Patents Examined by Layla Lauchman
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Patent number: 8593630Abstract: Described herein are spectrometers comprising one or more wavelength-selective filters, such as guided mode resonance filters. Some of the spectrometers described herein are configured for obtaining absorbance spectra in a discrete fashion by measuring absorbances of a sample at multiple discrete wavelengths or wavelength bands. In another aspect, methods are also provided for obtaining spectra, images and chemical maps of samples in a discrete fashion.Type: GrantFiled: October 7, 2010Date of Patent: November 26, 2013Assignee: The Board of Trustees of the University of IllinoisInventors: Rohit Bhargava, Brian T. Cunningham
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Patent number: 8570498Abstract: Customized spectral profiles, and filters and illuminants having a customized spectral profile, optimized to reduce light in one or more wavelength regions for which one or more pigments are relatively more susceptible to perceptible changes in appearance.Type: GrantFiled: May 14, 2010Date of Patent: October 29, 2013Assignee: Board of Regents, The University of Texas SystemInventor: Carl W. Dirk
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Patent number: 8570509Abstract: A spectrometry apparatus includes a transmissive diffraction grating that transmits incident light. The transmissive diffraction grating has inclined surfaces made of a first dielectric material. The inclined surfaces are arranged so that they are inclined relative to a reference line. When the angle of incidence of light incident on the transmissive diffraction grating is measured with respect to the reference line and defined as an angle ?, and the angle of diffraction of diffracted light is measured with respect to the reference line and defined as an angle ?, the angle of incidence ? is smaller than a Bragg angle ? defined with respect to the inclined surfaces, and the angle of diffraction ? is greater than the Bragg angle ?.Type: GrantFiled: May 12, 2011Date of Patent: October 29, 2013Assignee: Seiko Epson CorporationInventors: Jun Amako, Kohei Yamada
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Patent number: 8564778Abstract: A spectrophotometer 300, webcam 302 or other instrument measures the color composition and texture of a person's face 400 or other body part. A computer system 301 includes a processor 501 and a non-transitory, non-signal computer readable medium 500 containing machine readable instructions that accept data from a spectrophotometer 300 or like instrument and uses a main executable program 502 and a subroutine 504 for color analysis to derive a mix of color to create a cosmetic product matching or enhancing the color composition and/or texture of the person's face or other body part. The computer system 301 and subroutine for color analysis create machine readable instructions 505 for the firmware of a cosmetic blending and dispensing machine 508. In order to properly mix and dispense high viscosity and air bubble riddled cosmetic material, a medical grade peristaltic pump 354 is used with triangle needle nozzles 374.Type: GrantFiled: September 17, 2012Date of Patent: October 22, 2013Inventor: Larry Y Igarashi
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Patent number: 8564773Abstract: In a spectroscopy module 1, a light passing hole 50 through which a light L1 advancing to a spectroscopic portion 4 passes is formed in a light detecting element 5. Therefore, it is possible to prevent the relative positional relationship between the light passing hole 50 and a light detecting portion 5a of the light detecting element 5 from deviating. Moreover, the light detecting element 5 is bonded to a front plane 2a of a substrate 2 with an optical resin adhesive 63. Thus, it is possible to reduce a stress generated onto the light detecting element 5 due to a thermal expansion difference between the light detecting element 5 and the substrate 2. Additionally, on the light detecting element 5, a first convex portion 101 is formed so as to be located at least between the light detecting portion 5a and the light passing hole 50 when viewed from a direction substantially perpendicular to the front plane 2a.Type: GrantFiled: August 12, 2011Date of Patent: October 22, 2013Assignee: Hamamatsu Photonics K.K.Inventors: Katsumi Shibayama, Tomofumi Suzuki, Masaki Hirose
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Patent number: 8559008Abstract: An ellipsometer includes an integrated focusing system with a beam splitter between the sample and the ellipsometer detector. The beam splitter provides a portion of the radiation to a lens system that magnifies any deviation from a best focus position by at least 2×. The focusing system includes a 2D sensor, where the spot of light focused on the sensor is 50 percent or smaller than the sensor. The focusing system may further include a compensator to correct optical aberrations caused by the beam splitter. A processor receives an image signal and finds the location of the spot from which focus error can be determined and used to correct the focal position of the ellipsometer. The processor compensates for movement of the spot caused by rotating optics. Additionally, a proportional-integral-derivative controller may be used to control exposure time and/or gain of the camera.Type: GrantFiled: April 7, 2011Date of Patent: October 15, 2013Assignee: Nanometrics IncorporatedInventors: Barry J. Blasenheim, Amit Shachaf
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Patent number: 8558998Abstract: Methods and systems are disclosed of sensing an object. A first radiation is spatially modulated to generate a structured second radiation. The object is illuminated with the structured second radiation such that the object produces a third radiation in response. Apart from any spatially dependent delay, a time variation of the third radiation is spatially independent. With a single-element detector, a portion of the third radiation is detected from locations on the object simultaneously. At least one characteristic of a sinusoidal spatial Fourier-transform component of the object is estimated from a time-varying signal from the detected portion of the third radiation.Type: GrantFiled: September 28, 2011Date of Patent: October 15, 2013Assignee: The Regents of the University of Colorado, a Body CorporateInventors: Daniel Feldkhun, Kelvin H. Wagner
