Patents Examined by Daniel F McMahon
  • Patent number: 11966777
    Abstract: A hardware state machine connected to a processor, the hardware state machine configured to receive operational codes from the processor; a multiplexer connected to the processor, the hardware state machine and a checksum circuit, the multiplexer configured to receive data from the processor; and a transmit circuit connected to the multiplexer, the transmit circuit configured to receive data from the multiplexer for transmission to a far end device, wherein the hardware state machine is further configured to, responsive receiving one or more operational codes from the processor: cause the checksum circuit to alter a checksum value of a first data packet being transmitted by the transmit circuit; and cause the transmit circuit to preempt transmission of the first data packet and begin transmitting a second data packet once the checksum value so altered has been transmitted from the transmit circuit.
    Type: Grant
    Filed: February 7, 2022
    Date of Patent: April 23, 2024
    Assignee: Texas Instruments Incorporated
    Inventors: Thomas Anton Leyrer, William Cronin Wallace, David Alston Lide
  • Patent number: 11966288
    Abstract: In an electronic apparatus, a processor executes a program stored in memory to perform essential functions. In the event of an error related to these functions, a self-test application is triggered. The processor may identify a relevant test routine from a set of routines, conduct tests on the function using the identified routine, and communicate the test results to a display. Accordingly, when an error occurs while the electronic apparatus is operating, the electronic apparatus can inform a user and a manufacturer of a cause of the error.
    Type: Grant
    Filed: February 10, 2022
    Date of Patent: April 23, 2024
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jaehoon Kim, Sungjun Kim, Kyuseon Son, Seunghee Shin, Myunggyun Yoon, Youngchang Lee
  • Patent number: 11953989
    Abstract: To achieve low-latency register error correction, a register can be read as part of an instruction when that instruction is the currently executing instruction in a processor. A correctable error in data produced from reading the register can be detected. In response to detecting the correctable error, the currently executing instruction in the processor can be changed into a register update instruction that is executed to overwrite the data in the register with corrected data. Then, the original (e.g., unchanged) instruction can be rescheduled.
    Type: Grant
    Filed: November 21, 2022
    Date of Patent: April 9, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Dean E. Walker, Chris Baronne
  • Patent number: 11953987
    Abstract: Example systems, read channels, and methods provide states equalization for a digital data signal in preparation for a soft output detector. The states equalizer determines a set of signal values from the digital data signal and filters the set of signal values through a set of finite impulse response filters configured to generate a set of state values for a target signal value, where each filter corresponds to a potential state of the target signal value. Based on the state values, a set of probabilities for possible states is determined and used to populate a decision matrix for a soft output detector.
    Type: Grant
    Filed: September 16, 2022
    Date of Patent: April 9, 2024
    Assignee: Western Digital Technologies, Inc.
    Inventors: Iouri Oboukhov, Richard Galbraith, Jonas Goode, Henry Yip, Niranjay Ravindran
  • Patent number: 11947819
    Abstract: A method and device for testing a conversion relationship between different reading manners in a flash memory chip and a readable storage medium are provided. Block reading is respectively performed, a bit error rate file is recorded, a test starting point, a test ending point and a test step length are is set in a block, the bit error rate file of the number of times of corresponding page reading is respectively recorded, and the number of times of page reading that is closest to the proportion of block error codes are found from the proportion of page error codes, a conversion of the number of times of block reading and the number of times of page reading is completed, conversion coefficients of the block reading and the page reading can be calculated for blocks in different states of a life cycle.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: April 2, 2024
    Assignee: INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD.
    Inventor: Dong Li
  • Patent number: 11949513
    Abstract: Provided are a method and a device for enabling HARQ feedback information to be transmitted in response to the reception of a downlink data channel in the unlicensed band. The method may include: receiving downlink control information including resource allocation information for a downlink data channel (PDSCH) in an unlicensed band; receiving HARQ timing indication information for transmitting HARQ feedback information in the unlicensed band; and transmitting the HARQ feedback information in the unlicensed band according to the HARQ timing indication information.
    Type: Grant
    Filed: May 14, 2019
    Date of Patent: April 2, 2024
    Assignee: KT CORPORATION
    Inventor: Kyujin Park
  • Patent number: 11947418
    Abstract: A computer system and a method implementing a remote access array are provided. A first drawer includes a first processor chip. A first main memory region is operatively connected to the first processor chip. A first non-addressable memory region is operatively connected to the first processor chip and includes the first remote access array. The first remote access array is configured to track data portions that are stored in the first main memory region and for which copies were created and sent to an external node. The first remote access array is backed up in the first main memory region. The first remote access array includes one or more entries and is configured to update all of the entries in response to a multi-drawer working partition being reduced to fit within the first drawer.
