Abstract: A programmable logic device (PLD) which includes a dedicated composable RAM array having a plurality of memory tiles. The PLD also includes an array of CLBs, wherein each of the CLBs in the array is coupled to a corresponding one of the memory tiles. The composable RAM array is accessed through the CLBs. That is, the input signals required by the memory tiles are routed through the corresponding CLBs. Similarly, the output signals provided by the memory tiles are routed out through the corresponding CLBs. Each CLB can be configured to operate as a conventional CLB (i.e., ignore its corresponding memory tile). Alternatively, each CLB can be configured to provide an interface to its corresponding memory tile. To help achieve this, each CLB comprises a set of multiplexers for selectively routing data output signals provided by the corresponding memory tile or output signals provided by the CLB.

Abstract: A modification to the available simulated annealing algorithm is provided to better utilize direct connects and other architecture-specific features of a Field Programmable Gate Array. A preferred embodiment comprises adding a template-based move to the SA move-set that recognizes a specific pattern or template in the user's design after mapping, and arranges the components into the optimal configuration for the specific template discovered. The present invention increases the intelligence of the SA move-set by selectively supplementing the random moves in the move-set with moves that produce locally good solutions.

Abstract: A system including a programmable logic device (PLD) mounted on a populated printed circuit board, and a configuration processor. The PLD includes a plurality of input/output blocks (IOBs), each having an input buffer and an output buffer. Each output buffer is coupled to an associated adjustable slew rate control circuit and to an adjustable delay line of the PLD. The configuration processor controls each of the slew rate control circuits to provide a first slew rate. The configuration processor also controls the output buffers to be coupled to the adjustable delay line. The configuration processor then controls the adjustable delay line to generate a first test pulse, which is applied to each of the output buffers. Depending on the impedances of the printed circuit board, the first test pulse transmitted from a particular output buffer may be reflected. Reflected test pulses return to the associated input buffers and are recorded.

Abstract: A logic/memory circuit (LMC) utilized in a configurable logic block (CLB) of a programmable logic device (PLD) that implements an eight-input lookup table (LUT) using an array of programmable elements arranged in rows and columns. A decoder is used to read bit values from one column (e.g., sixteen programmable elements) of the array. In one embodiment, a separate read bit line is provided to facilitate faster read operations. A sixteen-to-one multiplexer/demultiplexer circuit is used to pass selected bit values to an output terminal. The array of programmable elements is programmable both from configuration lines during a configuration mode, and by data transmitted on the interconnect resources through the multiplexer/demultiplexer circuit. In one embodiment, the programmable elements of the array are connected in pairs to product term generation circuitry. Product terms generated by the product term circuitry are passed to a macrocell circuit to perform programmable array logic (PAL) logic operations.

Abstract: A linear feedback shift register in a programmable gate array. A first lookup table is configured as a shift register having n selectable taps and a shift-input. A second lookup table is configured as a parity generator and has inputs coupled to the n selectable taps and an output coupled to the shift-input of the shift register.

Abstract: A structure for providing clearing/programming includes a plurality of synchronous flip-flops, and a plurality of associated two-input multiplexers. A control signal in a first logic state provided to the multiplexers provides a first signal propagation direction through the flip-flops, whereas the control signal in a second logic state provides a second signal propagation direction through the flip-flops. One method for clearing and programming a programmable logic device includes arranging a plurality of memory cells in sets, clearing the sets in a first spatial sequence, and programming the sets in a second spatial sequence. Sets of memory cells could include columns of memory cells, each column having an associated storage element. In this manner, a plurality of columns of memory cells can be cleared or programmed in any predetermined order.

Abstract: The invention provides an IC driver circuit having an adjustable trip point. The driver circuit automatically adjusts the trip point of the circuit based on the state of the output signal (and thus, by inference, on the state of the input signal), by using first and second switches to couple and decouple secondary pullup and pulldown circuits. In one embodiment, this coupling/decoupling also ensures that the output signal has a shorter rise/fall time than the input signal. Therefore, the output signal reaches a midpoint voltage level (i.e., VCC/2) before the input signal reaches the same level. In a sense, the driver circuit has a negative propagation delay. In a second embodiment, the first and second switches are controlled to ensure low noise-sensitivity, rather than high speed. In another embodiment, the driver circuit can be controlled for either high speed or noise insensitivity.

