Abstract: A semiconductor device, including a substrate of a first conductivity type, an active region and a termination structure portion formed on a front surface of the substrate, and a plurality of regions of a second conductivity type formed concentrically surrounding the periphery of the active region in the termination structure portion. Each region has a higher impurity concentration than one of the regions adjacent thereto on an outside thereof. The plurality regions include first and second semiconductor regions, and an intermediate region sandwiched between, and in contact with, the first and second semiconductor regions, and a third semiconductor region. The intermediate region includes a plurality of first subregions and a plurality of second subregions that are alternately arranged along a path in parallel to a boundary between the active region and the termination structure portion, the second subregions having a lower impurity concentration than the first subregions.

Abstract: A memory device includes a plurality of memory cells. A first memory cell of the plurality of memory cells includes a first write transistor includes a first write gate, a first write source, and a first write drain. A first read transistor includes first read gate, a first read source, a first read drain, and a first body region separating the first read source from the first read drain. The first read source is coupled to the first write source. A first capacitor has a first upper capacitor plate coupled to the first write drain and a first lower capacitor plate coupled to the first body region of the first read transistor.

Abstract: A display apparatus comprises a first signal line on a substrate, a second signal line intersecting with the first signal line, a first gate electrode, a first source electrode, a first drain electrode, and a second gate electrode disposed on the same layer as that of the first signal line, a first active layer spaced apart from the first gate electrode and partially overlapped with the first gate electrode, a second active layer spaced apart from the second gate electrode and partially overlapped with the second gate electrode, and a first electrode of a display device connected with the second active layer.

Abstract: A semiconductor device has an interposer mounted over a carrier. The interposer includes TSV formed either prior to or after mounting to the carrier. An opening is formed in the interposer. The interposer can have two-level stepped portions with a first vertical conduction path through a first stepped portion and second vertical conduction path through a second stepped portion. A first and second semiconductor die are mounted over the interposer. The second die is disposed within the opening of the interposer. A discrete semiconductor component can be mounted over the interposer. A conductive via can be formed through the second die or encapsulant. An encapsulant is deposited over the first and second die and interposer. A portion of the interposer can be removed to that the encapsulant forms around a side of the semiconductor device. An interconnect structure is formed over the interposer and second die.

Abstract: A light emitting display apparatus includes a substrate, a first metal line and a second metal line spaced apart from each other along a first direction on the substrate and disposed along a second direction crossing the first direction, and a subpixel overlapped with at least one of the first metal line and the second metal line. The subpixel includes a first light emission portion between the first metal line and the second metal line, and a second light emission portion overlapped with at least one of the first metal line and the second metal line.

Abstract: Embodiments of methods to form three-dimensional (3D) memory devices include the following operations. First, an initial channel hole is formed in a stack structure of a plurality first layers and a plurality of second layers alternatingly arranged over a substrate. An offset is formed between a side surface of each one of the plurality of first layers and a side surface of each one of the plurality of second layers on a sidewall of the initial channel hole to form a channel hole. A semiconductor channel is formed by filling the channel hole with a channel-forming structure, the semiconductor channel having a memory layer including a plurality of first memory portions each surrounding a bottom of a respective second layer and a plurality of second memory portions each connecting adjacent first memory portions.

Abstract: A field effect transistor comprising a buffer and channel layer formed successively on a substrate. A source electrode, drain electrode, and gate are all formed in electrical contact with the channel layer, with the gate between the source and drain electrodes. A spacer layer is formed on at least a portion of a surface of the channel layer between the gate and drain electrode and a field plate is formed on the spacer layer isolated from the gate and channel layer. The spacer layer is electrically connected by at least one conductive path to the source electrode, wherein the field plate reduces the peak operating electric field in the device.

Abstract: A semiconductor device and method of forming a semiconductor device are provided. The semiconductor device includes a pore-type heater having a center pore recess. The semiconductor device further includes a tapered structure formed on the pore-type heater and having a tip portion at least extending down to the center pore recess. The semiconductor device also includes a containment layer confining volatile active material during any of a fabrication and an operation of the semiconductor device performed above a threshold temperature.

Abstract: Provided are a display panel and a display device. The display panel includes a substrate and a plurality of pixel units disposed on the substrate. Each pixel unit includes a driving circuit and a light-emitting component, the driving circuit is disposed between the substrate and the light-emitting component, and the driving circuit is used for driving a corresponding light-emitting component to emit light. At least one light-emitting component is a micro Light Emitting Diode (LED). For a pixel unit in which the light-emitting component is the micro LED, the driving circuit at least includes a first thin film transistor, and a source and a drain of the first thin film transistor are disposed in a source-drain layer. A first electrode of the micro LED is electrically connected to a source or a drain of a corresponding first thin film transistor.

Abstract: A display substrate, a display device and a test method of the display substrate are disclosed. The display substrate includes a display region and a peripheral region. The peripheral region includes: a first leading wire extending in a first direction and including a first end and a second end; a first test wire electrically connected with the first leading wire at a first position of the first test wire between the first end and the second end; the display region includes first signal wires of first group extending in a second direction, two first signal wires arranged outermost in the first direction among the first signal wires of first group are respectively connected with the first end and the second end, and remaining first signal wires among the first signal wires of first group are connected with the first leading wire between the first end and the second end.

