Patents Examined by Michael Cygan
  • Patent number: 7258022
    Abstract: A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: August 21, 2007
    Assignee: Honeywell Federal Manufacturing & Technologies
    Inventor: Edward G. Wenski
  • Patent number: 7257987
    Abstract: Methods and systems for analyzing samples, such as gas samples, are described. One method comprises providing a gas sample, increasing pressure applied to the gas sample to compress the sample to a smaller volume and provide a pneumatically focused gas sample, and analyzing the pneumatically focused gas sample using any of a variety of analytical techniques. Also disclosed are systems for gas analysis, including systems for analysis of pneumatically focused, and thereby concentrated, gas samples and for analysis of particulate matter in gas samples. Analytical systems constructed within personal computer cases also are disclosed.
    Type: Grant
    Filed: February 18, 2004
    Date of Patent: August 21, 2007
    Assignee: State of Oregon acting by and through the State Board of Higher Education on behalf of Portland State University
    Inventors: Robert J. O'Brien, Thomas R. Smith
  • Patent number: 7258027
    Abstract: A detector of an absolute rotation angle and torque includes a first gear coupled to an input shaft of a torsion-bar unit, a gear A engaging with the first gear, and a first detecting section of an absolute rotation angle placed at the center of the gear A. The detector also includes a second gear coupled to an output shaft of the torsion-bar unit, a gear B engaging with the second gear, and a second detecting section of an absolute angle placed at the center of gear B.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: August 21, 2007
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Koji Oike, Kiyotaka Uehira, Masaharu Ushihara
  • Patent number: 7258901
    Abstract: A nanostructure is fabricated using charged particle deposition to deposit a catalyst on a substrate. A charged particle beam is directed to location on the substrate where the catalyst is to be deposited, with a beam-activated precursor gas also being directed to the location. For example, a nickel dot can be selectively deposited onto a substrate by using a charged particle beam to decompose a nickel-containing precursor gas, and then a carbon nanotube can be grown on the nickel dot, with the diameter of the nanotube conforming to the size of the nickel dot.
    Type: Grant
    Filed: March 23, 2006
    Date of Patent: August 21, 2007
    Assignee: FEI Company
    Inventors: Randall Lee, Thomas Owen Mitchell, Johannes Jacobus Lambertus Mulders
  • Patent number: 7258006
    Abstract: A one-piece molded polymeric sight gauge shield with internal cylindrical bore and method for making same are disclosed, along with a liquid-containing urn including same. The shield is molded by mating first and second mold portions about first and second spaced-apart cores to define: (i) a first annular void about the first core; and, (ii) a second annular void about the second core. The first and second mold portions respectively comprise first and second stand-up portions that first and second sidewall voids between themselves and the mating mold portion. First and second end portions of a gauge shield member are molded by filling the first and second voids, while the first and second sidewalls of the gauge shield member are molded by filling the first and second sidewall voids. The molding operation is a single-axis straight-pull molding method.
    Type: Grant
    Filed: December 8, 2003
    Date of Patent: August 21, 2007
    Assignee: The Meyer Company
    Inventors: Timothy J. Toth, Raymond P. Kawolics
  • Patent number: 7258023
    Abstract: Disclosed herein is a process for measuring the transfer resistance of a cosmetic product, such as a foundation, comprising: i) depositing an amount of the cosmetic product onto a first face of a support; ii) applying the first face of the support onto a sheet, under given pressure and given duration conditions; iii) while maintaining a pressure, effecting a relative translational motion between the sheet and the support, parallel to the plane of the sheet and at a substantially constant speed; and iv) determining a transfer index for the product as a function of the amount of residual product on the first face, or in the event of a residual amount that is greater than zero and less than the said given amount, as a function of the length of a trail formed by the product transferred onto the sheet.
    Type: Grant
    Filed: December 9, 2004
    Date of Patent: August 21, 2007
    Assignee: L'Oreal S.A.
    Inventor: Franck Giron
  • Patent number: 7255011
    Abstract: Switches SW1 to SW4 and variable resistors are formed so as to overlap each other at positions corresponding to the X-axial positive direction, the X-axial negative direction, the Y-axial positive direction, and the Y-axial negative direction, respectively. When at least one of the switches SW1 to SW4 is off, no Z-axial output is activated and only X- and Y-axial outputs are activated. On the other hand, when any of the switches SW1 to SW4 is on, no X- and Y-axial outputs are activated and only a Z-axial output is activated.
    Type: Grant
    Filed: May 18, 2006
    Date of Patent: August 14, 2007
    Assignee: Nitta Corporation
    Inventor: Hideo Morimoto
  • Patent number: 7254985
    Abstract: The oxygen sensor of the present invention has excellent durability capable of effectively preventing contamination with lead or the like for a detection electrode even in low temperature exhaust gases, and having stable response over a long period of time. The contamination preventive layer provided in the sensor device comprises composite powders having coarse powders covered therearound with fine powders, and hollows not filled with fine powders are scattered in gaps among the composite powders. Both the coarse and fine powders comprise ceramic powders. Further, it is particularly preferred that the ceramic powders are powders of a titania powder having a peak at 1 ?m or less and a composite ceramic powder containing alumina such as spinel having a peak at 10 ?m or more.
