Patents Examined by Layla Lauchman
  • Patent number: 8310660
    Abstract: A method and system for calibrating a multiple-beam curvature/flatness sensor in order to provide an accurate media curvature/flatness measurement. One or more flat media sheets are passed through a multiple-beam media curvature/flatness sensor and the timing data associated with the lead edge/trail edge crossing each beam associated with the multiple beam curvature/flatness sensor is used for the calibration of the curvature/flatness sensor system. The unknown variables in the media curvature/flatness equation which takes into consideration of the manufacture and assembly errors of the sensor as well as the media deflection due to gravity can be determined and eliminated in order to obtain a calibrated media curvature/flatness equation. The calibrated media curvature/flatness equation can further be applied in the curvature/flatness measurement in order to achieve accurate measurement results.
    Type: Grant
    Filed: March 16, 2010
    Date of Patent: November 13, 2012
    Assignee: Xerox Corporation
    Inventor: Ming Yang
  • Patent number: 8305576
    Abstract: In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured.
    Type: Grant
    Filed: May 13, 2010
    Date of Patent: November 6, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kazuaki Ohkubo, Shunsuke Mishima
  • Patent number: 8300222
    Abstract: A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.
    Type: Grant
    Filed: August 22, 2011
    Date of Patent: October 30, 2012
    Assignee: Vita Zahnfabrik H. Rauter GmbH & Co. KG
    Inventors: Wayne D. Jung, Russell W. Jung, Walter W. Sloan, Alan R. Loudermilk
  • Patent number: 8300220
    Abstract: A probe using integrated confocal reflectance imaging, confocal Raman spectroscopy, and gross spatial imaging for non-invasiveIy evaluating a target of interest of a living subject. In one embodiment, the probe includes a casing with first and second ends, and first, second and third optical pons The firsi and second optical ports are located at the first end of the casing and the third optical port is located at the second end of the casing such that the first and third optical ports define a first optical path therebetween and the second and third optical ports define a second optical path therebetween, respectively. Each optical path has first and second portions, where the second portions of the first and second optical paths arc substantially overlapped and proximal to the third optical port.
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: October 30, 2012
    Assignees: Vanderbilt University, Montana State University
    Inventors: Anita M. Mahadevan-Jansen, David Dickensheets, Chad Lieber
  • Patent number: 8294894
    Abstract: The present invention provides a particle counter capable of accurately discriminating the signal of scattered light by real particles from the background light noise, and furthermore, capable of detecting smaller particles than conventional particle counters. The particle counter according to the present invention includes: a light irradiator for emitting light to the measurement area 40 in a vacuum state or in a near vacuum state; a scattered light detector 32 for detecting scattered light generated when the light is delivered to the measurement area 40; a discriminator 18 for determining whether or not a particle exists in the measurement area 40 by comparing the detection signal of the scattered light detector 32 and a predetermined discrimination threshold; a vacuum gauge 12 for measuring the pressure of the measurement area 40; and the threshold setting unit 16 for setting a discrimination threshold in accordance with the pressure of the measurement area 40.
    Type: Grant
    Filed: November 25, 2009
    Date of Patent: October 23, 2012
    Assignee: Shimadzu Corporation
    Inventors: Akira Arakawa, Takahiro Mori, Tsunehiro Inoue
  • Patent number: 8294905
    Abstract: This invention provides an optical measurement device enabling a highly accurate measurement with respect to a measuring target object in which an inclined surface or a curved surface exists at one part of the surface or a tilted measuring target object. The light shielding portion is configured to define an incident angle range with respect to a light receiving center axis of a diffuse reflected light. In other words, a maximum angle formed by the advancing direction of the diffuse reflected light and the light receiving center axis when the diffuse reflected light passes through the opening of the light shielding portion is defined by the diameter of the opening. The light projecting portion projects a light projection beam so that a converging position on the light receiving center axis is included within a range of the light shielding portion on the light receiving center axis for the component converged by the lens portion of the light projection beam (i.e.
    Type: Grant
    Filed: November 12, 2009
    Date of Patent: October 23, 2012
    Assignee: Omron Corporation
    Inventor: Kenta Yamakawa
  • Patent number: 8294891
    Abstract: In one aspect, a system for use in product packaging is disclosed that includes a polymeric sensing substrate coupled to a package such that a front sensing surface thereof is in contact with a portion of a product, e.g., a fungible product, stored in the package and a back surface thereof is accessible via an environment external to the package. The system further includes a radiation source adapted to direct radiation to the substrate's back surface such that the radiation would interact with one or more molecular species of the product that are in contact with the substrate's sensing surface. The system also includes a detector that is adapted to detect radiation returning from the substrate in response to its illumination by the radiation source. The front surface of the sensing substrate can comprise a plurality of micron-sized or submicron-sized ridges having a discontinuous or continuous metal coating, e.g.
