Abstract: The invention provides a light-extraction element, comprising a light-diffusion layer which including a resin; and a plurality of raspberry-like particles uniformly dispersed in the resin, wherein the raspberry-like particles feature a surface with a plurality of round bumps, and the plurality of raspberry-like particles are composed of a material having a single reflective index. The invention also provides a light-emitting device, including a pair of electrodes composed of an anode and a cathode; an organic light-emitting unit disposed between the pair of electrodes, wherein the organic light-emitting unit includes a light-emitting layer; and a light-extraction element which is disposed on a light-emitting surface of the light-emitting device.

Abstract: A stratified gate dielectric stack includes a first high dielectric constant (high-k) gate dielectric comprising a first high-k dielectric material, a band-gap-disrupting dielectric comprising a dielectric material having a different band gap than the first high-k dielectric material, and a second high-k gate dielectric comprising a second high-k dielectric material. The band-gap-disrupting dielectric includes at least one contiguous atomic layer of the dielectric material. Thus, the stratified gate dielectric stack includes a first atomic interface between the first high-k gate dielectric and the band-gap-disrupting dielectric, and a second atomic interface between the second high-k gate dielectric and the band-gap-disrupting dielectric that is spaced from the first atomic interface by at least one continuous atomic layer of the dielectric material of the band-gap-disrupting dielectric.

Abstract: Methods are described for forming “air gaps” between adjacent metal lines on patterned substrates. The common name “air gap” will be used interchangeably with the more technically accurate “gas pocket” and both reflect a variety of pressures and elemental ratios. The air gaps are produced within narrow gaps between copper lines while wide gaps retain dielectric material. Retention of the dielectric material within the wide gaps enables formation of a desirable planar top surface. Using a hardmask layer and a selective dry-etch process enables a wet processing step to be avoided right before the formation of the air gaps. The air gaps can have a dielectric constant approaching one, favorably reducing interconnect capacitance compared with typical low-k dielectric materials.

Abstract: In some embodiments, an integrated circuit (IC) device includes a substrate having a first functional region, a second functional region and a third functional region. The IC device also includes a plurality of dielectric layers over the substrate, a first guard ring in the plurality of dielectric layers and around the first functional region, and a second guard ring in the plurality of dielectric layers and around the second functional region. The second guard ring is separate from the first guard ring, and the third functional region is free of a guard ring. The IC device further includes a seal ring in the plurality of dielectric layers. The seal ring encircles the first and the second guard rings, and is separate from the first and the second guard rings.

Abstract: An embodiment integrated circuit (e.g., diode) and method of making the same. The embodiment integrated circuit includes a well having a first doping type formed over a substrate having the first doping type, the well including a fin, a source formed over the well on a first side of the fin, the source having a second doping type, a drain formed over the well on a second side of the fin, the drain having the first doping type, and a gate oxide formed over the fin, the gate oxide laterally spaced apart from the source by a back off region of the fin. The integrated circuit is compatible with a FinFET fabrication process.

Abstract: An active organic electroluminescence device back panel and a manufacturing method thereof are disclosed. The device back panel includes: a substrate, a plurality of active TFT pixel arrays formed on the substrate, and organic planarization layers, organic electroluminescence electrodes, pixel definition layers, and support bodies formed on the active TFT pixel arrays. Each of the active TFT pixel arrays includes a driving TFT and a switch TFT. The driving TFT has a gate insulation layer that has a thickness greater than a thickness of a gate insulation layer of the switch TFT. Through thickening the gate insulation layer of the driving TFT, the gate capacitance of the driving TFT can be reduced and the sub-threshold swing of the driving TFT is increased to realize well definition of grey levels.

Abstract: Disclosed is a structure for improved electrical signal isolation between adjacent devices situated in a top semiconductor layer of the structure and an associated method for the structure's fabrication. The structure comprises a first portion of a trench extending through the top semiconductor layer and through a base oxide layer below the top semiconductor layer. A handle wafer is situated below the base oxide layer and a second portion of the trench, having sloped sidewalls, extends into the handle wafer. The sloped sidewalls are amorphized by an implant, for example, Xenon or Argon, to reduce carrier mobility in the handle wafer and improve electrical signal isolation between the adjacent devices situated in the top semiconductor layer.

Abstract: The purpose of the present invention is to reduce the wiring inductance of a power semiconductor module.

Abstract: According to example embodiments, a three-dimensional semiconductor device including a substrate with cell and connection regions, gate electrodes stacked on the cell region, a vertical channel structure, pads, a dummy pillar, and first and second semiconductor patterns. The vertical channel structure penetrates the gate electrodes on a lowermost gate electrode and includes a first gate dielectric pattern. The pads extend from the gate electrodes and are stacked on the connection region. The dummy pillar penetrates some of the pads on a lowermost pad and includes a second gate dielectric pattern. The first semiconductor patterns are between the vertical channel structure and the substrate. The second semiconductor patterns are between the dummy pillar and the substrate. The first and second gate dielectric patterns may be on the first and second semiconductor patterns, respectively. The second gate dielectric pattern may cover a whole top surface of the second semiconductor pattern.

Abstract: A semiconductor device including: a first semiconductor region of a first conductivity type; a second semiconductor region of a second conductivity type adjacent to the first region; third and fourth semiconductor regions of the second conductivity type over or at least partially within the first semiconductor region; a fifth semiconductor region of the first conductivity type between the third and fourth semiconductor regions; a first gate over the fifth semiconductor region; sixth and seventh semiconductor regions of the first conductivity type over or at least partially within the second semiconductor region; an eighth semiconductor region of the second conductivity type between the sixth and seventh semiconductor regions; a second gate over the eighth semiconductor region; the third and seventh semiconductor regions coupled to first and second regions of the first gate, respectively, and the fourth and sixth semiconductor regions coupled to first and second regions of the second gate, respectively.

