Patents Examined by Christine S Kim
  • Patent number: 11022554
    Abstract: A method of detecting a presence of foreign material in a ply is disclosed. A source of foreign material is marked with a fluorescent indicator. The source of foreign material is separated from the ply. An illumination source is provided for illuminating the ply at a different wavelength than the fluorescent indicator fluoresces so that the ply reflects light at a different wavelength. A sensor detects illumination of the ply and fluorescent indicator included in the foreign material disposed upon the ply. Differences in light reflected from the ply and fluorescence of the indicator disposed in the foreign material are detected thereby identifying existence of the foreign material in the ply.
    Type: Grant
    Filed: April 5, 2019
    Date of Patent: June 1, 2021
    Assignee: VIRTEK VISION INTERNATIONAL ULC
    Inventor: Kurt D. Rueb
  • Patent number: 11026319
    Abstract: Embodiments of the present disclosure disclose a multi-output high-voltage power supply including a channel selection circuit (103) including a plurality of switches; and a high-voltage power supply module (101) connected to the channel selection circuit (103), wherein the high-voltage power supply module (101) includes a fine adjusting power supply component (110) and a plurality of coarse adjusting power supply components (120-1 to 120-N) connected in series, wherein one high-voltage output terminal of the high-voltage power supply module (101) is connected to a common terminal of the channel selection circuit (103), and the other high-voltage output terminal of the high-voltage power supply module (101) is grounded through a current sampling resistor.
    Type: Grant
    Filed: December 26, 2019
    Date of Patent: June 1, 2021
    Assignees: Tsinghua University, NUCTECH COMPANY LIMITED, NuRay Technology Co., Ltd
    Inventors: Yuanjing Li, Yaohong Liu, Huaping Tang, Jinsheng Liu, Xiying Liu, Zhanfeng Qin, Wei Jia, Jinsong Pan
  • Patent number: 11009470
    Abstract: Based on counts detected by a photon counting detector, a characteristic of X-ray attenuation amounts ?t is acquired for each X-ray energy bin. This characteristic is defined by a plurality of mutually different known thicknesses t and linear attenuation coefficients in the X-ray transmission direction. This substance is composed of a material which is included in an object and which is the same in type as the object or which can be regarded as being similar to the object in terms of the effective atomic number. Correcting data for replacing the characteristic of the X-ray attenuation amounts ?t by a linear target characteristic are calculated. The linear target characteristic is set to pass through the origin of a two-dimensional coordinate having a lateral axis assigned to thicknesses t and a longitudinal axis assigned to the X-ray attenuation amounts ?t. The correcting data are calculated for each X-ray energy bin.
    Type: Grant
    Filed: October 24, 2016
    Date of Patent: May 18, 2021
    Assignee: JOB CORPORATION
    Inventors: Tsutomu Yamakawa, Shuichiro Yamamoto, Masahiro Okada
  • Patent number: 11009612
    Abstract: A control apparatus may include a processor for calculating a detection efficiency, which is detected by a gamma-ray detection unit, of gamma-rays emitted from a sample stuffed into a first container. A shape of the first container is a shape which surrounds at least a part of the gamma-ray detection unit that detects the gamma-rays. An area inside the first container is divided into a plurality of similar areas which is area similar in shape to each other. The gamma-ray detection unit detects the gamma-rays emitted from the sample included in each the similar areas for each of the plurality of similar areas. The processor calculates the detection efficiency as a similar-area-detection efficiency based on a result of detection performed by the gamma-ray detection unit.
    Type: Grant
    Filed: June 26, 2018
    Date of Patent: May 18, 2021
    Assignee: SEIKO EG&G CO., LTD.
    Inventor: Yuki Hattori
  • Patent number: 11002672
    Abstract: An apparatus is disclosed for generating electromagnetic waves such as terahertz waves. The apparatus may comprise a finger structure having a plurality of conductive lines, wherein at least two of the plurality of conductive lines is separated by photosensitive material, a plurality of detectors, and a capacitor having a plurality of conductive lines separated by a dielectric material. Light from a laser incident on the photosensitive material causes free carriers in the photosensitive material to move to a conduction band and be accelerated by a voltage across the conductive lines of the finger structure applied by the capacitor to produce the terahertz waves.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: May 11, 2021
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Wolfgang Hartmut Nitsche, John Laureto Maida
  • Patent number: 10993679
    Abstract: Disclosed is a portable X-ray generation device, which uses an electric field emission X-ray source, and is thus advantageous in reducing weight and volume and has excellent reliability in X-ray emission performance. The portable X-ray generation device according to the present invention includes an electric field emission X-ray source, which includes a cathode electrode having an electron emitter, an anode electrode having an X-ray target surface, and a gate electrode between the cathode electrode and the anode electrode; and a driving signal generator configured to generate at least three driving signals applied to the cathode electrode, the anode electrode, and the gate electrode, respectively, by direct current power having a predetermined voltage, wherein the driving signal generator includes a current controller maintaining a tube current between the anode electrode and the cathode electrode to have a constant value during X-ray emission.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: May 4, 2021
    Assignees: VATECH Co., Ltd., VATECH EWOO Holdings Co., Ltd.
