Abstract: A position detection device includes a first position detector, a second position detector, and a signal generator. The first position detector includes a first magnetic field generation unit, a second magnetic field generation unit, and a first magnetic sensor. The second position detector includes a third magnetic field generation unit, a fourth magnetic field generation unit, and a second magnetic sensor. The positions of the second and fourth magnetic field generation units vary in response to variations in a detection-target position. The signal generator generates a position detection signal, which is the sum of a first detection signal generated by the first magnetic sensor and a second detection signal generated by the second magnetic sensor. Each of the first and second position detectors includes a bias magnetic field generation unit.

Abstract: A test apparatus includes a host compliance printed circuit board having a first circuit plane and a second circuit plane separated by at least one dielectric layer. A first row of surface mount pads are disposed on the first circuit plane. The first row of surface mount pads includes a first pad and a second pad. A second and third row of surface mount pads are disposed on the first circuit plane. A first and second differential pair of circuit lines is disposed on the first circuit plane. The first differential circuit line has one end coupled to the first pad. The second differential circuit line has one end coupled to the second pad. The first and second differential pair of circuit lines extend from the first and second pads and between the second and third rows of surface mount pads.

Abstract: A device for magnetic measurement that includes a DC magnetic field sensor having at least four discrete elements, each of the discrete elements being constituted by at least one coil and a magnetic material without remanence, where the at least four discrete elements are substantially identical. The magnetic field sensor includes a first discrete element orientated in a given direction, and a second discrete element associated therewith to constitute a first differential pair. The second discrete element being orientated in parallel but in an opposite direction relative to the first discrete element. The device further including two other discrete elements constituting a second differential pair substantially identical to the first differential pair. The two other discrete elements being parallel to the orientation of the first differential pair but are respectively orientated in an opposite direction to the first and second discrete elements of the first differential pair.

Abstract: Methods and related systems conduct a capacity check of a battery via a partial discharge cycle. A method of estimating a total capacity of a battery includes partially discharging the battery at a controlled discharge rate so as to discharge an amount of energy from the battery over a period of time. An output voltage of the battery is measured during the period of time. A total capacity of the battery is estimated based on the amount of energy discharged from the battery during the partial discharge cycle and the output voltage of the battery measured during the partial discharge cycle.

Abstract: Obscured feature detectors are disclosed. An obscured feature detector includes a sensor plate array including three or more sensor plates, each of the three or more sensor plates configured to form a first end of a corresponding electric field and to take a sensor reading of the corresponding electric field. The corresponding electric field varies based on a proximity of the sensor plate to one or more surrounding objects and on a material property of each of the one or more surrounding objects. The three or more sensor plates include a first sensor plate that has a first shape and a second sensor plate that has a second shape that is different from the first shape of the first sensor plate. The obscured feature detector also includes one or more common plates to form a second end of the corresponding electric field of the three or more sensor plates.

Abstract: A servo motor system and method has been developed to provide speed, orientation, location, and/or direction detection using a single inductive sensor. Direction, orientation, speed, and/or location detection are detected using a single channel inductive sensor in a servo motor control system. Mechanical control systems using servo motors are easily upgraded with added safety, precision control, and automation using the inductive sensor system described herein.

Abstract: A circuit and method provide improved trimming of a DCR sensing circuit where a sensing element is sensitive to self-heating or having a large tolerance. The circuit includes a resistive divider circuit coupled to a sensing element. The resistive divider circuit includes a trim resistor and two test points. Prior to trimming the trim resistor, an actual resistance of the sensing element is determined. A target voltage across the trim resistor to be trimmed is calculated according to the determined sensing element resistance and a known small trim current that is to be injected into the circuit during the trimming process. This injected trim current has a low current value so there is no self-heating of the sensing element. Then, the trim resistor is trimmed while injecting this small trim current into the resistive divider circuit and the voltage across the trim resistor is monitored.