Abstract: Embodiments of the invention include nanowire and nanoribbon transistors and methods of forming such transistors. According to an embodiment, a method for forming a microelectronic device may include forming a multi-layer stack within a trench formed in a shallow trench isolation (STI) layer. The multi-layer stack may comprise at least a channel layer, a release layer formed below the channel layer, and a buffer layer formed below the channel layer. The STI layer may be recessed so that a top surface of the STI layer is below a top surface of the release layer. The exposed release layer from below the channel layer by selectively etching away the release layer relative to the channel layer.

Abstract: Solid state lighting (“SSL”) devices with improved current spreading and light extraction and associated methods are disclosed herein. In one embodiment, an SSL device includes a solid state emitter (“SSE”) that has a first semiconductor material, a second semiconductor material spaced apart from the first semiconductor material, and an active region between the first and second semiconductor materials. The SSL device can further include a first contact on the first semiconductor material and a second contact on the second semiconductor material and opposite the first contact. The second contact can include one or more interconnected fingers. Additionally, the SSL device can include an insulative feature extending from the first contact at least partially into the first semiconductor material. The insulative feature can be substantially aligned with the second contact.

Abstract: An array substrate includes a substrate as well as a first insulating layer, a first conductive layer, a second insulating layer, a second conductive layer and a conductive structure sequentially formed thereon. The first insulating layer has a first opening communicated with a through hole of the substrate. The first conductive layer includes a first ring pattern extending from top of the first insulating layer into the first opening. The second insulating layer has a second opening communicated with the first opening. The second conductive layer includes a second ring pattern extending from top of the second insulating layer into the second opening. The first ring pattern laterally protrudes toward an axis of the through hole from the second ring pattern. The conductive structure extends from above the second insulating layer to a bottom surface of the substrate through the first and second openings and the through hole.

Abstract: Methods for forming via last through-vias. A method includes providing an active device wafer having a front side including conductive interconnect material disposed in dielectric layers and having an opposing back side; providing a carrier wafer having through vias filled with an oxide extending from a first surface of the carrier wafer to a second surface of the carrier wafer; bonding the front side of the active device wafer to the second surface of the carrier wafer; etching the oxide in the through vias in the carrier wafer to form through oxide vias; and depositing conductor material into the through oxide vias to form conductors that extend to the active carrier wafer and make electrical contact to the conductive interconnect material. An apparatus includes a carrier wafer with through oxide vias extending through the carrier wafer to an active device wafer bonded to the carrier wafer.

Abstract: A method of forming an integrated circuit structure includes forming a gate dielectric on a wafer, forming a work function layer over the gate dielectric, depositing a capping layer over the work function layer, soaking the capping layer in a silicon-containing gas to form a silicon-containing layer, forming a blocking layer after the silicon-containing layer is formed, and forming a metal-filling region over the blocking layer.

Abstract: An integrated circuit includes a first diffusion area for a first type transistor. The first type transistor includes a first drain region and a first source region. A second diffusion area for a second type transistor is separated from the first diffusion area. The second type transistor includes a second drain region and a second source region. A gate electrode continuously extends across the first diffusion area and the second diffusion area in a routing direction. A first metallic structure is electrically coupled with the first source region. A second metallic structure is electrically coupled with the second drain region. A third metallic structure is disposed over and electrically coupled with the first and second metallic structures. A width of the first metallic structure is substantially equal to or larger than a width of the third metallic structure.

Abstract: An electronic device including a flexible display panel is provided. The electronic device includes a display panel, a first component, a movable module, and a housing. The housing includes a first movable portion, a second component, and a third component. The third component includes a first space where the first component is stored. The display panel includes a flexible display portion. The display portion includes a first region, a second region, and a third region. The first region is fixed to the second component. The second region is fixed to the first component stored in the third component. The movable module has a function of holding a first angle that is formed between the second component and the third component by the first movable portion. The third region positioned between the first region and the second region has a function of forming a curved surface according to the first angle. The first component slides in the first space according to the first angle.

Abstract: A method of manufacturing a vertical transistor device comprises forming a bottom source region on a semiconductor substrate, forming a channel region extending vertically from the bottom source region, forming a top drain region on an upper portion of the channel region, forming a first gate region having a first gate length around the channel region, and forming a second gate region over the first gate region and around the channel region, wherein the second gate region has a second gate length different from the first gate length, and wherein at least one dielectric layer is positioned between the first and second gate regions.

Abstract: A semiconductor device (100, 100?, 100?) and a method for manufacturing a semiconductor device (100, 100?, 100?). The semiconductor device (100, 100?, 100?) includes a substrate (104, 106), a GaN layer (112), and an AlGaN layer (114). The GaN layer (112) is located between the substrate (104, 106) and the AlGaN layer (114). The device further includes at least one contact (130, 132, 134), comprising a central portion (150) and an edge portion (152), and a passivation layer (160) located at least between the edge portion (152) of the contact (130, 132, 134) and the AlGaN layer (114). The edge portion (152) is spaced apart from an upper surface of the passivation layer (160). The edge portion (152) may be spaced apart from the passivation layer (160) by a further layer (170) or by an air gap (172).

Abstract: The application discloses a method adapted to manufacture an array substrate and a display panel. The method includes: form a photoresist layer, a source and a drain; post-baking the photoresist layer, so that the photoresist layer flows to the position of a channel; etching a semiconductor layer to obtain a preset pattern; and peeling off the photoresist layer.