Abstract: A second virtual address may be received, where the second virtual address is different from a first virtual address. A second hash value may be computed based on the second virtual address. A first comparison result may be determined by comparing the second hash value with a first hash value, where the first hash value is computed based on the first virtual address. The first comparison result may be used to select a selected structure from either a first structure or a second structure. The selected structure may be used to determine predicted aliasing bits which are used to determine an index corresponding to the second virtual address.

Abstract: A graph-based timing analysis (GBA) is applied to a circuit design that includes a routed gate-level netlist to produce timing estimates of the circuit design. A machine learning (ML) model is applied to modify these GBA timing estimates of the circuit design to make them more accurate. For example, the ML model may be trained using timing estimates from path-based timing analysis as the ground truth, and using features of the circuit design from the GBA as input to the ML model.

Abstract: A cryptography system comprises a noising engine and a de-noising engine. The noising engine is configured to receive a key pattern, determine a final membership value based on one or more input parameters and a first knowledge base, and generate a noised key pattern based on the key pattern and the final membership value. The de-noising engine is configured to receive the noised key pattern and the final membership value, and generate a de-noised key pattern based on the noised key pattern, the final membership value, and a second knowledge base.

Abstract: A processing system employs a method to order the elements within a memory. Ordering the elements includes receiving an accessed memory element. The accessed memory element is requested by a processor from a memory. Further, the accessed memory element is compared to stored elements within the memory to generate control signals. Gate control signals from the control signals are generated. The order of the stored elements within the memory is updated based on the gate control signals.

Abstract: A method includes generating a plurality of input vectors based on input signals to an electric circuit, selecting a subset of the plurality of input vectors, and determining a plurality of datapoints based on the selected subset of the plurality of input vectors. Each datapoint of the plurality of datapoints indicates a power consumption of the electric circuit corresponding to an input vector of the selected subset of the input vectors. The method also includes generating, by a processor, a plurality of vector sequences based on the selected subset of the plurality of input vectors. Each vector sequence of the plurality of vector sequences includes a portion of the selected subset of the plurality of input vectors arranged chronologically. The method further includes training a machine learning model based on a first subset of the plurality of vector sequences and a corresponding first subset of the plurality of datapoints.

Abstract: Methods and systems are described herein relate to automatic channel identification of high-bandwidth memory channels and subchannel generation. An HBM channel identification system may perform a sequence of operations to identify HBM channels within a netlist of an interposer: channel dimension prediction, channel bounding box prediction, channel orientation derivation, subchannel partition, and subchannel routing region creation. In one example, an HBM channel identification method includes identifying candidate nets within a netlist. A bounding box that includes one or more nets of the candidate nets is determined. Once the bounding box is determined, the orientation of the box is determined and used to determine a pattern of bumps within the bounding box. Finally, a subchannel is generated based on the pattern of bumps.

Abstract: A system and method are provided for testing logic using a logic built in self-test (LBIST) system, and in particular where the LBIST system tolerates unknown inputs (Xs) to the logic cells forming an XLBIST system. The system allows for providing multiple test system clocks from the LBIST system to the logic during a system clock capture cycle of a system clock during testing of the logic, wherein the system clock is separate from the multiple test system clocks of the LBIST system. Further, timing of an application of clock cycles of the multiple test system clocks of the LBIST system is controlled and provided to the logic during the system clock capture cycle.

Abstract: An electric circuit and a method for filtering glitches are described. The electric circuit includes a filter, an inverter circuit, and a reset circuit. The inverter circuit is electrically coupled to an output of the filter. The reset circuit is electrically coupled to the output of the filter. The reset circuit pulls the output of the filter high when an input signal to the electric circuit and the output of the inverter circuit are both low, pulls the output of the filter low when the input signal to the electric circuit and the output of the inverter circuit are both high, and passes the output of the filter when (i) the input signal to the electric circuit is high and the output of the inverter circuit is low or (ii) the input signal to the electric circuit is low and the output of the inverter circuit is high.

Abstract: The present disclosure describes circuits (e.g., clock synthesizers) and methods for producing alternating signals. A clock synthesizer includes an oscillator, a voltage control circuit, and a frequency control circuit. The oscillator produces an output signal with a frequency. The voltage control circuit produces a control voltage for the oscillator based on the frequency of the output signal. The frequency control circuit produces a control signal for the oscillator based on (i) an input voltage to the frequency control circuit and (ii) the control voltage. The control signal causes the oscillator to adjust the frequency of the output signal such that the voltage control circuit adjusts the control voltage to be closer to the input voltage.

Abstract: Various embodiments of a method and apparatus for determining parametric timing yield and bottlenecks are disclosed which take into account correlation between electrical circuit paths through common timing arcs of an integrated circuit chip under design. Monte Carlo samples of timing arc delays are generated and used in computing timing yield and identify yield bottlenecks.

Abstract: A system and method for evaluating optimization of a hardware engine are described herein. In an example embodiment, a first operation of a desired application is performed using one or more hardware resources each associated with one or more task graphs of a plurality of task graphs. A first result is recorded from a first simulation based on a first task graph of the plurality of task graphs implemented using a first configuration of a first hardware resource associated with the first task graph. A second result is recorded from a second simulation based on a second task graph of the plurality of task graphs implemented using a second configuration of a second hardware resource associated with the second task graph. An interface is generated based on the first result and the second result for rendering by a display device.

