Abstract: A method includes instantiating a first plurality of rows in a first region of a fabric. The first region has a height corresponding to a sum of heights of the first plurality of rows. The method also includes instantiating a second plurality of rows in a second region of the fabric. The second region is horizontally adjacent to the first region in the fabric. The second region has a height corresponding to a sum of heights of the second plurality of rows. The method further includes determining whether a row of the first plurality of rows is misaligned with a row of the second plurality of rows and adding a transition region between the row of the first plurality of rows and the row of the second plurality of rows in response.

Abstract: A voltage driver for supplying a supply voltage includes multiple PMOS transistors, multiple NMOS transistors, a pad, impedance divider circuits, NMOS clampers, and PMOS clampers. A maximum of the supply voltage is N times a maximum of the drain-source voltage of each transistor. The pad is configured to receive a voltage signal for dynamically controlling gates of a subset of the NMOS transistors and a subset of the PMOS transistors. The impedance divider circuits are configured to generate limited voltage signals, each of which is a fraction of voltage between the pad and supply voltage or between the pad and ground. The NMOS clampers and PMOS clampers configured to receive reference voltages and limited voltage signals to generate output, which is in turn input into gate terminals of the subset of NMOS or PMOS transistors.

Abstract: A semiconductor memory includes, in part, M×N select transistors disposed along M rows and N columns, where M and N are integers greater than or equal to 2. The memory further includes, in part, a first set of M wells each configured to be biased independently of the remaining M?1 wells. Each well has formed therein N of the select transistors each having a source/drain terminal coupled to the same bitline corresponding to a different one of M bitlines of the memory. The memory further includes, in part, M×N anti-fuses. Each anti-fuse is associated and forms a bitcell with a corresponding one of the M×N select transistors.

Abstract: On-the-fly multi-bit flip-flop (MBFF) generation is provided by selecting at least two flip-flop blocks from a plurality of candidate flip-flop blocks; identifying a control block from a plurality of candidate control blocks, the control block being identified based on operational specifications of the selected flip-flop blocks; and generating a multi-bit flip-flop instance based on the selected flip-flop blocks and the identified control block.

Abstract: A method of forming a complementary field effect transistor (CFET) is provided. The method includes adding a blocking material to a vertical channel of the CFET having an epitaxial growth, the blocking material being located below and in contact with a lower portion of the growth, adding an insulating material to an open area within the vertical channel to surround a portion of the epitaxial growth, performing an etch to (i) remove a portion of the insulating material, (ii) expose a contact surface of the epitaxial growth and (iii) provide a vertical opening within the vertical channel, the etch leaving a portion of the blocking material, and filling in the vertical opening with a conductive material, the conductive material reaching the exposed contact surface of the epitaxial growth, the blocking material remaining below the conductive material to prevent contact between the conductive material and a silicon substrate below the growth.

Abstract: A system determines physical design information along a logic hierarchy of a circuit design. The system accesses physical design metrics associated with different parts of a physical design of a circuit. The system accesses a logic design of the circuit comprising a hierarchy of logic blocks. The system determines the physical design metrics associated with one or more logic blocks of the hierarchy of the logic design based on a relation between the physical design and the logic design. The system configures a user interface to display the hierarchy of the logic design of the circuit along with the physical design metrics associated with the one or more logic blocks of the hierarchy. The system sends the configured user interface for display.

Abstract: A differential multiplexer includes a number of input stages. Each stage includes, in part, first and second transistor receiving an input signal and the inverse of the input signal, a biasing circuit supplying a bias to the gate terminal of the first and second transistors, a current source coupled between a source terminal of the first and second transistors and a ground terminal, a first switch coupling a drain terminal of the first transistor to a first terminal of a first resistor having a second terminal coupled to a supply voltage, a second switch coupling a drain terminal of the second transistor to a first terminal of a second resistor having second terminal coupled to the supply voltage, a third switch coupling the drain terminal of the first transistor to the supply voltage, and a fourth switch coupling the drain terminal of the second transistor to the supply voltage.

Abstract: A level shifter circuit includes a level shifter configured to receive a first clock signal associated with a first power level and generate a second clock signal associated with a second power level, wherein the second power level is greater than the first power level. The level shifter circuit further includes an input clock buffer having a first input, wherein the first input comprises the second clock signal from the level shifter, and a second input coupled in parallel to the first input, wherein the second input includes the first clock signal.

Abstract: A circuit provides fail safe protection of an input/output (I/O) circuit of a chip. The I/O circuit comprises an I/O pad connected to one or more other chips via an I/O bus. The circuit comprise a supply and failsafe detector component. The supply and failsafe detector component generates an I/O supply output signal. The I/O supply output signal has a low voltage value when the I/O supply voltage of the chip is below a medium voltage level and the I/O supply output signal having a high voltage value when the I/O supply voltage of the chip is above the medium voltage level. The medium voltage is above a threshold voltage of the transistor of the I/O circuit and below the high voltage value. The circuit uses the I/O supply output signal to provide a reference voltage as input to the transistor of the I/O circuit.

