Abstract: A sample holder (19) includes a base portion (41), a sample carrying portion (42), a rotation guide portion (43), a cooling stage (46), a connection member (47), a first support portion, and a fixing guide portion (48). The base portion (41) is configured to be fixed to a stage (12), which is configured to be driven to rotate by a stage driving mechanism (13). The rotation guide portion (43) is configured to guide synchronous rotation of the base portion (41) and the sample carrying portion (42). The cooling stage (46) is configured to cool a sample (S). The connection member (47) is configured to be connected to the cooling stage (46). The first support portion is configured to support the base portion (41), which is configured to be driven to rotate by the stage (12).

Abstract: A mass spectrometer is disclosed comprising an ion optics device housing having one or more external electrical connectors (1719) provided thereon. An ion optics device (301) is arranged inside the ion optics device housing, the ion optics device (301) comprising one or more electrodes for manipulating ions, the one or more electrodes being electrically connected to the one or more external electrical connectors (1719) provided on the ion optics device housing. A voltage supply housing (1717) is provided having one or more external electrical connectors provided thereon. One or more voltage supplies are arranged inside the voltage supply housing (1717), the one or more voltage supplies being in electrical communication with the one or more external electrical connectors provided on the voltage supply housing.

Abstract: A pulsed accelerator for a Time of Flight mass spectrometers comprising a set of parallel electrodes. The accelerator is inclined at an oblique angle to the incoming ion beam defined by the ratio of the incoming ion beam velocity spreads axial and transverse to the beam. Additionally a deflection electrode is included to deflect unwanted ions away from the detector during the fill cycle of the accelerator.

Abstract: There is provided an ion implanter including a beam generation device that generates an ion beam, based on an implantation recipe, a plurality of measurement devices that measure at least one physical quantity of the ion beam, and a control device that acquires a data set including a plurality of measurement values measured by the plurality of measurement devices, and evaluates measurement validity of the at least one physical quantity of the ion beam by using a model representing a correlation between the plurality of measurement values.

Abstract: A method of assessing the analytical performance of a biochemical measured using a multi-analyte assay is described. The method includes analytically validating a measurement of the level of a first biochemical in a sample, wherein the first biochemical has been previously analytically validated for three or more analytical validation conditions; measuring the level of a second biochemical in a sample, wherein the second biochemical is structurally or biochemically related to the first biochemical; and comparing validation parameters of the first biochemical with validation parameters of the second biochemical to determine whether the performance of the second biochemical is acceptable based on the comparison results.

Abstract: An optical height detection system in a charged particle beam inspection system. The optical height detection system includes a projection unit including a modulated illumination source, a projection grating mask including a projection grating pattern, and a projection optical unit for projecting the projection grating pattern to a sample; and a detection unit including a first detection grating mask including a first detection grating pattern, a second detection grating mask including a second detection grating pattern, and a detection optical system for forming a first grating image from the projection grating pattern onto the first detection grating mask and forming a second grating image from the projection grating pattern onto the second detection grating masks. The first and second detection grating patterns at least partially overlap the first and second grating images, respectively.

Abstract: Laser plasma optical device comprising a laser system for outputting driving light pulses and signal light pulses, a vacuum target chamber, a gas target generating device for generating gas and forming a required plasma channel target through high voltage capillary discharge ionization (or through laser picosecond pre-pulse ablation) of gas, and a focusing element. The driving light pulse is focused on the generated plasma channel target through the focusing element to generate a density-modulated plasma wake; and after a predetermined delay time T, the signal light pulse is focused onto a leading edge region of a second plasma density cavitation bubble of the plasma wake through the focusing element, so that the frequency of the signal light pulse is red-shifted to generate an ultra-intense near-single-cycle mid-infrared pulse.

Abstract: A sample attachment device includes a mount, a mounted depression, and a pressure release depression. Liquid and air bubbles can pass the pressure release depression. The mounted depression is on the mount. A cartridge is mounted on the mounted depression. The pressure release depression is in the mounted depression. The pressure release depression is vertically under the cartridge when the cartridge is mounted on the mounted depression.

Abstract: A display control unit (52) displays a screen for setting sample information on a display unit (8) for each sample placed in a sample placement section (20), and an input processing unit (53) receives information such as a culture name and seeding date and time information input by an operator via an operation unit (7), and stores the information in a storage unit (55). This file is transferred to a data processing unit (4) and stored in a sample information storage unit (40). After analyzing the respective samples in an LC-MS (3), a quantitative analysis unit (42) performs a quantitative analysis based on the obtained data, associates the analysis result with the sample information, and stores the data in an analysis result storage unit (43). As a result, the sample information and the analysis result of the respective samples in the preprocessing stage are associated with each other.

Abstract: An atomic force microscope (“AFM”) based interferometer, uses a light source, and a splitting optical interface, splitting the light beam into a signal light beam and a reference light beam. Both the signal and reference light beams are focused in the vicinity of an AFM cantilever. A beam displacer introduces a lateral displacement between the signal light beam and reference light beam, the lateral displacement being such that, in at least one plane between the beam displacer and the focusing lens structure, the center of the signal light beam is separated from the center of the reference light beam by more than half a sum of their beam diameters on that plane. A detector operates to determine differences in optical path length between the signal light beam and reference light beam to determine information about movement of the cantilever.