Abstract: A motor driving device includes: a converter unit having a capacitor; a plurality of inverter units having a plurality of semiconductor switching elements and configured to convert a capacitor voltage across the capacitor into an AC voltage to drive a plurality of motors; a second switch configured to connect the negative-side terminal of the capacitor to ground; a first detector configured to detect a ground-referenced voltage; and a second detector configured to detect the capacitor voltage. The motor driving device controls the semiconductor switching elements to establish a measurement state for enabling measurement of an insulation resistance of a measurement target motor, determines that the ground-referenced voltage has converged when an amount of change in the waveform of the ground-referenced voltage detected by the first detector becomes equal to or lower than a threshold, and calculates the insulation resistance based on the ground-referenced voltage and the capacitor voltage.

Abstract: A sensor for measuring the position of a component that is displaceable relative to the sensor, includes a circuit board and a metal body. The circuit board includes a first region in which a detector is located, and a second region in which electronic components are located, which are electrically connected to the detector. The metal body includes a first layer having a first area as well as a second layer having a second area. The first region of the circuit board is fixed in place in the first area and the second region of the circuit board is fixed in place in the second area. The first layer and the second layer of the metal body are situated between the first region and the second region of the circuit board so that the first region is located in a first plane and the second region is located in a second plane.

Abstract: Provided is a current detection device that enables to eliminate the influence of vibration that is applied to a bus bar, which is configured as a shunt resistor and measures current with high accuracy and high reliability. The current detection device is provided with a first wiring member and a second wiring member consisting of a conductive metal material, and a resistor body consisting of a metal material having a lower temperature coefficient of resistance than those wiring members and is joined between the first wiring member and the second wiring member, wherein a connection portion for making a connection to another wiring member or device is formed at an end of the first wiring member and second wiring member, the end being an opposite side from a joint with the resistor body, and a fixing member is provided between the connection portion and the joint with the resistor body.

Abstract: An array substrate, a display panel and a test method thereof and a display device. The array substrate has a display region and a peripheral region and includes a first electrode layer and a first test line. The first electrode layer includes a plurality of first signal lines arranged along a first direction, and the first signal lines extend from the peripheral region to the display region; the first test line is provided in the peripheral region, and extends along the first direction; the first test line is overlapped with and insulated from the first signal lines.

Abstract: A semiconductor device comprises a device substrate and a metal film, with first and second non-recessed areal regions separated by a recessed areal region. The metal film covers contiguously the recessed and non-recessed areal regions and transition surfaces joining them. A first transition surface includes metallized portions over which (i) the first transition surface is not parallel to the other transition surface, (ii) the first transition surface is inclined relative to the device substrate, and (iii) the metal film on the first transition surface is contiguous with adjacent metal film portions on the recessed and non-recessed areal regions. A portion of an optoelectronic device surface running parallel to an optical waveguide of the device can be left exposed by a metal film on the device. Light propagating transversely out of the waveguide through the exposed portion can be detected, measured, or imaged for non-destructive device characterization or testing.

Abstract: A manipulator may include a base portion, an upright portion connected to the base portion, a test head attachment incorporated into the upright portion, and an upright quick connect assembly incorporated into the test head attachment. In some cases, the manipulator includes an automatic weight transfer mechanism, a mobile base portion with casters and/or steerable casters.

Abstract: A system for determining DC leakage current flowing through an electrically insulating structure in a high voltage direct current power system is provided. The DC leakage current is a composite DC current. The insulating structure is operatively coupled to at least an overhead energized DC electrical line. The system further includes a direct current meter adapted to be electrically coupled to at least the insulating structure. The meter includes a waveform separator. The separator is configured to receive and separate the composite DC current into a corresponding direct current (DC) and an alternating current (AC) component. The separator further includes at least one comparator which is configured to produce at least one corresponding digital signal from the AC component; and a processor. The processor receives and analyzes the at least one corresponding digital signal and the DC component to determine a resultant leakage current flowing through the insulating structure.

