Abstract: A stress distribution measurement method is a method of measuring stress distribution generated on a structural object including two support parts and a beam part provided between the support parts. The method includes: generating first image data by performing, through a first image capturing unit, image capturing of a moving object or an identification display object attached to the structural object from the moving object; calculating, based on the first image data, a movement duration in which the moving object moves between the support parts; generating, as second image data, thermal image data by performing image capturing of the surface of the beam part through a second image capturing unit; calculating a temperature change amount based on a second image data group corresponding to the movement duration; and calculating a stress change amount based on the temperature change amount to calculate stress distribution based on the stress change amount.

Abstract: A radiation detector includes a substrate and a membrane suspended above the substrate by spacers, wherein the spacers electrically contact a radiation sensor formed in the membrane and thermally insulate the membrane from the substrate.

Abstract: Embodiments of the present disclosure include a method that includes activating a neutron generation unit operable to emit neutrons toward a target for a first period of time. The method also includes recording first measurement data, via a detection unit, during the first period of time. The method further includes deactivating the neutron generation unit after the first period of time. The method also includes processing at least a portion of the first measurement data after the first period of time, the first measurement data being correlated to burst gate. The method includes recording second measurement data, via the neutron detection unit, during a second period of time, the second measurement data being correlated to a capture gate.

Abstract: An observation apparatus includes: alight source that emits pulsed light; and an objective that includes a first optical element serving as a light guide part and irradiates a sample with the pulsed light. The first optical element consists of a medium that satisfies the following conditional expression for ?1 and ?2: 0.75<?2/?1<1.33 where ?1=(n2?n1)/(?2??1) and ?2=(n3?n2)/(?3??2) are satisfied (?1 indicates a light wavelength of 706.52 nm; ?2 indicates a light wavelength of 1529.6 nm; ?3 indicates a light wavelength of 2325.4 nm; and n1, n2, and n3 respectively indicate refractive indexes that the medium has for ?1, ?2, and ?3).

Abstract: A radiation source that simultaneously produces two radiation frequencies of combined radiation, in order to break apart a mutated DNA base pair. The radiation source produces combined radiation, the combined radiation being for a thymine base and a cytosine base in a thymine and cytosine base pair. The radiation source produces combined radiation, the combined radiation being for a guanine base and a thymine base in a guanine and thymine base pair. The radiation source produces combined radiation, the combined radiation being for an adonine base and a guanine base in an adonine and guanine base pair. The radiation source produces combined radiation, the combined radiation being for an adonine base and a cytosine base in an adonine and cytosine base pair.

Abstract: A charged particle device includes an electron emitting part for emitting electrons, an electron irradiated part configured to be irradiated with the electrons emitted from the electron emitting part, a container part configured to evacuate an interior thereof and contain the electron irradiated part in the interior thereof, an electric wire containing part configured to be inserted from an outside of the container part via an insertion part provided in the container part to contain an electric wire through which electricity is conducted to the electron irradiated part contained in the container part, and an insertion-part-side protrusion part configured to surround the electric wire containing part and protrude from a vicinity of the insertion part on an inner wall of the container part to an interior of the container part.

Abstract: Systems, methods, and apparatuses having an array of micro mirrors that rotate according to absorbed radiation and reflect light to generate light spots. In a first setting, a processor obtains an image of the light spots, determines positions of the light spots using a computationally efficient but less accurate method to calculate the intensities of radiation directed at the micro mirrors, and provides the calculated radiation. In a second setting, the processor does not determines the position; and the image is transmitted to a separate computing device to determine positions of the light spots using a computationally intensive but more accurate method to calculate the intensities of radiation directed at the micro mirrors. The system can dynamically switch between the first setting and second setting without a need to adjust hardware.

Abstract: A measurement device includes an emitter configured to emit an electromagnetic signal to an object to be measured. A first detector is disposed to measure a first portion of the electromagnetic signal that is reflected by the object to be measured. A second detector is disposed to measure a second portion of the electromagnetic signal that is transmitted through the object to be measured. The emitter is configured to emit the electromagnetic signal in a direction substantially perpendicular to a surface of the object to be measured.

Abstract: The present invention discloses a thermal pile sensing structure integrated with one or more capacitors, which includes: a substrate, an infrared sensing unit and a partition structure. The infrared sensing unit includes a first and a second sensing structure. A hot junction is formed between the first and the second sensing structures at a location where the first and the second sensing structures are close to each other. A cold junction is formed between the partition structure and the first sensing structure at a location where these two structures are close to each other. Another cold junction is formed between the partition structure and the second sensing structure at a location where these two structures are close to each other. A temperature difference between the hot junction and the cold junction generates a voltage difference signal. Apart of the partition structure forms at least one capacitor.

Abstract: When performing CT imaging while maintaining a state in which a rotational axis Ax and an irradiation axis (optical axis) intersect obliquely, the X-ray CT apparatus 1 of the present invention can make assessments from a group of cross-sectional images resulting from provisional CT imaging, so even an unskilled person can determine a specific cross-sectional image with high precision, and can further determine the CT imaging conditions so that the cross-sectional image is positioned in the center. In addition, by performing main imaging by narrowing the target field from provisional CT imaging, CT imaging can be performed without the portion to be viewed deviating from the field of view. As a result, the operator can perform CT imaging without repeating a process of trial and error involving performing CT imaging while changing the CT imaging conditions, and CT imaging can be performed efficiently without requiring skill.

