Patents Examined by Magid Y. Dimyan
  • Patent number: 7350164
    Abstract: Optimization design method for configurable analog circuits and devices resulting from same. An implementation fabric for a given application domain can be accurately pre-characterized in terms of devices and parasitics. Customization structures are designed and characterized to be applied to the fabric to customize a device for a particular application. In some embodiments, characterization is accomplished by formulating a configurable design problem as an optimization with recourse problem, for example, a geometric programming with recourse (GPR) problem. Devices can be produced for multiple applications from the application domain using the same optimized fabric to provide predictable performance.
    Type: Grant
    Filed: November 1, 2004
    Date of Patent: March 25, 2008
    Assignees: Carnegie Mellon University, The Board of Trustees for the Leland Stanford Junior University
    Inventors: Yang Xu, Lawrence Pileggi, Stephen P. Boyd
  • Patent number: 7350182
    Abstract: The invention includes methods of forming patterned reticles. Design features can be introduced into a layout for a reticle prior to optical proximity correction, and then removed prior to taping a pattern onto the reticle. Design features can alternatively, or additionally, be introduced after optical proximity correction and asymmetrically relative to one or more parts of a reticle pattern. The introduced features can subsequently be taped to the reticle as part of the formation of the patterned reticle.
    Type: Grant
    Filed: August 4, 2004
    Date of Patent: March 25, 2008
    Assignee: Micron Technology, Inc.
    Inventors: H. Daniel Dulman, William A. Stanton, John R. C. Futrell
  • Patent number: 7350178
    Abstract: A programmable logic integrated circuit has an embedded processor with a watchdog timer circuit. The watchdog timer circuit is used to detect software or hardware failures. In one implementation, the watchdog timer circuit includes a counter register that advances (e.g., incremented or decremented) with each clock. To prevent the watchdog timer circuit from becoming triggered, the watchdog timer circuit should be reset or reloaded by software. For example, the count register may be reset to a value to start the count over. If the count register is allowed to count to a final or maximum value, the watchdog timer circuit will become triggered, generating a triggered signal that causes the programmable logic integrated circuit to be reset. A reset causes a reloading of the configuration data used to program the programmable logic and embedded processor portions of the integrated data. The configuration data may be stored in an external nonvolatile storage memory.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: March 25, 2008
    Assignee: Altera Corporation
    Inventors: Andrew Crosland, Roger May, Edward Flaherty, Andrew Draper
  • Patent number: 7350175
    Abstract: The design system, which is equipped with capability to analyze circuit board design data, comprises a storing section for recording design data, including structure data, circuit data, and element data; a selection section for selecting a pair of circuit elements subject to interference analysis among circuit elements placed on a circuit board, represented by the structure data; a substitution section for acquiring element data concerning circuit elements selected by the selection section from the design data and, based on element data, generating equivalent circuit data representing electromagnetic coupling within the pair of circuit elements with the help of an equivalent circuit; and an analysis section for calculating an amount of interference within the pair of circuit elements by analyzing data produced by combining the equivalent circuit data with the circuit data.
    Type: Grant
    Filed: September 28, 2005
    Date of Patent: March 25, 2008
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Hideki Iwaki, Yukinobu Furukawa
  • Patent number: 7346866
    Abstract: A method, a computer program, and an apparatus are provided for generating circuit energy models for a macro using clock gating inputs. Circuit energy models are used to estimate system power consumption. The present invention enables circuit energy models to be created for macros that contain clock gating inputs. Power tables are created based upon the macro's input switching factor percentage and the clock activation percentage. These power tables are generated from a minimum number of power simulations. By using clock activation percentage as a parameter accurate energy tables are produced.
    Type: Grant
    Filed: January 27, 2005
    Date of Patent: March 18, 2008
    Assignee: International Business Machines Corporation
    Inventors: Rajat Chaudhry, James Scott Neely, Daniel Lawrence Stasiak
  • Patent number: 7340710
    Abstract: A method for binning and layout of an integrated circuit design which includes providing a table setting forth predefined widths of signal wires and corresponding spacing to shield wires, characterizing effects on timing, noise, and power distribution based on predefined widths and spacing combinations as functions of the length of the signal wire, and laying out the integrated circuit design based upon the predefined widths of signal wires and corresponding spacing to shield wires. The shield wires are adjacent and on both sides of the routed signal wire.
    Type: Grant
    Filed: April 18, 2005
    Date of Patent: March 4, 2008
    Assignee: Sun Microsystems, Inc.
    Inventors: Stephan Hoerold, Arjun Dutt
  • Patent number: 7340704
    Abstract: A method for performing verification is proposed. The method comprises receiving a design and building an intermediate binary decision diagram for the design containing one or more nodal binary decision diagrams. In response to a size of the intermediate binary decision diagram exceeding a size threshold, a node of the design is selected for case-splitting. A first case-splitting is performed upon the selected node of the design to generate a primary constraint for setting the selected node to a primary value. A first constraining is performed on one of the one or more nodal binary decision diagrams with the primary constraint to generate a primary final binary decision diagram, a first verification of the design is performed using the primary final binary decision diagram.
