Abstract: In one example, an RF coil array includes a first RF coil configured to generate a magnetic field along a first axis, the first RF coil having a first surface, a second RF coil configured to generate a magnetic field along a second axis, orthogonal to the first axis, the second RF coil having a second surface, and a first foldable interconnect coupling the first RF coil to the second RF coil. The first foldable interconnect may be adjusted to couple the first RF coil to the second RF coil with a first amount of overlap and with the first surface and second surface facing a common direction, or couple the first RF coil to the second RF coil with a second amount of overlap, larger than the first amount of overlap, and with the first surface in face to face position with the second surface.

Abstract: Hybrid frequency/time-domain modeling may be used to compute the synthetic transient response to an eddy-current pulse for use in a high-dynamic-range and efficient inversion method for pulsed-eddy-current pipe inspection tools. In accordance with some embodiments, frequency-domain response signals are computed for a plurality of frequencies and converted, by frequency-to-time-domain transformation, to a first synthetic transient response signal. A time boundary associated with an onset of spurious oscillations in the first synthetic transient response signal is then automatically determined, and a second synthetic transient response signal beginning at the determined time boundary is determined directly with a time-domain numerical technique. A portion of the first synthetic transient response signal ending at the time boundary may be combined with the second synthetic transient response signal.

Abstract: Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments are directed to methods for fabricating such probe or cantilever structures. In some embodiments, for example, cantilever probes have extended base structures, slide in mounting structures, multi-beam configurations, offset bonding locations to allow closer positioning of adjacent probes, compliant elements with tensional configurations, improved over travel, improved compliance, improved scrubbing capability, and/or the like.

Abstract: A detection circuit and a switch module using the same is provided. The detection circuit includes a comparison circuit. A first input end of the comparison circuit is coupled to an output end of a power supply, and a second input end of the comparison circuit is coupled to an input end of a switch circuit. The comparison circuit compares voltage information or current information obtained via its first input end and it second input end, and accordingly generates an output signal. The output signal indicates whether there is an external resistor between the power supply and the switch circuit. According to the output signal, the switch circuit determines how a current provided by the power supply is to be detected, and accordingly continues or stops providing the current to a load.

Abstract: A method of testing sensors includes providing a test sheet that includes a plurality of sensor assemblies, a plurality of test pads, and traces extending from the sensor assemblies to the plurality of test pads. A sensor is positioned on each sensor assembly. Each sensor is connected to the sensor assembly with wire bonds. An enclosure is formed over the plurality of sensor assemblies. An electrical signal is detected from each of the plurality of sensor assemblies at the test pads.

Abstract: Provided is a method of diagnosing at least one winding set of a stator of a generator during operation, the winding set having plural wires for plural phases, the method including: obtaining, for each of the plural wires of the winding set, an individual strength of an individual power output from the respective wire of the plural wires of the winding set; obtaining a sum strength of power; forming, for each considered wire of the plural wires of the winding set, an individual ratio between the individual strength of the considered wire and the sum strength; forming, for each considered wire of the plural wires of the winding set, a diagnostic value by subtracting from an individual ratio not corresponding to the considered wire a term depending on the individual ratio corresponding to the considered wire; diagnosing at least one wire based on comparing the diagnostic values.

Abstract: A testing system for carrying out electrical testing of at least one first through via forms an insulated via structure extending only part way through a substrate of a first body of semiconductor material. The testing system has a first electrical test circuit integrated in the first body and electrically coupled to the insulated via structure. The first electrical test circuit enables detection of at least one electrical parameter of the insulated via structure.

Abstract: A power supply circuit includes an internal power source that receives power supply from an external power source, an abnormality detection circuit that receives power supply from the internal power source to detect abnormalities of the external power source, a protection target circuit that receives the power supply from the external power source, and a protection function unit that restricts electric power supplied to the protection target circuit to a predetermined range, when the abnormality detection circuit detects the abnormalities.

Abstract: A test and measurement device for testing an electronic device under test comprises a test controller, which is configured to control the test and measurement device to perform tests with the electronic device under test based on respective user provided configuration parameters, and a memory device, which is coupled to the test controller, wherein the test controller is configured to automatically store for every test in the memory device a parameter set comprising the user provided parameters.

Abstract: A circuit for detecting a glitch in power supply includes a detection circuit to detect the glitch in a DC supply voltage of the power supply when a magnitude in the glitch in a DC supply voltage of the power supply exceeds a detection threshold, wherein the detection threshold is a function of the DC supply voltage, and wherein the detection circuit comprises a low pass filter, a control circuit coupled to the low pass filter, and a current mirror circuit coupled to the control circuit having an output for providing a logic signal indicative of a detected glitch.

