Abstract: Provided is a signal interleaving method which includes: interleaving parity bits by encoding input bits based on a low density parity check (LDPC) code according to a code rate of 6/15 and a code length of 64800; splitting a codeword comprising the input bits and the interleaved parity bits into a plurality of bit groups; interleaving the plurality of bit groups according to a specific permutation order to provide an interleaved codeword; de-multiplexing bits of the interleaved codeword to generate data cells; mapping the data cells onto constellation points for 1024-quadrature amplitude modulation (QAM); and transmitting a signal based on the constellation points.

Abstract: Disclosed are embodiments of a method that provides for pre-production run development of a fail signature database, which stores fail signatures for systematic defects and corresponding root causes. The fail signatures in the database is subsequently accessed and used for a variety of purposes. For example, the fail signatures are evaluated and, based on the results of the evaluation, actions are taken to prevent specific systematic defects from occurring during production runs and/or to allow for early detection of specific systematic defects during production runs. In some embodiments, following production runs, new fail signatures from failing production chips are developed and compared against the fail signatures in the fail signature database. In some embodiments, when a signature match indicates that a particular production chip has a same systematic defect with a same root cause as a particular prototype chip in-line advanced process control (APC) is performed.

Abstract: An error correcting method of a semiconductor memory device includes receiving first data from outside the semiconductor memory device. First check bits are generated based on the first data and a first parity generator matrix. The first parity generator matrix includes a plurality of columns of bits. The plurality of columns of bits are arranged in a plurality of parity generator matrix groups. An error correcting code (ECC) code word including a plurality of ECC code word groups is stored in the plurality of memory cell groups. Each of the plurality of ECC code word groups have the first data and the first check bits. The plurality of ECC code word groups correspond to the plurality of parity generator matrix groups, respectively.

Abstract: In a transmission method according to one aspect of the present disclosure, a cyclic shift is applied to each row of an interleaver matrix in which each of a plurality of rotation components of each section is replaced with a cell, in which two rotation components are set to a real component and an imaginary component, by using (cyclic shift value k×floor(Q/max{D,(NRF×NC)}/2)) cells allocated to the row, and a value of k mod NRF varies in at least two rows of one section portion of a combined complex interleaver matrix in the cyclic shift.

Abstract: In one embodiment, a method includes reading a plurality of narrow-spread (NS) codewords from M tracks of a magnetic tape medium using a plurality of read elements, the plurality of NS codewords collectively comprising data logically organized as a predetermined number of two-dimensional arrays. Each two-dimensional array includes a predetermined number of NS codewords positioned orthogonally to a predetermined number of wide-spread (WS) codewords, with a first NS codeword from a first two-dimensional array being read in its entirety from the magnetic tape medium prior to reading a second NS codeword from the first two-dimensional array. The method also includes laterally decoding each NS codeword from the first two-dimensional array read from the M tracks of the magnetic tape medium in succession prior to decoding any WS codewords from the first two-dimensional array. The NS codewords are protected with a stronger encoding than the WS codewords within each two-dimensional array.

Abstract: Various implementations described herein are directed to a memory device. The memory device includes a first interleaving circuit that receives data words and generates a first error correction code based on the received data words. The memory device includes a second interleaving circuit that receives the data words and generates a second error correction code based on the received data words as a complement to the first error correction code. The second interleaving circuit interleaves data bits from multiple different data words and stores modified data words based on the multiple different data words.

Abstract: A memory device that includes a memory cell array and control circuit in which the memory cell array includes a normal region including a first failed block and a redundant region including a first redundant block replacing the first failed block. The control circuit includes a mapping table storing replacement information. The control circuit refers to the mapping table for accessing the first redundant block. When testing the memory device, the control circuit writes “1” in the normal region and the first redundant block, writes “0” in the redundant region except the first redundant block, adds the replacement information regarding a second failed block and second redundant block in the redundant region to the mapping table and verifies the result of replacing the second failed block with the second redundant block based on entire data read from the memory cell array with respect to entire range assigned to the address signal.

Abstract: A method for automatic correction of nonvolatile memory in information handling systems includes storing ECC data for a compressed BIOS firmware. The ECC data are used to identify and correct error bits in the compressed BIOS firmware. The discovered error bits are recorded in the nonvolatile memory and accessed for a faster correction method for the compressed BIOS firmware than using the ECC data on subsequent attempts.

Abstract: An integrated circuit device includes a first partition and a second partition. The integrated circuit device also includes a Joint Test Action Group (JTAG) system that controls at least a portion of the integrated circuit device via multiple logic signals. The JTAG system includes a JTAG interface receives the multiple logic signals. The JTAG system also includes a JTAG hub instantiated in the first partition and being communicatively coupled to the JTAG interface. The JTAG system further includes JTAG-based logic instantiated in the second partition. The integrated circuit device further includes an interface instantiated in the first partition configured to communicatively couple the JTAG hub to the JTAG-based logic.

Abstract: A transmitter and receiver of a broadcasting signal and a method of processing the broadcasting signal are provided. The transmitter includes: a segmenter configured to segment an L1 signaling of a frame into a plurality of segmented L1 signalings such that each of the segmented L1 signalings has bits a number of which is equal to or smaller than a predetermined number; and an encoder configured to perform a Bose, Chaudhuri, Hocquenghem (BCH) and a low density parity check (LDPC) encoding, or the LDPC encoding without the BCH encoding, with respect to the segmented L1 signalings.