Abstract: A non-volatile memory cell is provided that includes a low voltage CMOS storage transistor having a source region and a drain region that are commonly connected to ground. The low voltage storage transistor is programmed by applying a high programming voltage to its gate, thereby rupturing the gate oxide of the storage transistor. The high programming voltage is applied to the low voltage storage transistor through a high voltage p-channel transistor. The high voltage p-channel transistor has a thicker gate oxide than the storage transistor, thereby enabling the p-channel transistor to withstand higher voltages. The high voltage p-channel transistor also has a higher breakdown voltage than a high voltage n-channel transistor of the same size. Both the low voltage storage transistor and the high voltage p-channel transistor are fabricated in accordance with a standard sub 0.35 micron process.

Abstract: A method is disclosed for alerting a user of a low power condition on, for instance, an FPGA interface device. An interface device having a microcontroller and an associated power plane for powering the microcontroller and other component on the interface device includes a detection circuit coupled to monitor the voltage level of the associated power plane. When the voltage level of the voltage plane falls below a predetermined threshold voltage, the detection circuit sends a low power flag to a host system. The low power flag, which is preferably sent to the host system using a USB port connection, alerts the host system of the low power condition on the interface device. The predetermined threshold voltage is selected to be a suitable amount higher than the minimum operating voltage for the microcontroller so as to allow sufficient time for the microcontroller to send the low power flag to the host system.

Abstract: A method and system are provided for increasing the accuracy of AC parametric testing. The invention provides a method of precisely estimating signal propagation delay time in an integrated circuit testing apparatus, wherein a plurality of signal propagation delay time measurements are taken and additional delay times are estimated by linearly interpolating the measured delays. A desired test point (desired output voltage at a given time) is established. Using a sample device, a slope is established on a time vs. voltage plot for a line through the desired test point. Where a desired test point falls between strobe times on a tester, linear extrapolation is used to calculate what voltages must be tested for at the two bracketing strobe times in order to guarantee the desired performance at the desired test point. One or more devices are then tested for the calculated voltages at the corresponding bracketing strobe times.

Abstract: A method of operating a pin of an in-system programmable logic device (ISPLD) which includes the steps of (1) applying a predetermined voltage to the pin when the ISPLD is in a set-up mode, and (2) maintaining the last voltage applied to the pin when the ISPLD is in a normal operating mode. The ISPLD is in the set-up mode when the logic of the ISPLD has not yet been configured, or is being configured. The ISPLD is in the normal operating mode after the logic of the ISPLD has been configured. A particular ISPLD includes a pin and a logic gate having a first input terminal coupled to the pin, a second input terminal coupled to receive a control signal, and an output terminal coupled to the pin. When the ISPLD is in the set-up mode, the control signal causes the logic gate to apply a predetermined voltage to the pin. When the ISPLD is in the normal operating mode, the control signal causes the logic gate to maintain the last applied voltage on the pin.

Abstract: A method of minimizing power use in programmable logic devices (PLD) using programmable connections and scrap logic to create a versatile power management scheme. Individual product terms in a PLD can be powered off, thereby saving power, without incurring the power-up and settling time delays seen in the prior art. Power management is not restricted to any one function block, nor must the entire device be powered down, unless so programmed. All conventional logic functionality present in the PLD is available to the power management elements, allowing, in one embodiment, a standard function block to be programmed to operate as the control function block. This logic functionality includes, but is not limited to, internal feedback, combinatorial functions, and register functions. Because scrap logic resources left over from user programming and small programmable connections are used, minimal additional chip surface area is needed.

Abstract: A system and method for event-driven simulation of a circuit is disclosed. The system includes a simulation history of events and node values at various times throughout the simulation of the circuit. The system allows the user to access the simulation history during the simulation, make changes to the state of the circuit at any time recorded within the simulation history, and resume the simulation of the circuit automatically corrected for any changes.

Abstract: The present invention allows one portion of an FPGA to reconfigure another portion of the same FPGA. The invention makes use of input/output ports that can be connected on the input side to a frame register for loading configuration data into the FPGA. When a portion of the FPGA is to be reconfigured, data are loaded by a portion of the FPGA not being reconfigured into the frame register of the FPGA and addressed to the portion of the FPGA being reconfigured. Loading of the data is accomplished by forming a configuration data stream in the portion of the FPGA not being reconfigured, then applying the configuration data stream to an output buffer of the FPGA and forwarding that data to an input buffer that is connected to a frame register of the FPGA configuration structure.

