Patents Examined by Jason McCormack
  • Patent number: 10004822
    Abstract: Apparatuses having an ultraviolet light lamp are disclosed, where ultraviolet light is projected exterior to the apparatus and, in some embodiments, to a region 2-4 feet from a floor of a room in which the apparatus is arranged. In some cases, an apparatus includes a mobile carriage supporting the lamp and the apparatus is configured such that the lamp is not moveable beyond vertical planes aligned with a casing of the mobile carriage. Additional or alternative embodiments of apparatuses include a housing transparent to ultraviolet light surrounding the lamp and an exhaust duct extending from a gas outlet of the housing into a support structure that has an outlet disposed along its lower half portion or its bottom surface. Other embodiments of apparatuses include a pulsed ultraviolet light lamp and a sensor system to monitor and determine when to replace the pulsed lamp based on pulse count.
    Type: Grant
    Filed: June 26, 2017
    Date of Patent: June 26, 2018
    Inventors: Mark A. Stibich, James B. Wolford, Alexander N. Garfield, Martin Rathgeber, Eric M. Frydendall
  • Patent number: 10009991
    Abstract: A target supply device may include: a tank including a cylindrical main body, a first end portion blocking an axial first end of the main body, and a second end portion blocking an axial second end of the main body; a nozzle provided to the first end portion of the tank and configured to output a target material contained inside the tank; and an inert gas supply unit configured to supply inert gas into the tank, in which the inert gas supply unit includes a gas flow path penetrating the second end portion of the tank and configured to guide the inert gas in a direction toward an inner wall of the main body.
    Type: Grant
    Filed: February 9, 2016
    Date of Patent: June 26, 2018
    Assignee: Gigaphoton Inc.
    Inventors: Toshihiro Nishisaka, Yoshiaki Kato, Fumio Iwamoto
  • Patent number: 9997329
    Abstract: An evaluation method according to an embodiment is to evaluate a precision of an aperture formed with multiple openings, and includes steps of forming a first evaluation pattern based on evaluation data using multiple electron beams generated by electron beam that has passed through the aperture, dividing the aperture into multiple regions, each of the regions including the multiple openings and defining the multiple divided regions, forming a second evaluation pattern based on evaluation data using the electron beam that has passed through a first divided region among the multiple divided regions, comparing the first evaluation pattern with the second evaluation pattern, and evaluating the precision of the aperture based on the comparison result between the first evaluation pattern and the second evaluation pattern.
    Type: Grant
    Filed: November 25, 2016
    Date of Patent: June 12, 2018
    Assignee: NuFlare Technology, Inc.
    Inventor: Rieko Nishimura
  • Patent number: 9995763
    Abstract: A scanning probe microscope (SPM) system and associated method. The SPM system having a probe adapted to interact with nanoscale features of a sample and scan within a target region to produce a three-dimensional image of that target region, the system maintaining location information for a plurality of features of interest of the sample according to a sample-specific coordinate system, wherein the SPM system is configured to adjust positioning of the probe relative to the sample according to a SPM coordinate system, the SPM system further configured to manage a dynamic relationship between the sample-specific coordinate system and the SPM coordinate system by determining a set of alignment errors between the sample-specific coordinate system and the SPM coordinate system and apply corrections to the SPM coordinate system to offset the determined alignment errors.
    Type: Grant
    Filed: February 24, 2015
    Date of Patent: June 12, 2018
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Eric Milligan, Andrew Lopez, Xianghai Wu, Sean Hand, Vladimir Fonoberov
  • Patent number: 9989504
    Abstract: The operation efficiency and accuracy of the simultaneous analysis of phospholipids, including fatty acid compositions are increased. After a first-time LC/MS/MS analysis for determining the phospholipid classes of the phospholipid contained in a sample is performed (S2-S3), a second-time LC/MS/MS analysis for determining fatty acid compositions is performed only for the detected phospholipids (S4-S8). By associating a method list in which an MRM transition for phospholipid class determination is recorded for each compound of phospholipid classes with a method list in which an MRM transition for fatty acid composition determination is recorded for each phospholipid compound, it is possible to promptly select MRM transitions for fatty acid composition determination that correspond to compounds of the detected phospholipid classes, and to easily create an analysis method for the second-time analysis.
