Abstract: A memory array includes memory cells arranged in a matrix with cell rows coupled to word lines and cell columns coupled to output bit lines. A control circuit maps a first group of memory cells to a first in-memory compute operation producing computation output signals on first output bit lines from a first matrix vector multiplication of a first input vector with a first group of computation weights stored in the first group of memory cells and maps a second group of memory cells to a second in-memory compute operation producing computation output signals on second output bit lines, different from the first output bit lines, from a second matrix vector multiplication of a second input vector, different from the first input vector, with a second group of computation weights stored in the second group of memory cells. The first and second in-memory compute operations are substantially simultaneously executed.

Abstract: A method of operating an inertial sensor module includes receiving a stream of inertial sensor data representing activity of a user of an electronic device and generating a plurality of wavelet sub-bands by performing a wavelet transform on the inertial sensor data. The method includes identifying a wavelet sub-band of highest energy from the plurality of wavelet sub-bands, generating augmented inertial sensor data by combining the wavelet sub-band of highest energy to the inertial sensor data, and identifying a first transition in the activity of the user based on the augmented inertial sensor data.

Abstract: Disclosed herein is method for fault detection and communication in analog power electronic circuits with a multiplicity of electronic fuses (e.g., a primary fuse and at least one secondary fuse). Current flow is monitored through each fuse. Fault conditions in these electronic fuses are identified. Upon detection, the fault signaling line, which is common to all fuses, is driven to a voltage indicative of the detected fault condition. The primary electronic fuse then latches the voltage on this fault signaling line. A detection and communication circuit enables corrective actions to be performed at the fuse level, dictated by the latched voltage.

Abstract: An integrated circuit package includes a support plate having a mounting face. An electronic chip, having a rear face and a front face, is mounted on the mounting face with the front face electrically connected to the mounting face of the support plate. A deformable thermally conductive film covers at least one portion of the rear face of the electronic chip so that the film is in contact with the rear face.

Abstract: Composite material comprising a fluoropolymer matrix and a filler formed of nanoparticles of a ceramic of the BZT-?BXT type wherein X is selected from Ca, Sn, and Mn and a is a molar fraction selected in the range between 0.10-0.90 doped with at least one doping element selected from the group consisting of Nb, La, Mn, Nd and W, wherein when X is Mn, the doping element is not Mn, wherein said nanoparticles have an average diameter comprised between 10 and 25% by weight on the total weight of the composite. The composite material is used to form a thin film usable as a piezoelectric material with inductive properties in electronic components, for example acoustic sensors such as microphones, and energy harvesting transducers.

Abstract: Provided is a power converter including first, second, third and fourth nodes and a wire bonding test circuit. The wire bonding test circuit includes a multiplexer having a first terminal of a first side coupled to the first node and second and third terminals of a second side. The wire bonding test circuit includes a first switch having a first terminal coupled to the second terminal or the third terminal of the multiplexer and a second terminal coupled to the second node. The wire bonding test circuit includes a second switch having a first terminal coupled to the second terminal or the third terminal of the multiplexer and a second terminal coupled to the third node. The wire bonding test circuit includes a third switch having a first terminal coupled to the second terminal or the third terminal of the multiplexer and a second terminal coupled to the fourth node.

Abstract: A method of facilitating live feedback on code generation includes generating first source code based on user configuration, presenting the generated first source code in a live preview user interface, and obtaining a change to the user configuration. The method also includes, responsive to the obtaining of the first change: generating second source code based on the first change; computing differences between the second source code and the first source code; and presenting the second source code in the live preview user interface by: visually signaling a correspondence between the first change and portions of the second source code that are associated with the differences; and visually distinguishing the portions of the second source code from other portions of the second source code.

Abstract: The bandwidth of SOC interfaces is exploited while minimizing the number of physical ports via a networking accelerator for use on board a vehicle, for instance, that comprises: media access control (MAC) controller circuitry configured to provide a MAC port layer to control exchange of information, wherein the exchange of information comprises data flow transmission to virtual machine ports (VMPs) over a data link; virtual machine transmission (VM Tx) bridge circuitry configured to handle transmission data flow to the VMPs; transmission router/switch circuitry configured to route/switch data flow from the MAC controller circuitry to the VM Tx bridge circuitry; and queue handler circuitry configured to provide queue management for data flow between the MAC controller circuitry and the VM Tx bridge circuitry.

Abstract: Provided is a module for monitoring instructions of a microcontroller. The module is adapted to receive instructions that are received at an input terminal of the microcontroller or that are being processed by a code pointer of the microcontroller. The module verifies the instructions received on the input terminal of the microcontroller or that are being processed by the code pointer of the microcontroller.

Abstract: An amplification circuit includes an amplifier circuit (provided by an operational amplifier) that amplifies a signal to be demodulated. A feedback loop of the amplification circuit has a resistance value that is controlled to discretely vary according to a level of an output node of the amplifier circuit. A comparison of the output level with respect to one or a plurality of thresholds, which define out-of-saturation operating ranges of the amplifier circuit, drives selection of the resistance value.

Abstract: The present description relates to a vertical power component formed in and on a semiconductor substrate doped with a first conductivity type and coated, on the upper side thereof, with a semiconductor layer doped with the first conductivity type. The component includes: an active region (100A); and first and second groups of first concentric field limiting rings surrounding the active region. Each first ring includes a first semiconductor region doped with a second conductivity type, opposite to the first conductivity type, extending vertically into the thickness of the semiconductor layer from the upper side thereof; and a second field limiting ring laterally interposed between the first and second groups of first field limiting rings (GR). The second ring includes a second doped semiconductor region of the second conductivity type extending vertically into the thickness of the semiconductor layer from the upper face thereof.