    Type: Grant
    Filed: June 23, 2005
    Date of Patent: March 4, 2008
    Assignee: International Business Machines Corporation
    Inventors: Jason Raymond Baumgartner, Christian Jacobi, Viresh Paruthi, Kai Weber
  • Patent number: 7337426
    Abstract: There is disclosed a pattern correcting method comprising extracting a correction pattern, at least the one or more correction patterns being included in a first design pattern formed on a substrate, acquiring layout information from the first design pattern, the layout information affecting a finished plane shape of the correction pattern on the substrate, determining contents of correction onto the correction pattern on the basis of the layout information, generating a design pattern-2 corresponding to the layout information so as to be associated with the correction pattern, and correcting the correction pattern in accordance with the contents of correction corresponding to the design pattern-2.
    Type: Grant
    Filed: April 27, 2005
    Date of Patent: February 26, 2008
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Toshiya Kotani, Shigeki Nojima, Kazuhito Kobayashi
  • Patent number: 7331028
    Abstract: A method and apparatus for managing a plurality of change orders for a circuit design is disclosed. The method generally includes the steps of (A) receiving the change orders generated manually by a user, (B) analyzing the circuit design with all of the change orders implemented and (C) generating a report suitable for the user to understand based on a result of the analyzing.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: February 12, 2008
    Assignee: LSI Logic Corporation
    Inventors: Matthias Dinter, Juergen Dirks, Herbert Johannes Preuthen
  • Patent number: 7325218
    Abstract: A problem is efficiently solved by giving a proper adjacent spacing condition only to nets having such a problem that a wiring delay and crosstalks are caused. A wiring processing unit executes a wiring process by giving a first adjacent spacing condition that does not become a wiring violation on the basis of a net list of a semiconductor circuit. A noise analyzing unit extracts error nets in which noise errors have occurred by a noise analysis of a wiring formed by the wiring processing unit. A wiring condition changing unit gives a second adjacent spacing condition for eliminating the noise errors to the error nets extracted by the noise analyzing unit, gives the first adjacent spacing condition to the nets other than the error nets, and allows the wiring process to be executed again on the basis of the net list.
    Type: Grant
    Filed: February 22, 2005
    Date of Patent: January 29, 2008
    Assignee: Fujitsu Limited
    Inventor: Hideaki Katagiri
  • Patent number: 7320117
    Abstract: A design method for a semiconductor integrated circuit device wherein for a path having a signal arrival time longer than a desired signal arrival time, and among multiple paths in the semiconductor integrated circuit device, a path isolation is performed so that a number of other components to be connected to the output of a component belonging to the path decreases. The design method can be integrated into an automatic design flow using a legacy electronic design automation tool.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: January 15, 2008
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Ryota Nishikawa, Gen Fukatsu
  • Patent number: 7313774
    Abstract: One embodiment of the present invention provides a system that associates an error in a layout with a cell. During operation, the system receives a layout which is designed to create a target feature with an intended shape. Next, the system determines an error in a critical dimension of the target feature. The system then identifies a cell in the layout based on the error's location in the layout, thereby associating the error with the cell. Note that associating errors with cells allows the errors to be summarized based on the associated cells, which can reduce the amount of time required to identify and fix the errors.
    Type: Grant
    Filed: June 21, 2005
    Date of Patent: December 25, 2007
    Assignee: Synopsys, Inc.
    Inventors: Peter J. Wright, Minghui Fan
  • Patent number: 7313776
    Abstract: A system that routes nets within an integrated circuit. During operation, the system receives a representation for the integrated circuit, which includes block boundaries for physical partitions of the IC generated from a hierarchical design placement of the integrated circuit. The system then classifies each net in the integrated circuit based on the location of pins associated with the net. Next, the system generates routing constraints for each net based on the classification of the net and applies a feedthrough constraint to the physical partitions to restrict nets from feeding through physical partition boundaries. Finally, the system routes each net using the routing constraints for the net and the feedthrough constraints for the physical partitions. This routing is performed based on these block boundaries prior to finalizing the hierarchical design placement, thereby facilitating early detection of congestion or timing violations which can be corrected early in the design process.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: December 25, 2007
    Assignee: Synopsys, Inc.
    Inventors: Neeraj Kaul, Balkrishna Rashingkar, Anthony Y. Tseng, Wei-Chih Tseng
  • Patent number: 7308662
    Abstract: A method of modeling capacitance for all practical 2D on-chip wire structures including coplanar and microstrip structures. The method includes using a field lines approach (600) to obtain capacitance expressions for structure components, combining the expressions (704) for components of the subject structure and obtaining a capacitance expression (705) for the subject structure. The static capacitance matrix for the structure is calculated from the capacitance expression. The structure components can include components with parallel plate field lines, quarter circle field lines, singularity field lines, singularity field lines with restriction, double set of quarter circle field lines which are used as building blocks for the subject structure. The final capacitance expressions can be used for the modeling of critical on-chip wires and devices as well as inside a capacitance extraction tool.