    Type: Grant
    Filed: April 13, 2017
    Date of Patent: June 5, 2018
    Inventors: Tsuyoshi Nakanishi, Masaki Yamada, Yoshihiro Kita, Suzumi Tokuoka
  • Patent number: 9991105
    Abstract: Disclosed are improved methods and structures for actively stabilizing the oscillation frequency of a trapped ion by noninvasively sampling and rectifying the high voltage RF potential at circuit locations between a step-up transformer and a vacuum feedthrough leading to the ion trap electrodes. We use this sampled/rectified signal in a feedback loop to regulate the RF input amplitude to the circuit. By employing techniques and structures according to the present disclosure we are advantageously able to stabilize a 1 MHz trapped ion oscillation frequency to <10 Hz after 200 s of integration, representing a 34 dB reduction in the level of trap frequency noise and drift, over a locking bandwidth of up to 30 kHz.
    Type: Grant
    Filed: December 23, 2016
    Date of Patent: June 5, 2018
    Inventors: Christopher Monroe, Kale Johnson, Jaime David Wong-Campos
  • Patent number: 9989556
    Abstract: Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (“TERS”), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.
    Type: Grant
    Filed: February 9, 2017
    Date of Patent: June 5, 2018
    Inventors: Sergey A. Saunin, Andrey V. Krayev, Vladimir V. Zhishimontov, Vasily V. Gavrilyuk, Leonid N. Grigorov, Alexey V. Belyaev, Dmitry A. Evplov
  • Patent number: 9981144
    Abstract: Interference of dose application in scanned ion beam therapy and organ motion, also called interplay effect, may lead to dose deviations at target volumes. Current repainting methods are susceptible to artifacts due to a predominant scanning direction, ranging from fringed field edges to under and overdosed regions (hot and cold spots). To overcome the difficulties inherent in the repainting techniques of conventional proton therapy systems, new random repainting techniques are described herein for mitigating the under-dose and/or over-dose pattern inherent in existing repainting techniques using a random repainting approach that randomly selects spot locations within the target area.
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: May 29, 2018
    Assignee: Varian Medical Systems Particle Therapy GMBH
    Inventor: Markus Bach
  • Patent number: 9984851
    Abstract: An ion implanter includes an energy analyzer electromagnet provided between an ion source and a processing chamber. The energy analyzer electromagnet includes a Hall probe configured to generate a measurement output in response to a deflecting magnetic field and an NMR probe configured to generate an NMR output. A control unit of the ion implanter includes a magnetic field measurement unit configured to measure the deflecting magnetic field in accordance with a known correspondence between the deflecting magnetic field and the measurement output, a magnetic field determination unit configured to determine the deflecting magnetic field from the NMR output, and a Hall probe calibration unit configured to update the known correspondence by using the deflecting magnetic field determined from the NMR output and a new measurement output of the Hall probe corresponding to the determined deflecting magnetic field.
    Type: Grant
    Filed: August 19, 2014
    Date of Patent: May 29, 2018
    Inventor: Hiroyuki Kariya
  • Patent number: 9981293
    Abstract: A charged particle beam system is disclosed, comprising: a charged particle beam generator for generating a beam of charged particles; a charged particle optical column arranged in a vacuum chamber, wherein the charged particle optical column is arranged for projecting the beam of charged particles onto a target, and wherein the charged particle optical column comprises a charged particle optical element for influencing the beam of charged particles; a source for providing a cleaning agent; a conduit connected to the source and arranged for introducing the cleaning agent towards the charged particle optical element; wherein the charged particle optical element comprises: a charged particle transmitting aperture for transmitting and/or influencing the beam of charged particles, and at least one vent hole for providing a flow path between a first side and a second side of the charged particle optical element, wherein the vent hole has a cross section which is larger than a cross section of the charged par
    Type: Grant
    Filed: April 21, 2016
    Date of Patent: May 29, 2018
    Inventors: Marc Smits, Johan Joost Koning, Chris Franciscus Jessica Lodewijk, Hindrik Willem Mook, Ludovic Lattard
  • Patent number: 9984856
    Abstract: An ion implantation apparatus performs a plurality of ion implantation processes having different implantation conditions to a same wafer successively. The plurality of ion implantation processes are: (a) provided so that twist angles of the wafer differ from each other; (b) configured so that an ion beam is irradiated to a wafer surface to be processed that moves in a reciprocating movement direction; and (c) provided so that a target value of a beam current density distribution of the ion beam is variable in accordance with a position of the wafer in the reciprocating movement direction. Before performing the plurality of ion implantation processes to the same wafer successively, a control device executes a setup process in which a plurality of scanning parameters corresponding to the respective implantation conditions of the plurality of ion implantation processes are determined collectively.