Abstract: An integrated circuit (IC) chip for providing a safety-critical value includes first and second processing paths. The first processing path includes a first processing element and is coupled to receive a first input signal on a first input pin and to provide a first output signal that provides the safety-critical value on an output pin. The second processing path includes a second processing element and is coupled to receive a second input signal and to provide a second output signal. The first processing path and the second processing path are independent of each other. A smart comparator on the IC chip receives the first output signal and the second output signal and initiates a remedial action responsive to a difference between the first output signal and the second output signal reaching a configurable threshold.

Abstract: Methods and apparatus are described relating to a probe assembly having a probe head securing mechanism that includes a lock ring housing and a lock ring disposed in the lock ring housing. In an example, a probe assembly includes a rigid substrate, a circuit board coupled to the rigid substrate, and a probe head securing mechanism. The probe head securing mechanism includes a lock ring housing and a lock ring disposed within the lock ring housing. The circuit board has a surface. The lock ring housing is coupled to the rigid substrate. The circuit board is disposed between the lock ring housing and the rigid substrate. The lock ring is rotatable relative to the lock ring housing. Rotation of the lock ring is configured to move the lock ring in a direction perpendicular to the surface of the circuit board.

Abstract: Embodiments disclosed herein are directed towards systems and methods for electric current leakage detection in a land seismic system. Embodiments may include generating at least one test signal using a digital to analog converter “DAC” circuitry, wherein the DAC circuitry includes an output operatively connected to earth ground. Embodiments may further include alternately grounding a positive path to an analog to digital converter “ADC” circuitry during a first time window and a negative path to the analog to digital converter during a second time window while measuring an ADC signal. Embodiments may also include determining an average amplitude of the first time window and the second time window and determining a leakage resistance based upon, at least in part, the average amplitude of the first time window and the second time window.

Abstract: A bilge pump breakout box is for connection to a bilge pump system that includes a bilge pump, a power supply, a manual on/off switch, and a float switch. The bilge pump breakout box includes a dielectric substrate, and a terminal block positioned on a first side of the substrate and including a plurality of electrical connection terminals configured to be electrically coupled to the bilge pump, the power supply, the manual on/off switch, and the float switch. Each of the plurality of electrical connection terminals includes a wire connector at a first end, and a connection pin at a second end and extending through the dielectric substrate. Connection circuitry is positioned on a second side of the dielectric substrate and electrically connecting various connection pins of the plurality of electrical connection terminals in a circuit pattern. A protective enclosure protects the components from the ambient environment.

Abstract: A ZSI testing apparatus includes a fault generation circuit, a plurality of cable assemblies coupled to the fault generation circuit, wherein the cable assemblies are structured to be selectively coupled to selected circuit interrupters, a human machine interface, and a controller coupled. The controller is configured to: (i) selectively cause a fault current to be provided to a number of the cable assemblies, (ii) receive an input from each circuit interrupter that is coupled to one of the cable assemblies, each input being indicative of a trip signal output of the circuit interrupter, (iii) determine based on the received inputs (a) that an error has occurred with respect to operation of the circuit interrupters and (b) a recommendation for fixing the error, and (iv) cause an output indicative of the error and the recommendation to be provided on the human machine interface.

Abstract: An inspection device comprises a stage for placing a device under test thereon, a dynamic characteristics test probe, a static characteristics test probe, and a control device configured to perform positional control by moving at least one of the stage, the dynamic characteristics test probe, and the static characteristics test probe. The control device performs the positional control such that the dynamic characteristics test probe is set to a dynamic characteristics test state in which the dynamic characteristics test probe is brought into contact with the electrode when the dynamic characteristics test is performed, and performs the positional control such that the static characteristics test probe is set to a static characteristics test state in which the static characteristics test probe is brought into contact with the electrode while the dynamic characteristics test probe is separated from the electrode when the static characteristics test is performed.