Patents Examined by David A. Vanore
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Patent number: 11890121Abstract: An apparatus for shielding radiation emitted during a medical procedure. The apparatus includes a board positionable on top of a procedure table. The board extends laterally between a first board edge and a second board edge, and longitudinally between a third board edge and a fourth board edge. The board includes a plurality of apertures distributed along at least one of the board edges. At least one radiation shield is removably mountable to the board. The at least one radiation shield includes at least one peg engageable with any one of the apertures in the board. The apparatus can include a body shield assembly and/or an adjustable screen assembly.Type: GrantFiled: June 25, 2021Date of Patent: February 6, 2024Assignee: ARMERY MEDICAL TECHNOLOGIES INC.Inventors: Andrew Barbod Yadegari, Andrew Stephen McLellan, Stephen George McLellan
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Patent number: 11894162Abstract: Described is a method comprising directing an ultra-low voltage electron beam to a surface of a first insulating layer. The first insulating layer is disposed on a second insulating layer. The method includes modifying, by the application of the ultra-low voltage electron beam, the surface of the first insulating layer to selectively switch an interface between a first state having a first electronic property and a second state having a second electronic property.Type: GrantFiled: February 11, 2021Date of Patent: February 6, 2024Assignee: University of Pittsburgh—Of the Commonwealth System, of Higher EducationInventor: Jeremy Levy
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Patent number: 11885757Abstract: A method for analyzing a rock sample includes segmenting a digital image volume corresponding to an image of the rock sample, to associate voxels in the digital image volume with a plurality of rock fabrics of the rock sample. The method also includes identifying a set of digital planes through the digital image volume. The set of digital planes intersects with each of the plurality of rock fabrics. The method further includes machining the rock sample to expose physical faces that correspond to the identified digital planes, performing scanning electron microscope (SEM) imaging of the physical faces to generate two-dimensional (2D) SEM images of the physical faces, and performing image processing on the SEM images to determine a material property associated with each of the rock fabrics.Type: GrantFiled: May 10, 2021Date of Patent: January 30, 2024Assignee: BP Corporation North America Inc.Inventors: Glen L. Gettemy, Nirjhor Chakraborty, Milad Saidian
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Patent number: 11886011Abstract: An optical microstructure is configured to work with an optical fiber or a different substrate and the optical microstructure includes a beam converter including a tapered optical guide configured to transform a gaussian optical beam into a first annular optical beam; an inverted cone having first and second reflection surfaces, each configured to reflect the first annular optical beam, having a radius R1, so that a resulting second annular optical beam has a radius R2 larger than the radius R1; and a prism having a reflection surface configured to reflect the second annular optical beam to form a third converging annular optical beam. The third converging annular optical beam includes plural single optical beams that intersect at a given crossing point, outside the optical microstructure. The plural single optical beams form an optical trap.Type: GrantFiled: May 13, 2021Date of Patent: January 30, 2024Assignee: KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGYInventors: Carlo Liberale, Andrea Bertoncini, Innem Venkata Anudeep Kumar Reddy
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Patent number: 11862429Abstract: An ion implantation system comprising: a sample platform; an ion gun; an electrostatic linear accelerator; a direct current (DC) final energy magnet (FEM); and a processor. The processor is programmed to control: a wafer acceptance test instrument, a DC recipe calculator, a DC real energy calculator, and a tool energy shift verifier. The wafer acceptance test instrument is configured to apply a wafer acceptance test (WAT) recipe to a test sample on the sample platform. The DC recipe calculator is configured to calculate a recipe for the DC FEM. The DC real energy calculator is configured to calculate a real energy of the DC FEM. The tool energy shift verifier is configured to verify a tool energy shift of the DC FEM. The ion implantation system is configured to tune the DC FEM based on the verified tool energy shift, and obtain a peak magnetic field of the DC FEM.Type: GrantFiled: November 1, 2021Date of Patent: January 2, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Yi-Hsiung Lin, Yao-Jen Yeh, Chia-Lin Ou, Cheng-En Lee, Hsuan-Pang Liu
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Patent number: 11848183Abstract: Devices and methods for surface-induced dissociation (SID) are disclosed. In one aspect, a device for SID is disclosed which, in one embodiment includes a collision surface, a deflector configured to guide precursor ions from a pre-SID region to the collision surface to cause SID, and an ion carpet having applied electrical properties configured to guide product ions resulting from collision with the collision surface to a post-SID region. In another aspect, a method for SID is disclosed which, in one embodiment includes guiding, by a deflector, precursor ions from a pre-SID region to a collision surface to cause SID, and guiding, by an ion carpet having selected applied electrical properties, product ions resulting from collision with the collision surface to a post-SID region.Type: GrantFiled: December 26, 2019Date of Patent: December 19, 2023Assignee: Ohio State Innovation FoundationInventors: Vicki Wysocki, Joshua Gilbert, Alyssa Stiving