Abstract: A method of using on-chip circuitry to test a memory of a chip is provided. The method including, in a capture stage, receiving, at a first n-bit compression structure including n first stage latches corresponding to each bit of the first n-bit compression structure, a value at each respective first stage latch for each of n memory addresses of the memory, such that each respective first stage latch receives a respective value from a memory address of the memory, n being an integer greater than one, and in the capture stage, passing the values from each respective first stage latch through compression logic of the first n-bit compression structure to output a single compressed address value, providing the single compressed address value to a second stage latch of the first n-bit compression structure.

Abstract: Embodiments relate to reading signals from a stimulus file produced by an emulator into a data store. A method includes executing, by a set of one or more worker processes, reading tasks. Each reading task is executable independent of other reading tasks. Each reading task includes reading a time slice of a signal from a stimulus file produced by a hardware emulator, and pushing a partial waveform corresponding to the time slice to a data store. The partial waveform includes a head and a tail that each has a smaller data size than an entirety of the partial waveform. The method further includes executing stitching tasks. The stitching tasks include pulling the heads and tails of the partial waveform from the data store, modifying the heads and tails to indicate a temporal order of the partial waveforms, and pushing the modified heads and tails back to the data store.

Abstract: A method includes: receiving value changes corresponding to timestamped logic value changes in recorded signals from a verification run of an integrated circuit (IC) design; generating recorded logic vectors from the value changes, each of the recorded logic vectors being associated with a corresponding signal identifier, each of the recorded logic vectors including a recorded logic values over a window of consecutive clock cycles computed from one or more value changes associated with the corresponding signal identifier and having timestamps within the window of consecutive clock cycles; determining, by a processor, inferred logic vectors including inferred logic values corresponding to signals output by cells of the IC design based on propagating the recorded logic values of the recorded logic vectors through the cells; and computing per-cycle power characteristics of the IC design based on the recorded logic vectors and the inferred logic vectors.

Abstract: Disclosed is a configuration to store metadata using an error correction code (ECC). The configuration receives at an ECC encoder of a memory controller, write data and an N-bit metadata, N comprising an integer greater than 0. The configuration generates a meta symbol using the N-bit metadata and creates an enhanced write data, the enhanced write data comprising the write data and the meta symbol generated by the N-bit metadata. The configuration encodes the enhanced write data and meta symbol to generate a parity. It deletes the meta symbol to generate an output, the output comprising an enhanced codeword and writes the enhanced codeword to a memory.

Abstract: Methods for diagnosing faults in memory periphery circuitry, computer readable media, and a test device for the same are provided. In one example, method is provided that includes receiving, at a test device, a first test syndrome from a memory device, the first test syndrome corresponds to a first test process executed by the memory device, wherein the memory device comprises a memory array and peripheral circuitry, and wherein the first test process is associated with a first circuit element of the peripheral circuitry; determining, by a processing device of the test device, a first fault associated with the first circuit element based on the first test syndrome; and diagnosing, by the processing device, the first fault to determine positional information of the first fault, the positional information is associated with the first circuit element.

Abstract: Tracking circuitry for a memory device is disclosed. The tracking circuitry includes an inverter, a level shifter, delay circuitry, and a logic gate. The inverter is configured to receive a first clock signal and generate an inverted clock signal. The level shifter is configured to receive the first clock signal and the inverted clock signal and generate a level shifted clock signal. The delay circuitry is configured to receive the level shifted clock signal and generate an inverted level shifted clock signal. The logic gate comprises a first input configured to receive the first clock signal and a second input configured to receive the inverted level shifted clock signal. The logic gate is configured to generate a second clock signal based on the first clock signal and the inverted level shifted clock signal.

Abstract: A method includes instantiating a first plurality of rows in a first region of a fabric. The first region has a height corresponding to a sum of heights of the first plurality of rows. The method also includes instantiating a second plurality of rows in a second region of the fabric. The second region is horizontally adjacent to the first region in the fabric. The second region has a height corresponding to a sum of heights of the second plurality of rows. The method further includes determining whether a row of the first plurality of rows is misaligned with a row of the second plurality of rows and adding a transition region between the row of the first plurality of rows and the row of the second plurality of rows in response.

Abstract: A voltage driver for supplying a supply voltage includes multiple PMOS transistors, multiple NMOS transistors, a pad, impedance divider circuits, NMOS clampers, and PMOS clampers. A maximum of the supply voltage is N times a maximum of the drain-source voltage of each transistor. The pad is configured to receive a voltage signal for dynamically controlling gates of a subset of the NMOS transistors and a subset of the PMOS transistors. The impedance divider circuits are configured to generate limited voltage signals, each of which is a fraction of voltage between the pad and supply voltage or between the pad and ground. The NMOS clampers and PMOS clampers configured to receive reference voltages and limited voltage signals to generate output, which is in turn input into gate terminals of the subset of NMOS or PMOS transistors.

Abstract: A method of forming a complementary field effect transistor (CFET) is provided. The method includes adding a blocking material to a vertical channel of the CFET having an epitaxial growth, the blocking material being located below and in contact with a lower portion of the growth, adding an insulating material to an open area within the vertical channel to surround a portion of the epitaxial growth, performing an etch to (i) remove a portion of the insulating material, (ii) expose a contact surface of the epitaxial growth and (iii) provide a vertical opening within the vertical channel, the etch leaving a portion of the blocking material, and filling in the vertical opening with a conductive material, the conductive material reaching the exposed contact surface of the epitaxial growth, the blocking material remaining below the conductive material to prevent contact between the conductive material and a silicon substrate below the growth.