Abstract: A method is for calculating a height of a chuck top. A height of the top surface of the chuck top which corresponds to an arbitrary position specified on the XY coordinate plane by a computer is calculated in each of the four quadrants based on a coordinate transformation formulas. The method includes setting, by using the computer, a conical model in which two adjacent points other than the center point of the chuck top which correspond to the specified coordinates in a predetermined quadrant of the XY coordinate plane are obtained on a circumference having the center point of the chuck top as the origin and specifying an arbitrary point in the predetermined quadrant by using the computer and calculating a height of the arbitrary point of the chuck top based on the conical model, the coordinate transformation formulas and the specified coordinates.

Abstract: There is provided a defect inspecting apparatus, which includes an irradiating optical system of irradiating a light beam on a surface of a face plate of a disk mounted on a stage to scan the surface of the face plate, a light-receiving optical system of receiving specular reflection light that has transmitted a shading filter with a shading difference that changes an amount of the specular reflection light from the face plate resulting from the light beam irradiated on the disk, and a processing unit of identifying defects on the surface of the face plate from the change in amount of the specular reflection light that has transmitted a filter, so that a size and a height of the defect can be measured with high accuracy when irregular defects are determined, which is not easily achieved by a conventional lens effect.

Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.

Abstract: An apparatus for detecting electromagnetic wave includes an electromagnetic wave sensor, a first electrode and a second electrode spaced from each other and electrically connected to the electromagnetic wave sensor, and a measuring device electrically connected to the first electrode and the second electrode. The electromagnetic wave sensor includes a carbon nanotube structure. The carbon nanotube structure includes a plurality of carbon nanotubes extending along a same direction from the first electrode to the second electrode. The measuring device is capable of measuring resistance of the carbon nanotube structure.

Abstract: A method of measuring parameters of a particle includes providing a particle, wherein the particle has a first portion and a second portion. The process includes providing a column of photo-detectors including a first photo-detector and a second photo-detector, wherein the first photo-detector and the second photo-detector are sensitive to the same range of light frequencies. Light is projected from the particle onto the column of photo-detectors wherein the column of photo-detectors is oriented so the light from the first portion is projected onto the first photo-detector and light from the second portion is projected onto the second photo-detector. Light measured by the first photo-detector differs from light measured by the second photo-detector. The process further includes using the different first and the second photo-detector measurements to determine at least one from the group consisting of particle temperature and particle diameter.

Abstract: A method for detecting an electromagnetic wave includes: providing a carbon nanotube structure including a plurality of carbon nanotubes arranged along a same direction. The carbon nanotube structure is irradiated by an electromagnetic wave to be measured. The resistance of the carbon nanotube structure irradiated by the electromagnetic wave is measured.

Abstract: Novel methods and laser spectroscopic systems for accurately measuring the concentration of compounds are disclosed herein. The disclosed methods utilize a modulation cancellation technique resulting in a significantly increase in the sensitivity and accuracy of laser spectroscopic measurements. In general, the methods and systems utilize modulation phase-shifting and amplitude attenuation to cancel the signals detected from at least two modulated light beams. Thus, any signal detected will be directly proportional to the concentration measurement.

Abstract: A system, for determining characteristics of a beam wavefront and reshaping such wavefront, including: apparatus for sampling the wavefront curvature and generating outputs; apparatus for reshaping the wavefront; and apparatus for receiving the outputs, proportioning the outputs to match the inputs need to drive controls for the reshaping apparatus, and sending the proportioned outputs to the reshaping apparatus. The reshaping apparatus is, preferably, a deformable mirror. The sampling apparatus includes a distorted grating. The method includes: positioning the sampling apparatus in the bean path; positioning a reshaping apparatus in the beam path; sampling the curvature of the wavefront and generating outputs representative of the curvature thereof; sending the generated outputs to the proportioning apparatus; proportioning the outputs to match the inputs needed to drive the controls of the reshaping apparatus; and sending the proportioned outputs to the reshaping apparatus to change the shape thereof.

Abstract: The present invention provides an inspecting apparatus for photovoltaic devices which electrifies the photovoltaic devices in a forward direction thereof to make the photovoltaic devices emit electro-luminescence light and which has a simple-structured and cheap darkroom. The inspecting apparatus of the present invention includes a darkroom 110 provided with a flat upper surface 111, a transparent plate 112 which is provided in the upper surface of the darkroom for disposing the photovoltaic devices as an inspecting object 200, a camera 120 which is provided in the darkroom and a driving mechanism to move the camera in the darkroom.

Abstract: An inspection apparatus for containers, comprising a first illumination device which directs light having first characteristic properties onto the base of the container, a second illumination device which directs light having second characteristic properties, which differ at least partially from the first characteristic properties, onto the base of the container, and at least one image recording device which receives at least a portion of the light directed onto the base of the container and transmitted by the latter. At least the second illumination device illuminates the base of the container in an indirect manner.

