Abstract: The present disclosure generally relates to improving adaptive tuning of different clock rates of a memory device. Rather than clock rates only being determined off of one parameter such as workload, the clock rates now will be determined using multiple parameters. The tuning may be based on system parameters to allow the system to withstand challenges that arise during the operation. The clock frequency table is maintained in the device controller. The table holds the clock frequency of each component. The disclosure proposes modifying the table according to different system environment parameters to maintain performance or reduce power consumption. Adaptive tuning allows a more flexible system design that can adapt according to the current system status. Adaptive tuning also reduces peak power consumption, improves performance, and better quality of service (QoS) compatibility characteristics.

Abstract: Technology for open block boundary group programming of non-volatile memory such as NAND. The open block boundary group could potentially be read in response to a request from a host for the data stored in the group. In an aspect, the memory system will determine whether programming a group of memory cells in a selected block will result in an open block. If it will not result in an open block, then the memory system uses a first set of programming parameters to program the group. However, if it will result in an open block then the memory system uses a second set of programming parameters to program the boundary group. The programming parameters may include verify levels and/or a program voltage step size. The second set of programming parameters can tighten Vt distributions, which mitigates mis-reads if the boundary group is read.

Abstract: The present disclosure generally relates to recognizing a violation of an expected write amplification (WAF) rate and informing a host device of the violation so that the host device may take corrective action and ensure the data storage device does not reach end of life (EOL) earlier than expected. The host can provide the data storage device with an expected lifetime and may additionally provide a benchmark WAF rate. The data storage device compares the actual WAF rate to the benchmark WAF rate and notifies the host device of any violation where the actual WAF rate exceeds the benchmark WAF rate.

Abstract: Techniques are presented to reduce sense amplifier noise from parasitic capacitances that can affect the internal transfer of a data value from a data latch to a sensing node. To transfer the data value, the sensing node is pre-charged and the data value used to set the control gate voltage on a transistor in a discharge path for the sensing node. In the discharge path, the transistor is connected in series with a switch, so that when the switch is turned on, the data value on the transistor's control gate will determine whether or not the sensing node discharges. To reduce noise in the process, before the data value is used to bias the discharge path transistor's control gate, a node between the transistor and switch is charged. Additionally, a lower voltage level can be used to turn on the discharge path switch.

Abstract: An apparatus includes a control circuit configured to connect to NAND strings that are connected to bit lines, where each bit line is connected to a plurality of NAND strings in a corresponding plurality of regions of a block. The control circuit is configured to apply a read voltage in read operations directed to NAND strings of the plurality of regions of the block and subsequently adjust the read voltage by a first predetermined amount for read operations directed to NAND strings of a first region of the block. The control circuit is further configured to adjust the read voltage by a second predetermined amount for read operations directed to NAND strings of a second region of the block. The first and second predetermined amounts are based on respective locations of the first and second regions in the block.

Abstract: The present disclosure generally relates to ensuring a data storage device consumes as little power as possible. Different HW modules in the data storage device can operate at different frequencies to ensure any bottleneck HW modules operate at as fast a frequency as possible, while non-bottleneck HW modules operate at slower frequencies and hence, consume less power. The frequency for each HW modules is dynamic and is adjusted based upon detected bottlenecks so that the data storage device can operate as efficiently as possible and consume as little power as possible.

Abstract: A thermal dissipation device for use with electronic assemblies or devices and that includes a heat conductive plate configured to thermally couple to one or more packaged components on a first side of the heat conductive plate. The thermal dissipation device further includes a heat conductive post coupled to a second side of the heat conductive plate. The heat conductive post includes a fin member rotatably coupled to the heat conductive post, which is configured to rotate about an axis of the heat conductive post to maximize both a flow of air across the fin member and thermal dissipation of heat from the heat conductive plate into the atmosphere.

