Patents Examined by Layla Lauchman
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Patent number: 8373855Abstract: A Raman head is provided capable of operating at high surrounding pressures. The Raman head has housing having a first, sealed chamber filled with an incompressible liquid and a second chamber that is open to the surrounding environment. At least one bellows can be used to equalize pressure between the first sealed chamber and the surrounding environment. A planar side of a pair of plano-concave lens is positioned within the first chamber and the concave side of each plano-concave lens is positioned within the second chamber of the Raman head. Light emitted as a result of a laser beam in communication with the pair of plano-concave lens can be analyzed by a Raman analyzer.Type: GrantFiled: January 29, 2011Date of Patent: February 12, 2013Assignee: Board of Regents of the University of Texas SystemInventors: Manfred Fink, Philip Varghese
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Patent number: 8373857Abstract: A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.Type: GrantFiled: March 21, 2012Date of Patent: February 12, 2013Assignee: Vita Zahnfabrik H. Rauter GmbH & Co. KGInventors: Wayne D. Jung, Russell W. Jung, Walter W. Sloan, Alan R. Loudermilk
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Patent number: 8358413Abstract: A system and method for automatically removing polarized light in an environment having polarized light and unpolarized light. Light is processed by a polarizer and measured by a sensor. Multiple measurements of a light characteristic are taken, each measurement corresponding to a polarity setting of the polarizer. The polarizer is automatically adjusted to enable the multiple measurements. The measurements may be of average light intensity, contrast, saturation, or another characteristic. Based on the multiple measurements and the corresponding polarity settings, an optimal polarity setting is determined, such that the amount of polarized light is minimized. A curve fitting calculation may be used to make the determination. The polarizer is adjusted to the determined polarity setting.Type: GrantFiled: October 18, 2011Date of Patent: January 22, 2013Assignee: CSR Technology Inc.Inventor: Eran David Pinhasov
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Patent number: 8358407Abstract: An integrated device for enhancing signals in Surface Enhanced Raman Spectroscopy (SERS). The integrated device comprising an array of nanostructures comprising a material, wherein the material is configured to allow light to pass through. The integrated device also comprising SERS active nanoparticles disposed on at least portion of the array of nanostructures and a mirror integrated below a base of the array of nanostructures. The mirror is configured to reflect light passing through the material into the array of nanostructures.Type: GrantFiled: April 30, 2010Date of Patent: January 22, 2013Assignee: Hewlett-Packard Development Company, L.P.Inventors: Min Hu, Wei Wu, Fung Suong Ou, Zhiyong Li, R. Stanley Williams
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Patent number: 8351031Abstract: A single-shot spectral imager or imaging system which acquires multiplexed spatial and spectral data in a single snapshot with high optical collection efficiency and with the speed limited only by the readout time of the detector circuitry. The imager uses dispersive optics together with spatial light modulators to encode a mathematical transform onto the acquired spatial-spectral data. A multitude of encoded images is recorded simultaneously on a focal plane array and subsequently decoded to produce a spectral/spatial hypercube.Type: GrantFiled: June 4, 2010Date of Patent: January 8, 2013Assignee: Spectral Sciences, Inc.Inventors: Marsha J. Fox, Pajo Vujkovic-Cvijin, Neil Goldstein
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Patent number: 8345228Abstract: A measuring device for quantitative determination of optical characteristic values for detecting photo- and/or electrochemical decomposition reactions taking place on surfaces of photocatalytically active substrates.Type: GrantFiled: June 25, 2007Date of Patent: January 1, 2013Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.Inventors: Frank Neumann, Thomas Neubert, Michael Vergöhl
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Patent number: 8345249Abstract: Provided is a liquid sample analyzing method for analyzing an analyte in a liquid sample by using a test piece (1) on which overflow blocking lines (7) are formed to prevent the liquid sample from flowing to the outside from a passage region (3a) of an extended layer (3). In a state in which the liquid sample is not extended in the passage region (3a) of the extended region (3), the test piece (1) is measured so as to cross the passage region (3a) of the extended layer (3) and the overflow blocking lines (7). Thus in a state in which a difference in brightness is large between the passage region (3a) of the extended region (3) and the overflow blocking lines (7), it is possible to properly recognize the boundary portions between the passage region (3a) of the extended region (3) and the overflow blocking lines (7).Type: GrantFiled: March 26, 2009Date of Patent: January 1, 2013Assignee: Panasonic CorporationInventors: Hideyuki Kurokawa, Koji Miyoshi, Masahiro Aga, Kenji Murakami, Takahiko Tanida, Ryosuke Yamada