    Type: Grant
    Filed: September 29, 2016
    Date of Patent: May 29, 2018
    Inventors: Shiro Ninomiya, Yasuharu Okamoto, Akihiro Ochi, Yusuke Ueno
  • Patent number: 9974978
    Abstract: A scintillation material is longitudinally packaged in a circumferentially surrounding sheath, where the sheath has a lower index of refraction than the scintillation material, to form a scintillation optic or scintillation fiber optic. The scintillation material yields secondary photons upon passage of a charged particle beam, such as a positively charged residual particle beam having transmitted through a sample. The internally generated secondary photons within the sheath are guided to a detector element by the difference in index of refraction. Multiple scintillation optics are assembled to form a two-dimensional scintillation array coupled to a two-dimensional detector array, such as for use in determination of state of the residual charged particle beam, determination of an exit point of the particle beam from the sample, path of the treatment beam, and/or tomographic imaging.
    Type: Grant
    Filed: August 17, 2016
    Date of Patent: May 22, 2018
    Inventors: W. Davis Lee, Mark R. Amato, Stephen L. Spotts, James P. Bennett
  • Patent number: 9977050
    Abstract: A method and a scanning probe microscope (SPM) for scanning a surface of a material. The method and SPM have a cantilever sensor configured to exhibit both a first spring behavior and a second, stiffer spring behavior. While operating the SPM in contact mode, the sensor is scanned on the material surface and a first spring behavior of the sensor (e.g. a fundamental mode of flexure thereof) is excited by deflection of the sensor by the material surface. Also while operating the SPM in contact mode, excitation means are used to excite a second spring behavior of the sensor at a resonance frequency thereof (e.g. one or more higher-order resonant modes) of the cantilever sensor to modulate an interaction of the sensor and the material surface and thereby reduce the wearing of the material surface.
    Type: Grant
    Filed: November 5, 2010
    Date of Patent: May 22, 2018
    Assignee: SWISSLITHO AG
    Inventors: Urs T. Duerig, Bernd W. Gotsmann, Armin W. Knoll, Mark Alfred Lantz
  • Patent number: 9978576
    Abstract: Systems and methods are provided for time-of-flight analysis of a continuous beam of ions by a detector array. A sample is ionized using an ion source to produce a continuous beam of ions. An electric field is applied to the continuous beam of ions using an accelerator to produce an accelerated beam of ions. A rotating magnetic and/or electric field is applied to the accelerated beam to separate ions with different mass-to-charge ratios over an area of a two-dimensional detector using a deflector located between the accelerator and the two-dimensional detector. An arrival time and a two-dimensional arrival position of each ion of the accelerated beam are recorded using the two-dimensional detector. Alternatively, an electric field that is periodic with time is applied in order to sweep the accelerated beam over a periodically repeating path on the two-dimensional rectangular detector.
    Type: Grant
    Filed: September 22, 2017
    Date of Patent: May 22, 2018
    Assignee: DH Technologies Development Pte. Ltd.
    Inventor: Robert Alois Grothe, Jr.
  • Patent number: 9974875
    Abstract: A sterilizer for point-of-sale credit card readers and keypads. One or more UV-C LEDs are integrated into the housing of the unit and directed at the keypad or other surface. The LED lights shine on the keypad or other contact surfaces, such as a stylus. Because LEDs use low DC voltage, the electronics may be powered by the keypad device power supply. The electronic circuits may be designed so that the LEDs are automatically turned on after each transaction is complete for a predetermined amount of time to kill the vast majority of pathogens that could be transmitted from person to person. The LEDs may be arranged on both the left and right side of the keypad, and at the top edge of the keypad to illuminate all exposed surfaces of the keys.
