Abstract: Apparatuses and methods for compensating for signal drop in memory. Compensating for signal drop can include applying a first signal to a terminal of a particular transistor and mirroring the first signal to a decoder replica. Compensating for signal drop can also include applying a second signal to a gate of the particular transistor, the second signal comprising a sensing signal and a signal drop on the decoder replica and sensing a state of the particular transistor.

Abstract: Technologies relating to crossbar array circuits with a 2T1R RRAM cell that includes at least one NMOS transistor and one PMOS transistor for low voltage operations are disclosed. An example apparatus includes a word line; a bit line; a first NMOS transistor; a second PMOS transistor; and an RRAM device. The first NMOS transistor and the second PMOS transistor are in parallel as a pair, wherein the pair connects in series with the RRAM device. The apparatus may further include an inverter, via which the second gate terminal of the second PMOS transistor is connected to the first gate terminal.

Abstract: An electronic device comprises a multi-chip package including multiple memory dice that include a memory array, charging circuitry, polling circuitry and a control unit. The charging circuitry is configured to perform one or more memory events in a high current mode using a high current level or in a low current mode using a lower current level. The polling circuitry is configured to poll a power status node common to the multiple memory dice to determine availability of the high current mode. The control unit is configured to operate the charging circuitry in the high current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is available, and operate the charging circuitry in the low current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is unavailable.

Abstract: According to an embodiment, a semiconductor memory device includes a memory cell array and a control circuit. The control circuit is configured to receive a first command set, receive a second command set related to a read operation while rejecting a command set related to a write operation or erase operation in response to the first command set, and execute the read operation on the memory cell array in response to the second command set.

Abstract: A system includes a memory device with microbumps and a processing device. The processing device is operatively coupled with the memory device to perform operations. The operations include transmitting data for a machine learning operation based on a set of the microbumps of the memory device where the data is being stored at the memory device. In addition, the operations include determining a change in a condition of the machine learning operation. Furthermore, the operations include that, in response to determining the change in the condition of the machine learning operation, determining a new set of the microbumps of the memory device that are to transmit subsequent data for the machine learning operation. Moreover, the operations include transmitting the subsequent data using the new set of microbumps of the memory device.

Abstract: A memory is provided that is configured to practice both a normal read operation and also a burst mode read operation. A column multiplexer selects from a plurality of columns using a pair of pass transistor for each column. The column multiplexer drives a true input node and a complement input node of an output data latch.

Abstract: A static random access memory SRAM unit and a related apparatus are provided, to reduce power consumption of an SRAM when the SRAM memory is accessed. The SRAM unit is located in an SRAM memory, and the SRAM memory includes an SRAM storage array including a plurality of SRAM units. The SRAM unit includes: a storage circuit, connected to each of a write circuit and a read circuit, and configured to store data; the write circuit, configured to write data into the storage circuit; and the read circuit, configured to: after a read enabling signal is valid, enable data on a read bit line connected to the SRAM unit to be the data stored in the storage circuit.

Abstract: A location of at least one fail bit to be repaired in a memory block of a memory is extracted from at least one memory test on the memory block. An available repair resource in the memory for repairing the memory block is obtained. It is determined whether a Constraint Satisfaction Problem (CSP) containing a plurality of constraints is solvable. The constraints correspond to the location of the at least one fail bit in the memory block, and the available repair resource. In response to determining that the CSP is not solvable, the memory block is marked as unrepairable or the memory is rejected. In response to determining that the CSP is solvable and has a solution satisfying the constraints, the at least one fail bit is repaired using the available repair resource in accordance with the solution of the CSP.

Abstract: A system includes a memory device and a processing device. The processing device performs, at a first frequency, a first scan of a page of a block family that measures a first data state metric and identifies a specific bin corresponding to a measured value for the first data state metric. Processing device updates a bin, to which the page is assigned, to match the specific bin. Processing device performs, at a second frequency higher than the first frequency, a second scan of the page to measure a second data state metric for read operations performed using a threshold voltage offset value from each of multiple bins. Processing device updates the bin, to which the page is assigned for the specified die, to match a second bin having the threshold voltage offset value that yields a lowest read bit error rate from the second scan.

Abstract: An ultra-deep compute Static Random Access Memory (SRAM) with high compute throughput and multi-directional data transfer capability is provided. Compute units are placed in both horizontal and vertical directions to achieve a symmetric layout while enabling communication between the compute units. An SRAM array supports simultaneous read and write to the left and right section of the same SRAM subarray by duplicating pre-decoding logic inside the SRAM array. This allows applications with non-overlapping read and write address spaces to have twice the bandwidth as compared to a baseline SRAM array.

