Abstract: A method of magnetic sensing uses at least two magnetic sensing elements including a first and a second magnetic sensor element. The method includes: a) measuring in a first configuration a combination of the first and second signal obtained from both sensors; b) measuring in a second configuration an individual signal obtained from the first sensor only; c) testing a consistency of the combined signal and the individual signal, or testing a consistency of signals derived therefrom, in order to detect an error. A sensor device is configured for performing this method. A sensor system includes the sensor device and optionally a second processor connected thereto.

Abstract: A power detection circuit is provided for detecting current total input power of a resonant circuit. The power detection circuit includes a detection circuit and an estimation circuit. The detection circuit receives a current signal and obtains resonant-slot baseband power according to the current signal to generate the baseband power value. The current signal represents a resonant-slot current generated by the resonant circuit. The estimation circuit receives the baseband power value and estimates the current total input power according to the baseband power value to generate an estimated power value.

Abstract: A semiconductor integrated circuit includes: one input terminal; multiple output terminals; multiple first current control elements connected between the input terminal and the respective output terminals; a control circuit that controls the first current control elements; a fault detection circuit that includes multiple voltage comparator circuits each of which compares a voltage proportional to a voltage of one of the output terminals with a predetermined threshold voltage and that detects an open-circuit state or a short-circuit state of the output terminals; an external terminal connected to an external resistor; a voltage convertor circuit that generates the threshold voltage according to a voltage of the external terminal that is generated by flowing a current through the external resistor, the threshold voltage being applied to an input terminal of each of the voltage comparator circuits; and a detection result output terminal for outputting a detection result by the fault detection circuit.

Abstract: A rotation detector includes a rotary member, a magnet rotating as the rotary member rotates, and a first magnetic sensor detecting a direction of magnetic flux that changes as the magnet rotates. And the rotation detector includes a first soft magnetic member and a second soft magnetic member for the first magnetic sensor that are arranged on one side and the other side, respectively, of a detection direction of the first magnetic sensor. The magnet has a rotation axis that passes through the magnet.

Abstract: A testing arrangement for testing Integrated Circuit (IC) interconnects is provided. In an example, the testing arrangement includes a substrate, and a first interconnect structure. The first interconnect structure may include a first member having a first end to attach to the substrate and a second end opposite the first end, and a second member having a first end to attach to the substrate and a second end opposite the first end. In some examples, the second end of the first member and the second end of the second member are to contact a second interconnect structure of a IC device under test, and the first end of the first member and the first end of the second member are coupled such that the first member and the second member are to transmit, in parallel, current to the second interconnect structure of the IC device under test.

Abstract: Systems, devices, and associated methods are provided for testing and tuning radiofrequency (RF) modules. An example system includes a test station including an imaging device, a measurement device, and a robotic arm. The system may include a rotary stage coupled with the robotic arm, measurement probes disposed in the rotary stage and operably coupled with the measurement device, and tuning tips disposed in the rotary stage. The system may include a galvo scanner and laser to remove conductive material. In operation, the test station may perform a testing procedure on an RF module where the measurement probes generate testing data indicative of testing parameters. The test station may perform a tuning procedure on the RF module where a tuning tip or the laser modifies the RF module based on the testing parameters. The testing and tuning may be performed by a user, semi-autonomously, or autonomously.

Abstract: A wiring structure includes a wiring such as a flexible printed wiring board, a permanent magnet, and a relay piece. The wiring has a conductive portion. The permanent magnet has electrical conductivity. The relay piece is formed of a conductive metal and connected to the conductive portion of the wiring. The relay piece has the permanent magnet fixed thereto by magnetic attraction.

Abstract: Provided are a load detection system and a load detection method thereof. The load detection system includes an adjustable power supply (110) and a detection module (12). The adjustable power supply (110) and a to-be-detected load 120 together form a set load detection circuit (11), and the adjustable power supply (110) is configured to output a changing power supply signal to the to-be-detected load (120) through the set load detection circuit (11). The detection module (12) is configured to detect at least two changing electrical parameters in the set load detection circuit (11), acquire an equivalent resistance value of the to-be-detected load (120) according to the at least two changing electrical parameters, and detect whether the to-be-detected load (120) includes a charging device according to a non-linear change curve or a linear change curve formed by the equivalent resistance value and the power supply signal.

Abstract: A semiconductor integrated circuit inputs and outputs signals regarding a test using two terminals, having a bidirectional terminal for input and output of data and an input terminal for input of a clock signal. A signal is output via the bidirectional terminal in accordance with an output control signal output from an output control circuit. The output control circuit performs control in synchronization with the clock signal to prevent data input to the bidirectional terminal and an output permission signal based on the output control signal from overlapping each other.