    Type: Grant
    Filed: June 22, 2022
    Date of Patent: April 2, 2024
    Assignee: International Business Machines Corporation
    Inventors: Ram Sai Manoj Bamdhamravuri, Robert J Sonnelitter, III, Ulrich Mayer, Chad G. Wilson, Avery Francois
  • Patent number: 11940874
    Abstract: Methods, systems, and devices for queue management for a memory system are described. The memory system may include a first decoder associated with a first error control capability and a second decoder associated with a second error control capability. The memory system may receive a command and identify an expected latency for performing an error control operation on the command. The memory system may determine whether to assign the command to a first queue associated with the first decoder or a second queue associated with the second decoder based at least in part on the expected latency for processing the command using the first decoder. Upon assigning the command to a decoder, the command may be processed by the first queue or the second queue.
    Type: Grant
    Filed: August 8, 2022
    Date of Patent: March 26, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Nitul Gohain, Jonathan S. Parry, Reshmi Basu
  • Patent number: 11933844
    Abstract: A test override circuit includes a memory that includes multiple memory instances. A path selector receives a control signal from automatic test pattern generator equipment (ATE) to control data access to data paths that are operatively coupled between the memory instances and a plurality of logic endpoints. The path selector generates an output signal that indicates which of the data paths is selected in response to the control signal. A gating circuit enables the selected data paths to be accessed by at least one of the plurality of logic endpoints in response to the output signal from the path selector.
    Type: Grant
    Filed: May 26, 2021
    Date of Patent: March 19, 2024
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Wilson Pradeep, Prakash Narayanan
  • Patent number: 11933845
    Abstract: A boundary scan test method is used to test connectivity of a pad having a direct connection to user logic. The method comprises the following steps: configuring an FPGA to enter a test mode; generating by means of user logic, a boundary scan chain for a boundary scan test; loading a boundary scan test instruction to the FPGA, and loading a PRELOAD instruction to a device having a pad to be tested for connectivity; sending, via a TDI port, a first test vector to the pad; performing the boundary scan test, and loading an EXTEST instruction to the device having the pad; and removing first response data from a TDO port, and performing response analysis and fault diagnosis.
    Type: Grant
    Filed: March 24, 2021
    Date of Patent: March 19, 2024
    Assignee: SHENZHEN PANGO MICROSYSTEMS CO., LTD.
    Inventors: Shiyjun Zhao, Puxia Liu, Qipan Fu
  • Patent number: 11934268
    Abstract: An example apparatus includes a media management superblock component configured to determine that a quantity of blocks of a superblock of a non-volatile memory array are bad blocks; compare the quantity of bad blocks to a bad block criteria; and write host data to the superblock with the quantity of bad blocks in response to the quantity of bad blocks meeting the bad block criteria. The use of the superblock with a particular quantity of bad block minimizes yield loss for non-use of partial superblocks.
    Type: Grant
    Filed: March 6, 2023
    Date of Patent: March 19, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Jianmin Huang, Xiangang Luo, Kulachet Tanpairoj
  • Patent number: 11928027
    Abstract: Embodiments include receiving fixed size error checking and correction data blocks and metadata at a memory controller. Embodiments may include performing data to symbol mapping based upon the fixed size data blocks and providing an output of the data to symbol mapping to a first encoder without metadata configured for full detection correction of single device error and to a second encoder with metadata configured for partial detection correction of single device error. Embodiments may include receiving data at a memory based upon an output from the first encoder and the second encoder and receiving data from the memory at a first decoder without metadata configured for full detection correction of single device error and at a second decoder with metadata configured for partial detection correction. Embodiments may include re-mapping symbol data from the first decoder and the second decoder to actual data and generating output data blocks and metadata.
    Type: Grant
    Filed: September 26, 2022
    Date of Patent: March 12, 2024
    Assignee: Cadence Design Systems, Inc.
    Inventors: Modi Dipakkumar Trikamlal, Maddula Balakrishna Chaitanya
  • Patent number: 11922031
    Abstract: Methods, apparatuses, and systems related to operations for controlling direct refresh management (DRFM) operations. A memory may process a DRFM sample command using bank logic located downstream from a command decoder. The bank logic may be configured to process the DRFM sample command according to an operating state of a targeted memory bank.
    Type: Grant
    Filed: September 23, 2022
    Date of Patent: March 5, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Joo-Sang Lee, Navya Sri Sreeram
  • Patent number: 11914473
    Abstract: Methods, systems, and devices for data recovery using ordered data requests are described. In some examples, a memory system may receive data units from a host device. A first controller of the memory system may generate a protocol unit using the data units. A second controller of the memory system may generate a data storage unit using data from the protocol unit, and may store the data unit to a memory device. The memory system may perform error detection operations using respective sets of parity bits for each of the units. Upon detecting an error, the memory system may, for a write operation, re-request data associated with error and regenerate the units to correct for the error, or, for a read operation, re-read data associated with the error and regenerate the units to correct for the error.