Abstract: A memory system can program data in different modes, such as normal mode programming and burst mode programming. Burst mode programming programs data into the memory device faster than normal mode programming. MLC Blocks for burst mode programming are selected based on one or more criteria, such as block age, block programming speed, or the like. Further, one or more burst mode TRIM settings, which include one or more of a program voltage TRIM setting, a step-up voltage TRIM setting, skip verify level, and a program pulse width, are used to program the blocks selected for burst mode programming. In this regard, burst mode programming is performed more quickly than normal mode programming.

Abstract: A tester for integrated circuits on a silicon wafer includes an input/output connection for testing an integrated circuit. The tester comprises circuitry arranged for transferring a first data frame to the integrated circuit via the input/output connection, the first data frame including a time reference for the data included in the data frame, a field for validating the time reference and a data field including at least one test command and for receiving a second data frame via the input/output connection, the data in the second data frame received having a duration that is a multiple of the time reference.

Abstract: A storage device includes a nonvolatile memory device and a controller configured to read data from the nonvolatile memory device, to divide the read data into a plurality of segments, and to sequentially perform error correction decoding with respect to the plurality of segments. When the error correction decoding of each segment is completed, the controller adds error correction parity to each of the decoded segments and sends the decoded segments with added error correction parity to an external host device. When error correction decoding of a second segment is not completed after a threshold time has elapsed after sending a first segment of which error correction decoding is completed, the controller adds an incorrect error correction parity to dummy data and sends the dummy data with the added incorrect error correction parity to the external host device.

Abstract: A storage control apparatus obtains first-code attached data, each having target data to be written and first code information, which includes an error detection code based on the target data and information about a first write destination, attached to the target data. The storage control apparatus then obtains the target data by excluding the first code information from the first-code attached data eliminates duplication of the target data, generates second code information which includes an error detection code for the target data remaining and information about a second write destination, and writes second-code attached data including the second code information into a memory device.

Abstract: Technical solutions are described for computing data check word for a host request for an I/O processing operation at a host computer system that communicates with a control unit. An example method includes obtaining information for a first I/O operation at a channel subsystem in the host computer system, and accessing an address control word (ACW) of the first I/O operation. The ACW is stored in the local channel memory, and the ACW includes a first data check seed-value. The method also includes computing a first data check word based on the first data check seed-value from the ACW. The method also includes obtaining information for a second I/O operation at the channel subsystem, and in response to the second i/o operation corresponding to said ACW of the first I/O operation, computing a second data check word based on a second data check seed-value from a cache memory.

Abstract: A computing device includes an interface configured to interface and communicate with a dispersed storage network (DSN), a memory that stores operational instructions, and a processing module operably coupled to the interface and memory such that the processing module, when operable within the computing device based on the operational instructions, is configured to perform various operations. A computing device receives a data access request involving a set of EDSs associated with a data object that are distributedly stored among storage units (SUs) including first SU(s) coupled via a local network of the DSN and second SU(s) remotely located to the computing device and coupled via an external network of the DSN. The computing device caches within the at least one memory therein a subset of EDSs stored within the second SU(s) remotely located to the computing device and coupled to the computing device via the external network.

Abstract: The invention relates to a method for decoding read bits including information bits from memory cells of a solid-state drive. The method comprises providing an indication of reliability of the read bits, and, based on the indication of reliability, iteratively soft decoding the read bits in order to obtain the information bits, wherein the soft decoding comprises, at each iteration of the soft decoding, if the current number of iterations has reached a predetermined number of iterations indicative of an admitted latency of the solid state drive, and if no information bits having an error rate below a predetermined error rate have been obtained, providing a further indication of reliability of the read bits, and iteratively soft decoding the read bits based on the further indication of reliability. The invention also relates to a corresponding controller and a corresponding solid-state drive.

Abstract: An apparatus is described that includes a plurality of circuits each designed to exhibit a unique signature code that is determined from manufacturing tolerances associated with a manufacturing process used to manufacture the circuits. The apparatus also includes error circuitry to determine an error has arisen based on a change in signature codes from the plurality of circuits.

Abstract: An interleaving method and apparatus for adaptively determining an interleaving depth of each of one or more interleaving blocks based on a maximum interleaving depth and a number of codewords of a packet, and interleaving the interleaving blocks based on the interleaving depth. The adaptively determining the interleaving depth includes: calculating a number of remaining codewords by performing a modulo operation on a basic interleaving depth and the number of the codewords; and determining the interleaving depth by adjusting the basic interleaving depth based on the number of the remaining codewords.

Abstract: A data storage device is disclosed comprising a storage medium. First data is encoded into a first codeword comprising a plurality of i-bit symbols, and second data is encoded into a second codeword comprising a plurality of j-bit symbols, wherein i is different than j and a first code rate of the first codeword is less than a second code rate of the second codeword. The first codeword and the second codeword are symbol interleaved to generate an interleaved codeword, and the interleaved codeword is written to the storage medium.