    Type: Grant
    Filed: July 1, 2003
    Date of Patent: August 14, 2007
    Assignee: NGK Spark Plug Co., Ltd.
    Inventors: Hiroshi Isomura, Takayoshi Atsumi, Koji Shiono, Masamine Takagi
  • Patent number: 7255000
    Abstract: In paper and board machines the position of a rolling device relative to another rolling device and/or the force exerted by the rolling device on the other rolling device or any variable acting on these is measured, and the value of the measured variable is compared with the set value of said variable in order to obtain the difference value of the variable, and the position of the rolling device and/or the force it exerts on the other rolling device is controlled on the basis of the difference value. The fluid pressure of the hydraulic means (5) and/or the flow velocity of the fluid to the hydraulic means is changed in order to alter the difference value of the variable by opening and/or closing at least one digital valve in a digital valve pack (7) functionally connected to the hydraulic means (S).
    Type: Grant
    Filed: November 13, 2003
    Date of Patent: August 14, 2007
    Assignee: Metso Paper, Inc.
    Inventors: Tatu Pitkänen, Petteri Lannes, Marko Tiilikainen
  • Patent number: 7255014
    Abstract: A wheel bearing apparatus has a wheel speed detecting apparatus which can prevent ingress of foreign matter into the wheel speed detecting portion of the wheel bearing apparatus. The wheel bearing apparatus has an encoder (19) mounted on the outer circumferential surface of an inner ring (6). A sensor holder (15) is arranged on the end of the outer member (4) opposite to the encoder (19). The sensor holder (15) includes an annular fitting member (16) and a holding portion (17). The holding portion (17) is formed by synthetic resin molded integrally with the annular fitting member (16). A wheel speed detecting sensor (20) is embedded in the resin and is positioned opposite to the encoder (19), via a predetermined gap between the two. A seal (11) is arranged at the inboard side of the encoder (19). The seal (11) includes a first sealing plate (21) and a second sealing plate (22) fit, respectively, on the sensor holder (15) and the inner ring (6).
    Type: Grant
    Filed: March 22, 2006
    Date of Patent: August 14, 2007
    Assignee: NTN Corporation
    Inventor: Syougo Suzuki
  • Patent number: 7251981
    Abstract: A degradation diagnosis method for simply performing degradation diagnosis of a gas sensor such as a hydrogen sensor. The hydrogen sensor has a reference detector member and common detector member, with each detector member respectively constituted of a detector element and temperature compensating element that form a pair. Power is normally supplied to the common detector member, which performs concentration detection of the hydrogen gas. When performing degradation diagnosis of this common detector member, concentration detection is performed simultaneously by each detector member for the gas of the prescribed hydrogen concentration by supplying power to both the common detector member and reference detector member and comparing the output value of the common detector member and the output value of the reference detector member.
    Type: Grant
    Filed: May 12, 2003
    Date of Patent: August 7, 2007
    Assignee: Honda Motor Co., Ltd.
    Inventors: Takashi Sasaki, Hiroyuki Abe, Tsuyoshi Eguchi, Yasushi Kojima, Takashi Saito, Akihiro Suzuki
  • Patent number: 7251988
    Abstract: A topography analyzing system (10) for analyzing a topographic microstructure is provided. The topography analyzing system includes a three-dimensionally adjustable platform (12), a loading platform (13), a microscopic viewing device (14), a topography measuring device (11), and a mirror (15). The adjustable platform is adapted for adjusting the spatial positions of itself and what is loaded thereon. The loading platform is disposed on the adjustable platform and is adapted for having a workpiece (17) to be evaluated loaded thereon. The topography measuring device is aside/adjacent the adjustable platform. The topography measuring device includes a probe extending to and overhanging the workpiece for detecting topography of the workpiece. The mirror is secured at an adjustable angle relative to the three-dimensional adjustable platform and is adapted for forming a mirror image of the probe and a selected measuring area of the workpiece.
    Type: Grant
    Filed: January 20, 2006
    Date of Patent: August 7, 2007
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Chuan-De Huang
  • Patent number: 7249521
    Abstract: The present invention is based on the recognition that some materials contain a magnetically susceptible or magnetic component. That is, they exhibit ferromagnetic, paramagnetic, diamagnetic or magnetic properties. According to the invention, it is possible to determine the presence of a magnetically susceptible or magnetic component in a sample of a material by obtaining a sample of the material, positioning the sample at a predetermined distance from a magnet and then measuring the magnetic force on the sample by the magnet. The force is measured using a force transducer. To obtain the magnetic force per unit gravitational force, the gravitational force on the sample is measured out of the presence of the magnet and the measured magnetic force is then divided by the gravitational force exerted on the sample. A sample thickness adjustment is necessary if comparing samples of different thicknesses.
    Type: Grant
    Filed: August 24, 2005
    Date of Patent: July 31, 2007
    Inventor: Peter Frasca
  • Patent number: 7246517
    Abstract: An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.
