Abstract: A timing generator that needs no analog circuit for adding jitters and allows the circuit scale and power consumption to be reduced.

Abstract: A self-synchronizing data bus analyzer is provided which can include a generator linear feedback shift register (LFSR) to generate a first data set, and can include a receiver LFSR to generate a second data set. The data bus analyzer may also include a bit sampler to sample the first data set received through a data bus coupled to the generator LFSR and output a sampled first data set. A comparator can be included to compare the sampled first data set with the second data set generated by the receiver LFSR and provide a signal to the receiver LFSR to adjust a phase of the receiver LFSR until the second data set is substantially the same as the first data set.

Abstract: An apparatus comprising a comparator circuit, a reference circuit, a plurality of elements and a logic circuit. The comparator circuit may be configured to generate a difference signal in response to (i) a reference signal and (ii) a test signal. The reference circuit configured to generate the reference signal in response to a first control signal. The plurality of elements may each be configured to generate an intermediate test signal. One of the intermediate test signals may be presented as the test signal by activating one of the test elements, in response to a second control signal. The logic circuit may be configured to generate (i) the first control signal and (ii) the second control signal, each in response to the difference signal.

Abstract: Disclosed is a system and method for testing a dual mode interface. The dual mode interface includes a first strobe circuit and a second strobe circuit configured to be inoperable during a first operational mode of the interface and operable during a second operational mode of the interface. The dual mode interface also includes a first data circuit and a second data circuit configured to be operable during the first operational mode and the second operational mode. The dual mode interface also includes a signal line connecting an output of the second strobe circuit with an input of the first strobe circuit and a switch element configured to activate said signal line in response to receipt of a test signal.

Abstract: A semiconductor integrated circuit has a cell array, a redundancy cell capable of replacing a defective cell, a redundancy control circuit, a plurality of first fuses, a plurality of second fuses, a plurality of third fuses, a first shift register configured to hold states of the plurality of first fuses, a second shift register configured to be connected in cascade to the first shift register and to hold states of the plurality of second fuses, a third shift register configured to be connected to the first and second shift registers in cascade and to hold states of the plurality of third fuses, a CRC remainder calculator configured to sequentially input information held by the first to third shift registers to a CRC generating equation to calculate a remainder obtained by division, and a CRC determination part that outputs information indicative of whether the first to third fuses are correctly programmed.

Abstract: A semiconductor device according to an embodiment of the present invention includes: a plurality of clock domains including a plurality of logic circuits operating in accordance with a clock signal; and a control circuit selectively supplying the clock signal to a predetermined number of clock domains selected from the plurality of clock domains based on a control signal.

Abstract: In a communication system based on OSI (Open Systems Interconnection) Reference Model, a pattern body generation circuit of a transmitting device generates and outputs a jitter test pattern body for jitter test. A selector selects an output (frame data) of a transmitting-end upper circuit during normal communication and selects an output (pattern body) of the pattern body generation circuit during jitter test. A transmitting-end MAC circuit performs transmitting-end processing of a MAC layer on the data selected by the selector to thereby obtain a MAC frame. A receiving-end MAC circuit performs receiving-end processing of a MAC layer on a received frame in MAC frame format to thereby obtain a payload. A pattern body verification circuit verifies a pattern body that is a payload obtained by the receiving-end MAC circuit during jitter test against a corresponding pattern body before transmission.

Abstract: Methods and structures for performing field flawscan to reduce manufacturing costs of a dynamic mapped storage device. In a dynamic mapped storage device in which all user supplied logical blocks are dynamically mapped by the storage device controller to physical disk blocks, features and aspects hereof permit flawscan testing of a storage device to be completed substantially concurrently with processing write requests for its intended application. A fraction of the storage device may be certified by an initial flawscan performed during manufacturing testing. Statistical sampling sufficient to assure a high probability of achieving specified capacity may be performed to reduce manufacturing time and costs in testing. Final flawscan of the remainder of the storage locations may be performed substantially concurrently with processing of write requests after the device is installed for its intended application.

Abstract: Provided is a test mode control circuit capable of preventing an MRS (mode register set) from changing in a test mode exit after a test mode entry. In the test mode control circuit, an MRS controller logically combines an MRS signal, a bank address, an MRS address, and a test mode control signal to output a latch control signal. A test mode control unit detects a test mode entry and a test mode exit to selectively activate one of a test mode set signal and a test mode exit signal, and outputs the test mode control signal having different voltage levels according to an activation state of the test mode set signal or the test mode exit signal. An address latch latches an input address when the MRS signal is activated, and outputs the latched input address as the MRS address when the latch control signal is activated.

Abstract: An interface test can be performed by, for example, only a self apparatus when interface operation specifications are different between the self apparatus and an original connection partner apparatus. An LSI has a plurality of interfaces (IFs) for transmission/reception of data with an external device, and the LSI includes an emulation control unit for allowing one of the two of the plurality of IFs to perform an operation of emulating an IF of a connection partner device having operation specifications different from those of the LSI, when two IFs are connected to each other via a transmission line.