Abstract: The present disclosure relates to systems and methods for heat transfer and cooling in PET. The system may include a gantry including a gantry forming a detection tunnel; a detector mounted to the gantry, and positioned in a circumference of the detection tunnel; a heat transfer device thermally coupled with the detector and configured to transfer heat generated by the detector; and a cooling device thermally coupled to the heat transfer device, and configured to cool the heat transfer device.

Abstract: The present invention provides a portable x-ray device with a housing having a side and rear handle, each with triggers and indicator lights in locations suitable for manipulation for use. A trigger is located at each end of each handle and deposed at an angle to be actuated by an operator, with the triggers on one handle controlling a function of the device and the triggers of the other handle controlling a different function. The invention also provides a system including a device with a processor and a wireless device for communication with an external processor.

Abstract: An energy-resolving x-ray detection system is provided, the system including at least one x-ray optic configured to receive x-rays having an energy bandwidth with a maximum x-ray energy. The at least one x-ray optic has at least one concave surface extending at least partially around and along a longitudinal axis. The at least one concave surface is curved in at least one cross-sectional plane parallel to the longitudinal axis and is configured to direct at least some of the received x-rays into at least one convergent x-ray beam having a minimum beam width in a plane perpendicular to the longitudinal axis. The minimum beam width is at a location and the at least one concave surface has an x-ray reflectivity less than 30% for x-rays having energies greater than one-third of the maximum x-ray energy. The system further includes at least one energy-dispersive x-ray detector configured to receive at least a portion of the at least one convergent x-ray beam.

Abstract: The present disclosure proposes a security inspection equipment and a radiation detection method, and relates to the field of security inspection. The security inspection equipment according to the present disclosure includes: a ray emitter; and a radiation detector comprising a forescatter detector, the forescatter detector and the ray emitter located on opposite sides of an object to be detected; wherein the radiation detector further comprises at least one of the following detectors: a backscatter detector located between the ray emitter and the object to be detected; or a transmission detector wherein the transmission detector and the ray emitter located on opposite sides of an object to be detected. Such a security inspection equipment has a forescatter detector, which can be used in combination with backscatter detector, to reduce detection dead angles.

Abstract: The present invention provides an infrared detector pixel structure and manufacturing method thereof. The bottom portion of a silicon substrate is bonded with a bonding substrate, an infrared absorbing layer in the bonding substrate is used for absorbing a part of infrared light, a closed cavity filled with infrared-sensitive gas is set in the silicon substrate, and a piezoelectric transforming unit is bonded onto the closed cavity. When the infrared-sensitive gas absorbs the infrared light to expand, the infrared sensitive gas will press the piezoelectric transforming unit, which causes piezoelectric signal generated by the piezoelectric transforming unit to be changed, thereby achieving the detection on the infrared light.

Abstract: An x-ray inspection apparatus may comprise an x-ray source, an x-ray detector, and a drive assembly. The drive assembly may be configured to lift a part carrier such that the part carrier is disengaged from a feed assembly and an object mounted on the part carrier is positioned between the x-ray source and the x-ray detector. The feed assembly may be configured to feed part carriers into and out of the x-ray inspection apparatus. The drive assembly may be further configured to subsequently lower the part carrier such that the part carrier is reengaged with the feed assembly.

Abstract: A core analysis system having a trailer and an analysis assembly secured to the trailer. The analysis assembly includes an X-ray Fluorescence (XRF) detection subassembly defining a sample analysis area. The analysis assembly further includes a conveyor subassembly configured to selectively deliver one or more core samples to the sample analysis area of the XRF detection subassembly.

Abstract: An inspection apparatus is provided with: an irradiating device configured to irradiate a sample in which a plurality of layers are laminated with a terahertz wave; a detecting device configured to detect the terahertz wave from the sample to obtain a detected waveform; and an estimating device configured to estimate a position of a first boundary surface on the basis of a second boundary surface pulse wave and a library, the second boundary surface pulse wave appearing in the detected waveform to correspond to a second boundary surface that is farther from an outer surface than the first boundary surface, the library representing an estimated waveform of the terahertz wave from the sample.

Abstract: A radiation imaging apparatus includes a pixel array in which a plurality of pixels are arrayed and a processing unit configured to process pixel signals non-destructively read out from the respective pixels. The processing unit performs a first process of obtaining image data of a plurality of frames by repeatedly reading out image data while the pixel array is irradiated with radiation, with a group of pixel signals from the plurality of pixels corresponding to image data of one frame, and a second process of generating data for a radiation image based on data differences between the image data of the plurality of frames.

Abstract: A radiographic imaging apparatus is provided. The apparatus comprises a sensor panel in which pixels are provided and a processor that generates an image that corresponds to the number of radiation photons incident on each of the pixels. In an imaging mode in which an image formed by radiation that has passed through a subject is generated, the processor generates a correction signal by correcting a value of a signal output from the conversion element of each of the pixels according to a correction coefficient for converting the value of the signal output from the conversion element on which a radiation photon was incident to a value that corresponds to an energy value of the radiation photon, and generates an image based on the number of correction signals of pixels on which a radiation photon was incident from among the correction signals of the pixels.