Abstract: Disclosed is a system to measure the energy level of a radiation pulse. The system includes a sample-and-hold module to measure the radiation pulse and to generate a signal representative of an energy level of the radiation pulse, and a processing module to determine an energy value of the radiation pulse based on the signal generated by the sample-and-hold module.

Abstract: The present invention discloses an optical measurement and/or inspection device that, in one application, may be used for inspection of semiconductor devices. A method is disclosed for extracting information of a device-under-test for an ellipsometer, comprising the steps: providing a plurality of incoming polarized beams using a plurality of polarizers, where each of the beams being polarized at a designated polarizing angle; using a parabolic reflector to focus said plurality of incoming polarized beams on a spot on a DUT; using a parabolic reflector to collect a plurality of beams reflected from said DUT; and analyzing said collected beams using a plurality of analyzers, wherein each of the analyzers having a designated polarizing angle with respect to its respective polarizer.

Abstract: In one embodiment, the disclosure relates to a method for interrogating a sample by: illuminating a first region of the sample with a first illumination pattern to obtain a plurality of first sample photons; illuminating a second region of the sample with a second illumination pattern to obtain a plurality of second sample photons; processing the plurality of first sample photons to obtain a characteristic atomic emission of the first region and processing the plurality of second sample photons to obtain a Raman spectrum; and identifying the sample through at least one of the characteristic atomic emission of the first region or the Raman spectrum of the second region of the sample.

Abstract: A solid-state imaging device includes: a solid-state imaging element having a light-receiving area; a transparent member disposed so as to oppose the light-receiving area; a supporting member configured to support the transparent member; a first mark disposed at either an upper surface of the transparent member or an upper surface of the supporting member; and a second mark disposed at an outer side of the light-receiving area, at an upper surface of the solid-state imaging element.

Abstract: An apparatus for recording a shape of a section of the human ear is provided. The apparatus has a recording device for recording a spatial shape of a first and a second subsection of the section and for recording a position or a variable representing the position of the first and the second subsection relative to a predetermined optical feature of the section. The apparatus has an evaluation device for obtaining shape information about the section by combination of the shapes of the subsections based on the recorded positions or the variables representing the respective position. This enables a number of individual images to be joined together into a three-dimensional map based on natural features in the auditory canal, such as skin flecks or veins for example.

Abstract: There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.

Abstract: An imaging system for imaging of a turbid medium comprises a radiation source to illuminate an object to be imaged. A detection system detects radiation from the object and includes a separation module which separates and distinguishes radiation components having respective wavelength ranges. An analysis module forms a comparison of respective radiation components. An image dataset is reconstructed on the basis of the comparison of respective radiation components. The comparison may involve the ratio of the levels of the high-wavelength radiation component to the low-wavelength radiation component, the relative difference of the levels of high-wavelength radiation component to the detected radiation, and the relative difference of the levels of the high-wavelength radiation component to the low-wavelength radiation component.

Abstract: Apparatus for performing Raman analysis may include a laser source module, a beam delivery and signal collection module, a spectrum analysis module, and a digital signal processing module. The laser source module delivers a laser beam to the beam delivery and signal collection module. The beam delivery and signal collection module delivers the laser source beam to a sample, collects Raman scattered light scattered from the sample, and delivers the collected Raman scattered light to the spectrum analysis module. The spectrum analysis module demultiplexes the Raman scattered light into discrete Raman bands of interest, detects the presence of signal energy in each of the Raman bands, and produces a digital signal that is representative of the signal energy present in each of the Raman bands. The digital signal processing module is adapted to perform a Raman analysis of the sample.

Abstract: An optical measuring system has a first optical measuring instrument and a second optical measuring instrument. The optical measuring system includes a first optical path to guide a first beam from a measuring region to the first optical measuring instrument, a second optical path to guide a second beam from the measuring region to the second optical measuring instrument, an optical system through which the first and second optical paths extend and in which the first and second optical paths are paraxial, a reflection area to change the direction of the first optical path, the second optical path crossing the reflection area, and a light transmission area arranged at a position where the reflection area and second optical path cross each other, the light transmission area having a higher light transmittance than the reflection area.

Abstract: An apparatus that can measure both haze and clarity on a web moving at conventional manufacturing speeds. The apparatus uses an integrating sphere and a novel mirror arrangement. With this arrangement, the invention can utilize a calibration curve created using known samples over the range of measurement desired to convert in real time, and the response of two photo detectors that measure the wide and low angle scattering signals, to deduce the desired optical property values. This approach significantly increases the speed and response of sensor and enables either on-line single point or full web scanning for uniformity measurement and control.