Abstract: A high density thin walled test device testing chips/ICs is disclosed. A housing includes a slot for a contact pin and a pair of elastomers. The pin has an arcuate recess to receive part of the elastomer. Likewise the housing includes a channel to receive part of the elastomer. The recess and channel together partially surround the elastomer but not completely to allow shear forces and expansion space for the elastomer as it is compressed by the channel and recess. In addition, a front channel extends from the top surface of the housing toward the bottom surface but leaving a floor to support the elastomer so that it does not warp the housing when compressed. Further, the channel or the recess may include retainers which prevent the elastomer from moving out of position when the pin is in an uncompressed state.

Abstract: A particulate matter detection circuit includes, a negative resistance circuit that couples to a first antenna inserted in a housing accommodating a first filter that filters an exhaust gas, couples to a second antenna inserted in the housing via a matching circuit that performs an impedance matching and a second filter that narrows the frequency band of a passing signal, and oscillates at a resonance frequency of the housing, and a detection circuit that outputs a voltage value corresponding to a signal strength of a radio wave received by a third antenna or the second antenna inserted in the housing. The resonance frequency of the housing varies depending on an amount of matter adhered to the first filter.

Abstract: A switch apparatus (10) for a measuring device (30) for a transformer includes controllable switch device (14) which are configured to short-circuit respectively assigned terminals (11) of one of a plurality of windings of the transformer. A test apparatus (40) including the switch apparatus (10) and a method (50) for operating the switch apparatus (10) are also disclosed. With apparatuses (10, 40) and methods (50) according to the exemplary embodiments, the work effort, time expenditure and errors and inaccuracies can be reduced through an automated testing of transformers.

Abstract: A power supply circuit includes an internal power source that receives power supply from an external power source, an abnormality detection circuit that receives power supply from the internal power source to detect abnormalities of the external power source, a protection target circuit that receives the power supply from the external power source, and a protection function unit that restricts electric power supplied to the protection target circuit to a predetermined range, when the abnormality detection circuit detects the abnormalities.

Abstract: A flexible current sensor comprising a sensing coil wound on a cylindrical flexible core where the sensing coil comprises two in series connected overlapping windings wound along the cylindrical flexible core in mutually opposite direction. The cylindrical flexible core comprises a plurality of individual fibers from a nonmagnetic material arranged into the nearest approximation of a cylindrical shape and the sensing coil is equipped with a nonconductive separation layer located between its windings.

Abstract: A floating input detection method and circuits. A method for detecting a floating signal input terminal includes providing a common-mode input voltage to a first amplifier coupled to the signal input terminal, and providing an output signal generated by the first amplifier to: a non-inverting input of a second amplifier coupled to the signal input terminal, an inverting input of the second amplifier, coarse detection circuitry, and fine float detection circuitry. The method also includes comparing, by the coarse detection circuitry, the output signal to a first threshold voltage, and determining the signal input terminal to be not floating responsive to the comparing indicating that the output signal is greater than the first threshold voltage.

Abstract: A defect number determination unit determines whether or not a solar cell string is defective in a plurality of positions on the basis of whether or not a combined impedance found from impedances in the case where an inspection signal is applied to a P terminal and an N terminal of the solar cell string deviates from a reference impedance by greater than or equal to a predetermined threshold.

Abstract: Sampled measurement data stream is controlled in an electrical network by measuring at least one measurement value in a remote device; detecting in the remote device at least one phenomenon of interest or request for a connection from the central device; activating by the remote device a communication channel for sampled measured values between the remote device and a central device in response to the detection of the phenomenon of interest or the request for a connection from the central device; and sending the measurement value from the remote device to the central device through the communication channel for sampled measured values.

Abstract: A method for electrostatic discharge (ESD) testing and analysis includes performing, by an ESD testing device, ESD testing on pins of an integrated circuit (IC) device to generate pre-stress ESD test data for each of the pins and post-stress ESD test data for each of the pins, determining, current shifts according to first data points of voltage-current (IV) curves of the pre-stress ESD test data corresponding to the IC device pins and to second data points of IV curves of the post-stress ESD test data corresponding to the respective pins of the IC device, assigning, by the device, a test result classification for each of the pins according to a relationship between a test threshold and the current shift for the respective pin, and displaying, by a workstation, a visually coded map of the IC device indicating the test result classification for each of the pins.

Abstract: The present disclosure provides a probe assembly and a probe structure thereof. The probe structure includes a first base part, a second base part, a connecting part, and a contacting part. The first base part includes a first contacting segment and a first connecting segment. The first contacting segment includes a first abutting portion and a first side end portion connected to the first abutting portion. The second base part includes a second contacting segment, a second connecting segment, and a passive component disposed between the second contacting segment and the second connecting segment. The second contacting segment includes a second abutting portion and a second side end portion connected to the second abutting portion. The first connecting segment and the second connecting segment are connected to the connection part. The contacting portion is connected to the connection part.