Abstract: Systems and methods are described for indirect detection of a missed sample from an autosampler. A method embodiment includes, but is not limited to, drawing a fluid through operation of an autosampler; directing the fluid via a fluid line to a valve of a fluid handling system, the valve including or being adjacent to a sensor to detect a presence or absence of liquid sample; directing the fluid from the valve into a holding line coupled to the valve; determining whether a threshold amount of liquid sample is present in the fluid in the holding line; and when it is determined that liquid sample is present in the fluid in the holding line in an amount less than the threshold amount, transferring a carrier fluid having a marker component to an analytic detector, the marker component present in the carrier fluid in an amount indicative of a missed sample.

Abstract: A method for strontium isotope analysis of picogram-level samples using highly sensitive silicotungstic acid emitter is presented by a thermal ionization mass spectrometry. The emitter has merits of extremely high sensitivity, low cost, simple operation, etc. It is an important innovation of the strontium isotope analysis of the picogram-level samples. Compared with a sample consumption of 1-50 ng of conventional emitter, the present invention only needs 30-200 pg to obtain satisfying measurement accuracy. The present invention greatly improves test sensitivity, and has broad application prospects in future.

Abstract: A method for determining a compensation factor parameter, c, for controlling an amount of ions ionised that are injected from an ion storage unit into mass analyser, where c is an adjustment factor that is applied to optimized injection times that are based on an optimized visible charge of a reference sample, the method comprising: detecting at least one mass spectrum for at least one amount of injected ions; determining from the at least one detected mass spectrum, a slope, s(sample), of a linear correlation of a relative m/z shift with visible total charge Qv of detected mass spectra; determining the compensation factor c as c=s(reference)/s(sample) where s(reference) is the slope of a linear correlation between reference-sample relative m/z shift values and reference-sample visible charge values determined from a plurality of mass spectra detected from a plurality of respective pre-selected amounts of a clean reference sample.

Abstract: We describe a method and apparatus for detecting humidity using a Field Asymmetric Ion Mobility Spectrometry (FAIMS) system. The system may comprise an ionizer for generating ions within a gas sample, wherein each ion has an associated ion mobility; an ion filter for separating the ions by applying a compensation field and a dispersion field to the generated ions; a detector for detecting an output from the ion filter; and a processor.

Abstract: Provided is an ion milling device capable of improving the reproducibility of an ion distribution. An ion milling device includes: an ion source (1); a sample stage (2) on which a sample (4) to be processed by being irradiated with an unfocused ion beam from the ion source (1) is placed; and a drive unit (8) configured to be arranged between the ion source (1) and the sample stage (2), and to move a linear ion beam measuring member (7) extending in a first direction to a second direction orthogonal to the first direction, in which the drive unit (8) moves the ion beam measuring member (7) within an emission range of the ion beam in a state where the ion beam is outputted from the ion source (1) under a first emission condition, and an ion beam current flowing through the ion beam measuring member (7) is measured by irradiating the ion beam measuring member (7) with the ion beam.

Abstract: A multi-charged particle beam writing apparatus according to one aspect of the present invention includes a region setting unit configured to set, as an irradiation region for a beam array to be used, the region of the central portion of an irradiation region for all of multiple beams of charged particle beams implemented to be emittable by a multiple beam irradiation mechanism, and a writing mechanism, including the multiple beam irradiation mechanism, configured to write a pattern on a target object with the beam array in the region of the central portion having been set in the multiple beams implemented.

Abstract: Articles and methods related to scanning probe microscopy probes are generally provided. A scanning probe microscopy probe may comprise a chip, a mechanical resonator attached to the chip, a tip attached to the mechanical resonator, and a handle attached to the chip. The handle may have a length of at least 5 mm and an average thickness of less than or equal to 500 microns. The probe may further comprise an insulating coating covering both the chip and the handle.

Abstract: A method of influencing a charged particle beam (11) propagating along an optical axis (A) is described. The method includes: guiding the charged particle beam (11) through at least one opening (102) of a multipole device (100, 200) that comprises a first multipole (110, 210) with four or more first electrodes (111, 211) and a second multipole (120, 220) with four or more second electrodes (121, 221) arranged in the same sectional plane, the first electrodes and the second electrodes being arranged alternately around the at least one opening (102); and at least one of exciting the first multipole to provide a first field distribution for influencing the charged particle beam in a first manner, and exciting the second multipole to provide a second field distribution for influencing the charged particle beam in a second manner.

Abstract: Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.

Abstract: In one example, a chamber inlet assembly includes a chamber inlet, an outer coupling for a delivery line, and an inner coupling for a processing region of a processing chamber. The inner coupling and the outer coupling are on inner and outer ends, respectively, of the chamber inlet, wherein a cross-sectional area of the inner coupling is larger than a cross-sectional area of the outer coupling. The chamber inlet assembly also includes a longitudinal profile including the inner and outer ends and a first side and a second side, the first and second sides being on opposite sides of the chamber inlet, wherein a shape of the longitudinal profile comprises at least one of triangular, modified triangular, trapezoidal, modified trapezoidal, rectangular, modified rectangular, rhomboidal, and modified rhomboidal. The chamber inlet assembly also includes cassette including the chamber inlet and configured to set into a side wall of the processing chamber.