Abstract: An integrated circuit (IC) design layout may be partitioned into a set of content areas. A content area in the set of content areas may be divided into a set of zones based on an image-based representation of the content area. A repetition unit may be identified in a zone in the set of zones, where the repetition unit is a portion of the zone, and where the zone includes multiple instances of the repetition unit. A skeleton layout may be generated corresponding to the IC design layout, where the skeleton layout specifies locations of the multiple instances of the repetition unit in the IC design layout.

Abstract: A testbench for a design under test (DUT) includes components used to verify functionality of the DUT through simulation of the DUT. The components are grouped into component groups, and the components within an individual component group are executed on a same thread of the simulation. The component groups are also executed on a single thread, which includes logging accesses to memory by different component groups. Based on the logged memory accesses, a processing device identifies whether any component groups create a thread data race. An action is taken in response to identifying thread data races.

Abstract: Aspects of the present disclosure relate to improving runtime performance of equivalence checkers by a shift left process that uses an RTL lint tool to identify RTL code that can be a source of verification complexity for the downstream equivalence checker. The RTL code is further compared to a corresponding circuit model to determine a potential gate-level location of the potentially problematic RTL code. A weight can be calculated to represent a level of verification complexity that may be generated by the particular portion of the RTL code. Further, one or more recommendations can be generated by the RTL lint tool to prevent some of the verification complexity for the downstream equivalence checker.

Abstract: Systems and methods for load compensation are presented to support a wide range of capacitive loads on a pad coupled to an I/O transmitter. The I/O transmitter includes I/O architecture coupled to a pad and a calibration circuit coupled to the I/O architecture. The calibration circuit includes sensing circuitry, pulse generation circuitry coupled to the sensing circuitry and control bit generation circuitry coupled to the pulse generation circuitry. The control bit generation circuitry generates control bits proportional to load variations detected at the pad and feeds the control bits to the I/O architecture to modulate rise and fall times of pulsed signals at the pad.

Abstract: A first set of ports and/or circuit elements in a circuit design may be received, where the first set of ports and/or circuit elements is expected to cause damage if the first set of ports and/or circuit elements is compromised. A second set of ports and/or circuit elements in the circuit design may be determined by performing forward path tracing from the first set of ports and/or circuit elements, backward path tracing from the first set of ports and/or circuit elements, or both forward and backward path tracing from the first set of ports and/or circuit elements. A report may be generated based on the second set of ports and/or circuit elements in the circuit design, where the report is used for performing threat analysis and risk assessment for the circuit design.

Abstract: A method and system are provided for placing cells in a circuit design layout. The method includes placing the cells at candidate locations in the circuit design layout in accordance with design rules, and determining, for each location, a probability of design rule success for the placement of each cell of the cells based on one or more of the available candidate locations.

Abstract: A first set of timing paths may be selected in an integrated circuit (IC) design. A first set of timing slack values may be calculated for the first set of timing paths across a first set of corners. A dominant corner may be selected in the first set of corners based on the first set of timing slack values. A second set of timing slack values for the dominant corner may be determined for a second set of timing paths in the IC design. A third set of timing slack values may be estimated for the second set of timing paths for non-dominant corners. The third set of timing slack values may be used to select a second set of corners for a timing path in the second set of timing paths, and circuit objects in the timing path may be marked with the second set of corners.

Abstract: A time division multiplexing (TDM) device includes a first first-in-first-out (FIFO) circuit configured to receive a user clock signal and a user data signal from a plurality of inputs, a transmitter circuit operatively coupled to the first FIFO circuit in a fast clock domain, the transmitter circuit including one or more multiplexing state machines, the one or more multiplexing state machines configured to receive a plurality of input signals from the plurality of inputs, multiplexing the input signals to form a multiplexed signal, and transmitting the multiplexed signal using a fast clock, a receiver circuit including one or more demultiplexing state machines, the one or more demultiplexing state machines configured to receive the multiplexed signal, and a second FIFO circuit configured to output the user data signal to the plurality of outputs.

Abstract: Generating an integrated circuit (IC) includes receiving Design For Testability (DFT) Compressor Decompressor (CODEC) circuitry of an integrated circuit (IC) design, and partitioning the DFT CODEC circuitry into two or more sub-blocks based on a number of scan chains within the IC design. Further, scan chains are assigned to each of the two or more sub-blocks based on locations of end points within the scan chains. A layout of the IC design is generated by placing the DFT CODEC circuitry within the IC design based the locations of end points within the scan chains and the assigned scan chains to each of the two or more sub-blocks.

