Abstract: An integrated circuit testing apparatus includes a probe card and a probe unit. The probe unit includes a plurality of conductive elastic bumps and a plurality of conductors positioned to conduct signals from the bumps to the probe card. The testing apparatus can further includes a substrate disposed between the probe card and the probe unit, and a flexible member disposed adjacent the substrate.

Abstract: In cases where a delay time in a wire, which connects a first NAND placed on the upstream side and a second NAND placed on the downstream side, is calculated, there are a plurality of logical paths in the first NAND, and a parasitic capacitance of an output pin of the first NAND is determined for each logical path. Therefore, the parasitic capacitance corresponding to each logical path of the first NAND is separated from a fixed load model which indicates a sum of a load of the wire and a capacitance of an input pin of the second NAND, and the parasitic capacitance is added to the fixed load model in the calculation of the delay time. Accordingly, a load for the delay time calculation can be produced while precisely reflecting the parasitic capacitance changing with the logical path on the load production, and the delay time calculation can be performed with high accuracy.

Abstract: A negative voltage detector including a resistor divider circuit is used to translate a negative voltage into a standard CMOS logic low or logic high value. The small area consumed by the negative voltage divider allows multiple device placement within a logic device without the consumption of much area on the logic device. Additionally, the multiple devices placed may detect different negative voltage thresholds with a simple tuning of device components.

Abstract: An apparatus for measuring the focus of a light exposure system for selectively exposing a photosensitive plate to light rays in a process of fabricating a semiconductor device, wherein there is provided a focus measuring part having opaque region, transparent region, and a transparent electrode arranged in the transparent region, a conducting stage supporting the photosensitive plate; and a capacitance detector for measuring the capacitance between the transparent electrode and the conducting stage.

Abstract: The on-line winding test unit determines a characteristic signature of a monitored winding(s) in a transformer, generator, or the like. A sensor detects incoming pulses, originating elsewhere on the energy delivery system, applied to the winding. A sensor detects output pulses after each input pulse has propagated through the winding. Data corresponding to the input and output pulses are stored. A processor computes the spectral densities of the data records. The logic then computes the characteristic signature, H(f), for the winding such that H(f) equals the average of Gxy divided by the average of Gxx for the valid data. Coherence is used to determine a valid H(f). A comparison of the H(f)'s over elapsed time using an error function indicates winding deformation or displacement.

Abstract: The electronic ignition device includes an ignition coil with a primary winding terminal and a secondary winding terminal generating a spark, a power element arranged between the primary winding terminal and ground, a protection circuit issuing a disable signal to the control terminal of the power element in preset conditions, and a voltage limiting circuit having inputs connected to the primary winding terminal and to the battery voltage, and an output connected to the control terminal of the power element. The voltage limiting circuit detects a potential difference between its own inputs and supplies to the control terminal an activation signal for the power element, in presence of the deactivation signal and when the potential difference exceeds the supply voltage by a preset value. Thereby, the voltage limiting circuit limits the voltage on the primary winding terminal to a preset value which depends upon the value of the battery voltage.

Abstract: A method for determining operational characteristics of capacitive sensors adapted for self-calibration includes the steps of providing at least one capacitive sensor having a suspended element and a pick-up plate. An AC input signal is applied to one of the plates, while force is provided between the plates, the force capable of variation. At least one operational characteristic of capacitive sensors can be determined, such as the suspended element spring constant and the gap distance between the plates. A capacitive sensor system adapted for self-calibration includes at least one capacitive sensor having a suspended element and a pick-up plate, a self-testing and calibration network, and a structure for generating force between the plates, the force capable of variation.

Abstract: A system for efficiently and cost effectively monitoring the status of the interface between two dissimilar media is provided. In a preferred embodiment, the system uses principles applied from the theory of time domain reflectometry (TDR), together with novel circuitry and low cost narrow band telemetry, to provide real time monitoring on a continuous basis, as needed. The circuitry involved permits operation of the system without relying on relative values of signal amplitude while employing a novel feedback function that sets the pulse repetition frequency instantaneously to permit an optimum data collection rate as well as a separate measure of the status based on the system operating parameters. It has particular application to real time monitoring and alerting to the effect of scour events in waterways.

Abstract: A plasma density measuring method which includes producing a surface wave at an interface between a dielectric member and a plasma, and measuring at least one of a plasma density and a relative change in plasma density, on the basis of the surface wave. A plasma processing system including a container having a window, and for storing therein a gas introduced thereinto, a dielectric member for closing the window of the container, a plasma voltage source for applying a high frequency voltage through the dielectric member to produce a plasma by use of the gas inside the container, wherein a predetermined process is performed by use of the thus produced plasma, a detecting system for detecting an electric field intensity distribution of a surface wave propagated through the dielectric member, and a feedback system for feeding back the result of detection by the detecting system, to determine a processing condition for the process.

Abstract: The invention is a multipath meter that analyses estimates of parameters associated with a direct signal component and one or more multipath signal components of a signal received by an antenna. The meter analyses the parameter estimates in order to facilitate the select of a location for an antenna, monitor signal quality at an existing antenna site, and/or to determine if satellite failure or some other type of signal failure has occurred. The multipath meter makes available to a user or for analysis information related to the contributions of the direct signal and the multipath signals to the received signal. The information includes estimates of various parameters such as delay, relative amplitude and phase of the direct and multipath signals. The meter calculates a ratio of the amplitudes of the direct and the multipath signals, to determine the severity of the multipath signals and, thus, the signal quality.

