Patents Examined by Layla Lauchman
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Patent number: 8520202Abstract: An asymmetrical-nanofinger device for surface-enhanced luminescence. The device includes a substrate, and a plurality of nanofingers coupled with the substrate. The plurality of nanofingers includes a primary nanofinger having a primary active-material cap, and a secondary nanofinger having a secondary active-material cap. An average diameter of the primary active-material cap is substantially greater than an average diameter of the secondary active-material cap. The primary nanofinger and secondary nanofinger of the plurality of nanofingers are to self-arrange into a close-packed configuration with an analyte molecule disposed between the primary active-material cap and the secondary active-material cap. A method for fabricating the asymmetrical-nanofinger device, and an optical apparatus including an optical component that includes the asymmetrical-nanofinger device are also provided.Type: GrantFiled: September 15, 2011Date of Patent: August 27, 2013Assignee: Hewlett-Packard Development Company, L.P.Inventor: Zhiyong Li
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Patent number: 8514384Abstract: Provided is an alignment method for an image reading apparatus including: a light source unit illuminating an original on an original table; a photoelectric conversion element for converting an optical image into an electric signal; and an imaging optical system for imaging, onto the photoelectric conversion element, a light beam from the illuminated original. The imaging optical system includes: a first optical element, arranged inside a first lens barrel, and having an optical surface that is rotationally symmetric about an optical axis; and a second optical element, arranged on an optical path between the first lens barrel and the photoelectric conversion element, and having an optical surface rotationally asymmetric about the optical axis. The alignment method includes aligning at least one of an attaching angle and an attaching position of the second optical element in a sub scanning direction relative to the first lens barrel.Type: GrantFiled: May 16, 2011Date of Patent: August 20, 2013Assignee: Canon Kabushiki KaishaInventor: Takayuki Sugiyama
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Patent number: 8508730Abstract: System(s), apparatus(es), and method(s) are provided for control of quality of light emitted from a group of solid-state light (SSL) sources that are part of an illumination fixture. The control is based at least in part on regulation of the spectral power distribution (SPD) of the light to match a SPD of a reference light source. A spectroscopic analyzer collects electromagnetic (EM) radiation emitted from the group of SSL sources and EM radiation substantially emitted from the reference light source. A first controller analyzes spectroscopic data related to SPDs of the group of SSL sources and the reference light source and, based on the analysis issues a configuration of the group of SSL sources. Implementation of the configuration causes the group of SSL sources to emit EM radiation with a SPD that nearly matches the SPD of the EM radiation substantially emitted from the reference light source.Type: GrantFiled: January 28, 2011Date of Patent: August 13, 2013Assignee: Atmel CorporationInventors: Kevin Hempson, Dilip Sangam
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Patent number: 8502972Abstract: A method for sensing a target object using optical mode excitations in microresonators, comprises: preparing at least one cluster including at least two microresonators; obtaining some first spectra of the cluster; adsorbing the target object on a surface of the cluster; obtaining some second spectra of the cluster; and sensing the target object by comparing a lineshape of the first spectra with a lineshape of the second spectra.Type: GrantFiled: December 25, 2008Date of Patent: August 6, 2013Assignee: Fujirebio Inc.Inventors: Michael Himmelhaus, Alexandre Francois
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Patent number: 8502977Abstract: A spectroscopic system may include: a spectroscopic scatterometer; an angular-resolved spectrometer; and a fiber bundle having a two-dimensional input surface and a one-dimensional output surface.Type: GrantFiled: June 1, 2010Date of Patent: August 6, 2013Assignee: KLA-Tencor CorporationInventor: Ivan Maleev
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Patent number: 8497988Abstract: A spectral distribution measuring device includes an illumination unit configured to illuminate white light to a surface of an object being measured; a slit array having a plurality of slits formed in alignment at equal intervals; a linear image sensor including a light receiving face having a plurality of rectangular pixels adjacently arranged in alignment and a plurality of spectral light-irradiated areas divided in each predetermined number of neighboring pixels; a plurality of areas being measured which is set on the surface of the object being measured, and reflects the light irradiated by the illumination unit to the plurality of slits; and a diffraction unit configured to diffract and disperse reflection light which is reflected from the areas being measured and has passed through each slit, the diffraction unit being disposed such that a direction where a diffraction image expands is inclined at an angle to a direction where the light receiving face expands.Type: GrantFiled: September 10, 2010Date of Patent: July 30, 2013Assignee: Ricoh Company, Ltd.Inventors: Kohei Shimbo, Manabu Seo, Naohiro Kamijo