Abstract: A method and software apparatus are provided for implementing a dynamically modifiable test flow for integrated circuit devices that adapts to the characteristics of each processed device lot. According to the method of the invention, a modified set of tests sufficient to ensure proper device function for a particular lot is performed, reducing test costs and increasing test capacity. The method and system of the invention periodically samples a predetermined sample number of devices using a full set of tests including a set of skippable tests. Depending upon the performance characteristics of the sample device group on the skippable tests, a number of skippable tests are skipped during a modified test flow. After a next set of devices is tested using the modified test flow, the full set of tests is again performed on another sample group, and the size and makeup of the modified test flow is adjusted according to the new results.

Abstract: A fault tolerance method for FPGAs featuring interconnect resources made up of wiring segments that are programmably coupled to two or more configurable logic blocks (CLBs) through connection switches. In accordance with a first embodiment, one of the wiring segments is designated as being reserved for each CLB. During routing, a wiring segment is assigned to a signal path only if the signal path is not associated with signal transmission to or from the CLB to which the wiring segment is reserved. In accordance with a second embodiment, one or more connection switches are designated as reserved switches for each horizontal segment. During routing, the reserved switches are not used to route signal paths. Fault tolerance is then performed by shifting the logic portion assigned to a defective CLB and/or the associated switch configuration data along its row towards a spare CLB located at the end of the row.

Abstract: A method for selecting the state assignments of a complex programmable logic device (CPLD) to minimize power consumption. Within the CPLD, a plurality of macrocells are selected to store a corresponding plurality of state variables, wherein the number of macrocells is selected to be equal to the number of states. For each of the states, one of the macrocells is assigned to store a state variable having a first logic state, and the remaining macrocells are assigned to store state variables having a second logic state. The macrocells storing state variables having the second logic state exhibit a lower power consumption than the macrocell storing the state variable having the first logic state. In addition, each of the macrocells includes a plurality of wired logic gates, each being in a high-current state or a low-current state. The number of wired logic gates in the low-current state is maximized in the macrocells assigned to store the state variables having the second logic state.

Abstract: A microelectronic device such as a Field-Programmable Gate Array (FPGA) includes a large number of elements which can be individually configured or programmed to provide a desired logical functionality. Input and output pins enable external connection of the elements. Each element is configurable to produce an output in response to a first pulse which is applied more than a minimum length of time after a second pulse. The first pulse can be a clock pulse, and the second pulse can be a data pulse, in which case the minimum length of time is the setup time for the element. Each element of a device is tested by repeatedly applying first and second pulses to the device with a delay of the second pulse relative to the first pulse being progressively changed from a first value until a second value corresponding to the minimum length of time is reached as indicated by a transition between the output being produced and the output not being produced.

Abstract: A system and method are disclosed for providing highly parallel, FFT calculations in a circuit including a plurality of RADIX-2 elements. Partitioned RAM resources allow RADIXes at all stages to have optimal bandwidth memory access. Preferably more memory is made available for early RADIX stages and a "critical" stage. RADIXes within stages beyond the critical stage preferably each need only a single RAM partition, and can therefore simultaneously operate without fighting for memory resources. In a preferred configuration having P RAM partitions and P RADIX stages, the critical stage is stage number log.sub.2 P, and until the critical stage, only P/2 RADIX elements can simultaneously operate within each stage. After the critical stage, all RADIXes within each stage can simultaneously operate.

Abstract: A method for generating a two-turn programmable routing structure is provided for a programmable logic device that provides a high degree of routing flexibility, with lane-changing capability, while requiring a relatively small diffusion surface area. One routing structure generated according to the method of the invention provides lane-changing capability for every interconnect line in the structure and a fast path for each interconnect line running straight through the structure. The routing structure preferably comprises a unitary elongated diffusion area separated by voltage-controlled transistor gates into serially arrayed adjacent diffusion regions. The sequential diffusion regions are connected to interconnect lines having assigned directions, and can be grouped into sets of N directions, where N is a multiple of eight.