to establish and maintain an optimal operating point of the network based upon the output of the network.

Abstract: Apparatuses, systems, methods, and computer program products are disclosed for persistent memory management. Persistent memory management may include replicating a persistent data structure in volatile memory buffers of at least two non-volatile storage devices. Persistent memory management may include preserving a snapshot copy of data in association with completion of a barrier operation for the data. Persistent memory management may include determining which interface of a plurality of supported interfaces is to be used to flush data from a processor complex.

Abstract: A methodology and structure for performing an erase verify in non-volatile memory is described. Both the odd wordlines and the even wordlines are driven to a high voltage level. This can be done simultaneously. The simultaneous charging of both the odd wordlines and the even wordlines, even when the erase verify will occur on only one of the odd or even wordlines reduces RC delay in the charging of the wordlines. After the odd and even wordlines are charged, then one set of wordlines, either the odd or even wordlines, is dropped to the erase verify voltage. The erase sense operation is then performed.

Abstract: Apparatuses, systems, methods, and computer program products are disclosed for an on-die capacitor. A memory chip comprises an array of memory cells. A capacitor is electrically coupled to an array of memory cells. A capacitor receives at least a portion of discharged electricity from an operation for an array of memory cells. A capacitor supplies electricity back to an array of memory cells during a subsequent operation for an array of memory cells.

Abstract: A method for detecting defects in a memory system includes receiving a command to perform a standard erase operation on at least one memory cell of the memory system. The method also includes performing a first defect detection operation on the at least one memory cell. The method also includes setting, in response to the first defect detection operation detecting a defect, a defect status indicator. The method also includes performing the standard erase operation on the at least one memory cell. The method also includes performing a second defect detection operation on the at least one memory cell. The method also includes setting, in response to the second defect detection operation detecting a defect, the defect status indicator.

Abstract: Apparatuses, systems, methods, and computer program products are disclosed for data rewrite operations. A non-volatile memory device comprises a non-volatile memory medium. A non-volatile memory device is configured to determine an error metric for a non-volatile memory medium in response to a read request for the non-volatile memory medium. A non-volatile memory device is configured to receive a refresh command from a controller over a bus. A non-volatile memory device is configured to rewrite data from a non-volatile memory medium during a predefined time period after receiving a refresh command in response to an error metric satisfying an error threshold.

Abstract: A circuit includes a program controller configured to perform a program operation with interleaved program-verify loops to program memory cells in a same block. During each program-verify loop, a control gate line voltage supply circuit first supplies a program pulse to a first cell of the block and then, before verifying the first cell, supplies a program pulse to a second cell of the block. After the program pulses are sent, the control gate line supply circuit consecutively supplies verify pulses to the first cell and the second cell such that a delay is introduced between the respective program and verify stages of the first and second cells. Additionally, a constant voltage bias on common control gate lines of the first and second memory cells is applied during the consecutive verify stages. Further, an order of verify pulses may be applied in a reverse order during a verify stage.

Abstract: Apparatuses, systems, and methods are disclosed for magnetoresistive random access memory. A magnetic tunnel junction (MTJ) for storing data may include a reference layer. A free layer of an MTJ may be separated from a reference layer by a barrier layer. A free layer may be configured such that one or more resistance states for an MTJ correspond to one or more positions of a magnetic domain wall within the free layer. A domain stabilization layer may be coupled to a portion of a free layer, and may be configured to prevent migration of a domain wall into the portion of the free layer.

Abstract: Apparatuses, systems, and methods are disclosed for magnetoresistive random access memory. A magnetic tunnel junction for storing data may include a reference layer, a barrier layer, and a free layer. A barrier layer may be disposed between a reference layer and a free layer. A free layer may include a nucleation region and an arm. A nucleation region may be configured to form a magnetic domain wall. An arm may be narrower than a nucleation region and may extend from the nucleation region. An arm may include a plurality of pinning sites formed at predetermined locations along the arm for pinning a domain wall.

Abstract: A memory device comprising a semiconductor substrate in which a memory cell region and a peripheral circuitry region are defined, wherein the memory cell region has a plurality of non-volatile memory cells arranged in one or more arrays and the peripheral circuitry region has at least one sense amplifier region comprised of at least one low voltage transistor. Further, a deep N-well region is formed in the substrate, wherein the memory cell region and the peripheral circuitry region are placed on the deep N-well region such that, in the event that a high erase voltage (VERA) is applied to the memory cell region during an erase operation, the high erase voltage is applied to all terminals of the at least one low voltage resistor, thereby protecting the low voltage transistor by preventing it from experiencing a large voltage difference between its terminals.

Abstract: To protect memory cards, such as SD type cards, and similar devices from Electrostatic Discharge (ESD), the input pads of the device include points along their edges that are aligned with correspond points on a conductive frame structure mounted adjacent the input pad to form a spark gap. The input pads are connected to a memory controller or other ASIC over signal lines that include a diode located between the input pad and the ASIC and a resistance located between the input pad and the diode. The resistance and diode are selected such that an ESD event at an input pad triggers a discharge across the spark gap before it is transmitted on to the ASIC, while also allowing a high data rate for signals along the signal line.

Abstract: A partial page sensing method and system are provided in which, while a bit line voltage (VBLC) is applied to first bit lines of a first partial page of a memory cell array, second bit lines, of a second partial page are floated. The second bit lines of the second partial page are bit lines which are interleaved with the first bit lines of the first partial page. Bit lines associated with one or more additional partial pages may be grounded or floated. A bit line associated with an additional partial page which is adjacent to one of the first bit lines may be floated.