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Patent number: 11848173Abstract: A method for measuring an electron signal or an electron induced signal may be provided. The method may include providing a threshold number of events or a threshold event rate for a pixel on a detector. The method may include collecting from the detector the threshold number of events or determining that the threshold event rate is achieved, wherein a signal at the detector is an electron signal or an electron induced signal from a sample. The method may include modulating an intensity of an electron source directed to the sample in response.Type: GrantFiled: January 31, 2023Date of Patent: December 19, 2023Assignees: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC., THE PROVOST, FELLOWS, FOUNDATION SCHOLARS, AND THE OTHER MEMBERS OF BOARD, OF THE COLLEGE OF THE HOLY AND UNDIVIDED TRINITY OF QUEEN ELIZABETH NEAR DUBLINInventors: Bryan Walter Reed, Lewys Jones
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Patent number: 11846736Abstract: The purpose of the present invention is to provide a scintillator for a charged particle beam device and a charged particle beam device which achieve both an increase in emission intensity and a reduction in afterglow intensity. This scintillator for a charged particle beam device is characterized by comprising a substrate (13), a buffer layer (14) formed on a surface of the substrate (13), a stack (12) of a light emitting layer (15) and a barrier layer (16) formed on a surface of the buffer layer (14), and a conductive layer (17) formed on a surface of the stack (12) and by being configured such that the light emitting layer (15) contains InGaN, the barrier layer (16) contains GaN, and the ratio b/a of the thickness b of the barrier layer (16) to the thickness a of the light emitting layer (15) is 11 to 25.Type: GrantFiled: July 10, 2019Date of Patent: December 19, 2023Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Eri Takahashi, Shin Imamura, Makoto Suzuki, Shunsuke Mizutani
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Patent number: 11842881Abstract: A measurement device that comprises a photoelectric conversion element and a signal processing part that receives, from the photoelectric conversion element, detected pulses that include dark pulses and signal pulses that are outputted in accordance with inputted photons. The signal processing part performs amplitude discrimination on the detected pulses on the basis of a pre-acquired dark pulse amplitude distribution for the photoelectric conversion element.Type: GrantFiled: December 18, 2018Date of Patent: December 12, 2023Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Akio Yamamoto, Kazuki Ikeda, Wen Li, Shunsuke Mizutani, Hiroyuki Takahashi
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Patent number: 11833266Abstract: A card distribution and sanitization apparatus, such as a dealing shoe, may use ultraviolet light to sanitize the surface of playing cards. The ultraviolet light may be directed to an outlet and/or interior cavity of the card distribution and sanitization apparatus and may be configured to emit light in the 200 nm to 290 nm wavelength range. An enclosure of the card distribution and sanitization apparatus may be coupled to ultraviolet light-emitters and may be configured to hold the playing cards and the ultraviolet light-emitters. An associated controller may control operations of the card distribution and sanitization apparatus.Type: GrantFiled: January 25, 2021Date of Patent: December 5, 2023Assignee: Wynn Resorts Holdings, LLCInventor: Ellen F. Whittemore
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Patent number: 11837453Abstract: A nebuliser outlet comprises an inlet end and an outlet end, a first channel and one or more second channels arranged between the inlet end and the outlet end. The first channel is configured to receive a capillary, and the one or more second channels are configured to pass gas to the outlet end. The nebuliser outlet is a single integrated component.Type: GrantFiled: June 23, 2021Date of Patent: December 5, 2023Assignee: Micromass UK LimitedInventors: Ian David Trivett, Anthony Hesse, Mark Walford, Daniel J. Kenny, David Gordon, Stanislaw Koziol, Steve D. Trudeau, Alastair M. Booth, Stephen Ayrton
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Patent number: 11835438Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample and includes a focused ion beam irradiation optical system, an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam, a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample, a detector configured to detect secondary charged particles emitted from an irradiation object, and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the sample piece transfer device, wherein the image data includes a reference mark.Type: GrantFiled: July 13, 2021Date of Patent: December 5, 2023Assignee: Hitachi High-Tech Science CorporationInventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
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Patent number: 11835769Abstract: An adjustable attenuation optical unit that may include a lightguide that includes a core, wherein the core comprises an output, an input and an exterior surface; and an adjustable attenuator that is configured to define an interfacing parameter related to an area of the exterior surface thereby receiving at least some of the light that impinges on the area.Type: GrantFiled: August 17, 2021Date of Patent: December 5, 2023Assignee: Applied Materials Israel Ltd.Inventors: Eitam Yitzchak Vinegrad, Itay Asulin