Abstract: Some aspects of this disclosure are directed to implementing hardware-based obfuscation of digital data. For example, some aspects of this disclosure relate to a method, including performing a capture operation that loads a plurality of primary input (PI) bits into corresponding shift registers of a plurality of test data registers (TDRs) disposed on one or more digital semiconductor devices and configured to store a plurality of secret information bits. The method further includes performing a sequence of shift operations on the plurality of TDRs to obtain a plurality of output bits. The method further includes applying, by an authenticating processor, a derivation function on the plurality of output bits to extract the plurality of secret information bits thereby authenticating the one or more digital semiconductor devices.

Abstract: A circuit includes a clock generator, a frequency divider, and a first biasing circuit. The clock generator generates a clock signal of a first frequency. The frequency divider includes a first pair of cross coupled transistors. The frequency divider produces the clock signal of a second frequency. The first biasing circuit is coupled with the first pair of cross coupled transistors of the frequency divider. The first biasing circuit is adapted to enable a change in a transconductance of the first pair of cross coupled transistors to stabilize a phase angle between the clock signal at the first frequency and the clock signal at the second frequency.

Abstract: A single-ended to a differential signal converter (converter) includes, in part, first, second, and third inverting elements, each having a first size, and coupled in series to form a chain of inverting elements. The converter further includes a fourth inverting element of a second size and coupled to the input of the first inverting element, a fifth inverting element of a third size and coupled to an output terminal of the first inverting element, a sixth inverting element of the third size and coupled to an output of the second inverting element, and a seventh inverting element of the second size and coupled to the output of the third inverting element. The outputs of the fourth and sixth inverting elements form a first one of the differential signals. The outputs of the fifth and seventh inverting elements form a second one of the differential signals.

Abstract: A method includes: receiving a data signal (DQ) and a clock signal (DQS); generating an indicator signal by: delaying the data signal (DQ) to generate a delayed data signal (DQ?); sampling the data signal (DQ) and the delayed data signal (DQ?) using an edge of the clock signal (DQS) to generate a first sampled value and a second sampled value; and generating the indicator signal based on the first sampled value and the second sampled value; and adjusting one or more of a DQ adjustable delay line associated with the data signal (DQ) and a DQS adjustable delay line associated with the clock signal (DQS) based on the indicator signal to synchronize the data signal (DQ) and the clock signal (DQS).

Abstract: A method includes receiving a crash signature and a crash configuration. The crash signature is generated in response to a software crash in a software application caused by the crash configuration. The method also includes applying a first machine learning model to determine a reference of a plurality of references that is closest to the crash signature and the crash configuration. The reference includes a reference crash signature and a reference configuration. The reference crash signature and the reference configuration are generated by a proxy crash to the software crash. The proxy crash was generated prior to the software crash by executing a modified test case against the software application.

Abstract: Techniques and systems for test case selection and ordering with covert minimum set cover for functional qualification are described. Some embodiments can determine a first set of test cases by, iteratively, identifying a set of faults that is covered by a smallest set of test cases, determining whether or not a test case that covers a fault is able to detect the fault, and selecting and adding a test case to the first set of test cases. Next, the embodiments can execute a minimum set cover process on the first set of test cases by using coverage scores for test cases in the first set of test cases for ranking.

Abstract: A system and method mitigates conflicts between clean unique requests by receiving a first clean unique request from a first processor core and a second clean unique request from a second processor core. The first clean unique request and the second clean unique request respectively indicate that the first processor core and second processor core request access to a first address of a memory. The memory is coupled to the first processor core and the second processor core. The first clean unique request and the second clean unique request are determined to be associated with the first address. Further, the second clean unique request is converted into a first read unique request based on determining that the first clean unique request and the second clean unique request are associated with the first address. The first read unique requests indicates that the second processor core requests data.

Abstract: Josephson junction (JJ) structures are disclosed. In some embodiments, a JJ structure may include alternating planar superconducting structures and planar non-superconducting structures arranged along a direction away from a wafer surface.

Abstract: A memory safety interface module (MSIM) configured to test a memory. The MSIM receives an original data from a digital logic and inverts the bits of the original data to generate an inverted data. It writes the inverted data to the memory address. The MSIM reads the inverted data from the memory address and determines whether the memory address and the inverted data are correct. The MSIM either writes the original data to the memory address in response to the memory address and the inverted data being correct or transmits an error indication in response to at least one of the memory address and the inverted data being incorrect. The MSIM reads the original data from the memory address and determines whether the memory address and the original data are correct or transmits an error indication in response to at least one of the memory address and the original data being incorrect.

Abstract: A processing device identifies clock phases of a multiphase clock system. The processing device selects a first clock phase and a second clock phase of the clock phases. The processing device determines an aggregate phase distance between the first clock phase and the second clock phase over multiple clock periods. The processing device determines, based on the aggregate phase distance, an aggregate time duration between the first clock phase and the second clock phase over the multiple clock periods of the multiphase clock system.

Abstract: Various embodiments of a method and apparatus for estimating the effective resistance for the design of on-chip power nets are disclosed. Through sampled node resistance, performance of a power net can be determined on an entire chip. Effective resistance predictions can be made for all nodes. Through the resistance predictions, a designer can analyze the which areas would benefit from power and ground augmentation.