Patents Examined by John E. Barlow, Jr.
  • Patent number: 7353143
    Abstract: An input signal is analyzed and a proposed processing control is output for review. A user may interact with the proposed processing control to change the outcome of the digital signal processing operation. As proposed changes are received, feedback is output so a user may see the results of the proposed operation. Input from a user commits the changes and the new waveform is output.
    Type: Grant
    Filed: August 19, 2005
    Date of Patent: April 1, 2008
    Assignee: Apple Inc.
    Inventor: Christopher Moulios
  • Patent number: 7353142
    Abstract: An electronic maintenance record file system for facilities comprising local monitoring units, installed near the equipment to be maintained, a calculator made available to the maintenance company and connected to the local units using a transmission network to receive and process the information transmitted by the local units. Each local unit includes identification resources of the technician in charge of maintaining the associated equipment; time stamping resources of the start and end of each operation performed by the technician; data input resources of the description of the work performed during the technician? s operation; and storage resources for storing, in the form of an electronic maintenance report file, the description of each operation performed on the associated equipment in relation with the identification information of the technician that performed the operation and the time stamp information of the start and end of the operation.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: April 1, 2008
    Inventor: Jean-Patrick Azpitarte
  • Patent number: 7333911
    Abstract: In a method for operating a positional measurement device and a corresponding positional measurement device, the device includes a signal generation unit configured to generate positional data and is connected to sequential or follower electronics by a communication unit. Data is transmitted between the signal generation unit and the communication unit via an internal interface unit, whereas measurement-data request instructions, which are transmitted by the sequential or follower electronics to the positional measurement device, are transmitted to the signal generation unit by bypassing the internal interface unit.
    Type: Grant
    Filed: September 19, 2003
    Date of Patent: February 19, 2008
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Hermann Hofbauer, Erich Strasser
  • Patent number: 7324904
    Abstract: Systems and methods are provided for detecting the potential of a wood sample, such as a board, to stay on grade, i.e., resist warp, after it is put into service and/or its moisture has re-equilibrated with the surrounding environment. The systems and methods include various sensor technologies and subjection of obtained data to various models, algorithms, and/or other mathematical formulas.
    Type: Grant
    Filed: December 21, 2005
    Date of Patent: January 29, 2008
    Assignee: Weyerhauser Company
    Inventors: Stanley L. Floyd, Chih-Lin Huang, Mark A. Stanish, John E. Jones, III, Susan Kaluzny, David C. Slaughter, Tom J. Taylor
  • Patent number: 7324907
    Abstract: Controlling an orienting/positioning system having a sensor and actuator for controlling at least one of an orienting and positioning action of the sensor. The invention (1) evaluates pre-action output information of a sensor in order to detect the position of a pattern in the input space of the sensor, (2) determines a targeted post-action position of the pattern in the input space of the sensor, (3) defines an actuator command by mapping any deviation of the pre-action and post action position in the input space to actuator control coordinates using a predefined mapping function, (4) controls the actuators according to the defined command to execute the orienting/positioning action, (5) detects the real post-action position of the pattern in an input space of the sensor, (6) adapts the mapping function based on differences between the real post-action position and the targeted post-action position of the pattern in the input space.
    Type: Grant
    Filed: April 8, 2005
    Date of Patent: January 29, 2008
    Assignee: Honda Research Institute Europe GmbH
    Inventors: Frank Joublin, Tobias Rodemann
  • Patent number: 7310593
    Abstract: An apparatus for determining a state parameter of an object to be monitored comprises a means for providing a plurality of measurement values, wherein the measurement values comprise information relating to the state parameter of the object to be monitored, a comparison means for comparing the measurement value to a predeterminable comparison parameter, wherein the comparison means is formed to output a first comparison signal when a predeterminable number of measurement values falls below the comparison parameter within a measurement interval, or to output a second comparison signal when the predeterminable number of measurement values exceeds or reaches the comparison parameter, wherein the first comparison signal or the second comparison signal indicate the state parameter.
    Type: Grant
    Filed: March 4, 2005
    Date of Patent: December 18, 2007
    Assignee: Infineon Technologies AG
    Inventor: Dirk Hammerschmidt
  • Patent number: 7310583
    Abstract: A system and method of measurement and processing of physical variables, and in particular electrical variables, comprising: a multimeter to measure multiple electrical variables, similar to any conventional multimeter; a microcomputer capable of the numerical processing of variables, storage and communication; a conventional computer that can read magnetic or optical storage media, or alternately, be connected to the Internet; an Internet website of public access to users of said multimeter; an Internet server which runs mathematical processing software to carry out graphical and numerical analysis.