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Patent number: 8553224Abstract: Optical fibers are utilized to provide high efficiency, spatially resolved coupling of light from collection optics to an imaging spectrometer. In particular, a micro lens array may be utilized to couple light from multiple spatial locations into individual optical fibers. At the opposite end of the fiber bundle, the fibers are packed tightly together to send the light into an imaging spectrograph. The light that enters this spectrograph maintains its spatial separation, for instance, along the array dimension and is spectrally dispersed, for instance, along a dimension orthogonal to the array dimension. This spatially separated, wavelength resolved light can then be recorded on a two dimensional detector such as a CCD camera.Type: GrantFiled: December 13, 2011Date of Patent: October 8, 2013Assignee: Battelle Memorial InstituteInventors: C. Alexander Morrow, Theodore J. Ronningen
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Patent number: 8553220Abstract: An optical device includes a projection group in which electrically conductive projections are arranged along a direction parallel to a virtual plane. The arrangement period of the projections in the projection group includes at least a first period and a second period different from the first period. The first period and the second period are shorter than a wavelength of an incident light.Type: GrantFiled: May 12, 2011Date of Patent: October 8, 2013Assignee: Seiko Epson CorporationInventors: Jun Amako, Kohei Yamada
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Patent number: 8547549Abstract: A substrate for Surface Enhanced Raman Scattering (SERS). The substrate comprises at least one nanostructure protruding from a surface of the substrate and a SERS active metal over the at least one nanostructure, wherein the SERS active metal substantially covers the at least one nanostructure and the SERS active metal creates a textured layer on the at least one nanostructure.Type: GrantFiled: November 17, 2008Date of Patent: October 1, 2013Assignee: Hewlett-Packard Development Company, L.P.Inventors: Huei Pei Kuo, Jing Tang, Fung Suong Ou, Zhiyong Li, Shih-Yuan Wang
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Patent number: 8547535Abstract: A component measurement apparatus includes a laser that emits non-collimated laser light, an objective lens that condenses the non-collimated laser light emitted from the laser in order for the laser light to illuminate internal tissue of an object of measurement without collimating the laser light, a half mirror that redirects reflected light reflected by the internal tissue of the object of measurement and refracted by the objective lens, a pin hole through which the reflected light redirected by the half mirror passes, a light-receiving element that receives the reflected light having passed through a pin hole, and a data analyzer section that measures a component of the object of measurement in accordance with data output from the light-receiving element.Type: GrantFiled: March 4, 2011Date of Patent: October 1, 2013Assignee: Yokogawa Electric CorporationInventors: Shin-ichiro Tezuka, Hitoshi Hara
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Patent number: 8547536Abstract: The quality control of vaccines is an important step in the release of vaccines to patients. Problems when dealing with vaccines include stability, batch-to-batch consistency and contamination. The invention provides a method of analyzing the composition of a protein-containing sample by electromagnetic spectroscopy, and derivatizing the obtained spectrum to obtain a derivative spectrum of the sample. The derivative spectrum may optionally be compared to a reference spectrum, to assess stability, contamination etc. relative to the reference. The derivative analysis technique allows the separation and discrimination between the spectral contributions of different components, thereby allowing differences in the spectra to be assigned to particular groups of the protein, or particular contaminants etc.Type: GrantFiled: December 9, 2008Date of Patent: October 1, 2013Assignee: Novartis AGInventors: Sandro D'Ascenzi, Giuseppe De Conciliis, Claudia Magagnoli, Giovanni Luigi Mattioli
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Patent number: 8542356Abstract: A method measuring the birefringence of an object. A measurement beam having a defined input polarization state is generated, the measurement beam being directed onto the object. Polarization properties of the measurement beam after interaction with the object are detected in order to generate polarization measurement values representing an output polarization state of the measurement beam after interaction with the object. The input polarization state of the measurement beam is modulated into at least four different measurement states in accordance with a periodic modulation function of an angle parameter ?, and the polarization measurement values associated with the at least four measurement states are processed to form a measurement function dependent on the angle parameter ?. A two-wave portion of the measurement function is determined and analysed in order to derive at least one birefringence parameter describing the birefringence, preferably by double Fourier transformation of the measurement function.Type: GrantFiled: September 20, 2011Date of Patent: September 24, 2013Assignee: Carl Zeiss SMT GmbHInventors: Damian Fiolka, Marc Rohe
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Patent number: 8542351Abstract: A coating inspection device for inspecting an object after a coating material has been applied is disclosed. The coating inspection device may include a pair of eyeglasses worn on a person's face, resting on the person's ears and nose. The eyeglasses may include a frame member having a first side and a second side opposite the first side. A set of lenses may be disposed within the frame member. At least one light source may be disposed on the frame member. The ultraviolet light source may be moveable to adjust the direction in which the ultraviolet light source emits light. A switch may be disposed on the frame.Type: GrantFiled: September 1, 2011Date of Patent: September 24, 2013Assignee: NIKE, Inc.Inventor: Shi-Hsien Yeh