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Patent number: 8497987Abstract: An optical device unit includes: an optical device that has an electrical conductor and that is capable of enhancing Raman scattering light generated by receiving light from a light source; and a guide unit that guides a gaseous sample to the optical device. The guide unit has a first fluid path for rotating the gaseous sample in an area facing the optical device.Type: GrantFiled: September 7, 2011Date of Patent: July 30, 2013Assignee: Seiko Epson CorporationInventors: Yusuke Sakagami, Jun Amako
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Patent number: 8493560Abstract: A sensor for determining the presence or concentration of a target entity in a medium is described, and includes (a) an optical waveguide; (b) a microresonator optically coupled with the optical waveguide such that light within the optical waveguide induces a resonant mode within the microresonator at an equator region (or a mode volume); and (c) at least one plasmonic nanoparticle adsorbed onto a surface area of the microresonator within the equator region (or the mode volume) such that light inducing a resonant mode within the microresonator also causes a plasmonic resonance in the at least one plasmonic nanoparticle. Detection methods for using such sensors are also described. Finally, methods, involving the use of carousel forces, for fabricating such sensors are also described.Type: GrantFiled: August 9, 2011Date of Patent: July 23, 2013Assignee: Polytechnic Institute of New York UniversityInventors: Siyka Shopova, Stephen Arnold, Raaj Haresh Rajmangal
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Patent number: 8482730Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.Type: GrantFiled: August 24, 2012Date of Patent: July 9, 2013Assignee: Applied Biosystems, LLCInventors: Austin Tomaney, Mark Oldham
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Patent number: 8482724Abstract: Brightness factors associated with shade fabric may be utilized when shading a building. A brightness factor may incorporate an openness factor, a visible light reflectance, a diffusion factor, a color, or other characteristics of the shade fabric. The brightness factor may be utilized when selecting a particular shade fabric for a room, building or other location. Additionally, the brightness factor may be utilized by an automated shade control system. The shade fabric selection may affect the building envelope by facilitating the optimization of daylighting, reduction of artificial electric lighting needs, minimization of glare conditions, and reduction of thermal load.Type: GrantFiled: November 26, 2012Date of Patent: July 9, 2013Assignee: MechoShade Systems, Inc.Inventors: Joel Berman, Jan Berman, Muthukumar Ramalingam
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Patent number: 8477309Abstract: An inspection system and a method. The method may include: illuminating the object with impinging light of a first polarization; performing a polarization based filtering of (a) multiple-reflected light signals, each multiple-reflected light signal being reflected from at least two different bevel side surfaces of the object, and (b) additional light signals, each additional light signal being reflected from a single element of the object, such as to suppress the multiple-reflected light signals, and to provide polarization based filtered light signals; and detecting the polarization based filtered light signals.Type: GrantFiled: August 4, 2011Date of Patent: July 2, 2013Assignee: Camtek Ltd.Inventor: Zehava Ben-Ezer
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Patent number: 8472012Abstract: An apparatus measuring optical characteristics including position detection is disclosed. A processor is coupled to a display. A first optical sensor makes a first measurement, and a second optical sensor makes a second measurement. A source of illumination and the first optical sensor determine a minimal distance between the apparatus and an external object such that illumination emitted by the source is not received by the first optical sensor when the apparatus is less than the minimal distance from the external object. A position of the apparatus with respect to an object and an optical property of light received by the apparatus are determined. A transparent member with a thickness less than the minimal distance may provide illumination external to the apparatus and receive light from external to the apparatus.Type: GrantFiled: August 28, 2012Date of Patent: June 25, 2013Assignee: JJL Technologies LLCInventors: Wayne D. Jung, Russell W. Jung, Alan R. Loudermilk
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Patent number: 8467060Abstract: A test apparatus comprising a self illuminated light source and second moveable element having spectrophotometrically neutral gray and color patches of predetermined hues and saturations. A digital software file provides identical spectrophotometrically neutral grayscale and color data which, when reproduced on a monitor or projection system, should match the grayscale and test colors provided by the apparatus. When the apparatus is placed in front of the monitor image or projected image, the neutral grays and color patches reproduced on the monitor image or projected image are compared against the image of the apparatus.Type: GrantFiled: March 24, 2010Date of Patent: June 18, 2013Inventor: Ferrand D. E. Corley