    Type: Grant
    Filed: January 22, 2008
    Date of Patent: October 23, 2012
    Assignee: President and Fellows of Harvard College
    Inventors: Eric Mazur, Eric Diebold
  • Patent number: 8294899
    Abstract: A method of mapping concentrations of airborne matter from an emission source of interest in an emission plume is provided. The method involves measuring airborne matter at one or more than one identified locations using an optical sensing instrument (OSI) operatively connected with one or more than one matter samplers and mounted on a vehicle. The one or more than one airborne matter samplers are passed through an airspace to be sampled, and one or more concentration measurements are obtained. Geographic positions and altitude values for each of the one or more identified locations are established, and a point concentration measurement for the airborne matter for each identified location determined. The concentration measurements are mapped relative to the geographic position and altitude values for each of the one or more identified locations to obtain an airborne matter concentration distribution map in one or more measurement surfaces through a cross-section or profile of the emission plume.
    Type: Grant
    Filed: October 6, 2010
    Date of Patent: October 23, 2012
    Assignee: Golder Associates Ltd.
    Inventor: Colin Irvin Wong
  • Patent number: 8289510
    Abstract: A method for analyzing defect information on a substrate, including logically dividing the substrate into zones, and detecting defects on the substrate to produce the defect information. The defect information from the substrate is analyzed on a zone by zone basis to produce defect level classifications for the defects within each zone. The zonal defect level classifications are analyzed according to at least one analysis method. The defect level classifications are preferably selected from a group of defect level classifications that is specified by a recipe. Preferably, the at least one analysis method includes at least one of zonal defect distribution, automatic defect classification, spatial signature analysis, and excursion detection. The defect level classifications preferably include at least one of individual defect, defect cluster, and spatial signature analysis signature.
    Type: Grant
    Filed: February 10, 2011
    Date of Patent: October 16, 2012
    Assignee: KLA-Tencor Corporation
    Inventors: Patrick Y. Huet, Robinson Piramuthu, Martin Plihal, Christopher W. Lee, Cho H. Teh, Yan Xiong
  • Patent number: 8289506
    Abstract: A first image formation point for a workpiece is provided between a camera and the workpiece. An image of the workpiece is at the first image formation point, and picked up by the camera. Meanwhile, an image for a protection glass is not formed at the first image formation point, and is instead diffused and then picked up by the camera. For this reason, an image caused by dirt on the protection glass is diffused. As a result, in the image picked up by the camera, images due to dirt become few and images due to the workpiece become relatively many. Therefore, the accuracy of an evaluation on the quality of the workpiece can be improved.
    Type: Grant
    Filed: July 29, 2008
    Date of Patent: October 16, 2012
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Yuji Kawazoe, Masahiro Nishio, Akihiro Toyoda
  • Patent number: 8289501
    Abstract: The present disclosure is directed towards embodiments of systems and methods for discriminating (e.g., masking out) scale bands that are determined to be not of interest from a scalogram derived from a continuous wavelet transform of a signal. Techniques for determining whether a scale band is not of interest include, for example, determining whether a scale band's amplitude is being modulated by one or more other bands in the scalogram. Another technique involves determining whether a scale band is located between two other bands and has energy less than that of its neighboring bands. Another technique involves determining whether a scale band is located at about half the scale of another, more dominant (i.e., higher energy) band.
    Type: Grant
    Filed: November 9, 2011
    Date of Patent: October 16, 2012
    Assignee: Nellcor Puritan Bennett Ireland
    Inventors: Paul Stanley Addison, James Watson, David Clifton
  • Patent number: 8284385
    Abstract: A welding accessory and a system for detecting UV radiation exposure during welding operations are disclosed. The welding accessory may have a surface exposed to UV radiation generated by electric arc welding, a first image visible without exposure to the UV radiation, and a second image formed from UV activated dye that is visible only after exposure to UV radiation generated by the electric welding arc. A system may include a UV exposure indicator with a first state and at least a second state, and include UV activated dye adapted to provide a reversible or persistent visual indication upon exposure to UV radiation. The visual indication may include any combination of symbols, logos, images, text, or other decorative or informational designs as desired.
    Type: Grant
    Filed: November 13, 2009
    Date of Patent: October 9, 2012
    Assignee: Lincoln Global, Inc.
    Inventors: Bruce John Chantry, Mark David McDowell
  • Patent number: 8284400
    Abstract: A hand-held color measurement device is provided that includes a housing with a measurement unit which receives measurement light through a measurement window, converts it into measurement signals, processes the measurement signals to form digital color measurement data, and provides it via a communications interface. A U-shaped bracket is arranged on the housing and includes a middle portion in which a diffuser is integrated. The two side arms of the bracket are rotatably mounted on the housing such that the bracket can be pivoted by 180° from a monitor position to an ambient light position and back to the monitor position, and wherein the diffuser lies in front of the measurement window in the ambient light position and is situated at a rear wall of the housing opposite the front wall in the monitor position. A holding mechanism is provided on the housing and on the two side arms of the bracket which fixes the bracket in its monitor position or ambient light position, respectively.
