Abstract: A design structure for a signal-handing apparatus or communication apparatus is provided which includes a common signal node operable to conduct a first signal, a first circuit coupled to the common signal node to utilize the first signal and a signal-handling element coupled to the common signal node. A signal-handling apparatus may include an isolating circuit coupled to a first conductor, a second conductor to conduct an output of the isolating circuit, and a signal-handling circuit coupled to the second conductor. A signal-handling circuit can perform a signal-handling function in response to the output of the isolating circuit. The signal-handling circuit and the first circuit may be isolated from the second conductor and the signal-handling circuit such that a communication signal may be conducted with less capacitance and be subject to less return loss.

Abstract: The invention relates to a method comprising the following steps: HDL instruction sequences which are to be at the origin of memory elements during the synthesis of the system are automatically localized in the original HDL description files; and so-called SCAN HDL instructions are inserted into at least some of the HDL description files in an automatic sequential manner and without relational or functional analysis of the identified memory elements, ensuring that at least one so-called SCAN channel is obtained during the synthesis of the system, linking the memory elements.

Abstract: Mechanisms are provided for performing intrusion searching of a hierarchical integrated circuit design. These mechanisms may receive the hierarchical integrated circuit design and perform a parallel intrusion search operation, that utilizes a substituting scan line, on the hierarchical integrated circuit design to identify intrusions of geometric objects in the hierarchical integrated circuit design. The mechanisms may further record intrusions of geometric objects in the hierarchical integrated circuit design identified by the parallel intrusion search operation. The parallel intrusion search operation may utilize a plurality of separate intrusion searches executed by the data processing system in parallel on the hierarchical integrated circuit design.

Abstract: The present invention is a method and system for outputting a sequence of commands and data described by a flowchart. The method includes steps as follows. A flowchart describing a sequence of commands and data is received. The flowchart includes a plurality of flowchart symbols. Each of the plurality of flowchart symbols is assigned a ROM (read only memory) record. Assigned ROM records are stored in a ROM. A processor is generated to include the ROM, wherein the processor receives as input a CLOCK signal, a RESET signal, an ENABLE signal and N binary inputs x1, x2, . . . xN, and outputs the sequence of commands and data.

Abstract: Disclosed is a mask data processing method of correcting a hierarchical structure. In the case that in design data having a hierarchical structure including a plurality of cells each having a design pattern, when the total number of graphic forms or the total edge length of a design pattern on which the calculation of mask data processing is to be executed, the amount of calculation to be executed, or the expansion degree presumably becomes equal to or larger than a predetermined threshold value if the calculation of the mask data processing is executed on the design data having the initial hierarchical structure, the hierarchical structure is corrected. This correction is performed to reduce the total number of graphic forms or the total edge length of the design pattern on which the calculation is to be executed, the amount of calculation to be executed, of the expansion degree.

Abstract: An apparatus and method are provided for performing a sequence of verification tests to verify the design of a data processing system. The apparatus comprises a system under verification representing the design of the data processing system, the system under verification including a component model representing at least one hardware component of the data processing system. The component model includes an interface module through which the component model interacts with other portions of the system under verification during performance of the verification tests. An alternative model is provided for representing the hardware component for selected verification tests, and the interface module comprises a verification interface module which is responsive to switch criteria specified by the alternative model to switch in the alternative model in place of the component model.

Abstract: A layout of cells is generated to satisfy a netlist of an integrated circuit. Cell-level process compensation technique (PCT) processing is performed on a number of levels of one or more cells in the layout to generate a PCT processed version of the one more cells in the layout. An as-fabricated aerial image of each PCT processed cell level is generated to facilitate evaluation of PCT processing adequacy. Cell-level circuit extraction is performed on the PCT processed version of each cell using the generated as-fabricated aerial images. The cell-level PCT processing and cell-level circuit extraction are performed before placing and routing of the layout on a chip. The PCT processed version of the one or more cells and corresponding as-fabricated aerial images are stored in a cell library.

Abstract: The process of laying out a floorplan for a clock control distribution network in an integrated chip design is simplified and the efficiency of a staging network created is improved. Rather than manually create the staging network in HDL or as a network description table while looking at a picture of the chip floorplan in a Cadence Viewer, an automated method which runs in the Cadence environment uses an algorithmic approach to the problem of maximizing the utilization of staging latches, eliminating unnecessary power and area usage. Efficiency is maximized by updating the Physical Layout directly with the staging solution arrived at by the algorithm.

Abstract: A method of configuring a device having programmable logic is disclosed. The method comprises generating a netlist associated with a circuit design; coupling the netlist to the device having programmable logic; performing a re-targeting function using a circuit on the device having programmable logic; generating configuration bits for configuring the programmable logic; and configuring the programmable logic to implement the circuit design according to the configuration bits based upon the netlist and results of the re-targeting function.