Abstract: To provide more test data during the manufacture of non-volatile memories and other integrated circuits, machine learning is used to generate virtual test values. Virtual test results are interpolated for one set of tests for devices on which the test is not performed based on correlations with other sets of tests. In one example, machine learning determines a correlation study between bad block values determined at die sort and photo-limited yield (PLY) values determined inline during processing. The correlation can be applied to interpolate virtual inline PLY data for all of the memory dies, allowing for more rapid feedback on the processing parameters for manufacturing the memory dies and making the manufacturing process more efficient and accurate. In another set of embodiments, the machine learning is used to extrapolate limited metrology (e.g., critical dimension) test data to all of the memory die through interpolated virtual metrology data values.

Abstract: The present disclosure generally relates to reducing latency when fetching Scatter Gather Lists (SGL). Rather than fetching the required SGLs sequentially regardless of what SGL descriptor is needed, the data storage device fetches all of the last entries of each SGL segment in ahead of time after receiving the command, but before the read data is available. The data storage device will still fetch the previous entries in the segment. Once the last entries are fetched, the last entries are stored in a table where the earlier descriptors of each segment are stored as the segments are fetched. In so doing, parallel fetching allows the data storage device to fetch SGL descriptors as needed and reduces the latency.

Abstract: Non-volatile memory cells are programmed by raising a voltage applied to a selected word line to a program voltage during a first time period of a programming process for selected non-volatile memory cells connected to the selected word line; programming the selected non-volatile memory cells using the program voltage during a second time period after the first time period; testing, during the first time period, whether the voltage applied to the selected word line is greater than one or more intermediate voltages; and elongating the first time period during the first time period if the voltage applied to the selected word line is not greater than one or more of the intermediate voltages.

Abstract: A memory system performs an erase process for the non-volatile memory cells including performing erase verify for the non-volatile memory cells. The erase verify comprises comparing threshold voltages of the non-volatile memory cells to an erase verify reference voltage and determining whether an amount of the non-volatile memory cells having a threshold voltage greater than the erase verify reference voltage is less than an allowed bit count. During the erase process, the system compares threshold voltages of the non-volatile memory cells to an intermediate reference voltage that is greater than the erase verify reference voltage and determines an amount of non-volatile memory cells having threshold voltages greater than the intermediate reference voltage. The Allowed Bit Count is increased (during the erase process) by the amount of non-volatile memory cells having threshold voltages greater than the intermediate reference voltage.

Abstract: An apparatus is provided that includes a memory cell having a reversible resistance-switching memory element coupled in series with a selector element. The selector element has a first resistance. The resistance-switching memory element is configured to reversibly switch between a second resistance and a third resistance. The memory cell may be selectively configured as either a re-writeable memory cell or a one-time programmable memory cell. The memory cell functions as a one-time programmable memory cell regardless of whether the resistance-switching memory element has the second resistance, the third resistance, or is electrically shorted.

Abstract: In NAND memory, data sanitization allows a relatively small unit of data (e.g., less than a block) to be effectively destroyed by increasing threshold voltages of memory cells from their programmed threshold voltage to the highest threshold state. To reduce the amount of disturb on memory cells not selected for data sanitization, prior to applying a program voltage to a target word line, a hole based pre-charge operation is performed. More specifically, for NAND strings having a memory cell selected for data sanitation, prior to applying a programming pulse to the corresponding word line, a soft erase operation is performed. After biasing the memory cells and select gates of the NAND strings to a low voltage, a soft erase voltage pulse is applied to the source lines and bit line to pre-charge the NAND string channels with holes.

Abstract: To remedy short term data retention issues, a system creates a gate to channel voltage differential for non-volatile memory cells between programming and verifying in order to accelerate the effects of the short term data retention issue. That is, the gate to channel voltage differential will accelerate the migrating of electrons out of shallow traps. In some embodiments, the gate to channel voltage differential comprises a higher voltage at the channel in comparison to the gate. In some embodiments, the programming comprises applying doses of a programming signal and the gate to channel voltage differential is only created for a subset of the time periods between doses of the programming signal.