Abstract: A semiconductor storage device includes: a first memory cell and a second memory cell that are adjacent to each other and connected to each other in series; a first word line connected to the first memory cell; a second word line connected to the second memory cell; and a control circuit. The control circuit is configured to, in a first read operation to read a first bit stored in the first memory cell, apply a first voltage to the first word line, and then, apply a first read voltage lower than the first voltage, to the first word line, and apply a second voltage to the second word line, and then, apply a third voltage lower than the second voltage and higher than the first voltage, to the second word line. The third voltage is applied to the second word line after the first read voltage is applied to the first word line.

Abstract: A SRAM system having an address scheme and/or wire control layout. By preferentially accessing a defined address range mapped to SRAM array blocks located near a controller, significant power savings can be realized. In one embodiment, the address scheme determines a range physically closer to a central control location. In another embodiment, the wire control layout reduces number and length of active wires, further reducing power consumption.

Abstract: An electronic device may include: a column control circuit configured to generate a column control pulse and a mode register enable signal, each with a pulse that is generated based on logic levels of a chip selection signal and a command address; and a control circuit configured to generate a read control signal to perform a read operation and a mode register read operation by delaying the column control pulse based on a logic level of the mode register enable signal and configured to generate a mode register control signal to perform the mode register read operation by delaying the column control pulse based on a logic level of the mode register enable signal.

Abstract: In an example, a method may include comparing input data to stored data stored in a memory cell and determining whether the input data matches the stored data based on whether the memory cell snaps back in response to an applied voltage differential across the memory cell.

Abstract: A compute-in-memory bitcell is provided that includes a pair of cross-coupled inverters for storing a stored bit. The compute-in-memory bitcell includes a logic gate formed by a pair of switches for multiplying the stored bit with an input vector bit. A controller controls the pair of switches responsive to a sign bit during a computation phase of operation and controls the pair of switches responsive to a magnitude bit during an execution phase of operation.

Abstract: According to one embodiment, a memory system is disclosed. The system includes a nonvolatile memory, a controller which controls the nonvolatile memory and to which a first voltage is supplied, and a circuit to which first and second signals from a host device are input, or the first signal is not input and the second signal is input from the host device, when the memory system is connected to the host device. The circuit converts a second voltage of the second signal into the first voltage when the first and second signal have the second voltage and the second voltage is lower than the first voltage, and does not convert a voltage of the second signal into the first voltage when the first signal is not input and the voltage of the second signal is the first voltage.

Abstract: The present invention provides a sensitivity amplifier, its control method, a memory read-write circuit and a memory device. The sensitivity amplifier includes: a first PMOS transistor and a second PMOS transistor, a first NMOS transistor and a second NMOS transistor, a first input/output terminal, and a second input/output terminal; four switch unit, the first PMOS and the first NMOS transistors are respectively connected to the first input/output terminal through one switch unit, the second PMOS and the second NMOS transistors are respectively connected to the second input/output terminal through another switch unit. The switch units configure each PMOS transistor and each NMOS transistor in an amplifier mode or in a diode mode. The first NMOS transistor's gate connects to the bit line, and the second NMOS transistor's gate connects to the reference bit line. The disclosed sensitivity amplifier has improved performance.

Abstract: Some embodiments include apparatuses and methods of using such apparatuses. One of the apparatuses includes a semiconductor material, a pillar extending through the semiconductor material, a select gate located along a first portion of the pillar, memory cells located along a second portion of the pillar, and transistors coupled to the select gate through a portion of the semiconductor material. The transistors include sources and drains formed from portions of the semiconductor material. The transistors include gates that are electrically uncoupled to each other.

Abstract: A memory device includes a common gate input buffer circuit. The input buffer circuit includes an input node configured to receive a signal representative of data to be stored in the memory device and a voltage reference node. The input buffer circuit further includes an amplification circuit electrically coupled to the input node and to the voltage reference node and configured to amplify the signal to provide for an amplified signal. The input buffer circuit additionally includes an equalization circuit electrically coupled to the amplification circuit and configured to process the amplified signal to provide for a filtered signal and an output circuit electrically coupled to equalization circuit and configured to provide for at least one output signal based on the filtered signal, wherein the output signal comprises a differential output signal and wherein the common gate input buffer circuit does not include a common mode feedback (CMFB) loop.

Abstract: The present disclosure includes apparatuses and methods for in-memory operations. An example apparatus includes a memory device including a plurality of subarrays of memory cells, where the plurality of subarrays includes a first subset of the respective plurality of subarrays and a second subset of the respective plurality of subarrays. The memory device includes first sensing circuitry coupled to the first subset, the first sensing circuitry including a sense amplifier and a compute component configured to perform an in-memory operation. The memory device includes second sensing circuitry coupled to the second subset, the second sensing circuitry including a sense amplifier. The memory device also includes a controller configured to direct a first movement of a data value to a selected subarray in the first subset based on the first sensing circuitry including the compute component.