Abstract: A power circuit includes a power transistor coupled between input and output nodes and receiving a control signal. A current sensing current senses a power current provided by the power transistor to the output node and generates a sense voltage. A voltage sensing circuit senses a drain-to-source voltage of the power transistor and generates a VDS sense current. A safe operating area (SOA) shaping circuit has a gain set by an adjustable resistance that is dynamically adjusted based upon the VDS sense current, the SOA shaping circuit applying the gain to the sense voltage to produce an adjusted sense voltage. A timing circuit generates an intermediate voltage by comparing the adjusted sense voltage and a first reference. An output comparator asserts a flag in response to the intermediate voltage becoming at least equal to a second reference. The control signal is modified in response to assertion of the flag.

Abstract: A load is powered between positive and negative rails. A switching converter generates the negative rail voltage based on an input voltage, with a power transistor involved therein. A replica generator produces a replica voltage mirroring the drain-to-source voltage of the power transistor. A buffer buffers the replica voltage. A first switch selectively connects the buffered voltage to an output node, in response to a control signal with a duty-cycle proportional to the input voltage divided by the negative rail voltage. A second switch selectively connects the buffered voltage to ground, according to the inverse of the control signal, resulting in a PWM signal at the output node. An output filter filters the PWM signal to generate a sense voltage indicative of the output current flowing from the load device. A processing circuit determines the input current from the positive rail to the load device based on the sense voltage.

Abstract: A process forms a high electron mobility transistor (HEMT) device with a recessed gate without damaging sensitive areas of the HEMT device. The process utilizes a first epitaxial growth process to grow a first set of layers of the HEMT. The epitaxial growth process is then stopped and a passivation layer is formed on the first set of layers. The passivation layer is then patterned to provide a passivation structure at a desired location of the recessed gate electrode. The channel layer and one or more barrier layers are then formed in a second epitaxial growth process in the presence of the passivation structure. The result is that the channel layer and the barrier layer growth around the passivation structure. The passivation structure is then removed, effectively leaving a recess in the channel layer. The gate electrode is then formed in the recess.

Abstract: An ESD protection device includes at least one semiconductor electronic switch electrically coupled in parallel with a diode. The semiconductor electronic switch and the diode each include at least one finger extending substantially parallel to a first direction. The fingers of the semiconductor electronic switch and of the diode are aligned with each other along this first direction.

Abstract: System, method, and circuitry for generating content for a programmable computing device based on user-selected configuration information. A settings registry is generated based on the user's selections. The settings registry and the user selected configuration information is utilized to generate the content, such as code, data, parameters, settings, etc. When the content is provided to the programmable computing device, the content initializes, configures, or controls one or more software and hardware aspects of the programmable computing device, such as boot sequence configurations, internal peripheral configurations, states of the programmable computing device, transitions between states of the programmable computing device, etc., and various combinations thereof.

Abstract: A molded carrier is formed by a unitary body made of a laser direct structuring (LDS) material and includes a blind opening with a bottom surface. The unitary body includes: a floor body portion defining a back side and the bottom surface of the blind opening and an outer peripheral wall body portion defining a sidewall surface of the blind opening. LDS activation followed by electro-plating is used to produce: a die attach pad and bonding pad at the bottom surface; land grid array (LGA) pads at the back side; and vias extending through the floor body portion to make electrical connections between the die attach pad and one LGA pad and between the bonding pad and another LGA pad. An integrated circuit chip is mounted to the die attach pad and wire bonded to the bonding pad. A wafer-scale manufacturing process is used to form the molded carrier.

Abstract: Sensor device with a microcontroller unit and a sensor including a transducer, which is coupleable to a device and generates a signal indicative of a physical quantity, and a processing circuit including: a conversion stage which generates samples of the physical quantity; a data generation stage which generates data vectors as a function of the samples, each data vector being formed by programmable quantity values; and a decision stage. The microcontroller unit programs the decision stage so that it classifies the data vectors by executing a decision tree having a structure and thresholds.

Abstract: A time-of-flight (TOF) sensor includes a timing generator generating a timing reference, a first array of TOF-related components including rows of TOF-related components, with each row receiving the timing reference, and a dummy row of TOF-related components. The TOF sensor also includes a second array of TOF-related components including rows of TOF-related components, with each row receiving the timing reference, and a dummy row of TOF-related components. A first path delivers the timing reference to the rows of the first array, the first path passing from the timing generator, through the dummy row of TOF-related components in the second array, to the first array of TOF-related components. A second path delivers the timing reference to the rows of the second array, the second path passing from the timing generator, through the dummy row of TOF-related components in the first array, to the second array of TOF-related components.

Abstract: An in-memory computation circuit includes a memory array with memory cells arranged in a matrix in rows and columns. Groups of memory cells store computational weights for an in-memory compute (IMC) operation that is performed with a first multiply and accumulate (MAC) elaboration to produce a first analog signal and a second MAC elaboration to produce a second analog signal. An analog-to-digital converter circuit operates to: increment a count value in a counter circuit in response to the first analog signal; convert the count value in the counter circuit to a negated count value; and increment the count value in the counter circuit starting from the negated count value in response to the second analog signal.