Abstract: A scintillation crystal can include Ln(1-y)REyX3, wherein Ln represents a rare earth element, RE represents a different rare earth element, y has a value in a range of 0 to 1, and X represents a halogen. In an embodiment, the scintillation crystal is doped with a Group 1 element, a Group 2 element, or a mixture thereof, and the scintillation crystal is formed from a melt having a concentration of such elements or mixture thereof of at least approximately 0.02 wt. %. In another embodiment, the scintillation crystal can have unexpectedly improved proportionality and unexpectedly improved energy resolution properties. In a further embodiment, a radiation detection apparatus can include the scintillation crystal, a photosensor, and an electronics device. Such a radiation detection apparatus can be useful in a variety of applications.

Abstract: A process for manufacturing at least one microbolometer comprising a sensitive material based on vanadium oxide containing nitrogen as additional chemical element, includes steps of determining a non-zero effective amount of the additional chemical element starting from which the sensitive material, having undergone a step of exposure to a temperature Tr for a duration ?tr, has an electrical resistivity ?a|r at ambient temperature greater than or equal to 50% of the native value ?a of said sensitive material at ambient temperature; producing the sensitive material in a thin layer having an amount of the additional chemical element greater than or equal to the effective amount determined beforehand, the sensitive material being amorphous and having an electrical resistivity of between 1 and 30 ?·cm; and exposing the sensitive material to a temperature Tr for a duration ?tr.

Abstract: A treatment planning apparatus include: a quality metric generator configured to electronically generate a first quality metric based on input received via a user interface; an optimizer configured to determine treatment parameters for a treatment plan that is executable by a processing unit of a treatment machine to operate the treatment machine, wherein the optimizer is configured to determine the treatment parameters for the treatment plan based on the first quality metric; and a controller configured to influence how the optimizer performs optimization, wherein the controller is configured to provide a first continuous function for the first quality metric.

Abstract: A fluid analyzer includes an optical source and an optical detector defining an optical beam path through an interrogation region of a fluid flow cell. Flow-control devices conduct analyte and reference fluids through a channel and the interrogation region, and manipulate fluid flow in response to control signals to move a fluid boundary separating the analyte and reference fluids across the interrogation region. A controller generates control signals to (1) cause the fluid boundary to be moved across the interrogation region accordingly, (2) sample an output signal from the optical detector at a first interval during which the interrogation region contains more analyte fluid than reference fluid and at a second interval during which the interrogation region contains more reference fluid than analyte fluid, and (3) determine from samples of the output signal a measurement value indicative of an optically measured characteristic of the analyte fluid.

Abstract: There is described a motion detection system of a building automation system comprising a motion sensing component and a processor. The motion sensing component is configured to generate a raw signal. The processor is configured to establish first-order difference signals based on the raw signal. The processor is also configured to identify in-band energy in a motion portion of a sensor frequency range based on the first-order difference signals and identify total energy in the sensor frequency range based on the first-order difference signals. In addition, the processor is configured to determine a ratio of the in-band energy and the total energy and generate a motion status update in response to determining that the ratio meets or exceeds a predetermined ratio threshold.

Abstract: According to one embodiment, a photon-counting detector (PCD) includes a plurality of macro-pixels. The plurality of macro-pixels arranged on a semiconductor crystal has a first face and a second face. The first face and the second face are parallel. Each macro-pixel from the plurality of macro-pixels is configured to acquire projection data for generating a reconstructed image. The plurality of macro-pixels each includes at least one large micro-pixel is disposed within the each macro-pixel and at least two small micro-pixels is disposed within the each macro-pixel. Each of the at least two small micro-pixels has a surface area that is less than a surface area of the at least one large micro-pixel.

Abstract: Provided are backscatter detection systems and methods implementing sensor arrays comprising flexible scintillators, and associated methods of operations. Specifically, an apparatus for detecting backscatter of a radiation beam formed in response to the radiation beam encountering an object comprises a structure configured to change from a first shape to a second shape. The apparatus further comprises a sensor array which comprises a flexible scintillating panel covering an area of the structure, and configured to conform to the shape of the structure form the first shape to the second shape. The flexible scintillating panel may comprise a plurality of optical fibers enclosed in a semi-rigid casing and coupled to a light detector. The plurality of optical fibers may be arranged in one or more layers. A layer of optical fibers may be arranged in a plurality of clusters or in an interwoven configuration.

Abstract: A core analysis system having a trailer and an analysis assembly secured to the trailer. The analysis assembly includes an X-ray Fluorescence (XRF) detection subassembly defining a sample analysis area. The analysis assembly further includes a conveyor subassembly configured to selectively deliver one or more core samples to the sample analysis area of the XRF detection subassembly.

Abstract: Disclosed is a method of determining an X-ray image for a liquid crystal X-ray detector. The method includes a first step of measuring a reference transmittance of a pixel while varying a bias voltage in a state in which an X-ray sensing liquid crystal panel is not irradiated with an X-ray, a second step of separating electrons and holes in the X-ray sensing liquid crystal panel by applying a separation voltage and irradiating the X-ray sensing liquid crystal panel with an X-ray, a third step of measuring a detection transmittance of a pixel by applying a measurement voltage to the X-ray sensing liquid crystal panel, a fourth step of deriving a bias voltage of a reference transmittance of the pixel corresponding to the detection transmittance, and a fifth step of determining an X-ray image of the pixel by subtracting the measurement voltage from the bias voltage derived in the fourth step.