    Inventors: Seunghun Shin, Jinpyo Chun, Taewoo Kim
  • Patent number: 10989822
    Abstract: An x-ray spectrometer includes at least one x-ray optic configured to receive x-rays having an incident intensity distribution as a function of x-ray energy and at least one x-ray detector configured to receive x-rays from the at least one x-ray optic and to record a spatial distribution of the x-rays from the at least one x-ray optic. The at least one x-ray optic includes at least one substrate having at least one surface extending at least partially around and along a longitudinal axis. A distance between the at least one surface and the longitudinal axis in at least one cross-sectional plane parallel to the longitudinal axis varies as a function of position along the longitudinal axis. The at least one x-ray optic further includes at least one mosaic crystal structure and/or a plurality of layers on or over at least a portion of the at least one surface.
    Type: Grant
    Filed: May 30, 2019
    Date of Patent: April 27, 2021
    Assignee: Sigray, Inc.
    Inventors: Wenbing Yun, Janos Kirz, Benjamin Donald Stripe
  • Patent number: 10976246
    Abstract: A method and apparatus for field spectroscopic characterization of seafood is disclosed. A portable NIR spectrometer is connected to an analyzer configured for performing a multivariate analysis of reflection spectra to determine qualitatively the true identities or quantitatively the freshness of seafood samples.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: April 13, 2021
    Assignee: VIAVI Solutions Inc.
    Inventors: Nada A. O'Brien, Charles A. Hulse, Heinz W. Siesler, Changmeng Hsiung
  • Patent number: 10969336
    Abstract: An optical signal detection module includes an optical measurement device (OMD) configured to detect an optical emission signal from an emission signal source placed in a signal-detecting position of the OMD. The optical signal detection module also includes a cover moveable between a closed position covering the signal-detecting position and an open position not covering the signal-detecting position. The cover includes an optical reference material that emits a reference emission detectable by the OMD. The cover is configured so that, when the cover is in the closed position, the inner surface is in the signal-detecting position of the OMD so that the OMD detects the reference emission. The optical signal detection module can also include a drive assembly coupled to the cover and configured to move the cover between the open position and the closed position. In some embodiments, the OMD can include a fluorometer.
    Type: Grant
    Filed: June 8, 2016
    Date of Patent: April 6, 2021
    Assignee: GEN-PROBE INCORPORATED
    Inventors: Norbert D. Hagen, David Opalsky, George T. Walker, Byron J. Knight
  • Patent number: 10961558
    Abstract: A spectroscopic method and system detects the amount of one or more substances or contaminants in or on a product, such as fecal contamination on meat samples.
    Type: Grant
    Filed: March 16, 2020
    Date of Patent: March 30, 2021
    Assignee: VERITIDE LIMITED
    Inventors: Joon Koo Choi, Craig Simon Tuffnell, James Martin Boulton
  • Patent number: 10964439
    Abstract: An X-ray diffraction apparatus having a solar slit, and a method for preventing the diffraction image on a detector from spreading in the in-plane direction even when an X-ray irradiation region spreads over the sample surface due to measurement by GIXD, thereby allowing for measurement with a short measurement time and a high resolution. The soller slit 100 includes a plurality of metallic thin plates 110, each being perpendicular to the bottom surface, which are arcuately arranged with a predetermined angular interval between each other so as to pass X-rays in a radiating direction from a particular focus, the soller slit being provided to be used at a position through which X-rays diffracted on a sample surface pass, the particular focus being the center of a goniometer circle, the X-rays being irradiated on a sample at an angle for GIXD.
    Type: Grant
    Filed: October 24, 2018
    Date of Patent: March 30, 2021
    Assignee: RIGAKU CORPORATION
    Inventors: Ladislav Pina, Adolf Inneman, Kazuhiko Omote, Shintaro Kobayashi
  • Patent number: 10955569
    Abstract: Detector systems for enhanced radiographic imaging incorporate x-ray CT imaging capabilities. The detector designs employ a layer of detector modules comprised of edge-on or face-on detectors, or a combination of edge-on and face-on detectors, and may employ structured detectors. The detectors can operate in a non-coincidence or coincidence detection mode.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: March 23, 2021
    Assignee: Minnesota Imaging and Engineering LLC
    Inventors: Robert Sigurd Nelson, William Bert Nelson
  • Patent number: 10948405
    Abstract: The present invention relates to a gas sensor employing a non-dispersive infrared (NDIR) scheme. The gas sensor may comprise: a light source portion for emitting light; a light cavity portion for multi-reflecting the emitted light; a light detecting portion for detecting the multi-reflected light; a first light coupling portion for reflecting and concentrating the light emitted by the light source portion toward the light cavity portion; and a second light coupling portion for reflecting and concentrating the light reflected by the light cavity portion toward the light detecting portion.