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Patent number: 11830702Abstract: Embodiments of the present disclosure provide a grid structure. The grid structure includes a carrier and a support column; wherein the support column is located on the carrier, the support column has a top surface for supporting a sample; and the support column has a groove, the groove extends along a direction from the top surface to the carrier, and a groove wall of the groove is connected to the top surface.Type: GrantFiled: June 30, 2021Date of Patent: November 28, 2023Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.Inventor: Wei Yang
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Patent number: 11830717Abstract: The invention generally relates to apparatuses for focusing ions at or above ambient pressure and methods of use thereof. In certain embodiments, the invention provides an apparatus for focusing ions that includes an electrode having a cavity, at least one inlet within the electrode configured to operatively couple with an ionization source, such that discharge generated by the ionization source is injected into the cavity of the electrode, and an outlet. The cavity in the electrode is shaped such that upon application of voltage to the electrode, ions within the cavity are focused and directed to the outlet, which is positioned such that a proximal end of the outlet receives the focused ions and a distal end of the outlet is open to ambient pressure.Type: GrantFiled: April 14, 2023Date of Patent: November 28, 2023Assignee: Purdue Research FoundationInventors: Robert Graham Cooks, Zane Baird, Wen-Ping Peng
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Patent number: 11830716Abstract: The invention generally relates to systems and methods for mass spectrometry analysis of microorganisms in samples.Type: GrantFiled: June 15, 2022Date of Patent: November 28, 2023Assignee: Purdue Research FoundationInventors: Robert Graham Cooks, Ahmed Mohamed Hamid, Alan Keith Jarmusch, Zheng Ouyang
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Patent number: 11826583Abstract: A neutron capture therapy system is provided, including a neutron generating device and a beam shaping assembly. The neutron capture therapy system further includes a concrete wall forming a space for accommodating the neutron generating device and the beam shaping assembly and shielding radiations generated by the neutron generating device and the beam shaping assembly. A support module is disposed in the concrete wall, the support module is capable of supporting the beam shaping assembly and is used to adjust the position of the beam shaping assembly, and the support module includes concrete and a reinforcing portion at least partially disposed in the concrete. The neutron capture therapy system designs a locally adjustable support for the beam shaping assembly, so that the beam shaping assembly can meet the precision requirement, improve the beam quality, and meet an assembly tolerance of the target.Type: GrantFiled: September 9, 2021Date of Patent: November 28, 2023Assignee: NEUBORON THERAPY SYSTEM LTD.Inventors: Tao Jiang, Wei-lin Chen
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Patent number: 11823861Abstract: The invention provides a charged particle beam device that prevents a leakage of an unnecessary magnetic field to a trajectory of a charged particle beam with which a sample is irradiated in a sample observation according to a boosting method. The charged particle beam device includes: a charged particle source configured to generate the charged particle beam with which the sample is irradiated; an object lens configured to generate the magnetic field for focusing the charged particle beam; and a boosting electrode that is provided inside the object lens and to which a voltage for accelerating the charged particle beam is applied. The boosting electrode is formed of a magnetic material.Type: GrantFiled: July 2, 2019Date of Patent: November 21, 2023Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Yuta Imai, Junichi Katane
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Patent number: 11821859Abstract: The embodiments of the present disclosure provide various techniques for detecting backscatter charged particles, including accelerating charged particle sub-beams along sub-beam paths to a sample, repelling secondary charged particles from detector arrays, and providing devices and detectors which can switch between modes for primarily detecting charged particles and modes for primarily detecting secondary particles.Type: GrantFiled: December 22, 2021Date of Patent: November 21, 2023Assignee: ASML Netherlands B.V.Inventors: Marco Jan-Jaco Wieland, Albertus Victor Gerardus Mangnus
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Patent number: 11823807Abstract: A nanotweezer and method of trapping and dynamic manipulation thereby are provided. The nanotweezer comprises a first metastructure including a first substrate, a first electrode, and a plurality of plasmonic nanostructures arranged in an array, and a trapping region laterally displaced from the array; a second metastructure including a second substrate and a second electrode; a microfluidic channel between the first metastructure and the second metastructure; a voltage source configured to selectively apply an electric field between the first electrode and the second electrode; and a light source configured to selectively apply an excitation light to the microfluidic channel at a first location corresponding to the array, thereby to trap a nanoparticle at a second location corresponding to the trapping region.Type: GrantFiled: July 27, 2021Date of Patent: November 21, 2023Assignee: Vanderbilt UniversityInventor: Justus C. Ndukaife