    Type: Grant
    Filed: February 8, 2005
    Date of Patent: December 18, 2007
    Assignee: Conecta S.A.
    Inventor: Alfredo De La Quintana
  • Patent number: 7308366
    Abstract: In a method of determining a regression model, and a method of predicting a component concentration of a test mixture using the regression model, the method of determining the regression model includes selecting a regression model, generating a plurality of observation points, each one of the plurality of observation points having a prediction target value and a measured value, determining a weight of the prediction target value and the measured value at each one of the plurality of observation points, and obtaining a calculation amount by reflecting the weights in differences between predicted values acquired by applying the measured values to the regression model and the prediction target values, and determining coefficients of the regression model to minimize the calculation amount.
    Type: Grant
    Filed: February 8, 2005
    Date of Patent: December 11, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Sang-joon Han
  • Patent number: 7308376
    Abstract: A computer platform automatic testing method and system is proposed, which is designed for use in conjunction with a computer platform for performing an automatic testing procedure on a computer-dedicated circuit unit installed on the computer platform, and which is characterized by the capability of performing an automatic testing procedure on a computer-dedicated circuit unit based on a user-specified set of hardware specification data about the computer platform and circuit unit under test, and the capability of automatically generating a test report that lists related data about each faulted part of the circuit unit being tested. This feature allows hardware engineers to more conveniently and efficiently correct faulted parts in the circuit unit being tested.
    Type: Grant
    Filed: February 5, 2005
    Date of Patent: December 11, 2007
    Assignee: Inventec Corporation
    Inventors: Ying-Chih Lu, Chin-Lung Wu, Chun-Yi Lee, Chia-Hsing Lee, Chi-Tsung Chang, Ling-Hung Yu
  • Patent number: 7275005
    Abstract: An inspection system inspects appearances of a plurality of worked products held by a sheet-like inspection target sheet, and includes an image processing station provided at a first location and defect detection stations provided at one or a plurality of second locations away from the first location. The appearance inspection system includes a marking station. The image processing station images each of the worked products held by the inspection target sheet and extracts image-processed data serving as an inspection target. The defect detection station displays on a computer the image-processed data to urge an operator to detect a defect part, and outputs detection result data including position data on the defect part, based on an instruction from the operator. The marking station gives onto the image-processed inspection target sheet a mark representing the defect part, based on the detection result data output by the defect detection station.
    Type: Grant
    Filed: December 17, 2003
    Date of Patent: September 25, 2007
    Assignee: Dai Nippon Printing Co., Ltd.
    Inventors: Susumu Baba, Makoto Futami, Yuichiro Yotsumoto
  • Patent number: 7272505
    Abstract: Information about coupling of a seismic receiver is obtained from a power spectrum for a record acquired at a seismic receiver. In one method, the power spectrum for the record is compared with a reference power spectrum, which may be known a priori or which may be determined from the power spectra of records acquired by a group of receivers. In an alternative method, one receiver of a group of receivers is designated as a reference receiver, and the power spectra of records acquired by other receivers in the group are compared with a power spectrum for the reference receiver. The obtained information about the coupling of a receiver may be used to determine a coupling correction operator for the receiver, and this operator can be applied to seismic data acquired by the receiver to correct for the effects of imperfect coupling of the receiver.
    Type: Grant
    Filed: July 28, 2004
    Date of Patent: September 18, 2007
    Assignee: Westerngeco L.L.C.
    Inventor: Claudio Bagaini
  • Patent number: 7254485
    Abstract: Methods of characterizing subsurface conditions in a selected geographic region previously associated as a whole with a specific subsurface material characteristic reference profile such as from a USDA-NRCS soil survey. The method includes deploying a sensing tool at selected positions within the geographic region to determine a depth-referenced subsurface material characteristic such as soil type or strata, comparing the determined subsurface material characteristic to the subsurface material characteristic reference profile associated with the geographic region to determine a correlation between the subsurface material characteristic reference profile and the depth-referenced subsurface material characteristic, and then deciding whether to deploy the tool at another position, and at what optimum position to deploy the tool, by considering the correlation.
    Type: Grant
    Filed: April 7, 2005
    Date of Patent: August 7, 2007
    Assignee: Deere & Company
    Inventors: Daniel James Rooney, Marek Dudka, Mark Andrew Cheyne
  • Patent number: 7225107
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
    Type: Grant
    Filed: December 7, 2003
    Date of Patent: May 29, 2007
    Assignee: Test Advantage, Inc.
    Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala
  • Patent number: 7222030
    Abstract: Techniques for profiling systems, such as mobile or embedded devices, are provided. The techniques can profile code executing on these systems based on power used by that code. The system may profile power usage for the entire system or a subsystem, component, or functional unit thereof, for example. The system may determine when a specified amount of power has been used, and a performance sampler may then temporarily stop execution of the code and sample state data. This sampled state data may be provided to a performance analyzer that determines performance of the executing code.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: May 22, 2007
    Assignee: Intel Corporation
    Inventors: Rajesh Banginwar, Eugene Gorbatov
  • Patent number: 7219026
    Abstract: A frequency measuring circuit may include an edge detector, a charge pump, and an analog-to-digital (A/D) converter. The edge detector may be configured to generate an output pulse responsive to an edge of an input clock signal. The charge pump may be configured to generate an output signal responsive to the output pulse from the edge detector. The analog-to-digital (A/D) converter may be configured to convert the output signal into a digital value representing a frequency of the input clock signal. Related methods and integrated circuit memory devices are also discussed.
    Type: Grant
    Filed: January 7, 2005
    Date of Patent: May 15, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyun-Jin Kim, Sang-Bo Lee
  • Patent number: 7216050
    Abstract: A system for testing a printed circuit board assembly (PCBA), in accordance with embodiments of the present invention, includes an interface diagnostic module coupled to a multi-dimensional search module. The multi-dimensional search module performs a simultaneous switching output pattern based stress test for each of a plurality of sets of timing parameters. The interface diagnostic module determines an error rate on an interface of the printed circuit board assembly for each of the stress tests. The multi-dimensional search module determines a best set of timing parameters based on the determined error rates.
    Type: Grant
    Filed: December 7, 2004
    Date of Patent: May 8, 2007
    Assignee: Nvidia Corporation
    Inventors: David A. Bachman, Carl W. Davies
  • Patent number: 7216062
    Abstract: A system that characterizes degradation of a component in a system. During operation, the system monitors inferential variables associated with a specimen of the component. Next, the system determines a time for the onset of degradation for the specimen and determines a time for the completion of degradation for the specimen. The system then computes a time interval between the onset of degradation and the completion of degradation, and uses the time interval to look up an entry in a defect library to obtain information which characterizes the degradation of the specimen of the component.
    Type: Grant
    Filed: June 13, 2006
    Date of Patent: May 8, 2007
    Assignee: Sun Microsystem, Inc.
    Inventors: Dan Vacar, David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez
  • Patent number: 7216061
    Abstract: An apparatus for detecting faults in a system monitored by a plurality of sensors is provided. The apparatus includes a hidden process driver unit that generates a hidden process driver based upon sensor values received from a group of correlated sensors selected from among the plurality of sensors. The apparatus also includes a sensor estimating unit that generates sensor estimates for each of the plurality of sensors based upon the hidden process driver and a known process driver provided by an uncorrelated sensor. The apparatus further includes a fault determining unit that indicates a fault when a residual based upon a difference between a sensor value supplied by one of the plurality of sensors and a corresponding one of the sensor estimates lies outside an acceptable range of residual values.
    Type: Grant
    Filed: August 24, 2005
    Date of Patent: May 8, 2007
    Assignee: Siemens Corporate Research, Inc.
    Inventors: Chao Yuan, Claus Neubauer, Zehra Cataltepe
  • Patent number: 7212952
    Abstract: Cause of abnormalities of an abnormal state of a control system of a plant of a turbine are estimated and diagnosed from characteristics of abnormal phenomena. By using a control system abnormality cause-and-effect matrix in which characteristics of a plurality of abnormal phenomena constructed on a knowledge base are correlated with a plurality of causes by correlating (weighting) scores, plant devices causing abnormality are inferred and diagnosed.
    Type: Grant
    Filed: March 25, 2005
    Date of Patent: May 1, 2007
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Shunzo Watanabe, Hideo Hosaka, Mitsuyoshi Okazaki, Seiichi Asatsu, Tatsuo Yamashita
  • Patent number: 7212930
    Abstract: An electricity metering method and apparatus is provided for determining the phase of first waveform relative to a harmonically distorted, second waveform having cycles temporally distinguished by an occurrence of an amplitude that is neither zero amplitude nor a maximum amplitude of said waveform.
    Type: Grant
    Filed: October 20, 2004
    Date of Patent: May 1, 2007
    Assignee: Veris Industries, LLC
    Inventor: David A. Bruno