Abstract: A smart card includes a first circuit delivering a power supply voltage and a second circuit coupled to the first circuit by an electrical conductor and powered with the power supply voltage. A light-emitting diode has a first terminal coupled to the electrical conductor and a second terminal coupled to a first terminal of the second circuit. During a first operating phase, the first circuit delivers a first value of the power supply voltage and the second circuit applies a first voltage to the first terminal. During a second operating phase, the first circuit delivers a second value of the power supply voltage and the second circuit applies a second voltage to the first terminal.

Abstract: A first element and a second element of a same device communicate with each other. The first element sends the second element a first piece of information representative of energy supplied by an electromagnetic field supplying power the device. The second element adapts its operating frequency as a function of the first piece of information.

Abstract: A method of operating a mechanical switching device is disclosed. The switching device includes a housing, an assembly disposed in the housing, and a body. The assembly is thermally deformable and comprises a beam held in two different places by two arms secured to edges of the housing. The beam is remote from the body in a first configuration and in contact with and immobilized by the body in a second configuration. The assembly has the first configuration at a first temperature and the second configuration when one of the arms has a second temperature different from the first temperature. The method includes exposing an arm of the assembly to the second temperature, and releasing the beam using a release mechanism. The release mechanism includes a pointed element comprising a pointed region directed towards the body. The pointed element limits an open crater in a concave part of a projection.

Abstract: An integrated circuit includes a first semiconductor well contained in a semiconductor substrate and a second semiconductor well contained in the first semiconductor well. A capacitive element for the integrated circuit includes a first electrode and a second electrode, where the first electrode includes at least one vertical conductive structure filling a trench extending vertically into the first semiconductor well. The vertical conductive structure is electrically isolated from the first semiconductor well by a dielectric envelope covering a base and the sides of the trench. The vertical conductive structure penetrates into the second semiconductor well at least at one longitudinal end of the trench. The second electrode includes the first semiconductor well and the second semiconductor well.

Abstract: An electronic device includes a switched-mode power supply having a first operating phase during which the output node of the switched-mode power supply is coupled by an on switch to a source of a first reference voltage. The first operating phase is followed by a second operation phase during which the output node of the switched-mode power supply is in a high impedance state. While in the second operating phase, a capacitor connected to the output node of the switched-mode power supply at least partially discharges into a load.

Abstract: An electronic chip includes a seal ring whose shape is contained within a rectangle, of a width equal to a maximum width of the electronic chip and a length equal to a maximum length of the electronic chip. At least one test pad is arranged at least partially within the rectangle. The test pad is shared with at least one other adjacent electronic chip.

Abstract: In accordance with an embodiment, a method includes: transmitting, by a first near-field communication (NFC) device, a field emission burst; comparing a characteristic property of a signal of the field emission burst to a detection threshold; determining a presence of a detection error based on the comparing; and adjusting the detection threshold based on a number of determined detection errors.

Abstract: An embodiment integrated circuit includes a first electromagnetic pulse detection device that comprises a first loop antenna formed in an interconnection structure of the integrated circuit, a first end of the first antenna being connected to a first node of application of a power supply potential and a second end of the antenna being coupled to a second node of application of the power supply potential, and a first circuit connected to the second end of the first antenna and configured to output a first signal representative of a comparison of a first current in the first antenna with a first threshold.

Abstract: The present disclosure relates to an electronic device comprising a first capacitor and a quartz crystal coupled in series between a first node and a second node; an inverter coupled between the first and second nodes; a first variable capacitor coupled between the first node and a third node; and a second variable capacitor coupled between the second node and the third node.

Abstract: A voltage regulator is embedded in a circuit intermediate a first node (coupled to a battery) and a second node (supplying power to an external memory). The voltage regulator is activatable in a first mode of operation for startup during which an voltage is applied to the second node that increases towards a supply threshold. In response to the voltage at the second node reaching the supply threshold, the voltage regulator transitions to a second mode of operation where a programmable regulated voltage (higher than the supply threshold) is applied to the second node. In response to receipt of a low-power operation request, a first high-drive regulator circuitry is deactivated and a second low-power regulator circuitry is activated to provide a third mode of operation at low power.

Abstract: A method for manufacturing an electronic device includes locally implanting ionic species into a first region of a silicon nitride layer and into a first region of an electrically insulating layer located under the first region of the silicon nitride layer. A second region of the silicon nitride layer and a region of the electrically insulating layer located under the second region of the silicon nitride layer are protected from the implantation. The electrically insulating layer is disposed between a semi-conducting substrate and the silicon nitride layer. At least one trench is formed extending into the semi-conducting substrate through the silicon nitride layer and the electrically insulating layer. The trench separates the first region from the second region of the electrically insulating layer. The electrically insulating layer is selectively etched, and the etch rate of the electrically insulating layer in the first region is greater than the etch rate in the second region.