Abstract: The present invention provides an active organic electroluminescence device back panel and a manufacturing method thereof. The device back panel includes: a substrate (20), a plurality of active TFT pixel arrays formed on the substrate (20), and organic planarization layers (228), organic electroluminescence electrodes (229), pixel definition layers (25), and support bodies (28) formed on the active TFT pixel arrays. Each of the active TFT pixel arrays includes a driving TFT (22) and a switch TFT (24). The driving TFT (22) has a gate insulation layer (220) that has a thickness greater than a thickness of a gate insulation layer (240) of the switch TFT (24). Through thickening the gate insulation layer of the driving TFT, the gate capacitance of the driving TFT can be reduced and the sub-threshold swing of the driving TFT is increased to realize well definition of grey levels.

Abstract: Embodiments of the disclosure provide semiconductor device structures and methods of forming the same. The semiconductor device structure includes a metal gate over a substrate. A first spacer is formed over sidewalls of the metal gate and having a first height. A second spacer is formed over the sidewalls of the metal gate and having a second height. The first height is higher than the second height. The first spacer is farther from the sidewalls of the metal gate than the second spacer. In addition, the semiconductor device structure includes a dielectric layer formed over the substrate to surround the first spacer and the metal gate.

Abstract: Disclosed is a structure for improved electrical signal isolation between adjacent devices situated in a top semiconductor layer of the structure and an associated method for the structure's fabrication. The structure comprises a first portion of a trench extending through the top semiconductor layer and through a base oxide layer below the top semiconductor layer. A handle wafer is situated below the base oxide layer and a second portion of the trench, having sloped sidewalls, extends into the handle wafer. The sloped sidewalls are amorphized by an implant, for example, Xenon or Argon, to reduce carrier mobility in the handle wafer and improve electrical signal isolation between the adjacent devices situated in the top semiconductor layer.

Abstract: Disclosed herein is a method of manufacturing a thin film semiconductor device includes the step of forming a silicon thin film including a crystalline structure on a substrate by a plasma CVD process in which a high order silane gas represented by the formula SinH2n+2 (n=2, 3, . . . ) and a hydrogen gas are used as film forming gases.

Abstract: Device comprising a ductile layer, a method for making a component comprising a ductile layer and a method for testing a component are disclosed. An embodiment includes an electronic device including a first conductive layer, a ductile layer and a brittle layer between the first conductive layer and the ductile layer.

Abstract: Provided is a method for fabricating a flexible display device. The method includes attaching a shape memory alloy film memorizing a shape thereof as a curved shape at a shape memory temperature or lower to a flexible substrate at a temperature higher than the shape memory temperature, forming a display device on the flexible substrate, and returning the shape memory alloy to the curved shape to remove the shape memory alloy film from the flexible substrate.

Abstract: Integrated circuits with backside power delivery capabilities are provided. An integrated circuit may include a substrate having front and back surfaces, a first interconnect stack formed on the front surface, and a second interconnect stack formed on the back surface. Routing structures that carry data signals, control signals, and other user signals may be formed only in the first interconnect stack. A large majority of routing structures that carry power supply signals may be formed in the second interconnect stack. Decoupling capacitor circuitry such as deep trench capacitors may be formed in the back surface of the substrate. The integrated circuit may be mounted on a package substrate. The first interconnect stack may be coupled to the package substrate via wire bond pads, whereas the second interconnect stack may be coupled to the package substrate via an array of solder bumps.

Abstract: A luminescent device and a manufacturing method for the luminescent device and a semiconductor device which are free from occurrence of cracks in a compound semiconductor layer due to the internal stress in the compound semiconductor layer at the time of chemical lift-off. The luminescent device manufacturing method includes forming a device region on part of an epitaxial substrate through a lift-off layer; forming a sacrificing portion, being not removed in a chemical lift-off step, around device region on epitaxial substrate; covering epitaxial substrate and semiconductor layer and forming a covering layer such that level of surface thereof in the region away from device region is lower than luminescent layer surface; removing covering layer on semiconductor layer, and that on sacrificing portion surface; forming a reflection layer on covering layer surface and semiconductor layer surface; and forming a supporting substrate by providing plating on reflection layer.

Abstract: Methods for reducing location-based variations in the switching characteristics of memory cells within a memory array are described. In some cases, the resistance of an embedded resistor within each memory cell may be set to reduce the overall variation in series resistances for the memory cells within a memory array. For example, embedded resistors associated with far-far bits may be set to a lower resistance than embedded resistors associated with near-near bits. An embedded resistor may comprise a layer of polysilicon within a memory cell. Selective ion implantation may be used to reduce the embedded resistor resistance for memory cells within a particular region of the memory array and to form two or more different sets of embedded resistors within the memory array.

Abstract: A semiconductor device is configured to perform a transmission process and a reception process using a radio wave, includes a transmission unit configured to perform the transmission process, and includes a modulator having a first inductor of a spiral shape, and a reception unit configured to perform the reception process, which includes a local oscillator having a second inductor. The second inductor includes a first portion extending in a first direction, a second portion extending in a second direction and a third portion extending in a third direction. The second direction and the third direction intersect with the first direction. The first portion, second portion and third portion include a same conductor layer. The second portion has an end which is not connected with the first portion. The third portion has another end which is not connected with the first portion, and the end of the second portion and said another end of the third portion are located apart in a plan view.