Patents Examined by David A. Vanore
  • Patent number: 11784024
    Abstract: A multi-cell detector may include a first layer having a region of a first conductivity type and a second layer including a plurality of regions of a second conductivity type. The second layer may also include one or more regions of the first conductivity type. The plurality of regions of the second conductivity type may be partitioned from one another, preferably by the one or more regions of the first conductivity type of the second layer. The plurality of regions of the second conductivity type may be spaced apart from one or more regions of the first conductivity type in the second layer. The detector may further include an intrinsic layer between the first and second layers.
    Type: Grant
    Filed: January 10, 2022
    Date of Patent: October 10, 2023
    Assignee: ASML Netherlands B.V.
    Inventors: Joe Wang, Yongxin Wang, Zhongwei Chen, Xuerang Hu
  • Patent number: 11779671
    Abstract: A portable sanitizing apparatus, such as a case, includes a first case portion arranged to receive an object to be sanitized, and a second case portion connected to the first case portion and including at least one UV light source configured to emit UV electromagnetic radiation. The second case portion includes an expansion member having a collapsed configuration and an expanded configuration. When the expansion member is in the expanded configuration, a distance between the second case portion and the first case portion is increased compared to when the expansion member is in the collapsed configuration, thereby increasing a distance from the at least one UV light source to the object to be sanitized.
    Type: Grant
    Filed: June 25, 2020
    Date of Patent: October 10, 2023
    Assignee: FKA Distributing Co., LLC
    Inventors: David Yang, Deepa Mani, Thomas Galloway
  • Patent number: 11779669
    Abstract: Embodiments of the disclosure include an uncovered ultraviolet light emitting panel for use in supporting instruments in an operating room. The panel fits inside an autoclave for sterilization and can be utilized without a sterile cover. In use, the panel irradiates surgical instruments and the nearby air continuously.
    Type: Grant
    Filed: May 2, 2022
    Date of Patent: October 10, 2023
    Inventor: John Mansell
  • Patent number: 11771395
    Abstract: The present invention relates to positioning a medical imaging system in relation to an object. In order to provide improved positioning possibilities which facilitate the workflow during an intervention, a medical imaging apparatus (10) is provided with an image acquisition arrangement (12), which is positionable in relation to an object (16) to acquire image data (18) of the object from different directions. An output unit (14) is arranged to provide the image data. According to the invention, first movement direction indicators (22) are provided to indicate possible movement directions of the image acquisition arrangement in relation to the object.
    Type: Grant
    Filed: January 30, 2019
    Date of Patent: October 3, 2023
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Peter Belei, Bart Carelsen
  • Patent number: 11769654
    Abstract: A method of mass spectrometry is disclosed comprising: performing a plurality of cycles of operation during a single experimental run, wherein each cycle comprises: mass selectively transmitting precursor ions of a single mass, or range of masses, through or out of a mass separator or mass filter at any given time, wherein the mass separator or mass filter is operated such that the single mass or range of masses transmitted therefrom is varied with time; and mass analysing ions.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: September 26, 2023
    Assignee: Micromass UK Limited
    Inventors: Keith Richardson, Jason Lee Wildgoose
  • Patent number: 11759655
    Abstract: A multi-layer multi-leaf collimation system includes at least a two layers of collimation leaves. The first multi-leaf collimator layer is configured to primarily perform a first function to affect a radiation beam traveling from a radiation source to a target and a second multi-leaf collimator layer is configured to primarily perform a second function, different from the first function, to affect the radiation beam for the administration of a treatment plan.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: September 19, 2023
    Assignee: Varian Medical Systems International AG
    Inventors: Janne I. Nord, Esa Kuusela, Jarkko Y. Peltola, Juha Kauppinen
  • Patent number: 11764030
    Abstract: Disclosed is a stage apparatus comprising: an object support configured to support an object; a positioning device configured to position the object support; a first connection arrangement configured to connect the object support to the positioning device, the first connection arrangement comprising at least one damped connection; and a second connection arrangement configured to connect the object support to the positioning device, the second connection arrangement comprising at least one substantially rigid connection.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: September 19, 2023
    Assignee: ASML Netherlands B.V.
    Inventors: Johannes Hubertus Antonius Van De Rijdt, Peter Paul Hempenius, Allard Eelco Kooiker, Jef Goossens, Petrus Wilhelmus Vleeshouwers
  • Patent number: 11756762
    Abstract: A sample holder retains a sample and can continuously rotate the sample in a single direction while the sample is exposed to a charged particle beam (CPB) or other radiation source. Typically, the CPB is strobed to produce a series of CPB images at random or arbitrary angles of rotation. The sample holder can rotate more than one complete revolution of the sample. The CPB images are used in tomographic reconstruction, and in some cases, relative rotation angles are used in the reconstruction, without input of an absolute rotation angle.