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Patent number: 8339604Abstract: Provided is a substrate having an alignment mark, methods of aligning wafers and fabricating semiconductors. An alignment method of a wafer comprises providing a wafer on a wafer stage of a photolithography apparatus, irradiating light to the alignment mark, collecting reflected light from the alignment mark, analyzing optical information of the collected light, and determining a location of the wafer based on the analyzed optical information, wherein the wafer comprises a first surface having an alignment mark, the alignment mark including a first plurality of alignment patterns in a first row, and a second plurality of alignment patterns in a second row, the second plurality of alignment patterns being adjacent to the first plurality of alignment patterns, wherein the first plurality of alignment patterns are arranged in a row direction at a first pitch, and the second plurality of alignment patterns are arranged in the row direction at a second pitch different from the first pitch.Type: GrantFiled: February 17, 2010Date of Patent: December 25, 2012Assignee: Samsung Electronics Co., Ltd.Inventors: Jun-Young Jang, Ji-Yong You
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Patent number: 8339597Abstract: A label-free multiplexed sensing platform is based on light interaction with aperiodic photonic structures with an advantage of a broadband operation. Multiple-scattering-induced “fingerprinting” colorimetric signatures can be used as a transduction mechanism. Aperiodic sensing platforms can operate in the infrared to provide an overlap with spectral fingerprints of biological molecules. Miniaturized optical biosensors may be based on engineered colorimetric scattering signatures (structural color), sharp spectral features, non-uniform angular distributions of scattered light, and broadband manipulation of the local density of states in nano-textured scattering surfaces with deterministic aperiodic order. The biosensors can be fabricated in semiconductor, metal, low- and high-index dielectric platforms using standard nanofabrication techniques such as electron-beam lithography, ion-beam milling, etc, and can be replicated over large areas by standard nano-imprint lithography.Type: GrantFiled: July 28, 2011Date of Patent: December 25, 2012Assignee: Trustees of Boston UniversityInventors: Luca Dal Negro, Svetlana V. Boriskina, Fiorenzo Omenetto
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Patent number: 8334977Abstract: In an evaluation device an analyzer is rotated so that the azimuth of the transmission axis of the analyzer has an inclination angle of 90 degrees±3 degrees with respect to the transmission axis of a polarizer. An imaging camera captures a regularly reflected image of a wafer under each condition, and an image processing unit evaluates the shape of a repeating pattern and detects dose defects and focus defects on the basis of the two images of the wafer captured by the imaging camera.Type: GrantFiled: May 9, 2011Date of Patent: December 18, 2012Assignee: Nikon CorporationInventors: Kazuhiko Fukazawa, Yuji Kudo
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Patent number: 8325338Abstract: There is disclosed a system comprising Raman spectroscopy used to detect key characteristics of ice formation on aircraft wings and engines in real time. This disclosure provides a method and apparatus for early detection of icing. The disclosed apparatus is suitable for use in aircraft, boats, oil rigs, wind turbines, and the like.Type: GrantFiled: January 13, 2010Date of Patent: December 4, 2012Assignee: The Blue Sky GroupInventors: John Pope, Daniel Buttry, Arthur R. Toews
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Patent number: 8326009Abstract: In a continuous mammography procedure, the breast of a subject is fixed in place in a retention device, and a first x-ray image is generated by irradiating the breast in the retention device. While the breast is still held in the retention device, the first x-ray image is evaluated to define a condition for generating a second x-ray image. The second x-ray image is then generated according to the defined condition, with the breast still in the same position in the retention device.Type: GrantFiled: October 15, 2007Date of Patent: December 4, 2012Assignee: Siemens AktiengesellschaftInventors: Wilhelm Hanke, Thomas Mertelmeier
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Patent number: 8319963Abstract: A compact sensor system comprising: an analysis cell configured for photon-matter interaction, where photons are received from a light source; and an integrated-optical spectral analyzer configured for identifying a set of frequencies, the integrated-optical spectral analyzer comprising: a waveguide coupled with the analysis cell, the waveguide configured for propagating a set of frequencies through the waveguide; one or more ring resonators coupled with the waveguide, the one or more ring resonators comprising a predetermined bandwidth and configured for capturing the set of frequencies corresponding to frequencies within the predetermined bandwidth; and one or more frequency detectors coupled with the one or more tunable ring resonators, the one or more frequency detectors configured for generating electrical signals that identify each of the set of frequencies.Type: GrantFiled: April 30, 2010Date of Patent: November 27, 2012Assignee: Hewlett-Packard Development Company, L.P.Inventors: Min Hu, Wei Wu, Fung Suong Ou, Zhen Peng, Zhiyong Li, R. Stanley Williams
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Patent number: 8319965Abstract: Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.Type: GrantFiled: August 6, 2010Date of Patent: November 27, 2012Assignee: Massachusetts Institute of TechnologyInventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Ronald H. Hoffeld, Jonathan Z. Lin, Nicholas M. F. Judson, George S. Haldeman, Vincenzo Daneu