Abstract: A method of verifying a logic circuit design by a hardware emulation system, includes, in part, receiving a netlist of the logic circuit design configured to operate in response to positive edges of a first clock signal, and transforming each of a first multitude of flip-flops disposed in the logic circuit design to a dual-enable flip-flop configured to operate in response to positive edges of a second clock signal thereby to generate a transformed logic circuit design. The state of the logic circuit design after 2k cycles of the first clock is the same as a state of the transformed logic circuit design after k cycles of the second clock.

Abstract: A system and method for performing circuit design analysis obtains a circuit design comprising cells. The cells are associated with cell types. Aging parameters of a core analytical model are determined for each of the cell types in the circuit design to generate a calibrated analytical model. Aging effects for the cells are determined based on the calibrated analytical model and target stress conditions. An aged timing model is determined for the cell types based on the aging effects, an unaged timing model, and the target stress conditions.

Abstract: An initial polarity associated with an element of an integrated circuit design is determined. Responsive to a determination that an optimization process associated with the integrated circuit design is completed, a current polarity associated with the element is determined. A determination is made that a signal is to be applied at the element based on activity data associated with the integrated circuit design. The signal is associated with a first activity. Responsive to a determination that the current polarity associated with the element does not correspond to the initial polarity associated with the element, the single applied to the element is inverted. The inverted signal is associated with a second activity that is inverted from the first activity.

Abstract: An integrated circuit device includes scan chains and path margin monitor units (PMUs) on a single die. The scan chains test signal paths in the integrated circuit device. The PMUs include path monitor circuitry and self-test circuitry. The path monitor circuitry monitor delays of signals propagating along the signal paths. The self-test circuitry test the path monitor circuitry and report the test results via a communications path other than the scan chains.

Abstract: A memory cell with dynamic disturb reduction includes first and second inverters in a cross-coupled arrangement, a write circuit to write to the memory cell, a read circuit to read the memory cell, and an interrupt circuit to disable at least a portion of the first inverter when the read circuit reads the memory cell.

Abstract: The present disclosure describes systems and methods for assigning nodes in a circuit design to layers. The method includes identifying a plurality of structures in a circuit design. Each of the plurality of structures includes four nodes of the circuit design and each of the four nodes are connected to every other node in the respective structure. The method also includes removing, from the plurality of structures, an even number of pairs of connected nodes of the circuit design to form a reduced node structure and assigning circuit layers for the nodes in the reduced node structure. The method further includes assigning, by a processing device, circuit layers for the pairs of connected nodes removed from the plurality of structures based on the assigned circuit layers for the nodes in the reduced node structure.

Abstract: A method of verifying connectivity in a circuit design, includes, in part, receiving a netlist of the circuit design; designating a plurality of destination nodes associated with the netlist; for each of the plurality of destination nodes, identifying one or more source nodes that are traversed from the destination node; for each source node identified as traversed from the destination node: transforming the netlist by including a first multiplexer having a first input terminal receiving a first variable logic value and an output terminal coupled to the source node; and enabling the first multiplexer to pass the first variable value to the destination node from the source node in order to check for connectivity between the source node and the destination node.

Abstract: The present disclosure describes systems and methods for generating a superconducting electronic circuit design. The system includes a memory and a processor. The processor simulates a superconducting electronic circuit design using a first process variation to produce a first score and simulates the superconducting electronic circuit design using a second process variation to produce a second score. The processor, in response to determining that the first score is lower than the second score, simulates the superconducting electronic circuit design using the first process variation and a first design variation to produce a third score and simulates the superconducting electronic circuit design using the first process variation and a second design variation to produce a fourth score. The processor updates the superconducting electronic circuit design using the first process variation and the first design variation in response to determining that the third score is higher than the fourth score.

Abstract: A system receives assertions representing properties of a circuit design. The system determines a representation of an alternating Büchi automaton based on the assertions. The system transforms the representation of the alternating Büchi automaton to generate a representation of a simplified alternating Büchi automaton. The simplified alternating Büchi automaton has fewer states than the alternating Büchi automaton. One or more states of the simplified alternating Büchi automaton are obtained by merging states of the alternating Büchi automaton representing the assertions of the circuit. The system performs formal verification of the circuit design using the simplified alternating Büchi automaton.

Abstract: Feature images representing a layout geometry of a lithographic mask are received. Mask function (MF) contributions from individual feature images are calculated by convolving the feature image with a corresponding three-dimensional mask (M3D) filter. The M3D filters represent an electromagnetic scattering effect of that feature image. At least one M3D filter also accounts for effects arising from a fabrication process for the lithographic mask.

Abstract: A circuit including: a memory cell connected to a first power supply configured to supply a first power supply voltage; a first bleeder transistor coupled between a first node of the memory cell and ground; and a second circuit coupled to a gate electrode of the first bleeder transistor and configured to supply a bleeder signal to control the first bleeder transistor in response to a drop in the first power supply voltage, wherein the first bleeder transistor is configured to discharge the memory cell in response to receiving the bleeder signal.