Abstract: A semiconductor design support device for designing a semiconductor integrated circuit includes a behavioral description, an RTL description, and a latency analyzer. The behavioral description describes an algorithm of processing performed by hardware in a motion level. The RTL description is generated by reading the behavioral description and recognizes a concept including register and clock synchronism peculiar to the hardware. The latency analyzer analyzes a result of a logic simulation performed on the RTL description to calculate a latency in each block representing an operation in a predetermined unit in the behavioral description.

Abstract: A method for creating an electron beam pattern exposure, where a pattern of shapes is generated, including at least one of lines and vias. To each shape there is assigned a set of exposure pixels and edge placement constraints. An intensity at each exposure pixel is calculated by using a simplex method, and a latent resist image location is calculated by convolving a proximity function with the pixel intensities. A shape critical dimension and a shape edge slope is statistically evaluated by applying linear regression on the locations of the calculated latent image. The electron beam pattern exposures are produced using dosages linearly optimized on a rotated pixel grid to produce the shape critical dimension and the shape edge slope.

Abstract: A method of designing a three-dimensional integrated circuit includes dividing two-dimensional layout data of a circuit formed on a semiconductor substrate into a plurality of layout block data in order to re-arrange in different layers, generating layout block data reversing one of the layout block data of two folded layers arranged vertically adjacent to each other, alternately arranging the reversed layout block data and non-reverse block layout data to form a plurality of layers vertically overlapped, selecting at least one from interconnects included in a plurality of layout block data of the circuit and ranging over plural layers so as to be mutually and functionally collected together with respect to at least one of time delay, interconnect length and block configuration, and re-arranging the selected interconnect using a via connecting an upper layer and an under layer of the folded interconnect.

Abstract: A computer-implemented method of verifying isolation between a plurality of modules of a circuit design to be implemented within an integrated circuit can include identifying a first module and at least a second module of the circuit design for the integrated circuit. One or more circuit attributes indicative of isolation between the first module and the second module can be identified and compared with at least one isolation criterion. An indication of whether the first module is isolated from the second module can be output according to results of the comparison.

Abstract: A method for realizes electric connections in a semiconductor electronic device between a nanometric circuit architecture and standard electronic components.

Abstract: A closed-loop IC design optimization process by automatically or manually creating design-specific cells with desired characteristics (e.g., performance, area, power, noise, etc.), which will be then implemented as a standard cell (also known hereafter as metacell), from a set of post-layout patterns. A post-layout pattern represents a part or whole of a standard cell and contains information regarding the pattern including, but not limited to, layout, timing, area, power and noise. As the metacells are created from post-layout patterns, the inaccuracies of prior dynamic library techniques are easily avoided. Such metacells, being design-specific, are optimized to satisfy the constraints imposed by the design context, thus bringing the powerful design-specific customization to standard cell-based design methodology.

Abstract: An embodiment provides systems and techniques for determining a process model. During operation, the system may receive a first optical model which models a first optical system of a photolithography process. Next, the system may use the first optical model to determine a second optical model that models a second latent image that is formed by the first optical system at a second distance. The system may also use the first optical model to determine a third optical model that models a third latent image that is formed by the first optical system at a third distance. Next, the system may receive process data which is obtained by subjecting a test layout to the photolithography process. The system may then determine a process model using the first optical model, the second optical model, the third optical model, the test layout, and the process data.

Abstract: A system and method to optimize a circuit layout, and more particularly, to a system and method of post layout data preparation to optimize a circuit layout and reduce random and systematic wire and via opens and shorts. The method includes stripping existing vias in a design layout and determining design parameters of the design layout including wiring placement and dimensions. The method further includes optimizing via layout by placing vias away from edges of the wiring and adjacent vias.

Abstract: Standard cell libraries and methods of designing semiconductor integrated circuits are provided. At least one of delay-adjusting cell data and load-capacitor cell data is stored in the cell library for a specified type standard cell in addition to the standard cell data. The specified type standard cell may be utilized as a delay-adjusting cell or a load-capacitor cell. Accordingly, precise adjustment of delay times during designing a semiconductor integrated circuit is enabled without requiring registering a new standard cell in the cell library. Semiconductor integrated circuits are also provided that are configured to allow precise adjustment of delay times in the semiconductor integrated circuits.

Abstract: A method of designing a semiconductor device includes: (A) dividing a layout region of a semiconductor chip into matrix by a unit region; and (B) determining an interconnection layout such that an occupation ratio of a high-density region to the layout region is less than 50%. Here, the high-density region is a set of the unit regions in each of which interconnection density is higher than a predetermined reference value.

Abstract: A memory cell for interconnection with READ and WRITE word lines and READ and WRITE bit lines includes a logical storage element such as a flip-flop formed by a first inverter and a second inverter cross-coupled to the first inverter. The storage element has first and second terminals and a storage element supply voltage terminal configured for interconnection with a first supply voltage. A WRITE access device is configured to selectively interconnect the first terminal to the WRITE bit line under control of the WRITE word line, and a pair of series READ access devices are configured to ground the READ bit line when the READ word line is active and the second terminal is at a high logical level. A logical “one” can be written to the storage element when a second supply voltage, greater than the first supply voltage, is applied to the WRITE word line, substantially without the use of a complementary WRITE bit line.