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Patent number: 8531657Abstract: This document discusses apparatus and methods for aligning and centering an articulated laser projection system. In an example, a laser projection system can include an alignment stabilization system configured to align an optical path to a reference and a centration stabilization system configured to center the optical path within an aperture. The alignment stabilization system can have an alignment stabilization processing path configured to receive alignment information from an alignment sensor, and the centration stabilization system can have a centration stabilization processing path configured to receive centration information from a centration sensor.Type: GrantFiled: September 15, 2011Date of Patent: September 10, 2013Assignee: Raytheon CompanyInventors: Ernest Dean Fasse, Frederick B. Koehler, Peter Val Messina
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Patent number: 8531662Abstract: A device and method for optically examining the interior of turbid media including acts of spatially separating a plurality of wavelength bands contained in a broad-band light; separately modulating the plurality of wavelength bands; recombining the plurality of modulated wavelength bands to a beam of spectrally encoded broad-band light; illuminating a turbid medium with the beam of spectrally encoded broad-band light; detecting light emanating from the turbid medium with a detector and demodulating the detected light with a demodulator to provide spectroscopic information.Type: GrantFiled: June 12, 2009Date of Patent: September 10, 2013Assignee: Koninklijke Philips N.V.Inventor: Martinus Bernardus Van Der Mark
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Patent number: 8525988Abstract: The invention relates to a miniaturized spectrometer for investigating the spectrum of emission radiation excited in an object by incident radiation. For the miniaturized spectrometer according to the invention, a diode laser is preferably used as an edge emitter (without a perforated shutter). The window of the edge emitter is arranged at the focal point of the converging lens at the input of the illuminating beam path (without an optical fiber), preferably without a perforated shutter. The edge emitter produces a divergent beam pencil with an elliptical cross-section. The length ratio of the main axes of the ellipse is more than 2:1. The large main axis of the ellipse runs parallel to the longitudinal axis of the entry slit of the microspectrometer.Type: GrantFiled: May 13, 2010Date of Patent: September 3, 2013Assignee: Boehringer Ingelheim microParts GmbHInventors: Sven Schoenfelder, Andreas Bablich, Dirk Baxmann, Robert James Kennedy
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Patent number: 8525987Abstract: A method for operating an optical filter in multiple modes. In one embodiment, an optical filter may be operated in a sensitivity mode to thereby generate a white light image representative of a region of interest. The optical filter may then be operated in a specificity mode to thereby generate a hyperspectral image representative of said region of interest. The white light image and the hyperspectral image may be fused to generate a hybrid image that provides morphological and hyperspectral data. The white light image and the hyperspectral image may be generated using a single detector, eliminating the need for image realignment.Type: GrantFiled: September 12, 2011Date of Patent: September 3, 2013Assignee: ChemImage Technologies LLCInventors: Thomas Voigt, Michael Fuhrman, Lei Shi
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Patent number: 8520208Abstract: A polarizing device may be used with sample inspection system having one or more collection systems that receive scattered radiation from a region on a sample surface and direct it to a detector. The polarizing device disposed between the collection system(s) and the detector. The polarizing device may include a plurality of polarizing sections. The sections may be characterized by different polarization characteristics. The polarizing device is configured to transmit scattered radiation from defects to the detector and to block noise from background sources that do not share characteristics with scattered radiation from the defects from reaching the detector while maximizing a capture rate for the defects the detector at a less than optimal signal-to-noise ratio.Type: GrantFiled: March 23, 2012Date of Patent: August 27, 2013Assignee: KLA-Tencor CorporationInventors: Stephen Biellak, Daniel Kavaldjiev
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Patent number: 8520204Abstract: A Dyson imaging spectrometer includes an entry port extending in a direction X, an exit port, a diffraction grating including a set of lines on a concave support, an optical system including a lens, the lens including a plane first face and a convex second face, the convex face of the lens and the concave face of the diffraction grating being concentric, the optical system being adapted to receive an incident light beam coming from the entry port and to direct it toward the diffraction grating, to receive a beam diffracted by the diffraction grating, and to form a spectral image of the diffracted beam in a plane of the exit port, the spectral image being adapted to be spatially resolved in an extension direction X? of the image of the entry port. The diffraction grating includes a set of non-parallel and non-equidistant lines and/or the support of diffraction grating is aspherical in order to form an image of the entry port in the exit plane of improved image quality and of very low distortion.Type: GrantFiled: November 2, 2009Date of Patent: August 27, 2013Assignee: Horiba Jobin Yvon SASInventor: Frederic Desserouer