    Type: Grant
    Filed: February 3, 2022
    Date of Patent: September 12, 2023
    Assignee: FEI Company
    Inventors: Bart Jozef Janssen, Edwin Verschueren, Erik Franken
  • Patent number: 11756763
    Abstract: A scanning electron microscope includes a spin detector configured to measure secondary electron spin polarization of secondary electrons emitted from the sample, and an analysis device configured to analyze secondary electron spin polarization data measured by the spin detector. The analysis device evaluates the strain in the sample by calculating a difference in the secondary electron spin polarization data of adjacent pixels.
    Type: Grant
    Filed: June 6, 2019
    Date of Patent: September 12, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Teruo Kohashi, Hideo Morishita, Junichi Katane
  • Patent number: 11756764
    Abstract: A charged particle beam apparatus includes: a movement mechanism; a particle source; an optical element; a detector; and a control mechanism, in which the control mechanism acquires a diffraction pattern including a plurality of Kikuchi lines, calculates a crystal zone axis of the sample by performing analysis based on a plurality of intersections at which two Kikuchi lines included in the diffraction pattern intersect with each other, calculates an inclination angle of the sample based on the crystal zone axis and an irradiation direction of the charged particle beam, and controls the moving mechanism based on the inclination angle.
    Type: Grant
    Filed: April 23, 2019
    Date of Patent: September 12, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takashi Dobashi, Hirokazu Tamaki, Kuniyasu Nakamura, Hiromi Mise
  • Patent number: 11749498
    Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.
    Type: Grant
    Filed: December 22, 2021
    Date of Patent: September 5, 2023
    Assignee: FEI Company
    Inventors: Marcus Straw, Alexander Makarov, Josh Gilbert, Aaron Torok, Joseph Christian, Alan Bahm, Kun Liu, Tom Nichols, Jeff Kosmoski, Dmitry Grinfeld
  • Patent number: 11749497
    Abstract: A charged particle beam apparatus covering a wide range of detection angles of charged particles emitted from a sample includes an objective lens for converging charged particle beams emitted from a charged particle source and a detector for detecting charged particles emitted from a sample. The objective lens includes inner and outer magnetic paths which are formed so as to enclose a coil. A first inner magnetic path is disposed at a position opposite to an optical axis of the charged particle beams. A second inner magnetic path, formed at a slant with respect to the optical axis of the charged particle beams, includes a leading end. A detection surface of the detector is disposed at the outer side from a virtual straight line that passes through the leading end and that is parallel to the optical axis of the charged particle beams.
    Type: Grant
    Filed: August 5, 2021
    Date of Patent: September 5, 2023
    Assignee: Hitachi High-Tech Corporation
    Inventors: Shunsuke Mizutani, Shahedul Hoque, Uki Ikeda, Makoto Suzuki
  • Patent number: 11749494
    Abstract: A computing unit generates a to-be-used-in-computation netlist on the basis of a to-be-used-in-calculation device model corresponding to a correction sample, estimates a first application result, on the basis of the to-be-used-in-computation netlist and an optical condition, when a charged particle beam is applied to the correction sample under the optical condition, compares the first application result and a second application result based on a detection signal when the charged particle beam is applied to the correction sample under the optical condition, and corrects the optical condition when the first application result and the second application result differ from each other.
    Type: Grant
    Filed: December 8, 2021
    Date of Patent: September 5, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda
  • Patent number: 11742174
    Abstract: A multipurpose and transferrable sample platform for supporting, analyzing and/or processing a target material. The platform includes a substrate; a dielectric layer formed over a face of the substrate; electrodes formed over the dielectric layer; a slot formed through the substrate and the dielectric layer; and an exfoliated graphene-based membrane placed over the slot and in electrical contact with the electrodes. The exfoliated graphene-based membrane is configured to support, or act upon, a study material or chemical precursors.
    Type: Grant
    Filed: February 20, 2020
    Date of Patent: August 29, 2023
    Assignee: KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY
    Inventors: Nitinkumar M. Batra, Pedro Miguel Costa, Dinesh Mahalingam, Suzana P. Nunes
  • Patent number: 11742105
    Abstract: A scanning magnet that deflects a charged particle beam has a winding U provided with grooves SL1 and SL4 provided at facing positions. A passing direction of a conductive wire forming the winding U passes through the groove SL1 in a ?-axis positive direction, and passes through the groove SL4 in a ?-axis negative direction. The winding U has a loop path SL1-SL4 in which the groove SL1 is directed to the ?-axis positive direction, and the groove SL4 is directed to the ?-axis negative direction. When a current flows in the ?-axis positive direction in a winding section U+ disposed in the groove SL1, a current flows in the ?-axis negative direction in a winding section U? disposed in the groove SL4. A yoke, the winding U, a winding V, and a winding W have a 120° rotationally symmetric structure with respect to a central axis of the yoke.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: August 29, 2023
    Assignee: HITACHI, LTD.