Abstract: An IC includes a plurality of pads at a top surface of a semiconductor wafer, an amplifier configured to receive a first AC signal at an input terminal, and output a second AC signal at an output terminal, a first detection circuit coupled to the input terminal and configured to output a first DC voltage to a first pad of the plurality of pads responsive to the first AC signal, and a second detection circuit coupled to the output terminal and configured to output a second DC voltage to a second pad of the plurality of pads responsive to the second AC signal.

Abstract: An arc fault detection device includes: a first electric line; at least one sensor for monitoring an electric current or voltage spectrum in the first electric line and outputting an analogue HF measurement signal; and an input section connected to the at least one sensor, the input section including: an input bandpass filter connected to the at least one sensor so as to filter the analogue HF measurement signal, a passband of the input bandpass filter having a predeterminable arc-frequency range so as to detect arcing effects; and a sampling mixer connected to the input bandpass filter, the sampling mixer having a sampling frequency lower than twice an upper threshold frequency of the arc-frequency range.

Abstract: Pink noise analysis, along with unique properties of the photovoltaic (PV) operating point of both the instantaneous current and voltage signal, is used to distinguish arc faults from other noisy loads or PV degradations.

Abstract: A conductive particle detecting device includes a plurality of electrodes, a permanent magnet, and a detecting circuit. The plurality of electrodes are arranged at intervals in a lubricant. The permanent magnet accumulates conductive particles in the lubricant between adjacent electrodes by a magnetic force. The detecting circuit detects target conductive particles based on electrical resistance between the adjacent electrodes. An attractive force of the permanent magnet acting on the conductive particles between the adjacent electrodes is set such that the lubricant remains as a non-conductive layer around fine-sized conductive particles having a smaller particle size than the target conductive particles.

Abstract: The abnormal power supply voltage detection device has a function of accurately detecting the abnormal voltage in accordance with the characteristics of the semiconductor element for each semiconductor chip. Circuit group for operating the adjustment function has a function of preventing the influence of the power supply voltage of the logic system such as control in the semiconductor product malfunctions becomes abnormal. Furthermore, it has a function of detecting the abnormal voltage of the various power supplies in the semiconductor product. It also has a function to test the abnormal voltage detection function in the normal power supply voltage range during use of semiconductor products.

Abstract: Systems, devices, and associated methods are provided for testing and tuning radiofrequency (RF) modules. An example system includes a test station including an imaging device, a measurement device, and a robotic arm. The system may include a rotary stage coupled with the robotic arm, measurement probes disposed in the rotary stage and operably coupled with the measurement device, and tuning tips disposed in the rotary stage. The system may include a galvo scanner and laser to remove conductive material. In operation, the test station may perform a testing procedure on an RF module where the measurement probes generate testing data indicative of testing parameters. The test station may perform a tuning procedure on the RF module where a tuning tip or the laser modifies the RF module based on the testing parameters. The testing and tuning may be performed by a user, semi-autonomously, or autonomously.

Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.

Abstract: A ground and test (G&T) device includes a test device housing having load and line conductors and a plurality of upper terminals and plurality of lower terminals carried by the test device housing and configured to engage the load and line conductors when the test device housing in installed within the compartment of the switchgear frame. A lower ground bus bar is carried by the test device housing and a plurality of grounding bars selectively connect either the upper terminals to the lower ground bus bar or connect the lower terminals to the lower ground bus bar. A ground shoe assembly is connected to the lower ground bus bar and configured to engage a grounding circuit carried by the switchgear frame.

Abstract: A method is disclosed for locating an earth fault in a DC network, to which multiple load zones are connectable. Each load zone has two symmetrically earthed load zone lines. In an embodiment of the method, for each load zone line, a line voltage is continuously measured between a line potential, at which the load zone line lies, and an earth potential. In the event that an earth fault is detected at a main line of the DC network, the main lines are separated from both load zone lines of a load zone and the earth fault is assigned to this load zone, if a magnitude difference between the magnitudes of the line voltages of the two load zone lines of this load zone are not significantly reduced after separating the main lines from the load zone lines.

Abstract: A testing device for testing electronic devices includes a test controller and a wireless power transmission system. The test controller is configured to generate testing signals for transmission to at least one of the plurality of electronic devices and receive testing data, in response to the testing signals. The wireless power transmission system is configured to receive the testing signal from the test controller, generate a power signal and a first asynchronous serial data signal in accordance with a wireless power and data transfer protocol, the first asynchronous serial data signal based on the testing signals, decode the power signal to extract a second data signal compliant with the wireless power and data transfer protocol, and decode the second data signal compliant with the wireless power and data transfer protocol to extract a second asynchronous serial data signal, the second asynchronous serial data signal based on the testing data.

Abstract: A method is provided to increase processor frequency in an integrated circuit (IC). The method includes identifying a gate included in the IC, the gate having a gate threshold voltage and performing a plasma process to form an antenna signal path in signal communication with the gate. The method further comprises adjusting the plasma process or circuit design to increase plasma induced damage (PID) applied to the gate so as to alter the gate threshold voltage.