Abstract: A method for determining characteristics of a structure is disclosed. The method comprises repetitively irradiating the structure with a transient continuous wave electromagnetic radiation and capturing as a function of time a transient part of the reflection or transmission of the transient continuous wave electromagnetic radiation reflected at or transmitted through the different interfaces of layer-based structure. The method furthermore comprises deriving from the transient part of the reflected or transmitted transient continuous wave electromagnetic radiation as function of time information regarding different contributions in the transient part of the reflected or transmitted transient continuous wave electromagnetic radiation stemming from the reflections at different interfaces of the structure and determining from said information at least geometric information and/or electromagnetic properties of the one or more materials of the structure. A corresponding system also is claimed.

Abstract: The invention concerns a detection device for detecting electromagnetic radiation, comprising a substrate, an array of thermal detectors, each thermal detector comprising a suspended absorbent membrane and a reflective layer. The detection device comprises at least one opaque vertical wall, arranged on the substrate and extending longitudinally between two adjacent thermal detectors, and produced from a material that is opaque to the electromagnetic radiation to be detected.

Abstract: A method and system is disclosed for acquiring image data of a subject. The image data can be collected with an imaging system in a selected manner and/or motion. More than one projection may be combined to generate and create a selected view of the subject.

Abstract: A method and apparatus for neutron radiography is provided for the examination of elongate radioactive items, primarily nuclear fuel elements, and also for the non-destructive testing of irradiated and non-irradiated objects in order to determine the internal structure and material composition thereof. The method and apparatus include placing an object under examination into a protective container. A detection system includes a rotatable limb with a mounting seat for securing neutron detectors in a diametric groove. The limb being mounted to be rotatable by a set angle about an axis parallel to the axis of the object under examination and having a semi-circular recess therein for the passage of an elongate object as the limb rotates by an angle ±?i relative to the direction of a neutron beam.

Abstract: The invention relates to a detector (110) for optical detection comprising a circuit carrier (130) designed to carry at least one layer, wherein the circuit carrier (130) is or comprises a printed circuit board (132); a reflective layer (138), the reflective layer (138) being placed on a partition of the circuit carrier (130), wherein the reflective layer (138) is designed to reflect the incident light beam (120), thereby generating at least one reflected light beam (124); a substrate layer (114), the substrate layer (114) being directly or indirectly adjacent to the reflective layer (138), wherein the substrate layer (114) is at least partially transparent with respect to the incident light beam (120); a sensor layer (122), the sensor layer (122) being placed on the substrate layer (114), wherein the sensor layer (122) is designed to generate at least one sensor signal in a manner dependent on an illumination of the sensor layer (122) by the incident light beam and the reflected light beam (124); and an eval

Abstract: A sealing element that visually indicates when a sealing element has been opened or corrupted without destruction of the seal. Ultraviolet light passes through a scattering layer and is absorbed by a fluorescing layer, the fluorescing layer reemitting the light in the visual spectrum and thereby allowing a user to inspect the integrity of the sealing element without otherwise destroying the seal.

Abstract: A sampling tool for use with an infrared spectrophotometer, and method of use. The sampling tool comprises a bottom plate; and a mesh attached to the bottom plate, the mesh having a plurality of interstitial spaces, and the mesh having a mesh width and a mesh thickness, wherein the mesh is configured to receive a sample material and retain a portion of the sample material within the interstitial spaces of the mesh to form a sample having a sample thickness which is substantially the same as the mesh thickness. The mesh width may be sized to be in a range of about 1 to 3 times the width of an infrared beam directed toward the sampling tool from the spectrophotometer.

Abstract: Computer-implemented methods for monitoring the functional state of a system for the computer-tomographic examination of workpieces by carrying out one or more computer-tomographic measurements on the workpiece. The measurements each result here in at least one measured value for at least one measurement variable. The method for monitoring the functional state selects measured values for at least one measurement variable from at least two measurements on one or more workpieces. At least one degree of variation for the selected measured values of the at least one measurement variable as well as at least one reference degree of variation for measured values of the at least one measurement variable is determined. The functional state of the system is determined by comparing the at least one determined degree of variation with the at least one reference degree of variation for the at least one measurement variable.

Abstract: Lower surface 2c or upper surface 2d of object to be sorted 2 is processed such that arithmetic mean roughness Ra is not less than 0.025 ?m in not less than 50% of lower surface 2c or upper surface 2d, object to be sorted 2 is irradiated with infrared light, and reflected light 4 from lower surface 2c or upper surface 2d of object to be sorted 2 is received, thereby determining a resin type of object to be sorted 2 on the basis of a reflection or absorption spectrum of object to be sorted 2 obtained from reflected light 4.

Abstract: The present invention provides an infrared detector pixel structure and manufacturing method thereof.

Abstract: A method, apparatus, system, and computer program product for automatically determining exposure time for an intraoral image. The method includes acquiring a low dose pilot projection image of an object to be imaged, performing a sanity check to ensure that a usable exposure is attainable, estimating a remaining exposure time required for an additional projection image, taking the additional projection image and adding the two images together to generate a final image wherein the dose delivered to the x-ray detector is influenced by patient specific dental anatomy.