    Type: Grant
    Filed: May 16, 2017
    Date of Patent: May 22, 2018
    Inventor: Michael Davis
  • Patent number: 9968697
    Abstract: The UV sanitizing device is a wheeled cart that is adapted for use in sanitizing the garments and personal equipment used by health care professionals. The UV sanitizing device uses ultraviolet radiation to sanitize objects contained within the cabinet. The interior surfaces of the cabinet supports a plurality of UV chambers that generate the UV radiation required for use in sanitizing the contents of the cabinet. The cabinet is further organized into two chambers such that shoes can be sanitized separately from the other articles being sanitized. The UV sanitizing device comprises a cabinet, a plurality of UV chambers, a plurality of wheels, a closure, a first container, and a second container.
    Type: Grant
    Filed: October 4, 2016
    Date of Patent: May 15, 2018
    Inventor: Eric Philipps
  • Patent number: 9966219
    Abstract: An electron energy loss spectrometer for electron microscopy is disclosed having an electrically isolated drift tube extending through the bending magnet and through subsequent optics that focus and magnify the spectrum. An electrostatic or magnetic lens is located either before or after or both before and after the drift tube and the lens or lenses are adjusted as a function of the bending magnet drift tube voltage to maintain a constant net focal length and to avoid defocusing. An energy selecting slit is included in certain embodiments to cleanly cut off electrons dispersed outside the energy range incident on the detector, thereby eliminating artifacts caused by unwanted electrons scattering back into the spectrum.
    Type: Grant
    Filed: June 25, 2015
    Date of Patent: May 8, 2018
    Assignee: GATAN, INC.
    Inventors: Alexander Jozef Gubbens, Colin Trevor, Ray Dudley Twesten, Melanie Barfels
  • Patent number: 9966226
    Abstract: A cross-section processing and observation method performed by a cross-section processing and observation apparatus comprises a cross-section processing step of forming a cross-section by irradiating a sample with an ion beam; a cross-section observation step of obtaining an observation image of the cross-section by irradiating the cross-section with an electron beam; and repeating the cross-section processing step and the cross-section observation step so as to obtain observation images of a plurality of cross-sections. In a case where Energy Dispersive X-ray Spectrometry (EDS) measurement of the cross-section is performed and an X-ray of a specified material or of a non-specified material that is different from a pre-specified material is detected, an irradiation condition of the ion beam is changed so as to obtain observation images of a plurality of cross-sections of the specified material, and the cross-section processing and observation of the specified material is performed.
    Type: Grant
    Filed: June 2, 2015
    Date of Patent: May 8, 2018
    Inventors: Atsushi Uemoto, Xin Man, Tatsuya Asahata
  • Patent number: 9960028
    Abstract: The invention generally relates to systems and methods for analyzing a sample from a surface. In certain aspects, the invention provides systems that include a sample introduction member that has an inlet, an outlet, and an opening along a wall of the sample introduction member. The sample introduction member may be configured such that the opening couples with a surface that includes a sample in a manner in which molecules of the sample enter the sample introduction member via the opening and exit the sample introduction member via the outlet. A mass spectrometer is configured to receive the molecules of the sample.
    Type: Grant
    Filed: June 16, 2015
    Date of Patent: May 1, 2018
    Assignee: Purdue Research Foundation
    Inventors: Zheng Ouyang, Xiao Wang, Xiaoyu Zhou
  • Patent number: 9960013
    Abstract: The present disclosure provides one embodiment of a method that includes slicing a first sub-polygon out of the pattern layout and writing the first sub-polygon onto the substrate using a beam with a first beam setting that is associated with the first sub-polygon. The method additional includes slicing a second sub-polygon out of the remaining pattern layout that does not include the first sub-polygon. The second sub-polygon interfaces with the first sub-polygon on at least one edge. Also, the method includes, without turning off the beam after writing the first sub-polygon onto the substrate, writing the second sub-polygon onto the substrate with a second beam setting that is associated with the second sub-polygon.
    Type: Grant
    Filed: January 13, 2016
    Date of Patent: May 1, 2018
    Inventor: Shih-Ming Chang