Abstract: In order to lower the peak and average current through the channel (thereby lowering peak and average power consumption) during program-verify, which exhibits a word line dependency, the inventors propose to program dummy memory cells connected to a dummy word line before programming data memory cells connected to a data word line. The additional resistance in the NAND string introduced by the preprogrammed dummy memory cells will cause the peak current, and power consumption, to be lower. To address the word line dependency, the dummy memory cells connected to the dummy word line can be programmed to different threshold voltages based on which data word line is to be programmed. Thus, prior to programming data non-volatile memory cells connected to a particular data word line, the dummy memory cells are programmed to a threshold voltage that is chosen based on the position of the particular data word line.

Abstract: A data storage device having a flash translation layer configured to handle file-system defragmentation in a manner that avoids, reduces, and/or optimizes physical data movement in flash memory. In an example embodiment, the memory controller maintains in a volatile memory thereof a lookaside table that supplants pertinent portions of the logical-to-physical table. Entries of the lookaside table are configured to track source and destination addresses of the host defragmentation requests and are logically linked to the corresponding entries of the logical-to-physical table such that end-to-end data protection including the use of logical-address tags to the user data can be supported by logical means and without physical data rearrangement in the flash memory. In some embodiments, physical data rearrangement corresponding to the file-system defragmentation is performed in the flash memory in response to certain trigger events, which can improve the input/output performance of the data-storage device.

Abstract: Disclosed herein is a data storage device. A data port transmits data between a host computer system and the data storage device. A non-volatile storage medium stores encrypted user content data and a cryptography engine connected between the data port and the storage medium uses a cryptographic key to decrypt the encrypted user content data. The access controller generates a challenge for a manager device. The challenge comprises a blinded public key of an ephemeral unlock key pair that is blinded by an unlock blinding key. The challenge further comprises the unlock blinding key in encrypted form. The access controller further provides the challenge to the device to be authorized for sending the challenge to the manager device; receives a response to the challenge; decrypts the unlock blinding key and calculates a shared secret; and upon determining that the response indicates approval of registering the device, registers the device to be authorized as an authorized device.

Abstract: A non-volatile storage apparatus comprises a plurality of memory cells that store host data and two models, a control circuit for writing to and reading from the memory cells, and an inference circuit. The inference circuit uses the first model with a first set of one or more metrics describing current operation of the non-volatile storage apparatus to make a first level prediction about defects and uses the second model with a second set of one or more metrics describing current operation of the non-volatile storage apparatus to make a second level prediction about defects. In one embodiment, the first level prediction is faster to make and uses less data collection, but is not as reliable, as the second level prediction. While second level prediction is more reliable, it takes more time to perform and requires a more intensive data collection, so it is only used when needed.

Abstract: In order to decrease the width of threshold voltage distributions of programmed memory cells without unreasonably increasing the time needed to complete programming, a non-volatile memory uses a zone based program speed adjustment. The non-volatile memory starts programming a first set of the non-volatile memory cells until a minimum number of memory cells of the first set of non-volatile memory cells reach a first threshold voltage. In response to the minimum number of memory cells reaching the first threshold voltage, the first set of non-volatile memory cells are categorized into zones/groups based on threshold voltage. The speed of programming is then adjusted differently for each zone/group and programming is completed for the first set of non-volatile memory cells.

Abstract: An MRAM-based vector multiplication device, such as can be used for inferencing in a neural network, is presented that is ultralow power, low cost, and does not require special on-chip programming. A crosspoint array has an MRAM cell at each crosspoint junction and periphery array circuitry capable of supplying independent input voltages to each word line and reading current on each bit line. Vector multiplication is performed as an in-array multiplication of a vector of input voltages with matrix weight values encoded by the MRAM cell states. The MRAM cells can be individually programmed using a combination of input voltages and an external magnetic field. The external magnetic field is chosen so that a write voltage of one polarity reduces the anisotropy sufficiently to align the cell state with the external field, but is insufficient to align the cell if only half of the write voltage is applied.