Abstract: A method according to one embodiment may include communicating, by a far end device with a near end device, using a Serial ATA (SATA) communications protocol; receiving, by the far end device, a SATA signal sequence having two bits, the state of which define at least one loopback mode; defining, by the far end device, a reserved and/or error state if both of the bits are set; and processing, by the far end device, the two bits together to determine if the two bits are in a state that defines at least one loopback mode or if the two bits are set. Of course, many alternatives, variations, and modifications are possible without departing from this embodiment.

Abstract: A scannable flip-flop and method are provided. The flip-flop includes a clock input, a normal data input, a test data input, a normal data output and a scan data output. The flip-flop has a normal operating mode during which the normal data output is enabled and the scan data output disabled and has a scan-shift mode during which the normal data output is disabled and the scan data output is enabled.

Abstract: There is implemented a semiconductor memory tester capable of efficiently conducting a test on a fast memory by programming according to parameters of a device without being attended by complex program handling. The semiconductor memory tester for determining pass/fail on a memory device under test is characterized in comprising a measurement division for comparing an output from the memory device under test with an expected value at timing on the basis of a clock outputted by the memory device under test.

Abstract: Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.

Abstract: A system and method of providing error detection and correction capability in an IC using redundant logic cells and an embedded field programmable gate array (FPGA). The system and method provide error correction (EC) to enable a defective logic function implemented within an IC chip design to be replaced, wherein at least one embedded FPGA is provided in the IC chip to perform a logic function. If a defective logic function is identified in the IC design, the embedded FPGA is programmed to correctly perform the defective logic function. All inputs in an input cone of logic of the defective logic function are identified and are directed into the embedded FPGA, such that the embedded FPGA performs the logic function of the defective logic function.

Abstract: In a high-speed serial link, an eye finder diagnostic circuit has improved performance by being on-chip with the existing capture latch(es) of a receive equalizer. The eye finder circuit employs an additional capture latch with its input tied to the same input node as the existing capture latch(es) of a receive equalizer. The additional capture latch has a clock input and reference voltage input. The clock input is adjusted through a phase interpolator (or variable delay line) while the reference voltage input is adjusted by a voltage generator. A digital post processing circuit then compares the output of the additional capture latch with the output of the other existing capture latch(es), in order to determine the receive eye opening. The horizontal eye opening is measured by changing the phase of the additional capture latch through the phase interpolator, while the vertical eye opening is measured by changing the reference voltage of the voltage generator of the additional capture latch.

Abstract: The resistance against recording defects of a write-once optical disk is enhanced allowing realtime recording and playback of data streams with a single speed disk drive. A data stream is recorded in data blocks on the optical disk. An error correction block for one or more data blocks is generated and written on the same optical disk during recording. A spare data area is kept blank on the storage medium and used for storing a defect data block reconstructed by using the error correction block.

Abstract: A panel driving circuit that produces a panel test pattern and a method of testing a panel are provided. The driving circuit includes a pattern generation unit and a selection unit. The pattern generation unit responds to a system clock and produces pattern test data and pattern test signals. The selection unit responds to a test signal and selects and outputs either (a) the pattern test data and the pattern test signals that are outputted from the pattern generation unit, or (b) the pattern test data and pattern test signals that are directly applied from the outside. The driving circuit and the method of the panel test generates the panel test data, the horizontal synchronizing signal, the vertical synchronizing signal, and the data activating signal within the driving circuit using a system clock so that the testing of the panel can be carried out without using a separate test device.

Abstract: Systems and methods for performing logic built-in-self-tests (LBISTS) in digital circuits. In one embodiment, the operation of LBIST circuitry is suspended at the end of each test cycle so that the bit patterns generated by the functional logic of the device under test can be examined to determine if any errors occurred during the test cycle. Pseudorandom bit patterns are scanned into the scan chains interposed between portions of the functional logic circuit and then propagated through the functional logic. The resulting bit patterns are captured in scan chains following the functional logic and then scanned out of the scan chains. The bit patterns are processed and compared to corresponding data generated by a parallel LBIST system in a device that is known to operate properly. The LBIST test cycles are then halted if there are errors in the generated bit patterns or resumed if there are no errors.

Abstract: Systems, controllers and methods are disclosed, such as an initialization system including a controller that receives patterns of read data coupled from a memory device through a plurality of read data lanes. The controller is operable to detect any lane-to-lane skew in the patterns of read data received through the read data lanes. The controller then adjusts the manner in which the read data received through the read data lanes during normal operation are divided into frames. The controller can also couple patterns of command/address bits to the memory device through a plurality of command/address lanes. The memory device can send the received command/address bits back to the controller through the read data lanes. The controller is operable to detect any lane-to-lane skew in the patterns of command/address bits received through the read data lanes to adjust the manner in which the command/address bits coupled through the command/address lanes during normal operation are divided into frames.