Abstract: A bipolar transistor includes a common collector region comprising a buried semiconductor layer and an annular well. A well region is surrounded by the annular well and delimited by the buried semiconductor layer. A first base region and a second base region are formed by the well region and separated from each other by a vertical gate structure. A first emitter region is implanted in the first base region, and a second emitter region is implanted in the second base region. A conductor track electrically couples the first emitter region and the second base region to configure the bipolar transistor as a Darlington-type device. Structures of the bipolar transistor may be fabricated in a co-integration with a non-volatile memory cell.

Abstract: An electronic chip includes a chip core including an input terminal, an output terminal, an external pad, and an input-output circuit coupled to the chip core and the external pad. The input-output circuit includes an enable terminal coupled to the chip core, a connection terminal coupled to the external pad, a switchable diode device coupled between a supply voltage and a reference voltage, and a levelling circuit. The switchable diode device is coupled to the connection terminal and the enable terminal and is configured to operate as a diode in response to a control signal in a first state applied to the enable terminal and to operate as an open circuit in response to the control signal in a second state applied to the enable terminal. The levelling circuit is coupled to the connection terminal, the input terminal of the chip core, and the output terminal of the chip core.

Abstract: A datum is written to a memory, by splitting a binary word, representative of the datum and an error correcting or detecting code, into a first part and a second part. The first part is written at a logical address in a first memory circuit. The second part is written at the logical address in a second memory circuit. The error correcting or detecting code is dependent on both the datum and the logical address.

Abstract: The integrated circuit of a non-volatile memory of the electrically erasable and programmable type includes memory cells, each memory cell having a state transistor including a gate structure comprising a control gate and a floating gate disposed on a face of a semiconductor well, as well as a source region and a drain region in the semiconductor well. The drain region includes a first capacitive implant region positioned predominantly under the gate structure and a lightly doped region positioned predominantly outside the gate structure. The source region includes a second capacitive implant region positioned predominantly outside the gate structure, the source region not including a lightly doped region.

Abstract: Provided is a device comprising a frequency demodulator and an amplitude demodulator. The device is configured to use, in a first mode, both the frequency demodulator and the amplitude demodulator in parallel and to activate a radio frequency identification (RFID) card mode or a Qi charger mode based on results provided by said demodulators.

Abstract: The present disclosure relates to a near-field communication device including a near-field communication controller. The near-field communication controller includes at least one first demodulator, adapted to apply a first type of demodulation to a first signal modulated according to a first or a second type of modulation; and at least one second demodulator, adapted to apply a second type of demodulation to the first signal.

Abstract: A device includes image generation circuitry and convolutional-neural-network circuitry. The image generation circuitry, in operation, generates a digital image representation of a wafer defect map (WDM). The convolutional-neural-network circuitry, in operation, generates a defect classification associated with the WDM based on the digital image representation of the WDM and a data-driven model generated using an artificial wafer defect digital image (AWDI) data set and associating AWDIs with classes of a defined set of classes of wafer defects. A wafer manufacturing process may be controlled based on the classifications of WDMs.

Abstract: The present disclosure provides devices and methods in which a semiconductor chip has a reduced size and thickness. The device is manufactured by utilizing a sacrificial or dummy silicon wafer. A recess is formed in the dummy silicon wafer where the semiconductor chip is mounted in the recess. The space between the dummy silicon wafer and the chip is filled with underfill material. The dummy silicon wafer and the backside of the chip are etched using any suitable etching process until the dummy silicon wafer is removed, and the thickness of the chip is reduced. With this process, the overall thickness of the semiconductor chip can be thinned down to less than 50 ?m in some embodiments. The ultra-thin semiconductor chip can be incorporated in manufacturing flexible/rollable display panels, foldable mobile devices, wearable displays, or any other electrical or electronic devices.

Abstract: In accordance with an embodiment, a method for determining an overall memory size of a global memory area configured to store input data and output data of each layer of a neural network includes: for each current layer of the neural network after a first layer, determining a pair of elementary memory areas based on each preceding elementary memory area associated with a preceding layer, wherein: the two elementary memory areas of the pair of elementary memory areas respectively have two elementary memory sizes, each of the two elementary memory areas are configured to store input data and output data of the current layer of the neural network, the output data is respectively stored in two different locations, and the overall memory size of the global memory area corresponds to a smallest elementary memory size at an output of the last layer of the neural network.