    Type: Grant
    Filed: June 15, 2005
    Date of Patent: December 11, 2007
    Assignee: International Business Machines Corporation
    Inventors: David Goren, Shlomo Shlafman
  • Patent number: 7305646
    Abstract: An apparatus that may include a base layer of a platform application specific integrated circuit (ASIC) and a mixed-signal function. The base layer of the platform application specific integrated circuit (ASIC) generally comprises a plurality of pre-diffused regions disposed around a periphery of the platform ASIC. Each of the pre-diffused regions may be configured to be metal-programmable. The mixed-signal function may include two or more sub-functions formed with a metal mask set placed over a number of the plurality of pre-diffused regions.
    Type: Grant
    Filed: May 9, 2005
    Date of Patent: December 4, 2007
    Assignee: LSI Corporation
    Inventors: Donald T. McGrath, Robert D. Waldron, Scott C. Savage, Kenneth G. Richardson
  • Patent number: 7305638
    Abstract: A method for improving yield of a process for fabricating a read-only memory (ROM) includes evaluating a yield of a ROM fabrication process associated with a first ROM design. At least two candidate ROM design modifications are identified. At least one of the candidate ROM design modifications comprises inversion of bit values of data to be stored in the ROM. A plurality of criteria are applied, including at least an amount of yield improvement and a difficulty of implementation associated with each candidate ROM design modification. One of the candidate ROM design modifications is selected based on the application of the criteria. A modified ROM fabrication process is performed to fabricate a ROM according to the selected ROM design modification.
    Type: Grant
    Filed: May 13, 2005
    Date of Patent: December 4, 2007
    Assignee: PDF Solutions, Inc.
    Inventor: Brian E. Stine
  • Patent number: 7305648
    Abstract: A server computer maintains a master database for a PCB design, and a copy of the PCB design is provided to multiple client computers. The server assigns each client a different pair of pins for which a connection must be routed. When a client completes an assigned routing task, it requests that the server update the PCB master design with the route found by the client for its assigned pin pair. After forwarding the request, the client does not update its copy of the PCB design to reflect the found route. Instead, the client returns its copy to the state occupied prior to assignment of the pin pair by the server. Upon receiving notification that the server incorporated the found route, the client updates its copy of the design to include that route.
    Type: Grant
    Filed: June 18, 2004
    Date of Patent: December 4, 2007
    Assignee: Mentor Graphics Corporation
    Inventors: Vladimir V. Petunin, Charles L. Pfeil, Alexander N. Starkov, Venkat Natarajan, Edwin Franklin Smith
  • Patent number: 7305644
    Abstract: More “timing closure efficient” Timing Driven Placements by implementing our new net weight for negative slack paths to enhance timing closure behavior is provided by a NSRF (Negative Slack Recover Factor). This new weight would not be based on the absolute amount of negative slack in a path, but rather it would be based on the proportion or percentage of the path's total net delay adder that must be recovered in order to achieve timing closure (zero slack). After an initial or previous placement has been created, then a list of paths with timing violations with a Negative Slack Recover Factor (NSRF) is created for each net in each of the timing paths on the list of paths, and then calculating a NSRF net weight factor for use in subsequent placements and also assigning nets in the list of paths with no timing violations a NSRF default value of one.
    Type: Grant
    Filed: May 16, 2005
    Date of Patent: December 4, 2007
    Assignee: International Business Machines Corporation
    Inventors: James J. Curtin, Kevin M. McIlvain, Ray Raphy, Douglas S. Search, Stephen Szulewski
  • Patent number: 7296248
    Abstract: A method of generating a parameterized cell is disclosed herein. The method comprises performing a compiling interpretation on a structure layout. The compiling interpretation includes i) determining and analyzing shape relationships of the structure layout, and ii) mapping shapes and calculating properties of mapped shapes. The method also includes generating code in response to the compiling interpretation, wherein the generated code is representative of one or more parameterized cells of a pcell library of an electronic design automation software program.
    Type: Grant
    Filed: June 20, 2005
    Date of Patent: November 13, 2007
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Julia Perez, Leo Kasel
  • Patent number: 7290226
    Abstract: Methods, systems and program products are disclosed that prioritize each target via for via redundancy based on at least one of the following: subnet timing information, a distance of a target via along a path from a driving source and a target via net/subnet characteristic, and attempt to add a redundant via to each target via based on the prioritization. The invention improves overall yield and reduces timing sensitivity to AC-related defects.
    Type: Grant
    Filed: April 4, 2005
    Date of Patent: October 30, 2007
    Assignee: International Business Machines Corporation
    Inventors: Anthony Correale, Jr., Lewis W. Dewey, III, Jason D. Hibbeler