Abstract: A voltage sensing apparatus includes an output for a voltage tap point that is useful in representing the voltage on a conductor that passes through the voltage sensing apparatus. The voltage sensing apparatus also performs the function of a separable insulated conductor, e.g. a conventional bushing or bushing insert as utilized in the electrical power distribution field. The voltage sensing apparatus includes a molded body having an embedded capacitance screen that provides the output. The body is molded about the capacitance screen. An arrangement is provided for locating the capacitance screen within the molded body. In a preferred embodiment, the capacitance screen is molded from a conductive plastic preferably formed with an open mesh or screen structure that permits the free flow of molding material.

Abstract: A coupling for a reflectivity-measuring device connects a first shaft of a reflectivity-measuring device with a second shaft of a motor. The first shaft inserts into a first hole of a main portion of the coupling, and the second shaft inserts into a second hole of the main portion. The-main portion further comprises a third hole communicating with the first hole, a fourth hole communicating with the second hole; a first non-skid member and a second non-skid member. The first non-skid member inserts into the third hole and abuts the first shaft located inside the first hole. The second non-skid member inserts into the fourth hole and abuts the second shaft located inside the second hole.

Abstract: Locating a fault of a transmission line in a system which performs bidirectional optical communication between a station-side device and plural subscriber devices and in which a transmission line 1 extending from the station-side device is branched by a branching/coupling device into plural transmission lines 2 each connected to the subscriber devices. The present invention provides a supervisory unit to the transmission line 1 and attenuators to respective transmission lines 2. The supervisory unit emits an optical test signal, observes a reflected signal of the test signal while changing the attenuation of the attenuators and locates the fault based on a return time and a return loss when the test signal returns as a reflected signal.

Abstract: A particle signal processing apparatus which processes a particle signal representative of characteristics of particles includes an amplifier having input and output terminals for amplifying a particle signal including serial pulses to output an output signal including the amplified serial pulses, a filter section for extracting a low frequency component from the output signal of the amplifier so that the extracted component is fed back into the input terminal as a negative feedback signal, and a feedback signal control section for allowing the filter section to fix the negative feedback signal when each of the amplified pulses rises and to hold the fixed negative feedback signal while the amplified pulse is larger than a threshold value.

Abstract: A cooling device detection circuit and method for detecting a cooling device in a computer system. In one embodiment, a cooling device detection circuit includes a detection stage and a power management stage. The detection stage is configured to sense an indication that the cooling device is functioning and to assert a signal if the cooling device is detected. The power management stage is configured to turn off a component cooled by the cooling device if the cooling device is not detected.

Abstract: A magneto-system firing apparatus which is capable of rapidly detecting an abnormal state in the case where abnormality occurs in the make/break operation of a contact point due to damage of a breaker or the like.

Abstract: A method and an apparatus for measuring capacitances between electrodes of an ink-jetting head. The apparatus includes a multi-probe having a plurality of probes to contact a plurality of electrode rows as one lump contact, each of the probes contacting one of the electrode rows and a plurality of the probes being divided into a predetermined number of groups. The apparatus further includes a plurality of scanners, each of which corresponds to each of the groups, to sequentially switch contacting-terminals of a plurality of the probes and a plurality of capacitance-measuring devices, each of which corresponds to each of the scanners, to measure capacitances between electrodes in all of the groups in parallel.

Abstract: A thermal head of a thermal printer is provided with an array of parallel connected heating elements and transistors connected in series to the heating elements in one to one relation. In a resistance measuring mode, one of the transistors connected to one heating element whose resistance is to measure is turned on, and other transistors are turned off. In this condition, a capacitor connected in parallel to the heating element is charged up to a predetermined voltage, and then discharged. A counter circuit starts time-counting by a short unit time t0 when a predetermined delay time T min has passed since the start of discharging, and outputs a count Q when the charged voltage goes down to a predetermined level. Based on a discharge time T=T min+t0·Q, the resistance of the heating element is calculated.

Abstract: A capacitance measurement circuit and probe includes a drive circuit couplable to a constant-current source, a threshold detector, a probe capacitor, and a reference capacitor. The circuit includes a plurality of switches being actuatable to alternately couple the current source to the probe capacitor and to the reference capacitor. The drive circuit is configured to alternately generate a signal of linear ramp waveform having a slope that is proportional to the magnitude of capacitance of the probe capacitor and of the reference capacitor. The voltage differential between the probe capacitor and reference capacitor are actively nulled to nominally eliminate a parasitic capacitance therebetween.

Abstract: The fault identification system includes a first logic circuit which is responsive to conventional protective elements which recognize the presence of low resistance single line-to-ground faults for the A, B and C phases on a power transmission line. The first logic circuit includes a portion thereof for recognizing and providing an output indication of single line-to-ground faults, faults involving two phases and three-phase faults, in response to the occurrence of different combinations of outputs from the protective elements. A calculation circuit, when enabled, is used to determine the angular difference between the total zero sequence current and the total negative sequence current for high resistance faults when the protective elements themselves cannot identify fault conditions. The angular difference is in one of three pre-selected angular sectors.