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Patent number: 8467038Abstract: A method for measuring optical properties of an optically variable marking applied on an object, the method including the steps of illuminating the optically variable marking so as to form a first light reflected by the marking at a first view angle and a second light reflected by the marking at a second view angle, the first and second lights having different spectral compositions as a result of the optically variable marking, refracting the second reflected light through a optical unit so as to redirect the second reflected light toward an optical sensor, capturing the first light and the second refracted light with the optical sensor simultaneously; and determining optical properties of the optical variable marking based on the captured first and second lights.Type: GrantFiled: June 29, 2011Date of Patent: June 18, 2013Assignee: SICPA Holding SAInventors: Eric Decoux, Xavier Schwab
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Patent number: 8462337Abstract: A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value ?0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors ?, ? regarding stray light in the reference measurement, an analysis value ? of the luminescence quantum yield with the effect of stray light reduced by ?=??0+?.Type: GrantFiled: September 8, 2009Date of Patent: June 11, 2013Assignee: Hamamatsu Photonics K.K.Inventors: Motoyuki Watanabe, Kazuya Iguchi, Kengo Suzuki
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Patent number: 8462341Abstract: A system, method of configuring, and application a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.Type: GrantFiled: March 14, 2011Date of Patent: June 11, 2013Assignee: J.A. Woollam Co., Inc.Inventors: Ping He, Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer, Martin M. Liphardt
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Patent number: 8462321Abstract: The present disclosure is directed towards embodiments of systems and methods for discriminating (e.g., masking out) scale bands that are determined to be not of interest from a scalogram derived from a continuous wavelet transform of a signal. Techniques for determining whether a scale band is not of interest include, for example, determining whether a scale band's amplitude is being modulated by one or more other bands in the scalogram. Another technique involves determining whether a scale band is located between two other bands and has energy less than that of its neighboring bands. Another technique involves determining whether a scale band is located at about half the scale of another, more dominant (i.e., higher energy) band.Type: GrantFiled: October 15, 2012Date of Patent: June 11, 2013Assignee: Nellcor Puritan Bennet IrelandInventors: Paul Stanley Addison, James Nicholas Watson, David Clifton
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Patent number: 8456630Abstract: Methods and systems for enhanced SERS sensing are disclosed, including generating electromagnetic radiation from a fiber laser; coupling the radiation to a SERS sensor comprising: a fiber comprising a first end and a second end, wherein the first end is coupled to the fiber laser and the second end is deposited with one or more metal nanoparticles; an in-line fiber grating integrated into the fiber between the first and the second end; a spectrometer configured to measure a spectrum produced by the in-line fiber grating; and a micro-processor configured to control the fiber laser and the spectrometer; exciting one or more molecules adsorbed on the surface of the one or more metal nanoparticles to generate a Raman signal; coupling the signal into the fiber; separating the signal into its wavelength components with the in-line fiber grating; and measuring the wavelength components with the spectrometer. Other embodiments are described and claimed.Type: GrantFiled: May 6, 2011Date of Patent: June 4, 2013Assignee: PolarOnyx, Inc.Inventor: Shuang Bai
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Patent number: 8451443Abstract: A concave reflection type diffraction optical element used for a Rowland type spectrometer, in which: the Rowland type spectrometer detects wavelengths in a range including a wavelength ?1 or more and a wavelength ?2 or less (?1<?2); the concave reflection type diffraction optical element has a diffractive efficiency D(?) at a wavelength ? which shows local maximum and maximum value at a wavelength ?a satisfying, ? 1 ? ? a < 7 ? ? 1 + 3 ? ? 2 10 ; the concave reflection type diffraction optical element includes a reference surface having an anamorphic shape; and the following condition is satisfied: R>r, where R indicates a meridional line curvature radius of the reference surface and r indicates a sagittal line curvature radius thereof.Type: GrantFiled: June 24, 2010Date of Patent: May 28, 2013Assignee: Canon Kabushiki KaishaInventors: Tokuji Takizawa, Kazumi Kimura
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Patent number: 8451458Abstract: An imaging microoptics, which is compact and robust, includes at least one aspherical member and has a folded beam path. The imaging microoptics provides a magnification |??| of >800 by magnitude. Furthermore, a system for positioning a wafer with respect to a projection optics includes the imaging microoptics, an image sensor positionable in the image plane of the imaging microoptics, for measuring a position of an aerial image of the projection optics, and a wafer stage with an actuator and a controller for positioning the wafer in dependence of an output signal of the image sensor.Type: GrantFiled: March 19, 2012Date of Patent: May 28, 2013Assignee: Carl Zeiss SMT GmbHInventors: Hans-Juergen Rostalski, Heiko Feldmann