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Patent number: 8319954Abstract: Detection and characterization of immunologically detected substances are performed electronically on human and animal biological fluids such as whole blood, serum, plasma, urine, milk, pleural and peritoneal fluids, and semen, which fluids are contained in a thin chamber forming a quiescent fluid sample, which chamber has at least two parallel planar walls, at least one of which is transparent.Type: GrantFiled: August 5, 2011Date of Patent: November 27, 2012Assignee: Abbott Point of Care, Inc.Inventors: Stephen C. Wardlaw, Robert A. Levine
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Patent number: 8319956Abstract: Brightness factors associated with shade fabric may be utilized when shading a building. A brightness factor may incorporate an openness factor, a visible light reflectance, a diffusion factor, a color, or other characteristics of the shade fabric. The brightness factor may be utilized when selecting a particular shade fabric for a room, building or other location. Additionally, the brightness factor may be utilized by an automated shade control system. The shade fabric selection may affect the building envelope by facilitating the optimization of daylighting, reduction of artificial electric lighting needs, minimization of glare conditions, and reduction of thermal load.Type: GrantFiled: February 22, 2010Date of Patent: November 27, 2012Assignee: MechoShade Systems, Inc.Inventors: Joel Berman, Jan Berman, Muthukumar Ramalingam
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Patent number: 8314933Abstract: Embodiments of the present invention relate to techniques for improving optofluidic microscope (OFM) devices. One technique which may be used eliminates the aperture layer covering the light detector layer. Other techniques retain the aperture layer, reversing the relative position of the light source and light detector such that light passes through the aperture layer before passing through the fluid channel to the light detector. Another technique adds an optical tweezer for controlling the movement of objects moving through the fluid channel. Another technique adds an optical fiber bundle to relay light from light transmissive regions to a remote light detector. Another technique adds two electrodes at ends of the fluid channel to generate an electrical field capable of moving objects through the fluid channel while suppressing rotation. These techniques can be employed separately or in combination to improve the capabilities of OFM devices.Type: GrantFiled: March 4, 2009Date of Patent: November 20, 2012Assignee: California Institute of TechnologyInventors: Xiquan Cui, Xin Heng, Lap Man Lee, Changhuei Yang
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Patent number: 8314925Abstract: A fiber-optic based thrust load measurement system is coupled to a bearing housing. The measurement system includes at least one fiber optic sensor configured to detect one or more parameters related to the bearing housing. An optical coupler is configured to regulate light signals emitted from a light source and light signals reflected from the fiber optic sensor. A detector system is configured to receive light signals from the optical coupler. A processor is configured to receive an output from the detector system and to determine a thrust load on a thrust bearing based on the detected one or more parameters related to the bearing housing.Type: GrantFiled: October 30, 2009Date of Patent: November 20, 2012Assignee: General Electric CompanyInventors: Eric John Rubbiero, Bala Corattiyil, Frederic Gardner Haaser, Scott Francis Wolfer
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Patent number: 8310675Abstract: A system and process for analyzing a sample includes an excitation section and an analyze section, said excitation section including a light source emitting an incident measurement luminous beam, a polarization state generator (PSG), first optics, and said analyze section includes a polarization state analyzer (PSA), a detection system and second optics. The excitation section includes an illumination source emitting an incident visualization luminous beam, superposition optics that direct the incident visualization luminous beam toward the sample surface along an optical axis which is identical to the optical axis of the incident measurement luminous beam and the analyze section includes separation optics that transmit a part of the reflected or transmitted visualization luminous beam and a part of the reflected or transmitted measurement luminous beam towards a visualization direction.Type: GrantFiled: January 18, 2008Date of Patent: November 13, 2012Assignee: Horiba Jobin Yvon SASInventors: Pascal Amary, Ramdane Benferhat, Denis Cattelan
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Patent number: 8311316Abstract: There is provided a database storing reference data including a plurality of reference image data, which are obtained by imaging reference substrates, respectively, wherein each of the reference substrates lacks only one of the films of different kinds but includes remainder of the films of different kinds, and wherein in the reference substrates the lacking films are different from each other, and wherein the plurality of reference image data is classified into categories according to the kinds of the films. Difference degrees between color information of a defect area extracted from an image data of an inspection target substrate and color information of corresponding areas of the reference substrates are calculated. Based on the difference degree, the defective film is identified.Type: GrantFiled: April 19, 2010Date of Patent: November 13, 2012Assignee: Tokyo Electron LimitedInventor: Shuji Iwanaga