    Type: Grant
    Filed: October 20, 2022
    Date of Patent: February 27, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Tal Sharifie, Chandrakanth Rapalli, Yoav Weinberg
  • Patent number: 11916669
    Abstract: Provided is a coding control method in a passive optical network (PON). The method includes acquiring data of a service to be coded and a preset codeword length N corresponding to the service to be coded; acquiring a coding mode corresponding to the preset codeword length N in a preset table describing a correspondence between codeword length ranges and coding modes; and coding data of the service by using the coding mode corresponding to the preset codeword length N. Further provided are a coding control apparatus in a PON, a communication device and a storage medium.
    Type: Grant
    Filed: September 29, 2022
    Date of Patent: February 27, 2024
    Assignee: ZTE CORPORATION
    Inventors: Zheng Liu, Liuming Lu, Yong Guo, Xingang Huang, Weiliang Zhang, Liquan Yuan
  • Patent number: 11914476
    Abstract: Methods, systems, and devices for generating a balanced codeword protected by an error correction code are described. A memory device may receive data bits for storage. Based on the data bits, the memory device may generate a codeword that includes the data bits, parity bits, and placeholder bits. The memory device may balance the codeword by inverting one or more packets of the codeword. After balancing the codeword, the memory device may store at least a portion of the codeword in memory so that a later operation or a decoding process reveals the packets that were inverted as part of the balancing process. Accordingly, the memory device may re-invert the appropriate packets to recover the original data bits.
    Type: Grant
    Filed: September 22, 2022
    Date of Patent: February 27, 2024
    Assignee: Micron Technology, Inc.
    Inventor: Christophe Vincent Antoine Laurent
  • Patent number: 11914467
    Abstract: Methods, systems, and devices for error detection, error correction, and error management by memory devices are described. Programmable thresholds may be configured for a memory device based on a type of data or a location of stored data, among other aspects. For example, a host device may configure a threshold quantity of errors for data at a memory device. When retrieving the data, the memory device may track or count errors in the data and determine whether the threshold has been satisfied. The memory device may transmit (e.g., to the host device) an indication whether the threshold has been satisfied, and the system may perform functions to correct the errors and/or prevent further errors. The memory device may also identify errors in received commands or may identify errors introduced in data after the data was received (e.g., using an error detecting code associated with a command or bus).
    Type: Grant
    Filed: October 11, 2022
    Date of Patent: February 27, 2024
    Inventors: Michael Dieter Richter, Thomas Hein, Wolfgang Anton Spirkl, Martin Brox, Peter Mayer
  • Patent number: 11906585
    Abstract: Built-in-self-test (BIST operations are performed by receiver lanes of a multilane receiver system, wherein at least one receiver lane is configured as a synthesized clock source for other receiver lanes configured to perform BIST operations. The at least one receiver lane configured as the synthesized clock source may generate a clock signal and provide the clock signal to the other receiver lanes performing the BIST operations. In some examples, digital control signals may be used for coordinating the enablement of the at least one receiver lane to function as the synthesized clock source and for coordinating the enablement of the other receiver lanes to perform BIST operations.
    Type: Grant
    Filed: April 1, 2022
    Date of Patent: February 20, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: A Santosh Kumar Reddy, Gunjan Mandal, Parin Rajnikant Bhuta, Raghavendra Molthati, Saikat Hazra, Sanjeeb Kumar Ghosh, Sunil Rajan, Krupal Jitendra Mehta, Praveen S Bharadwaj
  • Patent number: 11899532
    Abstract: Methods, systems, and devices for determining locations in memory for boot-up code are described. An indication of one or more timeout durations for a boot sequence is received. Information for the boot sequence is stored in one or more memory cells based on the one or more timeout durations, where the one or more memory cells is selected based on a read latency, an error rate, or a storage-level of the one or more memory cells with relation to the indicated one or more timeout durations. The information for the boot sequence stored in the one or more memory cells is accessed based on an initialization of the boot sequence.
    Type: Grant
    Filed: May 31, 2022
    Date of Patent: February 13, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Nitul Gohain, Giuseppe Cariello, Jameer Mulani
  • Patent number: 11894087
    Abstract: The disclosed test circuit includes: an input terminal, a processing circuit, and an output terminal. The input terminal receives an input signal. The input signal includes a test command for indicating a test target circuit module and an address of the target circuit module. The processing circuit responds to the test command and the target. The address of the circuit module determines the test mode signal, the test mode signal carries the test type, the test mode signal is used to trigger the target circuit module to perform the test corresponding to the test type, and the output terminal sends the test mode signal to the target circuit module according to the address of the target circuit module. Thus, the test mode signal can be accurately transmitted to different circuit modules in the memory chip.
    Type: Grant
    Filed: July 7, 2021
    Date of Patent: February 6, 2024
    Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
    Inventor: MinNa Li