    Type: Grant
    Filed: February 22, 2017
    Date of Patent: March 16, 2021
    Assignee: LG ELECTRONICS INC.
    Inventors: Minwoo Lee, Junho Sung
  • Patent number: 10932734
    Abstract: Disclosed is a portable X-ray generation device, which uses an electric field emission-type X-ray source, and is thus advantageous in reducing weight and volume and has excellent reliability in X-ray emission performance.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: March 2, 2021
    Assignees: VATECH Co., Ltd., VATECH EWOO Holdings Co., Ltd.
    Inventors: Seunghun Shin, Jinpyo Chun, Taewoo Kim
  • Patent number: 10921267
    Abstract: An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1.
    Type: Grant
    Filed: September 3, 2019
    Date of Patent: February 16, 2021
    Assignee: Rigaku Corporation
    Inventors: Yoshiyuki Kataoka, Kosuke Kawakyu
  • Patent number: 10918284
    Abstract: Provided is a reliable or accurate optical detection method or such an optical imaging method. Also provided is an application technique using such a method. At least a part of an optical path starting from a light-emitting source or reaching a photodetector includes a plurality of optical paths. At a predetermined position of the optical path, beams of light after passing through the plurality of optical paths are mixed. This mixed light is used for optical detection or optical imaging. An optical-length difference among beams of light passing through the plurality of optical paths may be longer than the coherence length. Means for feed-backing predetermined characteristics of a target to the optical characteristics to be used for optical detection or optical imaging may be included. Such means may be used separately from the above. Such means may be applied to another technique, an application material or an application program.
    Type: Grant
    Filed: April 20, 2020
    Date of Patent: February 16, 2021
    Assignee: HIDEO ANDO
    Inventor: Hideo Ando
  • Patent number: 10914851
    Abstract: Time of flight (TOF) corrections for radiation detector elements of a TOF positron emission tomography (TOF PET) scanner are generated by solving an over-determined set of equations defined by calibration data acquired by the TOF PET scanner from a point source located at an isocenter of the TOF PET scanner, suitably represented as matrix equation at ?t=CS where ?t represents TOF time differences, C is a relational matrix encoding the radiation detector elements, and S represents the TOF corrections. A pseudo-inverse C?1 of relational matrix C may be computed to solve S=C?1 ?t. TOF corrections can be generated for a particular type of detector unit by identifying the radiation detector elements in C by detector unit. Further, multi-photon triggering time stamps can be adjusted to first-photon triggering based on ?{square root over (P1/Pm)} where P1 is average photon count using first-photon triggering and Pm is a photon count using multi-photon triggering.
    Type: Grant
    Filed: June 25, 2020
    Date of Patent: February 9, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Sharon Xiaorong Wang, Thomas Leroy Laurence
  • Patent number: 10912529
    Abstract: A method for determining a current remaining time during a measurement for the purpose of medical imaging, an evaluation unit, a medical imaging device, and a computer program product are provided. The method provides for a permitted operating range and an item of extrapolation information regarding the critical event to be provided. The current remaining time is determined by an evaluation unit based on the permitted operating range and the item of extrapolation information.
    Type: Grant
    Filed: July 14, 2017
    Date of Patent: February 9, 2021
    Assignee: Siemens Healthcare GmbH
    Inventor: Rainer Schneider
  • Patent number: 10910190
    Abstract: An embodiment of the inventive concept provides an X-ray tube including a chamber having a hollow pillar shape using a first axis as a central axis, a cathode electrode disposed on a bottom surface of the chamber, an emitter provided at a position at which the cathode electrode meets the first axis, an anode electrode including a through-hole using the first axis as a central axis and a target layer inclined to the first axis, a gate electrode disposed between the cathode electrode and the anode electrode and having an opening exposing the emitter, a focusing electrode disposed between the gate electrode and the anode electrode, a window spaced apart from the target layer of the anode electrode, and a window electrode provided on a top surface of the chamber to fix a side surface of the window. Here, the window electrode is grounded.
    Type: Grant
    Filed: January 6, 2020
    Date of Patent: February 2, 2021
    Assignee: Electronics and Telecommunications Research Institute
    Inventor: Jin-Woo Jeong
  • Patent number: 10901230
    Abstract: Example super-resolution microscopy systems are described herein that are configured for relatively high throughput. The disclosed microscopy systems can be to generate an array of sub-diffraction activated areas for imaging. The microscopy systems can be to utilize imaging techniques that employ time delay integration to build up super-resolution images over time. The disclosed microscopy systems can utilize long-lived fluorophores in conjunction with wide field and patterned illumination to generate super-resolution images of a sample with relatively high throughput.
    Type: Grant
    Filed: June 20, 2017
    Date of Patent: January 26, 2021
    Assignees: ILLUMINA, INC., ILLUMINA CAMBRIDGE LIMITED
    Inventors: Gary Mark Skinner, Geraint Wyn Evans, Stanley S. Hong, John A. Moon, M. Shane Bowen, Jonathan Mark Boutell, Jason Richard Betley