    Type: Grant
    Filed: June 19, 2006
    Date of Patent: July 24, 2007
    Assignee: Korea Institute of Machinery & Materials
    Inventors: Hak-Joo Lee, Jae-Hyun Kim, Chung-Seog Oh, Seung-Woo Han, Shin Hur, Soon-Gyu Ko, Byung-Ik Choi
  • Patent number: 7243527
    Abstract: The sensing apparatus for a vehicle includes a case having an opening part formed so as to communicate with an outside. A printed circuit board is disposed inside of the case, and includes a circuit unit. A noxious gas sensing part is electrically connected with the circuit unit for sensing a noxious gas of an external air inflowing through the opening portion, and for outputting a sensing signal. A connector is disposed at least partially with the case, one end thereof being directly connected with the circuit unit, and the other end thereof being directly connected with an external device.
    Type: Grant
    Filed: December 30, 2004
    Date of Patent: July 17, 2007
    Assignee: Hyundai Motor Company
    Inventor: Moo Yong Kim
  • Patent number: 7243554
    Abstract: A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.
    Type: Grant
    Filed: September 16, 2005
    Date of Patent: July 17, 2007
    Assignee: Honeywell Federal Manufacturing & Technologies
    Inventor: Edward G. Wenski
  • Patent number: 7240534
    Abstract: The present invention provides systems and methods that can provide a high g-force to a test specimen. An exemplary system of the present invention includes a beam, rigidly fixed at one or both ends, on which a test specimen can be mounted. A loading device is preferably provided that can load the beam by using a ceramic column positioned between the beam and the loading device. A flywheel that has a cutter that can be deployed on command while the flywheel is rotating to fracture the ceramic column is also provided. The present invention also provides systems and methods for controllably damping the oscillation of a loaded beam at some point after the load on the beam is released to produce a high g-force event. For example, a damping device of the present invention may be engaged after the completion of the high g-force event. Such damping can prevent subsequent ringing or oscillation of the beam without affecting the magnitude of the high g-force event.
    Type: Grant
    Filed: June 2, 2005
    Date of Patent: July 10, 2007
    Assignee: Honeywell International Inc.
    Inventor: Owen D. Grossman
  • Patent number: 7234343
    Abstract: Evanescent wave scattering by a scanning probe in a scanning probe microscope is utilized to determine and monitor separation between a scanning probe and a sample. A laser light is totally internally reflected at the interface between a more optically dense (incident) medium and less optically dense (transmitting) medium, exciting a decaying evanescent field in the less optically dense medium. A scanning probe, such as a colloidal probe, is dipped into the evanescent field, which scatters off the scanning probe. The portion of the scattered field propagates back into the incident medium and is then detected by a detector. A dependency between the intensity of the scattered evanescent field and the separation between the probe and the incident medium was measured and used in determining the separation. This dependency of intensity is used to prepare images or maps of interfaces. A particular application of determining the separation between the probe and the sample in an atomic force microscope is disclosed.
    Type: Grant
    Filed: July 12, 2004
    Date of Patent: June 26, 2007
    Assignee: Virginia Tech Intellectual Properties, Inc.
    Inventors: William Ducker, John Walz, Spencer Clark
  • Patent number: 7234360
    Abstract: A sensor for measuring mechanical changes in length, in particular a compressive and/or tensile stress sensor, includes a sandwich system with two flat and superposed electrodes separated from each other by a tunnel element (tunnel barrier), in particular an oxide barrier, a current being set up between the electrodes and through the tunnel barrier, one electrode consisting of a magnetostrictive layer 3 which responds to elongation, and wherein the contributions of the anisotropies caused by mechanical tension are larger than those from the intrinsic anisotropies, relative changes in system resistance ?R/R larger than 10% at room temperature being attained during elongation.
    Type: Grant
    Filed: April 3, 2003
    Date of Patent: June 26, 2007
    Assignees: Stifting Caesar, Infineon Technologies AG
    Inventors: Eckhard Quandt, Markus Lohndorf, Alfred Ludwig, Manfred Ruhrig, Joachim Wecker
  • Patent number: 7234341
    Abstract: An object is to provide a gas sensor which can suppress positional shift of a to-be-held member such as a gas detection element, as well as a method of manufacturing the gas sensor. A gas sensor (101) includes a gas detection element (111), a metallic shell (131), a plate packing (157), and a first packing (159). A proximal end surface (113t2) of a projection (113) of the gas sensor element (111) and a central inner circumferential surface (135n) of the metallic shell (131) form an acute-angle clearance (120). The first packing (159), which has a wedge-like cross section, is disposed in the clearance (120) such that the first packing (159) is pressed against the proximal end surface (113t2) of the projection (113) of the gas sensor element (111) and the central inner circumferential surface (135n) of the metallic shell (131).
    Type: Grant
    Filed: July 13, 2004
    Date of Patent: June 26, 2007
    Assignee: NGK Spark Plug Co., Ltd.
    Inventors: Hisaharu Nishio, Takashi Nakao, Kazuhiro Kouzaki