    Type: Grant
    Filed: April 1, 2011
    Date of Patent: October 9, 2012
    Assignee: X-Rite Europe GmbH
    Inventors: Zachary Hastings, Steven Vordenberg, Andrew Masia, Daniel Dupuis, Marco Kessler, Beat Frick
  • Patent number: 8279433
    Abstract: A haemolysator having a sonotrode plate and oscillation generating elements acting thereupon, wherein the oscillation generating elements are set into mechanical oscillations by an electrical AC-signal generator. The haemolysater also includes a sample chamber to which the sonotrode plate transmits mechanical oscillations, and has oscillation generating elements that are excitable toward mechanical oscillations in a wide frequency band.
    Type: Grant
    Filed: November 12, 2009
    Date of Patent: October 2, 2012
    Assignee: Roche Diagnostics Operating, Inc.
    Inventor: Herfried Huemer
  • Patent number: 8279427
    Abstract: A method for measuring the refractive index of a material with Bragg gratings includes the emission of a collimated radiation beam (9) from a radiation source (4) with a large spectrum and orientation thereof along a direction normal to the material (2) to be examined, the propagation of the collimated radiation beam (9) entering the material (2), then a Bragg diffraction grating (3) that is obliquely placed to the direction of the collimated radiation beam (9), and again the material (2), the subjection to spectral analysis of the collimated radiation beam exiting the material (2), the grating (3) producing a minimum in the spectrum subjected to the spectral analysis in accordance with Bragg's law, and the calculation of the refractive index of the material (2) from the measure of the wavelength corresponding to the minimum in thus spectrum. A relevant apparatus is described.
    Type: Grant
    Filed: April 17, 2008
    Date of Patent: October 2, 2012
    Assignee: Universita Politechnica delle Marche
    Inventors: Francesco Simoni, Riccardo Castagna, Luigino Criante, Daniele Eugenio Lucchetta, Francesco Vita
  • Patent number: 8274650
    Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.
    Type: Grant
    Filed: May 6, 2010
    Date of Patent: September 25, 2012
    Assignee: Applied Biosystems, LLC
    Inventors: Austin B. Tomaney, Mark F. Oldham
  • Patent number: 8274653
    Abstract: The present invention provides a small spectroscope that has a short response time. A spectroscope according to one embodiment of the present invention includes: a beam deflector that includes an electro-optic crystal, having an electro-optic effect, and paired electrodes used to apply an electric field inside the electro-optic crystal; spectroscopic means for dispersing light output by the beam deflector; and wavelength selection means for selecting light having an arbitrary wavelength from the light dispersed and output by the spectroscopic means.
    Type: Grant
    Filed: July 30, 2008
    Date of Patent: September 25, 2012
    Assignee: Nippon Telegraph and Telephone Corporation
    Inventors: Koichiro Nakamura, Yuzo Sasaki, Kazuo Fujiura, Shogo Yagi
  • Patent number: 8269962
    Abstract: A Raman spectrometer comprising means for illuminating a sample with a shaped laser beam and a detector that is operable to detect light that is reflected from or transmitted through a sample. Preferably, the shaped laser beam has a dark spot at its center.
    Type: Grant
    Filed: March 10, 2008
    Date of Patent: September 18, 2012
    Assignee: The University Court of the University of St. Andrews
    Inventors: Kishan Dholakia, Iain Cormack, Michael Mazilu
  • Patent number: 8259299
    Abstract: Systems and methods for scanning and analyzing characteristics of a gas sample utilizing electromagnetic radiation are disclosed. More particularly, the systems and methods utilize an electromagnetic radiation source connected to a transmitter and an analyzer connected to a receiver. A sample gas volume to be analyzed is placed between the transmitter and receiver and a frequency sweep of electromagnetic radiation is transmitted through the sample to create a series of spectral data sets, which are developed into a composite spectrogram by the analyzer and processed to determine the one or more characteristics of the sample. A magnetic field can alternatively be applied around the transmitter, receiver and sample to enhance some characteristic analysis applications and to make other characteristic analysis applications possible.
    Type: Grant
    Filed: November 18, 2009
    Date of Patent: September 4, 2012
    Assignee: RF Science & Technology Inc.
    Inventors: David James Harra, Rick Eugene Sanner, Mark Norman Iverson
  • Patent number: 8248585
    Abstract: A laser capture microdissection system includes a laser illuminator, a fiber and an electric moving stage. The fiber has a probe terminal and a coupling terminal for being coupled to the laser illuminator. The electric moving stage includes a fiber probe holder, a driving mechanism for vertical shift, a stage unit, a driving mechanism for horizontal shift and an electronic control unit. The driving mechanism for vertical shift serves for driving the fiber probe holder to shift in microscale. The stage unit has a nanoscale shift controller, a placing portion, wherein the nano-scale shift controller is connected to the placing portion, and the placing portion is located under the fiber probe holder. The driving mechanism for horizontal shift serves for driving the stage unit to shift in microscale. The electronic control unit is electrically connected to the nanoscale shift controller and the driving mechanism for horizontal shift.
    Type: Grant
    Filed: December 17, 2009
    Date of Patent: August 21, 2012
    Inventors: Chien-Ming Chen, Jen-Ai Lee