    Inventors: Takahiro Yamada, Takuya Nomura, Seiji Soeda
  • Patent number: 11740370
    Abstract: Provided is a radiation detection system for improving the accuracy of a neutron beam irradiation dose for a neutron capture therapy system. The neutron capture therapy system includes a charged particle beam, a charged particle beam inlet for passing the charged particle beam, a neutron generating unit for generating the neutron beam by means of a nuclear reaction with the charged particle beam, a beam shaping assembly for adjusting flux and quality of the neutron beam, and a beam outlet adjoining to the beam shaping assembly, the radiation detection system includes a radiation detection device arranged within the beam shaper or outside the beam shaping assembly, the radiation detection device is used for real-time detection of the overflowing neutron beam by the neutron generating unit or the generated ?-ray after the nuclear reaction of the charged particle beam with the neutron generating unit.
    Type: Grant
    Filed: November 2, 2021
    Date of Patent: August 29, 2023
    Assignee: NEUBORON MEDTECH LTD.
    Inventors: Yuanhao Liu, Weilin Chen
  • Patent number: 11742173
    Abstract: The invention relates to an apparatus and a method for inspecting a sample. The apparatus includes a sample holder for holding the sample, at least the sample holder comprises a cooling system which is configured for cooling at least the sample, preferably to cryogenic temperatures; a charged particle exposure system includes an assembly for projecting a focused beam of primary charged particles onto the sample held by the sample holder; and a light optical microscope. The sample holder includes a sheet of a scintillator material, and the sample holder is configured to position the sample in between the charged particle optical column and the sheet of the scintillator material. The light optical microscope includes a detection system configured for acquiring an optical image of at least a part of the sheet of the scintillator material.
    Type: Grant
    Filed: March 18, 2020
    Date of Patent: August 29, 2023
    Assignee: DELMIC IP B.V.
    Inventors: Sander Den Hoedt, Jacob Pieter Hoogenboom
  • Patent number: 11742172
    Abstract: A charged particle beam device includes: a movement mechanism configured to hold and move a sample; a charged particle source configured to emit charged particles with which the sample is irradiated to obtain an image of the sample; and a control unit configured to control the movement mechanism to move the sample and to obtain the image of the sample. The control unit obtains a reference image of the sample in a reference arrangement state by the charged particles, generates a goal image of the sample in a target arrangement state different from the reference arrangement state by calculation from the reference image, moves the sample to each of different arrangement states by the movement mechanism, obtains a candidate image of the sample in each of the different arrangement states by the charged particles, and generates a comparison result between respective candidate images and the goal image.
    Type: Grant
    Filed: January 11, 2019
    Date of Patent: August 29, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takashi Dobashi, Hirokazu Tamaki, Hiromi Mise
  • Patent number: 11742194
    Abstract: The present invention is directed to a method and device to desorb an analyte using heat to allow desorption of the analyte molecules, where the desorbed analyte molecules are ionized with ambient temperature ionizing species. In various embodiments of the invention a current is passed through a mesh upon which the analyte molecules are present. The current heats the mesh and results in desorption of the analyte molecules which then interact with gas phase metastable neutral molecules or atoms to form analyte ions characteristic of the analyte molecules.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: August 29, 2023
    Inventors: Jordan Krechmer, Brian D. Musselman
  • Patent number: 11742195
    Abstract: The present disclosure includes a computer-implemented method for filtering out at least one selected ion from an ion beam by the following steps: determining the selected ion with a selected ion mass, selected charge and/or selected mass to charge ratio; determining at least one predefinable region with predefinable ions, whose ion masses, charges and/or mass to charge ratios are greater than or smaller than the selected ion mass, the selected charge and/or the selected mass to charge ratio of the selected ion; isolating the predefinable region of the ion beam along a trajectory of the ion beam, and detecting the predefinable ions within the predefinable region. In addition, the present disclosure includes to a computer program which is configured to perform a method according to the present disclosure and to a computer program product having the computer program.
    Type: Grant
    Filed: June 13, 2019
    Date of Patent: August 29, 2023
    Assignee: Analytik Jena GmbH
    Inventor: Roland Lehmann